Methods of measurement for semiconductor materials, process control, and devices Quarterly report, 1 Jan. - 31 Mar. 1970
Methods of measurement for semiconductor materials process control, and devices
Baroody, A. J., Jr.↗
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Radiation Resistant Silicon Semiconductor Devices-Patent
Improving radiation resistance of silicon semiconductor junctions by doping with lithium
Wysocki, J. J.↗
Methods of measurement for semiconductor materials, process control, and devices Quarterly report, 1 Apr. - 30 Jun. 1970
Measurement methods for semiconductor devices, materials, and production control
Baroody, A. J., Jr.↗
Apparatus and method for separating a semiconductor wafer Patent
Separation of semiconductor wafer into chips bounded by scribe lines
Litant, I.↗
Research study of structural damage produced in silicon semiconductors by neutron irradiation Final report, Jun. 1969 - Jul. 1970
Characteristics of damage produced in silicon semiconductors by neutron irradiation
Sargent, G. A.↗
Method of making impurity-type semiconductor electrical contacts Patent
Fabrication of sintered impurity semiconductor brushes for electrical energy transfer
Horton, J. C.↗
Method of electrolytically binding a layer of semiconductors together Patent
Binding layer of semiconductor particles by electrodeposition
Ellis, S. G.↗
Gd or Sm doped silicon semiconductor composition Patent
Gadolinium or samarium doped-silicon semiconductor material with resistance to radiation damage for use in solar cells
Mandelkorn, J.↗
Extended area semiconductor radiation detectors and a novel readout arrangement Patent
Mosaic semiconductor radiation detector and position indicator systems engineering for low energy particles
Reinitz, K.↗
Semiconductor material and method of making same Patent
Addition of group 3 elements to silicon semiconductor material for increased resistance to radiation damage in solar cells
Mandelkorn, J.↗
Methods of measurement for semiconductor materials, process control, and devices Quarterly report, 1 Jul. - 30 Sep. 1970
NBS activities in developing methods of measurement for semiconductor materials, process control, and devices
Bullis, W. M.↗
A study of metal insulator semiconductor magnetoresistance, bulk, and surface properties of indium antimonide
Metal-insulator-magnetoresistance, bulk, and surface properties of indium antimonide compound semiconductor material
Grannemann, W. W.↗
Method of temperature compensating semiconductor strain gages Patent
Method for temperature compensating semiconductor gages by exposure to high energy radiation
Gross, C.↗
Bulk semiconductor materials for millimeter and submillimeter wave detection
Investigating electrical properties of bulk semiconductor materials for application as millimeter and submillimeter wave detectors
Eldumiati, I. I.↗
Radiation Effects Design Handbook. Section 1 - Semiconductor Diodes
Design handbook for steady state radiation effects on semiconductor diodes
Hamman, D. J.↗
Methods of measurement for semiconductor materials, process control, and devices Quarterly report, 1 Oct. - 31 Dec. 1970
Alpha and gamma radiation detectors and measuring instruments for semiconductor materials, process control, and devices
Bullis, W. M.↗
Reliability studies in semiconductor fabrication
Profiling procedures including computer program (OLS) for measuring junction depth in anodic oxidation - semiconductor fabrication reliability studies
Source record↗
Study of semiconductor heterojunctions of ZnSe, GaAs and Ge
Experimentals characteristics of semiconductor heterojunction pairs ZnS/GaP and ZnSe/GaP
Milnes, A. G.↗