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At least 523 records · Page 29

Analysis of integrity and microstructure of linear friction welded Waspaloy

Nickel-base superalloy, Waspaloy, was linear friction welded (LFWed) under different axial shortening conditions of 2.0, 3.4, and 4.6 mm. The tensile properties and microhardness of the weldments were investigated in the as-LFWed condition and compared with those in the post-weld heat treated (PWHTed) condition. Mechanical properties were related to microstructures following examination by optical microscopy, high resolution scanning electron microscopy, and electron backscatter diffraction (EBSD). Analyses of the EBSD results in terms of the misorientation angle distribution, which represents the stored energy, were performed. In the as-LFWed condition, the yield strength (YS) and ultimate tensile strength (UTS) increased with axial shortening due to greater expulsion of the softened interfacial material toward the periphery as flash. In contrast, with increasing axial shortening the total elongation initially remained constant and then decreased. This was also related to the expulsion of the softened interfacial material into the bifurcated flash. Extensive dissolution of the strengthening phase (γ′) in the weld area during linear friction welding (LFW) contributed to the lower YS and UTS in the as-welded condition compared to the PWHTed condition where the γ′ particles were recovered. After performing post-weld heat treatment (PWHT), the total elongation improved due to the relaxation of stored energy and grain growth in the thermomechanically affected zone (TMAZ). - Highlights: • Tensile property and microstructure in Waspaloy linear friction welds were studied. • Yield strength and ultimate tensile strength increased with axial shortening. • Elongation initially remained constant and then decreased with axial shortening. • Post-weld heat treat recovered dissolved γ′ particles and increased weld strength. • Stored energy relaxation during post-weld heat treatment improved weld elongation.

36 MATERIALS SCIENCE↗

Magnetic and Kinetical Properties of Fe-27%Ni-4%Mn and Fe-27%Ni-4%Mn-2%Zn Alloys Investigated by VSM and DSC

We report on the structural, thermal, and magnetic properties of thermally induced martensite in Fe-27%Ni-4%Mn and Fe-27%Ni-4%Mn-2%Zn alloys. Scanning electron microscopy (SEM), differential scanning calorimetry (DSC), and vibrating sample magnetometry (VSM) techniques were employed in the present research. SEM observations revealed the lath martensite morphology formation in both Fe-27%Ni-4%Mn and Fe-27%Ni-4%Mn-2%Zn alloys. As well, the thermally induced martensite start temperature (M{sub s}) was determined to be − 27.18 °C for Fe-27%Ni-4%Mn and − 40.63 °C for Fe-27%Ni-4%Mn-2%Zn alloy from DSC measurements. Further, the Curie temperature was detected at 160 K for Fe-27%Ni-4%Mn and 196 K for Fe-27%Ni-4%Mn-2%Zn alloys after VSM measurements where magnetic saturation values were measured at 20 emu g{sup − 1} for Fe-27%Ni-4%Mn alloy and 18 emu g{sup − 1} for Fe-27%Ni-4%Mn-2%Zn alloy, respectively. The coercivity value of the alloys was also found to be 0.082 kOe for Fe-27%Ni-4%Mn and 0.050 kOe for Fe-27%Ni-4%Mn-2%Zn alloys. Finally, the effect of Zn addition to the austenite–martensite phase tarnsformations of Fe-27%Ni-4%Mn was discussed in detail according to structural, thermal, and magnetic properties of both alloys after a quantitative experimental comparison.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Scanning ultrafast electron microscopy reveals photovoltage dynamics at a deeply buried $p^- \mathrm{Si/SiO_2}$ interface

The understanding and control of charge carrier interactions with defects at buried insulator/semiconductor interfaces is essential for achieving optimum performance in modern electronics. In this work, we report on the use of scanning ultrafast electron microscopy (SUEM) to remotely probe the dynamics of excited carriers at a Si surface buried below a thick thermal oxide. Our measurements illustrate a previously unidentified SUEM contrast mechanism, whereby optical modulation of the space-charge field in the semiconductor modulates the electric field in the thick oxide, thus affecting its secondary electron yield. By analyzing the SUEM contrast as a function of time and laser fluence we demonstrate the diffusion mediated capture of excited carriers by interfacial traps.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Atomic-column scanning transmission electron microscopy analysis of misfit dislocations in GaSb/GaAs quantum dots

The structural quality of GaSb/GaAs quantum dots (QDs) has been analyzed at atomic scale by aberration-corrected high-angle annular dark-field scanning transmission electron microscopy. In particular, we have studied the misfit dislocations that appear because of the high-lattice mismatch in the heterostructure. Our results have shown the formation of Lomer dislocations not only at the interface between the GaSb QDs and the GaAs substrate, but also at the interface with the GaAs capping layer, which is not a frequent observation. The analysis of these dislocations points to the existence of chains of dislocation loops around the QDs. The dislocation core of the observed defects has been characterized, showing that they are reconstructed Lomer dislocations, which have less distortion at the dislocation core in comparison to unreconstructed ones. As a result, strain measurements using geometric phase analysis show that these dislocations may not fully relax the strain due to the lattice mismatch in the GaSb QDs.

36 MATERIALS SCIENCE↗

Multislice Electron Tomography Using Four-Dimensional Scanning Transmission Electron Microscopy

Electron tomography offers useful three-dimensional (3D) structural information, which cannot be observed by two-dimensional imaging. By combining annular dark-field scanning transmission electron microscopy (ADF STEM) with aberration correction, the resolution of electron tomography has reached atomic resolution. However, tomography based on ADF STEM inherently suffers from several issues, including a high electron-dose requirement, poor contrast for light elements, and artifacts from image-contrast nonlinearity. Here, we develop an alternative method called multislice electron tomography (MSET) based on four-dimensional STEM tilt series. In this study, our simulations show that multislice-based 3D reconstruction can effectively reduce undesirable reconstruction artifacts from the nonlinear contrast, allowing precise determination of atomic structures with improved sensitivity for low-Z elements, at considerably low electron-dose conditions. We expect that the MSET method can be applied to a wide variety of materials, including radiation-sensitive samples and materials containing light elements whose 3D atomic structures have never been fully elucidated due to electron-dose limitations or nonlinear imaging contrast.

74 ATOMIC AND MOLECULAR PHYSICS↗

Visualization of defects in single-crystal and thin-film PdCoO 2 using aberration-corrected scanning transmission electron microscopy

Single-crystal delafossite PdCoO 2 is known to have an extremely low intrinsic impurity concentration of ~0.001%, demonstrating extraordinarily high conductivity with a mean free path of ~20 μm at low temperatures. However, when grown as thin films, the resistivity at room temperature increases by a factor of 3–80 times, depending on the film thickness. Using scanning transmission electron microscopy, we identify different classes of defects for the single crystal vs epitaxial thin film. The dominant defect for single-crystal PdCoO 2 is found to be ribbonlike defects. For the thin films, we identify different types of defects arising in epitaxial thin films mainly due to substrate termination that disrupt the lateral connectivity of the conducting planes. Further, our results are consistent with the high conductivity of single crystals and increased electrical resistivity of the thin films compared to that of single crystals, suggesting that selecting a proper substrate, improving surface quality, and reducing the step density are the keys to enhance the film quality for utilizing PdCoO 2 as a platform for future applications.

36 MATERIALS SCIENCE↗

Simplex‐based model for nanoparticle grain identification in four‐dimensional scanning transmission electron microscopy data

Grain identification in polycrystalline nanoparticles, for example, determining which crystal phases are present at each spatial location, is fundamental to materials characterisation. This is particularly challenging when grains overlap extensively, as commonly occurs in four-dimensional scanning transmission electron microscopy (4D-STEM) datasets. We propose a simplex-based model (SBM) in which each simplex vertex represents the diffraction pattern (DP) of a pure grain, and the simplex edges and interior represent overlapping grains. Our SBM grain identification algorithm operates on the Bragg disk (BD) data matrix distilled from the 4D-STEM data to identify the grain membership at each scan position, together with a BD feature matrix whose columns represent the DPs for each constituent grain, which is important for identifying the crystal structure of each grain. We solve the model using a two-stage algorithm. In Stage 1, we adapt a linear mixing algorithm to estimate an initial BD feature matrix whose columns represent DPs of potentially overlapping grains. Our Stage 2 algorithm incorporates sparsity considerations to transform the initial BD feature matrix so that its columns represent DPs of pure grains. Using simulated datasets with various grain configurations, we demonstrate that SBM recovers both the BD feature matrix and membership maps more accurately than existing methods, even when a grain lacks any pure region and completely overlaps with other grains.

4D-STEM segmentation↗

Investigation of the synthesis and characterization of platinum-DMSA nanoparticles using millifluidic chip reactor

Here a continuous flow process for production of water-soluble Platinum-Dimercaptosuccinic acid (Pt(DMSA)) nanoparticles at ambient conditions using millifluidics is demonstrated. The process development was supported by in-situ synchrotron radiation-based X-ray absorption spectroscopy (XAS) investigations. The XAS revealed that the nucleation and growth of the Pt(DMSA) nanoparticles is extremely fast. Such a fast nucleation and growth process was also found to hinder coating of the channel walls, except at the zone 1 where the reactants first interact. The engineering of hitherto unreported Pt(DMSA) nanoparticles, well characterized using High-resolution transmission electron microscopy (HR-TEM), Scanning transmission electron microscopy (STEM), Scanning electron microscopy (SEM), Energy dispersive spectroscopy (EDS), Powder X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and Fourier transform infra-red spectroscopy (FT-IR), using continuous flow processes offers potential opportunities for scale-up.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Scanning electron acoustic microscopy of residual stresses in ceramics - Theory and experiment

The paper presents a three-dimensional mathematical model of signal generation and contrast in brittle materials and uses the model to simulate the effect of residual stress fields on the scanning electron acoustic microscopy (SEAM)-generated electron acoustic signal. According to the model, a positive (tensile) strain produces an increase in the output signal, whereas a negative (compressive) strain produces a decrease in the ouput signal. Dark field contrast conditions occur at a chopping frequency at which V2 - V1 is greater than 0 (where V2 = V is the SEAM output in a region of residual stresses, and V1 is the output in a stress-free region of the sample). Under ideal conditions (maximum contrast) V1 approaches zero. It was found that tensile strains of the order 0.2-0.3 percent, possible in brittle materials, would produce a variation of the acoustic output signal of the order 10 nV (about 1 percent), well within the image contrast and signal processing capability of the SEAM electronics.

Cantrell, John H.↗

Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry

The ability to image light elements in soft matter at atomic resolution enables unprecedented insight into the structure and properties of molecular heterostructures and beam-sensitive nanomaterials. In this study, we introduce a scanning transmission electron microscopy technique combining a pre-specimen phase plate designed to produce a probe with structured phase with a high-speed direct electron detector to generate nearly linear contrast images with high efficiency. We demonstrate this method by using both experiment and simulation to simultaneously image the atomic-scale structure of weakly scattering amorphous carbon and strongly scattering gold nanoparticles. Our method demonstrates strong contrast for both materials, making it a promising candidate for structural determination of heterogeneous soft/hard matter samples even at low electron doses comparable to traditional phase-contrast transmission electron microscopy. Ultimately, simulated images demonstrate the extension of this technique to the challenging problem of structural determination of biological material at the surface of inorganic crystals.

77 NANOSCIENCE AND NANOTECHNOLOGY↗

Chapter 14: Electron Microscopy on Thin Films for Solar Cells

This chapter overviews the various techniques applied in scanning electron microscopy (SEM) and transmission electron microscopy (TEM), and highlights their possibilities and also limitations. It gives the various imaging and analysis techniques applied on a scanning electron microscope. The chapter shows that imaging is divided into that making use of secondary electrons (SEs) and of backscattered electrons (BSEs), resulting in different contrasts in the images and thus providing information on compositions, microstructures, and surface potentials. Whenever aiming for imaging and analyses at scales of down to the angstroms range, TEM and its related techniques are appropriate tools. In many cases, also SEM techniques provide the access to various material properties of the individual layers, not requiring specimen preparation as time consuming as TEM techniques. Finally, the chapter dedicates to cross-sectional specimen preparation for electron microscopy. The preparation decides indeed on the quality of imaging and analyses.

14 SOLAR ENERGY↗

Effect of Cooling Rate on Microsegregation During Solidification of Superalloy INCONEL 718 Under Slow-Cooled Conditions

The solidification sequence, microstructural evolution, solid-liquid interface variation, interdendritic segregation, and elemental distribution of as-cast IN718 alloy at three slow-cooling rates (5, 10, and 20 °C/min) were investigated by differential scanning calorimetry (DSC), confocal laser scanning microscopy (CLSM), optical microscopy (OM), field-emission scanning electron microscopy (FESEM), and electron-probe microanalysis (EPMA) techniques. The results indicate that as the cooling rate decreases, the constitutional supercooling at the solidification front affects the solid-liquid interface more significantly, and the size and quantity of the Laves phase increase. However, the composition of the Laves phase is insensitive to the cooling rate in the range of conditions studied here. In dendrite core, the contents of Ni, Cr, Fe, and Al follow a slight downward trend with an increasing cooling rate, whereas the Nb, Mo, and Ti contents show an upward trend. Additionally, Mo shows a stronger propensity to segregate under slow-cooling conditions because its effective partition coefficient almost linearly decreased with decreasing cooling rate, which is same as Nb. Using the parameters experimentally determined in this study and the Clyne–Kurz equation, we achieved reasonable agreement between the calculated and measured liquid composition change during the solidification process at different cooling rates. All experimental and theoretical programs in this research were undertaken with the aim of gaining further understanding of the microsegregation behaviors in large-scale IN718 ingots, whose cooling rates are within a lower range.

36 MATERIALS SCIENCE↗

A three-dimensional reconstruction algorithm for scanning transmission electron microscopy data from thick samples

Increasing interest in three-dimensional nanostructures adds impetus to electron microscopy techniques capable of imaging at or below the nanoscale in three dimensions. We present a reconstruction algorithm that takes as input a focal series of four-dimensional scanning transmission electron microscopy (4D-STEM) data and transcends the prevalent structure retrieval algorithm assumption of a very thin specimen homogenous along the optic axis. We demonstrate this approach by reconstructing the different layers of a lead iridate (Pb$_2$Ir$_2$O$_7$) and yttrium-stabilized zirconia (Y$_{0.095}$Zr$_{0.905}$O$_2$) heterostructure from data acquired with the specimen in a single plan-view orientation, with the epitaxial layers stacked along the beam direction.

Brown, Hamish G↗

Relation between sampling, sensitivity and precision in strain mapping using the Geometric Phase Analysis method in Scanning Transmission Electron Microscopy

The sensitivity and the precision of the Geometric Phase Analysis (GPA) method for strain characterization is a topic widely discussed in the literature and is usually difficult to quantify. Indeed, the GPA precision is intricately linked to the resolution of the strain maps defined when masking the periodic reflections in Fourier space. In this study an additional parameter, sampling, is proposed to be analyzed regarding the precision of GPA by developing the concept of a phase noise in the GPA equations. Both experimentally and theoretically, the following article demonstrates how the precision, and the sensitivity of the GPA method is improved when using a larger pixel spacing to record an electron micrograph in Scanning Transmission Electron Microscopy (STEM). In conclusion, the counterintuitive concept of increasing the field of view to improve the GPA precision results in an extension of the application of strain characterization methods in STEM towards low deformation levels.

47 OTHER INSTRUMENTATION↗

Probing individual single atom electrocatalyst sites by advanced analytical scanning transmission electron microscopy

Single atom electrocatalysts (SAEs) are promising next-generation materials for promoting a variety of important reactions, such as the oxygen reduction, nitrogen reduction, and CO 2 reduction reactions. While bulk characterization techniques such as X-ray absorption spectroscopy and Mössbauer spectroscopy have significantly enhanced our understanding of these catalysts, direct probing of individual single metal atom sites at the atomic scale is necessary to understand local variations in the properties of these sites and accelerate design and synthesis of improved SAEs. Aberration-corrected scanning transmission electron microscopy (STEM) has become a powerful tool for providing this type of atomic-scale information about SAE metal sites. These sites are typically unstable under the electron beam, however, which, in combination with conventional acquisition methods and detectors, has limited the type and quantity of information obtainable by spectroscopic STEM techniques. Here, we map multiple individual SAE metal sites in a nitrogen-doped carbon containing atomically dispersed Fe and Re (FeReNC) at the atomic scale by direct electron detection electron energy-loss spectroscopy (EELS). Direct electron detection provides an improved signal-to-noise ratio over conventional scintillator-based detectors and enables detection and real space localization of weak signals. In addition, we demonstrate an automated method for identification of metal atom positions, placement of the probe on these sites, and simultaneous EELS and energy dispersive X-ray spectroscopic (EDS) signal acquisition. This simultaneous acquisition of EELS and EDS provides access to the composition and bonding of a wide range of SAE metal sites. In this study, focusing the probe directly on the metal sites also increases the relevant data acquisition rate by more than an order of magnitude over two-dimensional mapping, enabling improved statistical measurements of site properties. The versatility, sensitivity, and speed that these techniques provide enhances our ability to probe the local elemental and chemical environment of a large number of individual SAE metal site structures at the atomic scale, enabling an improved understanding of the variations in the local properties of these electrocatalysts to be gained. As a result, significantly increased information about individual metal sites will be available to future electrochemical studies through these techniques, accelerating the development of advanced SAEs.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Structure of bismuth films obtained using an array of identically oriented single-crystal bismuth islands preliminarily grown on a substrate

An array of identically oriented single-crystal bismuth islands formed on mica plates is used as a substrate to improve the structure of bismuth thin films grown by vacuum thermal evaporation. The array of islands is formed by the chemical etching of a single-crystal bismuth film 1 μm thick grown by floating-zone recrystallization under a coating. The structure of the obtained films is studied by X-ray diffraction, atomicforce microscopy, and electron backscatter diffraction scanning electron microscopy.

36 MATERIALS SCIENCE↗

Influence of Cetyltrimethylammonium Bromide on Gold Nanocrystal Formation Studied by In Situ Liquid Cell Scanning Transmission Electron Microscopy

The synthesis of monodisperse size- and shape-controlled Au nanocrystals is often achieved with cetyltrimethylammonium bromide (CTAB) surfactant; however, its role in the growth of such tailored nanostructures is not well understood. To elucidate the formation mechanism(s) and evolution of the morphology of Au nanocrystals in the early growth stage, we present an in situ liquid-cell scanning transmission electron microscopy (STEM) investigation using electron beam-induced radiolytic species as the reductant. The resulting particle shape at a low beam dose rate is shown to be strongly influenced by the surfactant; the Au nanocrystal growth rate is suppressed by increasing the CTAB concentration. At a low CTAB concentration, the nanoparticles (NPs) follow a reaction-limited growth mechanism, while at high a CTAB concentration the NPs follow a diffusion-limited mechanism, as described by the Lifshitz–Slyozov–Wagner (LSW) model. Moreover, we investigate the temporal evolution of specific NP geometries. In conclusion, the amount of Au reduced by the electron beam outside the irradiated area is quantified to better interpret the nanocrystal growth kinetics, as well as to further develop an understanding of electron beam interactions with nanomaterials toward improving the interpretation of in situ measurements.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗