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NASA NTRS1978

The OSO-8 mosaic graphite stellar X-ray polarimeter

The OSO 8 satellite, launched on June 21, 1975, contains two X-ray polarimeters. These polarimeters use mosaic crystals of graphite to yield polarization-sensitive Bragg reflection of stellar X-rays. The crystals reflect a narrow energy bandwidth centered at 2.6 and 5.2 keV. The polarimeter background signal is minimized by mounting the crystals on parabolic surfaces which focus the diffracted X-rays onto small-area beryllium-window proportional counters. This technique permits the observation of low-intensity X-ray sources and reduces the possibility of systematic background effects which could lead to a false signature of polarization. A description of the instrument is given, and preliminary results for the Crab Nebula and Cyg X-1 are presented.

Novick, R.↗

NASA NTRS1979

A structural analysis of small vapor-deposited 'multiply twinned' gold particles

High resolution selected zone dark field, Bragg reflection imaging and weak beam dark field techniques of transmission electron microscopy were used to determine the structure of small gold particles vapor deposited on NaCl substrates. Attention was focused on the analysis of those particles in the 50-150 A range that have pentagonal or hexagonal bright field profiles. These particles have been previously described as multiply twinned crystallites composed of face-centered cubic tetrahedra. The experimental evidence of the present studies can be interpreted on the assumption that the particle structure is a regular icosahedron or decahedron for the hexagonal or the pentagonal particles respectively. The icosahedron is a multiply twinned rhombohedral crystal and the decahedron is a multiply twinned body-centered orthorhombic crystal, each of which constitutes a slight distortion from the face-centered cubic structure.

Yang, C. Y.↗

NASA NTRS1981

A diffuse soft X-ray spectrometer

A design for a diffuse X-ray spectrometer utilizing Bragg reflection is described. The geometry has a very high throughput for a given physical size and allows simultaneous observation at all wavelengths within its range. Spectral resolving power is about 35 to 50. A similar unit equipped with thallium acid pthallate crystals will cover the 11 - 24 A-range with about half this throughput and twice the resolving power.

Mccammon, D.↗

NASA NTRS1988

X-ray rocking curve measurements of bent crystals

A three-crystal laboratory X-ray spectrometer is used to measure the Bragg reflection from concave cylindrically curved crystals to be used in the high-resolution X-ray spectrometer of the NASA Advanced X-ray Astrophysics Facility (AXAF). The first two crystals, in the dispersive (1.1) arrangement, select a narrow collimated monochromatic beam in the Cu K-alpha(1) line at 1.5 A (8.1 keV), which illuminates the test crystal. The angular centroids of rocking curves measured along the surface provide a measure of the conformity of the crystal to the desired radius of curvature. Individual and combined rocking-curve widths and areas provide a measure of the resolution and efficiency at 1.54 A. The crystals analyzed included LiF(200), PET, and acid phthalates such as TAP.

Hakim, M. B.↗

NASA NTRS1990

The Stellar X-ray Polarimeter - A focal plane polarimeter for the Spectrum X-Gamma mission

This paper describes an X-ray polarimeter that will be flown on the Spectrum X-Gamma mission. The instrument exploits three distinct physical processes to measure polarization: Bragg reflection from a graphite crystal, Thomson scattering from a metallic lithium target, and photoemission from a cesium iodide photocathode. These three methods allow polarization measurements over an energy band from 0.3 to 12 keV. The polarimeter will make possible sensitive measurements of several hundred known X-ray sources. X-ray polarization measurements will make it possible to constrain the geometry of gas flow in X-ray binaries, identify nonthermal emission in supernova remnants, test current models for X-ray emission in radio pulsars, determine the radiation mechanisms in active galactic nuclei, and search for inertial frame dragging (Lense-Thirring effect) around the putative black hole in Cygnus X-1.

Kaaret, P.↗

NASA NTRS1989

Study of the polarization dependence of the photoelectric effect in the soft X-ray band - A focal plane photoelectric stellar X-ray polarimeter for the Spectrum-X-Gamma mission

An experimental study of the polarization dependence of the photoelectric effect in cesium iodide in the soft X-ray band was started (Heckler et al., 1989). At a grazing angle of 10 degrees and a photon energy of 2.6 keV, it is found that the photoelectric yield from a thin layer of evaporated cesium iodide varies by 12.4 percent as the polarization vector of the incident X-ray beam is rotated about the line-of-sight. The rotation angle corresponding to the maximum photoyield is displaced by 16 degrees from the normal to the photocathode. This modulation and phase shift are in good agreement with the results recently reported by Fraser, et al. (1989) It is shown that a focal plane stellar X-ray polarimeter based on this photoelectric effect will be substantially more efficient than convential X-ray polarimeters such as those based on either Bragg reflection or scattering from low atomic number targets.

Heckler, A.↗

NASA NTRS1991

Four-Mirror X-Ray And Extreme-Ultraviolet Monochromator

More mirrors provide additional wavelength selectivity. Four-mirror x-ray and extreme-ultraviolet monochromator provides narrower wavelength passband than devices described in "Compact X-Ray and Extreme Ultraviolet Monochromator" (MFS-28499) and "Scanning X-Ray or Extreme Ultraviolet Monochromator" (MFS-28492). Relies on Bragg reflection from two identical parallel multilayer mirrors to extract narrow-spectrum x-ray or extreme-ultraviolet beam from broad-spectrum input beam.

Hoover, Richard B.↗

NASA NTRS1991

Compact X-Ray And Extreme-Ultraviolet Monochromator

Monochromator for x-ray and extreme-ultraviolet radiation provides higher spectral resolution than achieved with thin-metal-foil broad-band-pass filters. Uses Bragg reflection to band-pass-filter radiation from high-intensity, broad-spectrum source. Operates over much broader x-ray and extreme-ultraviolet spectrum than devices based upon natural crystals. Intended to filter continuum radiation from sources like synchrotrons, laser plasma sources, free-electron lasers, and wigglers to produce monochromatic beams for testing and analysis of x-ray and extreme-ultraviolet telescopes and microscopes, for calibration of photographic films and detectors, for biological and biomedical research, for x-ray lithography, for processing of materials, and for research in properties of materials.

Hoover, Richard B.↗

NASA NTRS1991

Imaging Microscope For "Water-Window" X Rays

Proposed microscope operates in "water-window" part of x-ray spectrum. Contains spherical-mirror substrates coated with multiple thin layers of material exhibiting Bragg reflection at wavelength at which water transparent. Suited for making high-resolution, high-contrast images for microbiological research.

Hoover, Richard B.↗

NASA NTRS1991

Ultra-High-Spectral-Resolution X-Ray/EUV Monochromator

Ultra-high-spectral-resolution X-Ray/EUV monochromator depends on Bragg reflection from multilayer coats and diffraction by mutlilayer-coated grating to select narrow wavelength band from input beam. Its monochromatic output beam of accurately known wavelength very useful in testing and calibration of x-ray telescopes, x-ray microscopes, photographic films, and photodetectors; in research in biological and biomedical disciplines, x-ray crystallography, properties and processing of materials, and x-ray lasers; and in x-ray lithography.

Hoover, Richard B.↗

NASA NTRS1991

Microscope Would Image X and Gamma Rays

Microscope contains Bragg-reflecting, grazing-incidence reflectors, filter wheel, and detector. Multiple nested coaxial pairs of reflectors used to form images simultaneously at multiple wavelengths. Collects and focuses radiation to produce images with moderate spectral resolution and high spatial resolution. Enables use of smaller, cheaper, better-shielded detectors. Combination of features provides new information of unprecedented value in several fields of research; probing fine structures of pulsed plasmas, investigating minute variations in structures of material specimens penetrated only by hard-x or gamma rays, or in producing maps of distributions of radioisotopes in biological specimens.

Hoover, Richard B.↗

NASA NTRS1990

On the performance of the scattering and crystal polarimeters for the Spectrum-X-Gamma mission

X-ray scattering from a lithium disk and Bragg reflection from a mosaic graphite crystal can be exploited to measure the linear polarization of radiation emitted from cosmic X-ray sources. The sensitivity is enhanced if the polarimeters are placed at the focus of an X-ray telescope. Such devices form two of the components of the Stellar X-ray Polarimeter experiment scheduled to fly on the Spectrum-X-Gamma mission. The expected on-axis performance of the two components is described based on detailed Monte Carlo simulations. The polarimetry experiment is expected to provide sensitive measurements of linear polarization for many cosmic X-ray sources. The nature and utility of such observations is described for pulsing X-ray sources such as the Crab pulsar and Her X-1.

Elsner, R. F.↗

NASA NTRS1991

Predicted performance of the lithium scattering and graphite crystal polarimeter for the Spectrum-X-Gamma mission

X-ray scattering from a lithium disk and Bragg reflection from a mosaic graphite crystal can be exploited to measure the linear polarization of radiation emitted from cosmic X-ray sources. The sensitivity is greatly enhanced if these polarimeters are placed at the focus of an X-ray telescope. Such devices form two of the three components of the Stellar X-Ray Polarimeter experiment scheduled to fly on the Spectrum-X-Gamma mission. The experiment will reside at the focus of one of the SODART X-ray telescopes. The expected on-axis performance of these two components of the Stellar X-Ray Polarimeter experiment based on detailed Monte-Carlo simulation is described. Various systematic effects, both external and internal to the experiment, that must be considered in order to properly design and utilize the experiment are also discussed.

Weisskopf, M. C.↗

NASA NTRS1992

SXRP - An X-ray polarimeter for the SPECTRUM-X-Gamma mission

The Stellar X-ray Polarimeter (SXRP) is a focal plane instrument which will be flown on the SPECTRUM-X-Gamma mission in 1993. The polarimeter is composed of two separate instruments: the first exploits the dependence on the polarization of the Bragg reflection from a graphite crystal, and of the Thomson scattering from a metallic lithium target. The second instrument makes use of the recently discovered polarization dependence of X-ray photoemission from CsI. The SXRP will permit sensitive measurements of several classes of galactic X-ray sources, such as X-ray pulsars, black-hole candidates and supernova remnants. Moreover, and for the first time, SXRP will be able to perform highly sensitive measurements of the brightest extragalactic sources.

Costa, E.↗

NASA NTRS1992

Electromagnetic scattering from microwave absorbers - Laboratory verification of the coupled wave theory

W-band measurements of the bistatic scattering function of some common microwave absorbing structures, including periodic wedge-type and pyramid-type iron-epoxy calibration loads and flat carbon-foam 'Echosorb' samples, were made using a network analyzer interface to a focused-lens scattering range. Swept frequency measurements over the 75-100 GHz band revealed specular and Bragg reflection characteristics in the measured data.

Gasiewski, A. J.↗

NASA NTRS1995

Correlations between critical current density, j(sub c), critical temperature, T(sub c),and structural quality of Y1B2Cu3O(7-x) thin superconducting films

Correlations between critical current density (j(sub c)) critical temperature (T(sub c)) and the density of edge dislocations and nonuniform strain have been observed in YBCO thin films deposited by pulsed laser ablation on (001) LaAlO3 single crystals. Distinct maxima in j(sub c) as a function of the linewidths of the (00 l) Bragg reflections and as a function of the mosaic spread have been found in the epitaxial films. These maxima in j(sub c) indicate that the magnetic flux lines, in films of structural quality approachingthat of single crystals, are insufficiently pinned which results in a decreased critical current density. T(sub c) increased monotonically with improving crystalline quality and approached a value characteristic of a pure single crystal. A strong correlation between j(sub c) and the density of edge dislocations ND was found. At the maximum of the critical current density the density of edge dislocations was estimated to be N(sub D) approximately 1-2 x 10(exp 9)/sq cm.

Chrzanowski, J.↗

NASA NTRS1999

High Resolution Triple Axis X-Ray Diffraction Analysis of II-VI Semiconductor Crystals

The objective of this research program is to develop methods of structural analysis based on high resolution triple axis X-ray diffractometry (HRTXD) and to carry out detailed studies of defect distributions in crystals grown in both microgravity and ground-based environments. HRTXD represents a modification of the widely used double axis X-ray rocking curve method for the characterization of grown-in defects in nearly perfect crystals. In a double axis rocking curve experiment, the sample is illuminated by a monochromatic X-ray beam and the diffracted intensity is recorded by a fixed, wide-open detector. The intensity diffracted by the sample is then monitored as the sample is rotated through the Bragg reflection condition. The breadth of the peak, which is often reported as the full angular width at half the maximum intensity (FWHM), is used as an indicator of the amount of defects in the sample. This work has shown that high resolution triple axis X-ray diffraction is an effective tool for characterizing the defect structure in semiconductor crystals, particularly at high defect densities. Additionally, the technique is complimentary to X-ray topography for defect characterization in crystals.

Volz, H. M.↗

NASA NTRS1999

Transport Through Higher Subbands of a Carbon Nanotube

The sub-band spacing can be comparable to the bias and kT in large diameter carbon nanotubes. As a result, the role of higher sub-bands cannot be neglected in transport. We discuss two interesting effects involving single particle transport such nanotubes: (i) The transmission probability of electrons at the crossing bands (around E=0) and higher sub-bands are quantitatively different. As a result, we show that the small bias resistance may be larger when the Fermi energy is away from the band center as opposed to being close to the band center. (ii) The primary contribution to current flowing in the presence of an applied bias is due to the crossing sub-bands. This is a result of the electron in the higher sub-bands undergoing Bragg reflection. As a consequence, in an idealized case where scattering is neglected, the differential conductance cannot be much larger than 4e(2)/h.

Anantram, M.P.↗