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NASA NTRS1994

Wavelength-division multiplexed optical integrated circuit with vertical diffraction grating

A semiconductor optical integrated circuit for wave division multiplexing has a semiconductor waveguide layer, a succession of diffraction grating points in the waveguide layer along a predetermined diffraction grating contour, a semiconductor diode array in the waveguide layer having plural optical ports facing the succession of diffraction grating points along a first direction, respective semiconductor diodes in the array corresponding to respective ones of a predetermined succession of wavelengths, an optical fiber having one end thereof terminated at the waveguide layer, the one end of the optical fiber facing the succession of diffraction grating points along a second direction, wherein the diffraction grating points are spatially distributed along the predetermined contour in such a manner that the succession of diffraction grating points diffracts light of respective ones of the succession of wavelengths between the one end of the optical fiber and corresponding ones of the optical ports.

Lang, Robert J.↗

NASA NTRS1994

MANN: A program to transfer designs for diffractive optical elements to a MANN photolithographic mask generator

There are two basic areas of interest for diffractive optics. In the first, the property of wavefront division is exploited for achieving optical fanout, analogous to the more familiar electrical fanout of electronic circuitry. The basic problem here is that when using a simple uniform diffraction grating the energy input is divided unevenly among the output beams. The other area of interest is the use of diffractive elements to replace or supplement standard refractive elements such as lenses. Again, local grating variations can be used to control the amount of bending imparted to optical rays, and the efficiency of the diffractive element will depend on how closely the element can be matched to the design requirements. In general, production restrictions limit how closely the element approaches the design, and for the common case of photolithographic production, a series of binary masks is required to achieve high efficiency. The actual design process is much more involved than in the case of elements for optical fanout, as the desired phase of the optical wavefront over some reference plane must be specified and the phase alteration to be introduced at each point by the diffraction element must be known. This generally requires the utilization of a standard optical design program. Two approaches are possible. In the first approach, the diffractive element is treated as a special type of lens and the ordinary optical design equations are used. Optical design programs tend to follow a second approach, namely, using the equations of optical interference derived from holographic theory and then allowing the introduction of phase front corrections in the form of polynomial equations. By using either of these two methods, diffractive elements can be used not only to compensate for distortions such as chromatic or spherical aberration, but also to perform the work of a variety of other optical elements such as null correctors, beam shapers, etc. The main focus of the project described in this report is how the design information from the lens design program is incorporated into the photolithographic process. It is shown that the MANN program, a photolithographic mask generator, fills the need for a link between lens design programs and mask generation controllers.The generated masks can be used to expose a resist-coated substrate which is etched and then must be re-coated, re-exposed, and re-etched for making copies, just as in the electronics industry.

Matthys, Donald R.↗

NASA NTRS2008

Transmissive Diffractive Optical Element Solar Concentrators

Solar-thermal-radiation concentrators in the form of transmissive diffractive optical elements (DOEs) have been proposed as alternatives to mirror-type solar concentrators now in use. In comparison with functionally equivalent mirror-type solar concentrators, the transmissive, diffractive solar concentrators would weigh and cost less, and would be subject to relaxed mechanical tolerances. A DOE concentrator would be made from a thin, flat disk or membrane of a transmissive material having a suitable index of refraction. By virtue of its thinness, the DOE concentrator would have an areal mass density significantly less than that of a functionally equivalent conventional mirror. The DOE concentrator would have a relatively wide aperture--characterized by a focal-length/aperture-diameter ratio ('f number') on the order of 1. A kinoform (a surface-relief phase hologram) of high diffractive order would be microfabricated onto one face of the disk. The kinoform (see figure) would be designed to both diffract and refract incident solar radiation onto a desired focal region, without concern for forming an image of the Sun. The high diffractive order of this kinoform (in contradistinction to the low diffractive orders of some other kinoforms) would be necessary to obtain the desired f number of 1, which, in turn, would be necessary for obtaining a desired concentration ratio of 2,500 or greater. The design process of optimizing the concentration ratio of a proposed DOE solar concentrator includes computing convolutions of the optical bandwidth of the Sun with the optical transmission of the diffractive medium. Because, as in the cases of other non-imaging, light-concentrating optics, image quality is not a design requirement, the process also includes trading image quality against concentration ratio. A baseline design for one example calls for an aperture diameter of 1 m. This baseline design would be scalable to a diameter as large as 10 m, or to a smaller diameter for a laboratory test article. Initial calculations have indicated that the characteristics of the test article would be readily scalable to a full-size unit.

Baron, Richard↗

NASA NTRS2009

Suppressing Ghost Diffraction in E-Beam-Written Gratings

A modified scheme for electron-beam (E-beam) writing used in the fabrication of convex or concave diffraction gratings makes it possible to suppress the ghost diffraction heretofore exhibited by such gratings. Ghost diffraction is a spurious component of diffraction caused by a spurious component of grating periodicity as described below. The ghost diffraction orders appear between the main diffraction orders and are typically more intense than is the diffuse scattering from the grating. At such high intensity, ghost diffraction is the dominant source of degradation of grating performance. The pattern of a convex or concave grating is established by electron-beam writing in a resist material coating a substrate that has the desired convex or concave shape. Unfortunately, as a result of the characteristics of electrostatic deflectors used to control the electron beam, it is possible to expose only a small field - typically between 0.5 and 1.0 mm wide - at a given fixed position of the electron gun relative to the substrate. To make a grating larger than the field size, it is necessary to move the substrate to make it possible to write fields centered at different positions, so that the larger area is synthesized by "stitching" the exposed fields.

Wilson, Daniel↗

NASA NTRS2018

Amorphous Phase Characterization Through X-Ray Diffraction Profile Modeling: Implications for Amorphous Phases in Gale Crater Rocks and Soils

The CheMin X-ray diffraction instrument on the Mars Science Laboratory rover has analyzed 18 rock and soil samples in Gale crater. Diffraction data allow for the identification of major crystalline phases based on the positions and intensities of well-defined peaks and also provides information regarding amorphous and poorly-ordered materials based on the shape and positions of broad scattering humps. The combination of diffraction data, elemental chemistry from APXS (Alpha Particle X-ray Spectrometer) and evolved gas analyses (EGA) from SAM (Sample Analysis at Mars) help constrain possible amorphous materials present in each sample (e.g., glass, opal, iron oxides, sulfates) but are model dependent. We present a novel method to characterize amorphous material in diffraction data and, through this approach, aim to characterize the phases collectively producing the amorphous profiles in CheMin diffraction data. This method may be applied to any diffraction data from samples containing X-ray amorphous materials, not just CheMin datasets, but we re-strict our discussion to Martian-relevant amorphous phases and diffraction data measured by CheMin or CheMin-like instruments.

Achilles, C. N.↗

DOE OSTI2025

X-ray diffraction strains in laser-ablated aluminum, nickel, sodium, and invar: Pressures to 475 GPa

Dynamically compressed materials in longitudinal waves are described by two physical models: hydrostatic pressure, with equal, normal, principal stresses or material uniaxially strained in the wave propagation direction. These models are disparate, so experimental comparisons and evaluations are important. Polycrystalline material in a state of hydrostatic pressure will have no eccentricity of x-ray-diffracted Debye–Scherrer rings. A general three-dimensional solution of Bragg diffracted x rays based on principal crystallographic strains in the compression wave was found. The distortion of x-ray diffraction beams has been used for strain measurements; the analysis developed incorporates a strained reciprocal lattice and the incident x-ray beam. Strain-distorted Polanyi surfaces form an annulus of compression with an ellipsoid of revolution in reciprocal space, which is intersected by Ewald's sphere for Bragg diffraction. The in situ measurements for strain describe nanosecond diffraction evaluated using two planes, (hkl) and (h′k′l′), both in the same crystallographic phase. Diffraction from Al, Ni, Na, and Invar quantifies the compression axial strains in these materials: The compression axial ratios are 0.65, 1.05, 0.88, and 1.58 at pressures of 291, 402, 409, and 367 GPa for the respective materials. Crystal structure transformations with homogeneous pressurized stresses, mandating equal normal strains, should not be anticipated to agree with heterogeneous, uniaxially strained, and sheared crystalline phases. Measurements support in-plane strains increasing with pressure, p , in fcc and hcp aluminum as ε 22 = −0.21 p /TPa.

Alloys↗

DOE OSTI2026

One-dimensional neutron diffraction from layered graphite: Reciprocal space structure and grating behavior

In this work we report observations of one-dimensional neutron diffraction from highly oriented pyrolytic graphite (HOPG), where the scattering angle varies continuously with incident angle following classical grating-like behavior. The 2D polycrystalline structure of HOPG—with highly aligned layers along the 𝑐 axis but random in-plane rotations—creates planes of scattering intensity in reciprocal space at 𝑄 𝑐 =𝑛⁢(2⁢𝜋/𝑑) where 𝑑=3.35Å is the interlayer spacing. As the Ewald sphere sweeps through reciprocal space during sample rotation, it continuously intersects these planes, producing the observed angular dispersion. We observe both first-order (𝑛=1) and second-order (𝑛=2) diffraction at conventional scattering angles (25°–70°), with peak positions that remain temperature-independent between 10 K and 294 K and follow quantitative agreement with momentum conservation 𝑄 𝑐 =𝑘⁢[sin⁡𝜓−sin⁡𝜓 𝑓 ]=𝑛⁢(2⁢𝜋/𝑑). X-ray diffraction under similar conditions shows no comparable behavior, confirming that sharp nuclear-vacuum contrast is essential. While diffraction intensities are weak (∼10 −6 of Bragg peaks), the observations demonstrate how the interplay of atomic-scale periodicity, nuclear contrast, and structural disorder enables observation of continuous diffraction curves at thermal neutron wavelengths, illustrating how HOPG's unique microstructure determines its scattering properties beyond conventional Bragg diffraction.

2-dimensional systems↗

DOE OSTI2024

TMD factorisation for diffractive jets in photon-nucleus interactions

Abstract Using the colour dipole picture and the colour glass condensate effective theory, we study the diffractive production of two or three jets via coherent photon-nucleus interactions at high energy. We consider the hard regime where the photon virtuality and/or the transverse momenta of the produced jets are much larger than the saturation momentumQ s of the nuclear target. We show that, despite this hardness, the leading-twist contributions are controlled by relatively large parton configurations, with transverse sizesR~ 1/Q s , which undergo strong scattering and probe gluon saturation. We demonstrate that these leading-twist contributions admit transverse-momentum dependent (TMD) factorisation, in terms of quark and gluon diffractive TMD distribution functions, for which we obtain explicit expressions from first principles. We go beyond our previous work by evaluating the contributions involving the quark diffractive distributions and by establishing that their DGLAP evolution emerges via controlled calculations within the colour dipole picture. We find the same expression for the quark diffractive TMD in two different processes (semi-inclusive diffraction and the diffractive production of quark-gluon dijets), thus demonstrating its universality.

Physics↗

DOE OSTI2026

Unsupervised anomaly detection in MeV ultrafast electron diffraction

MeV ultrafast electron diffraction (MUED) is a pump-probe technique used to study the dynamic structural evolution of materials. An ultrashort laser pulse triggers structural changes, which are then probed by an ultrashort relativistic electron beam. To overcome low signal-to-noise ratios, diffraction patterns are averaged over thousands of shots. However, shot-to-shot instabilities in the electron beam can distort individual patterns, introducing uncertainty. Improving MUED accuracy requires detecting and removing these anomalous patterns from large datasets. In this work, we developed a fully unsupervised methodology for the detection of anomalous diffraction patterns. Using a convolutional autoencoder, we calculate the reconstruction mean squared error of the diffraction patterns. Based on the statistical analysis of this error, we provide the user an estimation of the probability that the pattern is normal, which also allows a posterior visual inspection of the images that are difficult to classify. This method has been trained with only 100 diffraction patterns and tested on 1521 patterns, resulting in a false positive rate between 0.2% and 0.4%, with a training time of 10 s per image and a test time of about 1 s per image. Here, the proposed methodology can also be applied to other diffraction techniques in which large datasets are collected that include faulty images due to instrumental instabilities.

43 PARTICLE ACCELERATORS↗

DOE OSTI2024

Nonlinear encoding in diffractive information processing using linear optical materials

Nonlinear encoding of optical information can be achieved using various forms of data representation. Here, we analyze the performances of different nonlinear information encoding strategies that can be employed in diffractive optical processors based on linear materials and shed light on their utility and performance gaps compared to the state-of-the-art digital deep neural networks. For a comprehensive evaluation, we used different datasets to compare the statistical inference performance of simpler-to-implement nonlinear encoding strategies that involve, e.g., phase encoding, against data repetition-based nonlinear encoding strategies. We show that data repetition within a diffractive volume (e.g., through an optical cavity or cascaded introduction of the input data) causes the loss of the universal linear transformation capability of a diffractive optical processor. Therefore, data repetition-based diffractive blocks cannot provide optical analogs to fully connected or convolutional layers commonly employed in digital neural networks. However, they can still be effectively trained for specific inference tasks and achieve enhanced accuracy, benefiting from the nonlinear encoding of the input information. Our results also reveal that phase encoding of input information without data repetition provides a simpler nonlinear encoding strategy with comparable statistical inference accuracy to data repetition-based diffractive processors. Our analyses and conclusions would be of broad interest to explore the push-pull relationship between linear material-based diffractive optical systems and nonlinear encoding strategies in visual information processors.

42 ENGINEERING↗

NASA NTRS1974

TM surface wave diffraction by a truncated dielectric slab recessed in a perfectly conducting surface

The diffraction of a TM sub o surface wave by a terminated dielectric slab which is flush mounted in a perfectly conducting surface is studied. The incident surface wave gives rise to waves reflected and diffracted by the termination; these reflected and diffracted fields may be expressed in terms of the geometrical theory of diffraction by introducing surface wave reflection and diffraction coefficients which are associated with the termination. In this investigation, the surface wave reflection and diffraction coefficients have been deduced from a formally exact solution to this canonical problem. The solution is obtained by a combination of the generalized scattering matrix technique and function theoretic methods.

Pathak, P. H.↗

NASA NTRS1978

On the use of classical and conical diffraction mountings for XUV gratings

A description is given of the properties of plane diffraction gratings used in conical diffraction. Formulas are given for computing the direction of the diffracted orders. Experiments were performed to investigate the behavior of gratings used on conical diffraction mountings. Comparisons made with classical diffraction mountings show a significant increase in the efficiency of the -1 order. An empirical formula to predict the efficiencies of gratings used in conical diffraction mountings has been verified by the measurements.

Neviere, M.↗

NASA NTRS1979

Applications of diffraction theory to aeroacoustics

A review is given of the fundamentals of diffraction theory and the application of the theory to several problems of aircraft noise generation, propagation, and measurement. The general acoustic diffraction problem is defined and the governing equations set down. Diffraction phenomena are illustrated using the classical problem of the diffraction of a plane wave by a half-plane. Infinite series and geometric acoustic methods for solving diffraction problems are described. Four applications of diffraction theory are discussed: the selection of an appropriate shape for a microphone, the use of aircraft wings to shield the community from engine noise, the reflection of engine noise from an aircraft fuselage and the radiation of trailing edge noise.

Lansing, D. L.↗

NASA NTRS1979

Applications of diffraction theory to aeroacoustics

The fundamentals of diffraction theory were reviewed and applied to several problems of aircraft noise generation, propagation, and measurement. The general acoustic diffraction problem is defined and the governing equations were set down. Diffraction phenomena are illustrated using the classical problem of the diffraction of a plane wave by a half-plane. Infinite series and geometric acoustic methods for solving diffraction problems are described. Four applications of diffraction theory are discussed: the selection of an appropriate shape for a microphone, the use of aircraft wings to shield the community from engine noise, the reflection of engine noise from an aircraft fuselage, and the radiation of trailing edge noise.

Lansing, D. L.↗

NASA NTRS1987

Dihedral corner reflector backscatter using higher order reflections and diffractions

The uniform theory of diffraction (UTD) plus an imposed edge diffraction extension is used to predict the backscatter cross sections of dihedral corner reflectors which have right, obtuse, and acute included angles. The UTD allows individual backscattering mechanisms of the dihedral corner reflectors to be identified and provides good agreement with experimental cross-section measurements in the azimuthal plane. Multiply reflected and diffracted fields of up to third-order are included in the analysis for both horizontal and vertical polarizations. The coefficients of the uniform theory of diffraction revert to those of the geometrical theory of diffraction (GTD) in far-field cross-section analyses, but finite cross sections can be obtained everywhere by considering mutual cancellation of diffractions from parallel edges. Analytic calculations are performed using UTD coefficients; hence the accuracy required in angular measurements is more critical as the distance increases. The common far-field approximation that all rays to the observation point are parallel is too gross an approxiation for the angular parameters in the UTD coefficients in the far field.

Griesser, Timothy↗

NASA NTRS1993

An extended UTD analysis for the scattering and diffraction from cubic polynomial strips

Spline and polynomial type surfaces are commonly used in high frequency modeling of complex structures such as aircraft, ships, reflectors, etc. It is therefore of interest to develop an efficient and accurate solution to describe the scattered fields from such surfaces. An extended Uniform Geometrical Theory of Diffraction (UTD) solution for the scattering and diffraction from perfectly conducting cubic polynomial strips is derived and involves the incomplete Airy integrals as canonical functions. This new solution is universal in nature and can be used to effectively describe the scattered fields from flat, strictly concave or convex, and concave convex boundaries containing edges. The classic UTD solution fails to describe the more complicated field behavior associated with higher order phase catastrophes and therefore a new set of uniform reflection and first-order edge diffraction coefficients is derived. Also, an additional diffraction coefficient associated with a zero-curvature (inflection) point is presented. Higher order effects such as double edge diffraction, creeping waves, and whispering gallery modes are not examined. The extended UTD solution is independent of the scatterer size and also provides useful physical insight into the various scattering and diffraction processes. Its accuracy is confirmed via comparison with some reference moment method results.

Constantinides, E. D.↗

NASA NTRS1994

A uniform geometrical optics and an extended uniform geometrical theory of diffraction for evaluating high frequency EM fields near smooth caustics and composite shadow boundaries

A uniform geometrical optics (UGO) and an extended uniform geometrical theory of diffraction (EUTD) are developed for evaluating high frequency electromagnetic (EM) fields within transition regions associated with a two and three dimensional smooth caustic of reflected rays and a composite shadow boundary formed by the caustic termination or the confluence of the caustic with the reflection shadow boundary (RSB). The UGO is a uniform version of the classic geometrical optics (GO). It retains the simple ray optical expressions of classic GO and employs a new set of uniform reflection coefficients. The UGO also includes a uniform version of the complex GO ray field that exists on the dark side of the smooth caustic. The EUTD is an extension of the classic uniform geometrical theory of diffraction (UTD) and accounts for the non-ray optical behavior of the UGO reflected field near caustics by using a two-variable transition function in the expressions for the edge diffraction coefficients. It also uniformly recovers the classic UTD behavior of the edge diffracted field outside the composite shadow boundary transition region. The approach employed for constructing the UGO/EUTD solution is based on a spatial domain physical optics (PO) radiation integral representation for the fields which is then reduced using uniform asymptotic procedures. The UGO/EUTD analysis is also employed to investigate the far-zone RCS problem of plane wave scattering from two and three dimensional polynomial defined surfaces, and uniform reflection, zero-curvature, and edge diffraction coefficients are derived. Numerical results for the scattering and diffraction from cubic and fourth order polynomial strips are also shown and the UGO/EUTD solution is validated by comparison to an independent moment method (MM) solution. The UGO/EUTD solution is also compared with the classic GO/UTD solution. The failure of the classic techniques near caustics and composite shadow boundaries is clearly demonstrated and it is shown that the UGO/EUTD results remain valid and uniformly reduce to the classic results away from the transition regions. Mathematical details on the asymptotic properties and efficient numerical evaluation of the canonical functions involved in the UGO/EUTD expressions are also provided.

Constantinides, E. D.↗

NASA NTRS1993

A UGO/EUTD Solution for the Scattering and Diffraction from Cubic Polynomial Strips

A uniform geometrical optics (UGO) and an extended uniform geometrical theory of diffraction (EUTD) solution is developed for the scattering and diffraction from perfectly conducting cubic polynomial strips. The new solution overcomes the difficulties of the classic GO/UTD solution near caustics and composite shadow boundaries. The approach for constructing the UGO/EUTD solution is based on a spatial domain physical optics (PO) radiation integral representation for the scattered field which is then reduced using a uniform asymptotic procedure. New uniform reflection, zero-curvature diffraction, and edge diffraction coefficients are derived and involve the ordinary and incomplete Airy integrals as canonical functions. Higher order effects such as double edge diffraction, edge-excited creeping waves, and whispering gallery modes are not examined in this work. The UGO/EUTD solution is very efficient and provides useful physical insight into the various scattering and diffraction processes. It is also universal in nature and can be used to effectively describe the scattered fields from flat, strictly concave or convex, and concave-convex boundaries containing edges. Its accuracy is confirmed via comparison with some reference moment method (MM) results.

Constantinides, Evagoras D.↗