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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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NASA NTRSDate not supplied

Phasing in COTS EEE parts in NASA

A number of activities within NASA and the space community, as well as growing technology needs and supply chain changes have accelerated the need to expand the use of COTS parts within NASA. While the use of COTS has been formally institutionalized and deemed acceptable for Class D space missions and those with greater tolerance for risk, there is still a lack of understanding of how to most effectively use COTS in such high risk-tolerance missions, and no apparent path towards broad use in missions with much less tolerance for risk. However, the reality is that the fundamental limitations of technology associated with the military specification system combined with the need to fly newer technologies in upcoming flagship robotic missions and human space flight missions will ultimately demand a more expansive use of COTS. The infinite nature of COTS gives rise to numerous challenges in the selection, acceptance, testing, and usage of COTS when reliable operation is essential. This presentation will highlight some of the current artifacts of a NASA Engineering and Safety Center (NESC) study on the use of COTS parts, as well as many of the historical through current facts about parts assurance within Agency to provide a path forward for reliable use of COTS for a range of space applications and risk postures.

EEE parts↗
NASA NTRS1972

Long life assurance study for manned spacecraft long life hardware. Volume 2: Long life assurance studies of EEE parts and packaging

Guidelines for the design, development, and fabrication of electronic components and circuits for use in spacecraft construction are presented. The subjects discussed involve quality control procedures and test methodology for the following subjects: (1) monolithic integrated circuits, (2) hybrid integrated circuits, (3) transistors, (4) diodes, (5) tantalum capacitors, (6) electromechanical relays, (7) switches and circuit breakers, and (8) electronic packaging.

Source record↗
NASA NTRS1976

Data processing/display design for the space shuttle/spacelab Electromagnetic Environment Experiment (EEE)

Methods for data analysis, data compression including universal coding, storage and retrieval on random access storage devices, and display were developed and implemented on the GSFC Interdata computer. The original 64 bit per frequency band representation was reduced to 10 bits through source coding/universal coding, a compression ratio of 6.4, prior to storage. Rapid encoding/decoding was achieved by the algorithms used so that rapid random access is retained.

Davisson, L. D.↗
NASA NTRS1977

RF environment survey of Space Shuttle related EEE frequency bands

Radio frequency assignments within the continental United States in frequency bands between 121 MHz abd 65 GHz were surveyed and analyzed in order to determine current utilization of anticipated frequency bands for the shuttle borne electromagnetic environment experiment. Data from both government and nongovernment files were used. Results are presented in both narrative form and in histograms which show the total number of unclassified assignments versus frequency and total assigned power versus frequency.

Simpson, J.↗
NASA NTRS2009

EEE Parts Related Issues

The contents include: 1) Water Soluble Flux; 2) Non-Hermetic Packages; 3) Counterfeit Parts; and 4) Lead-Free Solder.

Hughitt, Brian↗
NASA NTRS2012

High Energy/LET Radiation EEE Parts Certification Handbook

Certifying electronic components is a very involved process. It includes pre-coordination with the radiation test facility for time, schedule and cost, as well as intimate work with designers to develop test procedures and hardware. It also involves work with radiation engineers to understand the effects of the radiation field on the test article/setup as well as the analysis and production of a test report. The technical content of traditional ionizing radiation testing protocol is in wide use and generally follows established standards (ref. Appendix C). This document is not intended to cover all these areas but to cover the methodology of using Variable Depth Bragg Peak (VDBP) to accomplish the goal of characterizing an electronic component. The Variable Depth Bragg Peak (VDBP) test method is primarily used for deep space applications of electronics. However, it can be used on any part for any radiation environment, especially those parts where the sensitive volume cannot be reached by the radiation beam. An example of this problem would be issues that arise in de-lidding of parts or in parts with flip-chip designs, etc. The VDBP method is ideally suited to test modern avionics designs which increasingly incorporate commercial off-the-shelf (COTS) parts and units. Johnson Space Center (JSC) developed software provides assistance to users in developing the radiation characterization data from the raw test data.

Reddell, Brandon↗
NASA NTRS2015

NASA EEE Parts 2014 Year in Review

The NASA Electronic Parts and Packaging Program continue to support Electrical, Electronic and Electromagnetic Parts for the agency with an eventful year of workshops, innovations, testing and challenges.

electronic↗