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At the Harsh Environment Mass Spectrometer workshop we focus on bringing the Mass spectrometer to the sample because it's not practical to bring the samples back to the laboratories. However there are many NASA mass spectrometer applications where we bring the samples to the instrument. This presentation will discuss some of those applications that are ripe for innovative instrument development.
Earth satellite-borne mass spectrometers are considered, taking into account the identification of atomic oxygen in the thermosphere with an 'open' source mass spectrometer flown on a sounding rocket, the conventional closed-source instrument, the mass spectrometers on the Atmosphere Explorer satellites, and mass spectrometer electron multiplier output. A description is presented of mass spectrometers and planetary entry probes. Attention is given to an attempt to obtain an atmospheric composition profile with a terrestrial entry probe, the descending trajectory in the early orbits of the Atmosphere Explorer C satellite, and the molecular nitrogen densities for the descending legs of the orbits. It is pointed out that chemical reactions on the surfaces of the mass spectrometer make the measurement of reactive atmospheric species such as atomic oxygen very difficult.
Mass spectrometers have been included in the payloads of several deep space missions over the past three decades. Our laboratory has designed and developed mass spectrometers for the Galileo Probe into the atmosphere of Jupiter, the Pioneer Venus Orbiter, the Cassini Orbiter Mission to Saturn, the Cassini/Huygens Probe Mission to Saturn's moon Titan, the Nozomi Mission to Mars, and most recently the CONTOUR comet nucleus flyby mission. Each mission has required attention to miniaturization, autonomous sampling, and consideration of the special hazards and measurement requirements of the target environment. Development ongoing in our laboratory includes further miniaturization, improved performance in the areas of sensitivity and precision for the important isotope measurements, and adaptation for the unusual environments to be encountered in locations such as the surface or subsurface of Europa or Mars. Various aspects of both the technical implementation of these delivered and planned experiments and the science drivers will be described.
Long duty cycle mass spectrometer for space research and source of cold electrons for ionizing neutral gas molecules in mass spectrometer
An automated mass spectrometer analysis system is disclosed, in which samples are automatically processed in a sample processor and converted into volatilizable samples, or their characteristic volatilizable derivatives. Each volatilizable sample is sequentially volatilized and analyzed in a double focusing mass spectrometer, whose output is in the form of separate ion beams all of which are simultaneously focused in a focal plane. Each ion beam is indicative of a different sample component or different fragments of one or more sample components and the beam intensity is related to the relative abundance of the sample component. The system includes an electro-optical ion detector which automatically and simultaneously converts the ion beams, first into electron beams which in turn produce a related image which is transferred to the target of a vilicon unit. The latter converts the images into electrical signals which are supplied to a data processor, whose output is a list of the components of the analyzed sample and their abundances. The system is under the control of a master control unit, which in addition to monitoring and controlling various power sources, controls the automatic operation of the system under expected and some unexpected conditions and further protects various critical parts of the system from damage due to particularly abnormal conditions.
An automated mass spectrometer analysis system is disclosed, in which samples are automatically processed in a sample processor and converted into volatilizable samples, or their characteristic volatilizable derivatives. Each volatizable sample is sequentially volatilized and analyzed in a double focusing mass spectrometer, whose output is in the form of separate ion beams all of which are simultaneously focused in a focal plane. Each ion beam is indicative of a different sample component or different fragments of one or more sample components and the beam intensity is related to the relative abundance of the sample component. The system includes an electro-optical ion detector which automatically and simultaneously converts the ion beams, first into electron beams which in turn produce a related image which is transferred to the target of a vidicon unit. The latter converts the images into electrical signals which are supplied to a data processor, whose output is a list of the components of the analyzed sample and their abundances. The system is under the control of a master control unit, which in addition to monitoring and controlling various power sources, controls the automatic operation of the system under expected and some unexpected conditions and further protects various critical parts of the system from damage due to particularly abnormal conditions.
Microleaks for inlets of mass spectrometers used to analyze atmospheric gases can be fabricated in silicon wafers by means of photolithography, etching, and other techniques that are commonly used in the manufacture of integrated circuits and microelectromechanical systems. The microleaks serve to limit the flows of the gases into the mass-spectrometer vacuums to specified very small flow rates consistent with the capacities of the spectrometer vacuum pumps. There is a need to be able to precisely tailor the dimensions of each microleak so as to tailor its conductance to a precise low value. (As used here, "conductance" signifies the ratio between the rate of flow in the leak and the pressure drop from the upstream to the downstream end of the leak.) To date, microleaks have been made, variously, of crimped metal tubes, pulled glass tubes, or frits. Crimped-metal and pulled-glass-tube microleaks cannot readily be fabricated repeatably to precise dimensions and are susceptible to clogging with droplets or particles. Frits tend to be differentially chemically reactive with various gas constituents and, hence, to distort the gas mixtures to be analyzed. The present approach involving microfabrication in silicon largely overcomes the disadvantages of the prior approaches.
A commercial atmospheric pressure ionization mass spectrometer (APIMS) was purchased from EXTREL Mass Spectrometry, Inc. (Pittsburgh, PA). Our research objectives were to adapt this instrument and develop techniques for real-time determinations of the concentrations of trace species in the atmosphere. The prototype instrument is capable of making high frequency measurements with no sample preconcentrations. Isotopically labeled standards are used as an internal standard to obtain high precision and to compensate for changes in instrument sensitivity and analyte losses in the sampling manifold as described by Bandy and coworkers. The prototype instrument is capable of being deployed on NASA C130, Electra, P3, and DC8 aircraft. After purchasing and taking delivery by June 1994, we assembled the mass spectrometer, data acquisition, and manifold flow control instrumentation in electronic racks and performed tests.
The design, development, manufacture, test and calibration of five lunar orbital mass spectrometers with the four associated ground support equipment test sets are discussed. A mass spectrometer was installed in the Apollo 15 and one in the Apollo 16 Scientific Instrument Module within the Service Module. The Apollo 15 mass spectrometer was operated with collection of 38 hours of mass spectra data during lunar orbit and 50 hours of data were collected during transearth coast. The Apollo 16 mass spectrometer was operated with collection of 76 hours of mass spectra data during lunar orbit. However, the Apollo 16 mass spectrometer was ejected into lunar orbit upon malfunction of spacecraft boom system just prior to transearth insection and no transearth coast data was possible.
Photoionization mass spectrometer for charge transfer reaction analysis
The Giotto Ion Mass Spectrometer (IMS) consists of two sensors: one optimized for the outer and the other for the inner coma, with each obtaining complementary information in the region for which it is not optimized. The outer coma is characterized by the interaction between solar wind and comentary plasmas, the inner coma by the outflow of cometary neutrals and their ionization products. Both sensors feature mass imaging characteristics, permitting simultaneous measurements of several ion species by multidetector arrays. Resultant mass-per-charge resolution is greater than or = 20. Energy per charge, and the elevation and aximuth of incident ions are measured. Calibration and in-flight solar-wind data show that the IMS will meet its scientific goals for the Halley encounter.
The present invention provides a quadrupole mass spectrometer and an ion filter for use in the quadrupole mass spectrometer. The ion filter includes a thin patterned layer including a two-dimensional array of poles forming one or more quadrupoles. The patterned layer design permits the use of very short poles and with a very dense spacing of the poles, so that the ion filter may be made very small. Also provided is a method for making the ion filter and the quadrupole mass spectrometer. The method involves forming the patterned layer of the ion filter in such a way that as the poles of the patterned layer are formed, they have the relative positioning and alignment for use in a final quadrupole mass spectrometer device.
The present invention provides a quadrupole mass spectrometer and an ion filter for use in the quadrupole mass spectrometer. The ion filter includes a thin patterned layer including a two-dimensional array of poles forming one or more quadrupoles. The patterned layer design permits the use of very short poles and with a very dense spacing of the poles, so that the ion filter may be made very small. Also provided is a method for making the ion filter and the quadrupole mass spectrometer. The method involves forming the patterned layer of the ion filter in such a way that as the poles of the patterned layer are formed, they have the relative positioning and alignment for use in a final quadrupole mass spectrometer device.
The present invention provides a quadrupole mass spectrometer and an ion filter for use in the quadrupole mass spectrometer. The ion filter includes a thin patterned layer including a two-dimensional array of poles forming one or more quadrupoles. The patterned layer design permits the use of very short poles and with a very dense spacing of the poles, so that the ion filter may be made very small. Also provided is a method for making the ion filter and the quadrupole mass spectrometer. The method involves forming the patterned layer of the ion filter in such a way that as the poles of the patterned layer are formed, they have the relative positioning and aligrnent for use in a final quadrupole mass spectrometer device.
A time-of-flight mass spectrometer having a chamber with electrodes to generate an electric field in the chamber and electric gating for allowing ions with a predetermined mass and velocity into the electric field. The design uses a row of very thin parallel aligned wires that are pulsed in sequence so the ion can pass through the gap of two parallel plates, which are biased to prevent passage of the ion. This design by itself can provide a high mass resolution capability and a very precise start pulse for an ion mass spectrometer. Furthermore, the ion will only pass through the chamber if it is within a wire diameter of the first wire when it is pulsed and has the right speed so it is near all other wires when they are pulsed.
Inflight hydrogen detection by mass spectrometer
Quadrupole mass spectrometer operation in presence of high background pressure of hydrogen
Computer controlled mass spectrometer system, processing spectral information data for on-line graphic system output