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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 55 records · Page 3
All sourcesNASA NTRSDOE OSTI
NASA NTRS1985

Crystalline-silicon reliability lessons for thin-film modules

The reliability of crystalline silicon modules has been brought to a high level with lifetimes approaching 20 years, and excellent industry credibility and user satisfaction. The transition from crystalline modules to thin film modules is comparable to the transition from discrete transistors to integrated circuits. New cell materials and monolithic structures will require new device processing techniques, but the package function and design will evolve to a lesser extent. Although there will be new encapsulants optimized to take advantage of the mechanical flexibility and low temperature processing features of thin films, the reliability and life degradation stresses and mechanisms will remain mostly unchanged. Key reliability technologies in common between crystalline and thin film modules include hot spot heating, galvanic and electrochemical corrosion, hail impact stresses, glass breakage, mechanical fatigue, photothermal degradation of encapsulants, operating temperature, moisture sorption, circuit design strategies, product safety issues, and the process required to achieve a reliable product from a laboratory prototype.

Ross, R. G., Jr.↗
NASA NTRS2002

A Cryogenic Half-Wave Plate Module to Measure Polarization at Multiple FIR Passbands

One of the key components in a far-infrared polarimeter that is being designed at the University of Chicago is a locally-powered half-wave plate module. This compact, lightweight, and reliable module will operate at cryogenic temperatures, rotating a half-wave plate about its axis within the optical path. By doing so, polarization measurements can be made. Further, by utilizing multiple half-wave plate modules within the polarimeter, multiple wavelengths or passbands can be studied. In this paper, we describe the design and performance of a relatively inexpensive prototype module that was assembled and tested successfully, outline the difficulties that had to be overcome, and recommend improvements to future modules. This effort now lays some of the groundwork for a next-generation polarimeter for far-infrared astronomy.

Rennick, Timothy S.↗
NASA NTRS1986

Crystalline-silicon photovoltaics summary module design and reliability

The evolution of the design and reliability of solar modules was described. Design requirements involved 14 different considerations, including residential building and material electrical codes, wind-loading, hail impact, operating temperature levels, module flammability, and interfaces for both the array structure and the operation of the system. Reliability research involved in diverse investigations including glass-fracture strength, soiling levels, electrochemical corrosion, and bypass-diode qualification tests. Based on these internationally recognized studies, performance assessments, and failure analyses, the Flat-plate Solar Array Project in its 11-year duration served to nuture the development of 45 different solar module designs from 15 PV manufacturers.

Ross, R. G., Jr.↗
NASA NTRS1986

Reliability of photovoltaic modules

In order to assess the reliability of photovoltaic modules, four categories of known array failure and degradation mechanisms are discussed, and target reliability allocations have been developed within each category based on the available technology and the life-cycle-cost requirements of future large-scale terrestrial applications. Cell-level failure mechanisms associated with open-circuiting or short-circuiting of individual solar cells generally arise from cell cracking or the fatigue of cell-to-cell interconnects. Power degradation mechanisms considered include gradual power loss in cells, light-induced effects, and module optical degradation. Module-level failure mechanisms and life-limiting wear-out mechanisms are also explored.

Ross, R. G., Jr.↗
DOE OSTI2023

DuraMAT FY 2022 Annual Report: Towards Predicting Lifetime

The Durable Module Materials Consortium (DuraMAT) launched in November 2016 with five years of funding from the U.S. Department of Energy s (DOE's) Solar Energy Technologies Office (SETO). The program renewed in 2022 for an additional 6 years. DuraMAT is a multi-lab consortium led by the National Renewable Energy Laboratory, with Sandia National Laboratories (Sandia) and Lawrence Berkeley National Laboratory (LBNL) as core research labs. DuraMAT's overarching goal is to accelerate a sustainable, just, and equitable transition to zero-carbon electricity generation by 2035. We work in partnership with our 22-member industry advisory board and the technical management team at SETO. DuraMAT transitioned from our first five-year program into a new six-year program in 2022. It was a very busy year; DuraMAT wrapped up projects from DuraMAT 1 and kicked off new laboratory-led projects for DuraMAT 2. This transition brings new goals and a renewed focus on accelerating the energy transition by improving photovoltaic (PV) module reliability.

accelerated stress testing↗
NASA NTRS2013

PV Reliability Development Lessons from JPL's Flat Plate Solar Array Project

Key reliability and engineering lessons learned from the 20-year history of the Jet Propulsion Laboratory's Flat-Plate Solar Array Project and thin film module reliability research activities are presented and analyzed. Particular emphasis is placed on lessons applicable to evolving new module technologies and the organizations involved with these technologies. The user-specific demand for reliability is a strong function of the application, its location, and its expected duration. Lessons relative to effective means of specifying reliability are described, and commonly used test requirements are assessed from the standpoint of which are the most troublesome to pass, and which correlate best with field experience. Module design lessons are also summarized, including the significance of the most frequently encountered failure mechanisms and the role of encapsulate and cell reliability in determining module reliability. Lessons pertaining to research, design, and test approaches include the historical role and usefulness of qualification tests and field tests.

photovoltaics↗
DOE OSTI2016

Module Degradation Mechanisms Studied by a Multi-Scale Approach

A key pathway to meeting the Department of Energy SunShot 2020 goals is to reduce financing costs by improving investor confidence through improved photovoltaic (PV) module reliability. A comprehensive approach to further understand and improve PV reliability includes characterization techniques and modeling from module to atomic scale. Imaging techniques, which include photoluminescence, electroluminescence, and lock-in thermography, are used to locate localized defects responsible for module degradation. Small area samples containing such defects are prepared using coring techniques and are then suitable and available for microscopic study and specific defect modeling and analysis.

14 SOLAR ENERGY↗
DOE OSTI2020

Combined-Accelerated Stress Testing for Advanced Reliability Assessment of Photovoltaic Modules

New and previously undiscovered degradation mechanisms continue to be identified after field exposure in new photovoltaic module designs or materials oftentimes results in significant losses in investment. This is despite passing certification tests. Testing is insufficient largely due to their single-or double-stress nature. A Combined-Accelerated Stress Test (C-AST) has recently been developed. The test combines multiple stress factors of the natural environment to better replicate conditions experienced by modules in the field and detect mechanisms not a-priori known in new materials and designs.

accelerator factor modeling↗
DOE OSTI2023

Advanced Module Architecture for Reduced Costs, High Durability and Significantly Improved Manufacturability (Final Report)

This project demonstrated a new module architecture (referred to herein as Glass/Glass) using silicone edge seals and an interlayer polymer that reduces manufacturing costs, significantly streamlines manufacturing processes, and reduces cap-ex costs while improving module reliability. A prototype manufacturing process to fabricate this new module architecture was demonstrated with a significantly improved process cycle time for the lamination step from the current industry standard of 13.5 minutes to approximately 30 seconds for each of the individual edge seal and internal polymer application steps. Samples are fabricated, strenuously stressed, and characterized to quantify the cost benefits, hardware capacities and accelerated stress performance of the new architecture. These results are being compared to a standard, laminated baseline architecture using a Glass/EVA/Glass or Glass/Thermoplastic/Glass design that traditionally has high moisture vapor transmission rates (MVTR).

14 SOLAR ENERGY↗
DOE OSTI2021

R&D to Ensure a Scientific Basis for Qualification Tests and Standards (Final Report: FY19-FY22)

This is the final technical report for the FY19-FY21 research program "R&D to Ensure a Scientific Basis for Qualification Tests and Standards." This research was performed because project return on investment in a photovoltaic (PV) system depends increasingly on maintaining high energy yields, and the system lifetime is a major factor in levelized cost of electricity (LCOE). Thus, the rate of PV deployment and the success of these assets depends upon reliable long-term power generation. This program advances PV module reliability of commercial products through identification of reliability needs, characterization that provides scientific understanding of targeted degradation mechanisms, and translation of those data into practical and predictive test protocols and standards. This report describes program scope, results, milestones, and accomplishments over the three-year period of performance.

14 SOLAR ENERGY↗
DOE OSTI2013

Design of a Marx-Topology Shaped-Pulse Modulator for FNAL

Fermi National Accelerator Laboratory is undergoing an effort to upgrade the 201 MHz Proton Source system. One subset of this upgrade is addressing the triode modulator reliability and performance issues. SLAC National Accelerator Laboratory proposes a Marxtopology modulator to replace the existing system. This paper presents the system design of this modulator, the SLAC F1 Marx.

Kemp, M. A.↗
DOE OSTI2017

2017 NREL Photovoltaic Reliability Workshop

NREL's Photovoltaic (PV) Reliability Workshop (PVRW) brings together PV reliability experts to share information, leading to the improvement of PV module reliability. Such improvement reduces the cost of solar electricity and promotes investor confidence in the technology -- both critical goals for moving PV technologies deeper into the electricity marketplace.

14 SOLAR ENERGY↗
NASA NTRS1981

Photovoltaic module and array reliability

Several statistical reliability studies have been conducted in areas of photovoltaic component design covering cell failure, interconnect fatigue, glass breakage and electrical insulation breakdown. This paper integrates the results from these various studies and draws general conclusions relative to optimal reliability features for future modules. The described analysis is based on designing for specified low levels of component failures and then controlling the degrading effects of the failures through the use of fault tolerant circuitry and module replacement. Means of selecting the cost-optimal level of component failures, circuit redundancy, and module replacement are described.

Ross, R. G., Jr.↗
DOE OSTI2022

Fast External Quantum Efficiency Measurements of Photovoltaic Modules

The external quantum efficiency (EQE) or associated spectral response is widely used to evaluate the performance of photovoltaics, light emitting diodes, photodetectors, photodiodes, semiconductor lasers, laser-induced refrigeration of solids etc. For photovoltaic (PV) devices, The EQE is used to determine the spectral mismatch correction that is used to convert a performance measurement from a non-ideal simulator spectrum to a standard spectrum in PV device calibrations. Moreover, EQE can provide important insight into the physics of a PV device. For instance, the EQE shape can be used to infer mechanisms limiting the performance of the device. However, EQE measurements of full-size PV modules remain a challenge in the PV community due to rare availability of reliable module QE measurement tools worldwide and the size and complexity of module architecture that comprises several cells connected in strings (series or/and parallel). Here, we use a customized nondestructive tool made of high-power light emitting diodes to perform high-throughput EQE measurements on PV modules. Circuit simulations show that the measurement system can safely be used to measure both crystalline silicon and thin film-based PV modules with series connected cells without the risk of damage through reverse bias. In addition, EQE mapping combined with electroluminescence show a strong correlation and provide a way to determine both spatial non-uniformity of the spectral response and defects/degradation effects across the module.

PV module↗
DOE OSTI2022

Degradation of Edge-Defined Film-Fed Silicon Glass–Glass Modules on Florida Rooftop After 22 Years

Thin silicon (< 100 μm) adoption can provide significantly lower cost. Kerfless technologies provide thin wafers while preventing material from being wasted. Understanding how this family of processing influences module reliability is important. A set of four edge-defined film-fed growth (EFG) silicon modules from a ten-module system in Florida is measured after 22 years of exposure. Power loss rates of 0.58–0.78% year -1 are measured for three modules, while a rate of 1.32% is measured for a module with severe delamination and corrosion. Short-circuit current degrades between 10.7% and 13.1% for all modules. Further, the losses are primarily optical and recombination based; however, series and shunt resistance effects play a non-negligible role. Pre-existing recombination losses exist but are exacerbated via degradation. Optical losses in short-circuit current are due in part to encapsulant yellowing. Electroluminescence (EL) images display the effects of processing on bulk quality by clearly showing lines of alternating brightness along the wafer length. To the authors’ knowledge, this is the first article displaying suns–V OC data, effective lifetime versus excess carrier density data, and module EL images for EFG silicon-based modules.

36 MATERIALS SCIENCE↗
DOE OSTI2024

R&D to Ensure a Scientific Basis for Qualification Tests and Standards (Final Report)

Project return on investment in a photovoltaic (PV) system depends increasingly on maintaining high energy yields, and the system lifetime is a major factor in levelized cost of electricity (LCOE). Thus, the rate of PV deployment and the success of these assets depends upon reliable long-term power generation. The overarching objective of this program is to improve photovoltaic (PV) module reliability via development of tests and standards. Where reliability problems or risk are discovered, we can design tests to ensure that these liabilities don't affect future generations of products. Customers can use these tests to understand which products are susceptible to certain degradation mechanisms, and manufacturers can use the tests to design unwanted characteristics out of their products. The work under this program identifies PV reliability needs, performs characterization that provides scientific understanding of targeted degradation mechanisms, and translates those data into practical and predictive test protocols and standards. Major accomplishments include: A model for polarization-type potential induced degradation (PID-p) was developed and validated against experimental data. NREL is currently leading a new edition of IEC 62804-1 for PID detection. PID-p can cause large losses in current and voltage for some module designs on cloudy days. Finite element modeling (FEM) and experiment was used to determine when cells crack in a module. It was shown that cells in landscape orientation are much more likely to crack than those on portrait orientation. Shortly thereafter, the first products with portrait-oriented cells were introduced. Studies of how to test for light and elevated temperature degradation (LeTID) culminated with the publication of IEC TS 63342. Software to predict the progression of LeTID was developed, validated, and made publicly available. Field validated tests and international standards for durability of PV module coatings abrasion, backsheets, and encapsulants were developed. Examples are IEC 62788-1-1, IEC 62788-2 ED2, IEC TS 62788-7-2, IEC 62788-7-3 ED1, IEC 63209-2. NREL led the development a high-temperature testing technical specification, and published guidelines that enable installers to determine whether higher-temperature testing is needed, simply based on location and mounting configuration. In a number of our case studies, variations in the bills of materials or workmanship have been associated with variations in reliability. These observations emphasize the importance of quality assurance to reliability. A framework for criticality (i.e. Pareto) analysis was developed and published. The framework helps us and other researchers determine what problems should be addressed for reliability research to have the biggest industry impact. NREL continues to participate actively in international standards development and stakeholder engagement activities, including organizing an annual PV Reliability Workshop. These activities are important for ensuring we address issues that are relevant and timely, and that we convey our results to those who may benefit.

14 SOLAR ENERGY↗
DOE OSTI2019

Proceedings of the 2019 PV Reliability Workshop, 26-28 February 2019, Lakewood, Colorado

NREL hosts an annual Photovoltaic Reliability Workshop (PVRW) so solar technology experts can share information leading to the improvement of PV module reliability. Such improvement reduces the cost of solar electricity and promotes investor confidence in the technology - both critical goals for moving PV technologies deeper into the electricity marketplace. This document collects the presentations and posters from the 2019 PV Reliability Workshop, which was hosted by NREL from Tuesday, February 26, to Thursday, February 28, 2019.

14 SOLAR ENERGY↗