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At least 55 records · Page 3

Effects of surface polishing on the microstrain behavior of telescope mirror materials

Rough ground silicic mirror substrate materials were found in previous investigations to exhibit significant surface yield. This effect was removed by surface etching, a procedure not normally employed in the finishing of optical telescope mirrors. The effects of fine grinding and polishing techniques as well as graded etching are investigated. Torsional shear measurements of yield strain versus stress are made on four candidate mirror substrate materials: polycrystalline silicon, ULE silica 7971, CER-VIT 101, and fused silica 7940. Commonly employed fine grinding and polishing practices are shown to remove a major portion of the surface yield found in rough ground mirror substrate materials.

Eul, W. A.↗

Development study of the X-ray scattering properties of a group of optically polished flat samples

A group of twelve optically polished flat samples were used to study the scattering of X-rays. The X-ray beam reflected from the twelve optical flat samples was analyzed by means of a long vacuum system of special design for these tests. The scattering measurements were made at 8.34A and 0.92 deg angle of incidence. The results for ten of the samples are comparable, the two exceptions being the fire polished samples.

Froechtenigt, J. F.↗

Polishing technique for beryllium mirror

Performance tests, accomplished by inserting entire X ray telescope and polished mirror into vacuum line 67 m long and taking photographs of an X ray resolution source, indicate that polishing increases mirror efficiency from 0.06 percent for X rays at 0.8 nm and increases resolution from 15 to 3.75 arc-seconds.

Froechtenigt, J. F.↗

Light Scattered from Polished Optical Surfaces: Wings of the Point Spread Function

Random figure errors from the polishing process plus particles on the main mirrors in a telescope cause an extended point spread function (PSF) declining approximately as the inverse square of the sine of the angle from a star from about 100 micro-rad to a right angle. The decline in at least one case, and probably in general, proceeds as the inverse cube at smaller angles where the usual focal plane aperture radius is chosen. The photometric error due to misalignment by one Airy ring spacing with an aperture of n rings depends on the net variance in the figure. It is approximately 60/(n+1)(3) when using the data of Kormendy (1973). A typical value is 6 x 10 to the -5th power per ring of misalignment with n = 100 rings. The encircled power may be modulated on a time scale of hours by parts per thousand in a wavelength dependent manner due to relative humidity effects on mirror dust. The scattering according to an inverse power law is due to a random walk in aberration height caused by a multitude of facets and slope errors left by the polishing process. A deviation from such a law at grazing emergence may permit monitoring the dust effects.

Kenknight, C. E.↗

Ion-Deposited Polished Coatings

Polished, dense, adherent coatings relatively free of imperfections. New process consists of using broad-beam ion source in evacuated chamber to ion-clean rotating surface that allows grazing incidence of ion beam. This sputter cleans off absorbed gases, organic contaminants, and oxides of mirror surface. In addition to cleaning, surface protrusions sputter-etched away. Process particularly adaptable to polishing of various substrates for optical or esthetic purposes.

Banks, B. A.↗

Mechanized Polishing of Optical Rod and Fiber Ends

Workpiece holder for standard grinding and polishing machine makes it easier to produce optical finish and shape on end of metal or glass rod or bundle of optical fibers. Previously, glass parts lapped and polished manually, time-consuming procedure calling for considerable skill.

Gum, J. S.↗

Proposed method of producing large optical mirrors Single-point diamond crushing followed by polishing with a small-area tool

Faster production of large optical mirrors may result from combining single-point diamond crushing of the glass with polishing using a small area tool to smooth the surface and remove the damaged layer. Diamond crushing allows a surface contour accurate to 0.5 microns to be generated, and the small area computer-controlled polishing tool allows the surface roughness to be removed without destroying the initial contour. Final contours with an accuracy of 0.04 microns have been achieved.

Wright, G.↗

Ultrasonic Polishing

The ultrasonic polishing process makes use of the high-frequency (ultrasonic) vibrations of an abradable tool which automatically conforms to the work piece and an abrasive slurry to finish surfaces and edges on complex, highly detailed, close tolerance cavities in materials from beryllium copper to carbide. Applications range from critical deburring of guidance system components to removing EDM recast layers from aircraft engine components to polishing molds for forming carbide cutting tool inserts or injection molding plastics. A variety of materials including tool steels, carbides, and even ceramics can be successfully processed. Since the abradable tool automatically conforms to the work piece geometry, the ultrasonic finishing method described offers a number of important benefits in finishing components with complex geometries.

Gilmore, Randy↗

Heat Transfer and Boundary-Layer Transition on a Highly Polished Hemisphere-Cone in Free Flight at Mach Numbers Up to 3.14 and Reynolds Numbers Up to 24 x 10(exp 6)

A highly polished hemisphere-cone having a ratio of nose radius to base radius of 0.74 and a half-angle of 14.5 was flight tested at Mach numbers up to 4.70. Temperature and pressure data were obtained at Mach numbers up to 3.14 and a free-stream Reynolds number of 24 x 10(exp 6) based on body diameter. The nose of the model had a surface roughness of 2 to 5 microinches as measured with an interferometer. The measured Stanton numbers were in good agreement with theory. Transition Reynolds numbers based on the laminar boundary-layer momentum thickness at transition ranged from 2,190 to 794. Comparison with results from previous tests of blunt shapes having a surface roughness of 20 to 40 microinches showed that the high degree of polish was instrumental in delaying the transition from laminar to turbulent flow.

Buglia, James J.↗

Technology Demonstrator for Direct Polishing of a 50cm C/SiC Ultra Light Mirror

The NRSU portion of the contract was completed on schedule and within acceptable limits of the estimated cost. The lapping of the substrate started on schedule, and completed ahead of schedule. The polishing of the substrate was begun ahead of schedule, and was completed approximately one month ahead of schedule. It is our opinion that the substrate meets the requirements of "diffraction limited performance at 2 microns" over the measured 16 in. area. The final photos suggest that there may be edge roll-off beyond the 16 in. diameter. However, we cannot quantify this. It is our opinion that this material is suitable for use in lightweight optics as long as cladding of some type is used (Silicon, SiC, Sol-Gel, etc), as the bare material itself is too "porous" to obtain a high quality finish. We feel that this part was at the low limit of structural integrity required to mechanically polish to this level of figure requirement. Any lesser structural integrity would require some form of "non contact" figuring.

Scribner, Ken↗

Striations, Polish, and Related Features from Clasts in Impact-Ejecta Deposits and the "Tillite Problem"

Proximal ejecta deposits related to three large terrestrial impacts, the 14.8-Ma Ries impact structure in Germany (the Bunte Breccia), the 65-Ma Chicxulub impact structure in the Yucatan (the Albion and Pook's Hill Diamictites in Belize) and the mid-Tertiary Azuara impact structure in Spain (the Pelarda Fm.) occur in the form of widespread debris-flow deposits most likely originating from ballistic processes. These impact-related diamictites typically are poorly sorted, containing grain sizes from clay to large boulders and blocks, and commonly display evidence of mass flow, including preferred orientation of long axes of clasts, class imbrication, flow noses, plugs and pods of coarse debris, and internal shear planes. Clasts of various lithologies show faceting, various degrees of rounding, striations (including nailhead striae), crescentic chattermarks, mirror-like polish, percussion marks, pitting, and penetration features. Considering the impact history of the Earth, it is surprising that so few ballistic ejecta, deposits have been discovered, unless the preservation potential is extremely low, or such materials exist but have been overlooked or misidentified as other types of geologic deposits . Debris-flow diamictites of various kinds have been reported in the geologic record, but these are commonly attributed to glaciation based on the coarse and poorly sorted nature of the deposits and, in many cases, on the presence of clasts showing features considered diagnostic of glacial action, including striations of various kinds, polish, and pitting. These diamictites are the primary evidence for ancient ice ages. We present evidence of the surface features on clasts from known proximal ejecta debris-flow deposits and compare these features with those reported in diamictites. interpreted as ancient glacial deposits (tillites). Our purpose is to document the types of features seen on clasts in diamictites of ejecta origin in order to help in the interpretation of the origin of ancient diamictites. The recognition of characteristic features in clast populations in ancient diamictites may allow identification and discrimination of debris-flow deposits of various origins (e.g., impact glacial, tectonic) and may shed light on some climatic paradoxes, such as inferred Proterozoic glaciations at low paleolatitudes.

Rampino, M. R.↗

Chemical Mechanical Polishing of Silicon Carbide

The High Temperature Integrated Electronics and Sensors (HTIES) team at the NASA Lewis Research Center is developing silicon carbide (SiC) as an enabling electronic technology for many aerospace applications. The Lewis team is focusing on the chemical vapor deposition of the thin, single-crystal SiC films from which devices are fabricated. These films, which are deposited (i.e., epitaxially "grown") on commercial wafers, must consist of a single crystal with very few structural defects so that the derived devices perform satisfactorily and reliably. Working in collaboration (NASA grant) with Professor Pirouz of Case Western Reserve University, we developed a chemical-mechanical polishing (CMP) technique for removing the subsurface polishing damage prior to epitaxial growth of the single-crystal SiC films.

Powell, J. Anthony↗

Stereomicroscope Inspection of Polished Aluminum Collector 50684.0

The Genesis polished aluminum "kidney" collector was damaged during the hard landing of the capsule on September 8, 2004 in the Utah desert. The kidney was introduced into the Genesis (ISO class 4) cleanroom laboratory on November 4, 2004 and stored under nitrogen cover gas. The collector is currently fastened to a highly polished stainless steel plate for secure handling. Curatorial work at JSC has made successful subdivision and subsequent allocation of samples from the kidney.

Rodriquez, M. C.↗

Removing Contamination From Genesis Sapphire Collectors By Polishing

The Array Collectors of the Genesis spacecraft collected bulk solar wind (SW), as well as three subsets of SW (fast, slow, and coronal mass ejection) in a variety of materials. In all cases the SW implant peaked within < 0.2 microns of the surface. So, when the sample return capsule crashed on landing, cleaning the surfaces for analysis became an extremely difficult, but imperative, task. One collector material was “sapphire”, commercial single crystal corundum. Only ~7.7% of the Genesis Array collectors were sapphire (SAP) but a much higher percentage survived the crash. In fact, surviving bulk SW sapphire collectors have an average area ~10x that of their silicon counterparts since SAP is physically tough, and hard (MOHS 9, by definition) as well as is chemically inert. So, SAP is a good candidate for analytical techniques for measuring SW that require clean areas larger than a millimeter; e.g., synchrotron TXRF and INAA. It is also possible to measure SW in SAP using laser ablation and secondary ion mass spectrometry (SIMS) and, recently, more researchers are choosing to analyze sapphire. Thus, removing surface contamination from SAP could enable many research projects. This report extends the task presented in Schmeling et al. ([4]) that used polishing compounds to remove contamination from Genesis sapphire. It focuses on how polishing with their two top candidates (colloidal silica and cerium oxide) affects the SW layer in SAP.

Genesis solar wind↗