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At least 55 records · Page 3

Production of electronic grade lunar silicon by disproportionation of silicon difluoride

Waldron has proposed to extract lunar silicon by sodium reduction of sodium fluorosilicate derived from reacting sodium fluoride with lunar silicon tetrafluoride. Silicon tetrafluoride is obtained by the action of hydrofluoric acid on lunar silicates. While these reactions are well understood, the resulting lunar silicon is not likely to meet electronic specifications of 5 nines purity. Dale and Margrave have shown that silicon difluoride can be obtained by the action of silicon tetrafluoride on elemental silicon at elevated temperatures (1100-1200 C) and low pressures (1-2 torr). The resulting silicon difluoride will then spontaneously disproportionate into hyperpure silicon and silicon tetrafluoride in vacuum at approximately 400 C. On its own merits, silicon difluoride polymerizes into a tough waxy solid in the temperature range from liquid nitrogen to about 100 C. It is the silicon analog of teflon. Silicon difluoride ignites in moist air but is stable under lunar surface conditions and may prove to be a valuable industrial material that is largely lunar derived for lunar surface applications. The most effective driver for lunar industrialization may be the prospects for industrial space solar power systems in orbit or on the moon that are built with lunar materials. Such systems would require large quantities of electronic grade silicon or compound semiconductors for photovoltaics and electronic controls. Since silicon is the most abundant semimetal in the silicate portion of any solar system rock (approximately 20 wt percent), lunar silicon production is bound to be an important process in such a solar power project. The lunar silicon extraction process is discussed.

Agosto, William N.

Nondestructive Evaluation of Ceramic Matrix Composite Combustor Components

Combustor liners fabricated from a SiC/SiC composite were nondestructively interrogated before and after combustion rig testing by X-ray, ultrasonic and thermographic techniques. In addition, mechanical test results were obtained from witness coupons, representing the as-manufactured liners, and from coupons machined from the components after combustion exposure. Thermography indications were found to correlate with reduced material properties obtained after rig testing. The thermography indications in the SiC/SiC liners were delaminations and damaged fiber tows, as determined through microstructural examinations. [copyright] 2003 American Institute of Physics

X-ray analysis

Contamination Barrier For Contour-Molding Material

Release agent prevents molding compound from adhering to or contaminating surface. Cleaning agent, Turco 4215 NCLT, forms barrier preventing silicone molding compound from sticking to surface and leaving contaminating residue. Also see MFS-29243.

Adams, James F.

Field Evaluation of Anti-Biofouling Compounds on Optical Instrumentation

Biofouling has been a serious question in the stability of optical measurements in the ocean, particularly in moored and drifting buoy applications. Many investigators coat optical surfaces with various compounds to reduce the amount of fouling; to our knowledge, however, there are no objective, in-situ comparative testing of these compounds to evaluate their effectiveness with respect to optical stability relative to untreated controls. We have tested a wide range of compounds at in-situ locations in Halifax Harbour and in the Adriatic Sea on passive optical sensors. Compounds tested include a variety of TBT formulations, antifungal agents, and low-friction silicone-based compounds; time-scales of up to four months were evaluated. The results of these experiments are discussed.

McLean, Scott

The Story Behind the Numbers: Lessons Learned from the Integration of Monitoring Resources in Addressing an ISS Water Quality Anomaly

Beginning in June of 2010 an environmental mystery was unfolding on the International Space Station (ISS). The U.S. Water Processor Assembly (WPA) began to produce water with increasing levels of total organic carbon (TOC). A surprisingly consistent upward TOC trend was observed through weekly in-flight total organic carbon analyzer (TOCA) monitoring. As TOC is a general organics indicator, return of water archive samples was needed to make better-informed crew health decisions and to aid in WPA troubleshooting. TOCA-measured TOC was more than halfway to its health-based screening limit before archive samples could be returned on Soyuz 22 and analyzed. Although TOC was confirmed to be elevated, somewhat surprisingly, none of the typical target compounds were the source. After some solid detective work, it was confirmed that the TOC was associated with a compound known as dimethylsilanediol (DMSD). DMSD is believed to be a breakdown product of silicon-containing compounds present on ISS. A toxicological limit was set for DMSD and a forward plan developed for operations given this new understanding of the source of the TOC. This required extensive coordination with ISS stakeholders and innovative use of available in-flight and archive monitoring resources. Behind the numbers and scientific detail surrounding this anomaly, there exists a compelling story of multi-disciplinary awareness, teamwork, and important environmental lessons learned.

McCoy, Torin

Quantitation of buried contamination by use of solvents

A method for determining the quantity of buried contamination using solvents is presented. A nonsporocidal method with which high spore recoveries are achievable from silicone coatings and potting compounds was developed. An extension of the method to silicon potting compound RTV 60 is reported. It is stated that spores remain viable during chemical curing of silicone potting compounds and more than ninety percent of the spore population is recoverable by amine dissolution and proper plating techniques.

Pappas, S. P.

Quantitation of buried contamination by use of solvents

Spore recovery form cured silicone potting compounds using amine solvents to degrade the cured polymers was investigated. A complete list of solvents and a description of the effect of each on two different silicone polymers is provided.

Pappas, S. P.

Production development of organic nonflammable spacecraft potting, encapsulating and conformal coating compounds. Volume 1: Discussion, figures, and references

Based upon extensive contacts with vendors, a broad array of non-flammable polymeric specie, and additives generally noted to have flame retarding properties, were considered. The following polymeric matrices were examined: modified silicone and fluorosilicone RTV's polyesters, epoxies, urethanes, and epoxy-urethanes. Optimization of formulations to obtain a suitable balance between the various properties and flammability resistance led to the final selection of a silicone RTV/additive-loaded compound which meets almost all program requirements. The very low valued properties found are within a realistic level of design toleration. Complete formulation, processing, and test data is provided for this compound, EPOCAST 87517-A/B, and the other formulations prepared by the project. Details of those test methods are presented along with procedures utilized in the program. In addition, a description of the special flammability facility previously designed and then modified for this program is also presented.

Lieberman, S. L.

Additives to reduce susceptibility of thermosets and thermoplastics to erosion from atomic oxygen

Polymeric materials have many attractive features such as light weight, high strength, and broad applicability in the form of films, fibers, and molded objects. In low earth orbit (LEO), these materials, when exposed on the exterior of the spacecraft, have the serious disadvantage of being susceptible to erosion by atomic oxygen (AO). AO is the most common chemical species at LEO altitudes. AO can be an extremely efficient oxidizing agent as was apparent from the extensive erosion of organic films exposed in STS missions. The mechanism for erosion involves the reaction of oxygen atoms at the surface of the substrate to form small molecular species. The susceptibility of polymeric materials varies with their chemical composition. Films with silicon atoms incorporated in the molecular structures have large coefficients of thermal expansion. This limits their utility. In an alternative approach additives were sought that mix physically and form a protective oxide layer when the film is exposed to AO. A large number of organic compounds containing silicon, germanium, or tin atoms were screened. Most were found to have very limited solubility in the polyetherimide (Ultem) films that were being protected from AO. However, one, bis(triphenyl tin) oxide, (BTO), is miscible in Ultem up to about 25 percent. Films of Ultem polyimide containing up to 25 wt percent BTO were prepared by evaporation of solvent from a solution of Ultem and BTO. The effects of AO on these films were simulated in the oxygen atmosphere of a radio frequency glow-discharge chamber. In the second part of this study, atoms were incorporated in epoxy resins. Experiments are in progress to measure the resistance of films of the cured epoxy to AO in the discharge chamber.

Orwoll, Robert A.

Radiation Response of Emerging High Gain, Low Noise Detectors

Data illustrating the radiation response of emerging high gain, low noise detectors are presented. Ionizing dose testing of silicon internal discrete avalanche photodiodes, and 51-MeV proton testing of InGaAs/InAlAs avalanche photodiodes operated in Geiger mode are discussed.

avalanche photodiodes

Studies in silazane chemistry

Chemistry of silazane compounds and application of data to synthesis of silicon-nitrogen linkage polymer compounds

ORGANIC SILICON COMPOUND

Analysis of strain in ion implanted 4H-SiC by fringes observed in synchrotron X-ray topography

A novel high energy implantation system has been successfully developed to fabricate 4H-SiC superjunction devices for medium and high voltage via implantation of dopant atoms with multi-energies ranging from 13 to 66 MeV. The significantly higher levels of energy used compared to conventional implantation processes, necessitates detailed characterization of the lattice damage caused by implantation. To achieve this by employing the novel high energy system, 4H-SiC wafer with 12 μm epilayers were blanket implanted by 13.8–65.7 MeV Al atoms. The lattice damages induced by the implantation were primarily characterized by Synchrotron X-ray Plane Wave Topography (SXPWT) and Reciprocal Space Mapping (RSM). Topographs reveal fringe contrast akin to multiple asymmetric diffraction peaks with an angular separation of only 2″ (arcseconds) observed on rocking curves, indicating inhomogeneous strain distribution across the implanted layer. The strain profile of the implanted layer was extracted from the fringe contrast by applying Rocking-curve Analysis by Dynamical Simulation (RADS). In conclusion, the maximum strain value is similar to that measured on the RSM.

A1. Characterization

Instruction manual for epitaxial apparatus

Instruction manual for apparatus using programmer operation of electronic valves for etching and growth of single crystal silicon, deposition of silicon dioxide, and nucleation site treatment

MANUAL