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At least 55 records · Page 3

Design, fabrication and expected performance of the HEAO-B X ray telescope

The X-ray telescope of the second High Energy Astronomy Observatory (HEAO-B) is described. The design consists of four concentric paraboloid/hyperboloid pairs. Focal length is 3.44 meters, paraboloid diameters vary from 580-336 mm, grazing angles vary from 70 to 40 arcmin for paraxial rays, segment lengths are 511 mm. The reflecting surfaces are nickel-coated fused quartz and the resolution is limited by assembly errors (for small field angles) and design aberrations (for large field angles). The local slope, roundness, and surface roughness are identified as the primary optical tolerances connected with the individual elements.

Van Speybroeck, L. P.↗

Primary aberrations for grazing incidence

Beginning with exact relations between object and image coordinates for a single reflective surface, a systematic analysis of general grazing incidence systems is presented. A complete set of primary aberrations for single-element and two-element systems is developed. The importance of a judicious choice for a coordinate system in showing field curvature to be clearly the predominant aberration for a two-element system is discussed. The validity of the theory is verified through comparisons with the exact ray-trace results for the case of a telescope.

Winkler, C. E.↗

Tunable-Bandwidth Filter System

A tunable-bandwidth filter system (TBFS), now undergoing development, is intended to be part of a remote sensing multispectral imaging system that will operate in the visible and near infrared spectral region (wavelengths from 400 to 900 nm). Attributes of the TBFS include rapid tunability of the pass band over a wide wavelength range and high transmission efficiency. The TBFS is based on a unique integration of two pairs of broadband Raman reflection holographic filters with two rotating spherical lenses. In experiments, a prototype of the TBFS, was shown to be capable of spectral sampling of images in the visible range over a 200 nm spectral range with a spectral resolution of 30 nm. The figure depicts the optical layout of a prototype of the TBFS as part of a laboratory multispectral imaging system for the spectral sampling of color test images in two orthogonal polarizations. Each pair of broadband Raman reflection holographic filters is mounted at an equatorial plane between two halves of a spherical lens. The two filters in each pair are characterized by steep spectral slopes (equivalently, narrow spectral edges), no ripple or side lobes in their pass bands, and a few nanometers of non-overlapping wavelength range between their pass bands. Each spherical lens and thus the filter pair within it is rotated in order to rapidly tune its pass band. The rotations of are effected by electronically controlled, programmable, high-precision rotation stages. The rotations are coordinated by electronic circuits operating under overall supervision of a personal computer in order to obtain the desired variation of the overall pass bands with time. Embedding the filters inside the spherical lenses increases the range of the hologram incidence angles, making it possible to continuously tune the pass and stop bands of the filters over a wider wavelength range. In addition, each spherical lens also serves as part of the imaging optics: The telephoto lens focuses incoming light to a field stop that is also a focal point of each spherical lens. A correcting lens in front of the field stop compensates for the spherical aberration of the spherical lenses. The front surface of each spherical lens collimates the light coming from the field stop. After the collimated light passes through the filter in the spherical lens, the rear surface of the lens focuses the light onto a charge-coupled-device image detector.

Bailey, John W.↗

Tunable-Bandwidth Filter System

A tunable-bandwidth filter system (TBFS), now undergoing development, is intended to be part of a remote-sensing multispectral imaging system that will operate in the visible and near infrared spectral region (wavelengths from 400 to 900 nm). Attributes of the TBFS include rapid tunability of the pass band over a wide wavelength range and high transmission efficiency. The TBFS is based on a unique integration of two pairs of broadband Raman reflection holographic filters with two rotating spherical lenses. In experiments, a prototype of the TBFS was shown to be capable of spectral sampling of images in the visible range over a 200-nm spectral range with a spectral resolution of .30 nm. The figure depicts the optical layout of a prototype of the TBFS as part of a laboratory multispectral imaging system for the spectral sampling of color test images in two orthogonal polarizations. Each pair of broadband Raman reflection holographic filters is mounted at an equatorial plane between two halves of a spherical lens. The two filters in each pair are characterized by steep spectral slopes (equivalently, narrow spectral edges), no ripple or side lobes in their pass bands, and a few nanometers of non-overlapping wavelength range between their pass bands. Each spherical lens and thus the filter pair within it is rotated in order to rapidly tune its pass band. The rotations of the lenses are effected by electronically controlled, programmable, high-precision rotation stages. The rotations are coordinated by electronic circuits operating under overall supervision of a personal computer in order to obtain the desired variation of the overall pass bands with time. Embedding the filters inside the spherical lenses increases the range of the hologram incidence angles, making it possible to continuously tune the pass and stop bands of the filters over a wider wavelength range. In addition, each spherical lens also serves as part of the imaging optics: The telephoto lens focuses incoming light to a field stop that is also a focal point of each spherical lens. A correcting lens in front of the field stop compensates for the spherical aberration of the spherical lenses. The front surface of each spherical lens collimates the light coming from the field stop. After the collimated light passes through the filter in the spherical lens, the rear surface of the lens focuses the light onto a charge-coupled-device image detector.

Aye, Tin↗

Nonstandard representations of aspheric surfaces in a telescope design

Space-based telescopes for sub-mm astronomy may require large, segmented primary mirrors. While spherical segments are the easiest to manufacture and test, a fast sphere produces large aberrations which must be corrected by one or more aspheric surfaces. Attention is presently given to an f/10 system with an f/0.7 spherical primary mirror and a field of view of + or - 1.5 min of arc. The third and fourth mirrors are conics, and the secondary is a 24th-degree power series on a base sphere. For sub-mm astronomy, a reasonable target for this design is a diffraction-limited image at 30 microns. In an effort to improve performance, the Wassermann-Wolf (1949) approach to aspheric design was applied.

Rodgers, J. M.↗

Formula for the rms blur circle radius of Wolter telescope based on aberration theory

A formula for the rms blur circle for Wolter telescopes has been derived using the transverse ray aberration expressions of Saha (1985), Saha (1984), and Saha (1986). The resulting formula for the rms blur circle radius over an image plane and a formula for the surface of best focus based on third-, fifth-, and seventh-order aberration theory predict results in good agreement with exact ray tracing. It has also been shown that one of the two terms in the empirical formula of VanSpeybroeck and Chase (1972), for the rms blur circle radius of a Wolter I telescope can be justified by the aberration theory results. Numerical results are given comparing the rms blur radius and the surface of best focus vs the half-field angle computed by skew ray tracing and from analytical formulas for grazing incidence Wolter I-II telescopes and a normal incidence Cassegrain telescope.

Shealy, David L.↗

Phase Sensor for Aligning a Segmented Telescope Mirror

A phase sensor has been developed for use in aligning a segmented telescope mirror to within a fraction of a wavelength in piston. (As used here, piston signifies displacement of a mirror segment along the optical axis of the telescope.) Such precise alignment is necessary in order to realize the full benefit of the large aperture achievable through segmentation. This phase sensor is achromatic. It is based on two-wavelength shearing interferometry, and can be modified to utilize an extended or broad-band (e.g., white) light source. The sensor optics include a ruled diffraction grating and an imaging lens. The sensor can measure the piston shift between segments as well as aberrations of the segments. It can measure the surface error of an individual segment, making it possible to compensate for the error with optimal amount(s) of piston and/or tilt. The precise capture range of the sensor depends partly on the telescope design; the largest relative piston shifts measurable by use of this sensor are of the order of 100 m. The accuracy of the sensor also depends partly on the telescope design; in general, the accuracy is sufficient to enable alignment to within approximately half a wavelength. The interferometric image is digitized and processed by a simple algorithm in real time, and the output of the algorithm can be used to maintain alignment in real time, even in the presence of atmospheric turbulence. The sensor is robust. Through calibration, it can be made insensitive to (and, hence, tolerant of) misalignments and aberrations of its own optics, most aberrations of the telescope as a whole (in contradistinction to aberrations of individual segments), and most aberrations introduced by atmospheric turbulence

Stahl, Philip↗

Binary pseudo-random array standards for calibration of 3D optical surface profilers used for metrology with significantly curved x-ray optics

High-accuracy metrology is vitally important in manufacturing ultra-high-quality free-form mirrors designed to manipulate X-ray light with nanometer-scale wavelengths. The current capabilities and possibility for improvements in X-ray mirror manufacturing are limited by inherent imperfections of the integrated metrology tools. In the case of Fizeau interferometry, metrology tools are currently calibrated with super-polished flat test-standard/reference mirrors. This is acceptable for measuring slightly curved X-ray optics. However, for even moderately curved aspherical X-ray mirrors the flat-reference calibration is not sufficiently accurate and stitching Fizeau interferometer-based surface metrology is used to mitigate the problem. But still, the retrace and aberration errors, as well as the limited spatial resolution, described with the instrument transfer function (ITF), can be transferred into the optical surface topography of X-ray mirrors obtained in stitching metrology. For ITF calibration, we have developed an original technique, based on test standards structured as two-dimensional (2D) highly-randomized (HR) binary pseudo-random arrays (BPRAs). The technique employs the unique properties of the HR BPRA patterns in the spatial frequency domain., i.e. the inherent 2D power spectral density of the HR BPRA pattern has a deterministic white-noise-like character that allows direct determination of the ITF with uniform sensitivity over the entire spatial frequency range and field-of-view of an instrument. Here, we explore technological, metrological, and analytical aspects essential for calibration of the retrace and aberration errors of Fizeau interferometers using different types of tilted test samples, including a super-polished reference mirror for the re-trace calibration and the uniformly redundant array (URA) BPRA standards for the geometrical distortion (aberration) calibration. While the first method was previously demonstrated by researchers at DIAMOND Light Source, a method based on the URA BPRA is described and demonstrated here for the first time. We outline the design and fabrication process used in fabrication of URA BPRA test standards, and present the results of application of the URA BPRA standards demonstrating the high efficacy of our approach to geometrical distortion calibration of Fizeau interferometers. We also discuss the possible sources of unexpected peculiarities of the systematic errors, including an astigmatic character of the retrace error, observed with Fizeau interferometers at the Advanced Light Source X-Ray Optics Laboratory.

Munechika, Keiko↗

ScO x rich surface terminations on lanthanide scandate nanoparticles

We report that the lanthanide scandate materials are widely used substrates for thin film growth and the potential applications of the LnScO 3 materials continue to grow with the recent ability to synthesize them as cuboidal faceted nanoparticles. A comprehensive understanding of the surface structure and chemistry of these oxides is essential for their informed application, either as single crystal or high surface area nanoparticle substrates. Here the {100} pseudocubic surfaces of LnScO 3 (Ln = La, Nd, Sm, Gd) nanoparticles were examined with aberration-corrected electron microscopy and higher-level density functional theory to reveal ScO x rich terminations across all investigated surfaces. Mixed terminations of single and double layer nature were observed, indicating the presence of multiple domains at the surface and introducing the possibility of synthetically controlling the surface reconstruction in the future.

36 MATERIALS SCIENCE↗

Extreme ultraviolet microscope characterization using photomask surface roughness

We demonstrate a method for characterizing the field-dependent aberrations of a full-field synchrotron-based extreme ultraviolet microscope. The statistical uniformity of the inherent, atomic-scale roughness of readily-available photomask blanks enables a self-calibrating computational procedure using images acquired under standard operation. We characterize the aberrations across a 30-um field-of-view, demonstrating a minimum aberration magnitude of smaller than λ/21 rms averaged over the center 5-um area, with a measurement accuracy better than λ/180 rms. The measured field variation of aberrations is consistent with system geometry and agrees with prior characterizations of the same system. In certain cases, it may be possible to additionally recover the illumination wavefront from the same images. Our method is general and is easily applied to coherent imaging systems with steerable illumination without requiring invasive hardware or custom test objects; hence, it provides substantial benefits when characterizing microscopes and high-resolution imaging systems in situ.

47 OTHER INSTRUMENTATION↗

Single Electron Self-coherence and Its Wave/Particle Duality in the Electron Microscope

Intensities in high-resolution phase-contrast images from electron microscopes build up discretely in time by detecting single electrons. A wave description of pulse-like coherent-inelastic interaction of an electron with matter implies a time-dependent coexistence of coherent partial waves. Their superposition forms a wave package by phase decoherence of 0.5 - 1 radian with Heisenbergs energy uncertainty ΔE H = $\hbar$/2 Δt -1 matching the energy loss ΔE of a coherent-inelastic interaction and sets the interaction time Δt. In these circumstances, the product of Planck's constant and the speed of light hc is given by the product of the expression for temporal coherence λ 2 /Δλ and the energy loss ΔE. Experimentally, the self-coherence length was measured by detecting the energy-dependent localization of scattered, plane matter waves in surface proximity exploiting the Goos–Hänchen shift. Chromatic-aberration Cc-corrected electron microscopy on boron nitride (BN) proves that the coherent crystal illumination and phase contrast are lost if the self-coherence length shrinks below the size of the crystal unit cell at ΔE > 200 eV. Finally, in perspective, the interaction time of any matter wave compares with the lifetime of a virtual particle of any elemental interaction, suggesting the present concept of coherent-inelastic interactions of matter waves might be generalizable.

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗

Fabrication of optical reflecting diffraction gratings by light-interference phenomenon

Features of technique: major reduction in cost of fabrication; gratings exhibit low stray or scattered radiation, improve signal noise ratio, and eliminate false spectral-lines; gratings can be fabricated free of optical aberrations, with high groove frequencies, and on practically any surface geometry; and fabrication time has been reduced.

Caruso, A. J.↗

Diffractive optics technology and the NASA Geostationary Earth Observatory (GEO)

Diffractive (or binary) optics offers unique capabilities for the development of large-aperture, high-performance, light-weight optical systems. The Geostationary Earth Observatory (GEO) will consist of a variety of instruments to monitor the environmental conditions of the earth and its atmosphere. The aim of this investigation is to analyze the design of the GEO instrument that is being proposed and to identify the areas in which diffractive (or binary) optics technology can make a significant impact in GEO sensor design. Several potential applications where diffractive optics may indeed serve as a key technology for improving the performance and reducing the weight and cost of the GEO sensors have been identified. Applications include the use of diffractive/refractive hybrid lenses for aft-optic imagers, diffractive telescopes for narrowband imaging, subwavelength structured surfaces for anti-reflection and polarization control, and aberration compensation for reflective imaging systems and grating spectrometers.

Morris, G. Michael↗

Telescope Wavefront Aberration Compensation with a Deformable Mirror in an Adaptive Optics System

With the goal of reducing the surface wavefront error of low-cost multi-meter-diameter mirrors from about 10 waves peak-to-valley (P-V), at lpm wavelength, to approximately 1-wave or less, we describe a method to compensate for slowly varying wavefront aberrations of telescope mirrors. A deformable mirror is utilized in an active optical compensation system. The kMS wavefront error of a 0.3m telescope improved to 0.05 waves (0.26 waves P-V) from the original value of 1.4 waves RMS (6.5 waves P-V), measured at 633nm, and the Strehl ratio improved to 89% from the original value of 0.08%.

active optics↗

In-situ transmission electron microscopy investigation on surface oxides thermal stability of niobium

Niobium is commonly used for superconducting quantum systems as readout resonators, capacitors, and interconnects. Structural defects at the Nb/Si and air/Nb interface may be a major source of two-level systems (TLS), which are detrimental to the device's coherence time. Thus, identifying and understanding the microscopic origin of possible TLS in Nb-based devices and their relationship to processing is key to superconducting qubit performance improvement. Here this work studied the structure and thermal stability of surface oxide on physical vapor deposited Nb films on Si wafers, using aberration-corrected (scanning) transmission electron microscopy and spectroscopy. Here, all Nb films exhibit columnar growth with strong [110] textures. After in-situ heating of the heterostructure at 360 °C inside the microscope, the initial amorphous niobium surface oxides decompose into face-centered cubic Nb nanograins in the amorphous Nb-O matrix, which may reduce microwave dissipation. Despite changes in the microstructure and chemistry of the niobium oxide surface layer due to heat treatment, the interface between the Nb and the surface oxide layer remains almost unchanged. Our comprehensive study of the Nb surface oxide decomposition mechanism may guide future superconducting qubit device optimization through interfacial scattering center and TLS minimization.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Effect of mid- and high-spatial frequencies on optical performance

In many of today's telescopes the effects of surface errors on image quality and scattered light are very important. The influence of optical fabrication surface errors on the performance of an optical system is discussed. The methods developed by Hopkins (1957) for aberration tolerancing and Barakat (1972) for random wavefront errors are extended to the examination of mid- and high-spatial frequency surface errors. The discussion covers a review of the basic concepts of image quality, an examination of manufacturing errors as a function of image quality performance, a demonstration of mirror scattering effects in relation to surface errors, and some comments on the nature of the correlation functions. Illustrative examples are included.

Noll, R. J.↗

A new antenna concept for satellite communications

A novel antenna configuration of two reflecting surfaces and a phased array is examined for application to satellite communications and shown to be superior in every respect to earlier designs for service to the continental United States from synchronous orbit. The vignetting that afflicts other two reflector optical systems is eliminated by use of a reflecting field element. The remaining aberrations, predominantly coma, are isolated in the time delay distribution at the surface of the array and can be compensated by ordinary array techniques. The optics exhibits infinite bandwidth and the frequency range is limited only by the design of the array.

Skahill, G.↗

Designing Aberration-Corrected Solid Unstable Resonators

In improved method of designing solid unstable resonator of laser diode, shapes of mirrors calculated to yield specified mode. Ray tracing used to compute shape of initially unspecified end mirror, given shape of initially specified end mirror and specified output mode. No need to accept aberrations or suboptimal circular shapes, to make iterative design computations in effort to converge on desired mode, or to assume paraxiality of rays: Angles between rays and optical axis large, cross sections of surfaces noncircular, and computed shape of end mirror exact. End mirror corrects for all aberrations.

Lang, Robert J.↗