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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 55 records · Page 3
All sourcesNASA NTRSDOE OSTI
NASA NTRS1972

A study of the properties of beryllium doped silicon with particular emphasis on diffusion mechanisms: Profiles of depth dependent conductivity as determined by electrical surface probes

Very large diffusion coefficients were encountered and required the determination of impurity profiles for samples approximately 1 cm thick. Since conductivity values are readily converted into concentrations of electrically active impurities, the major problem became that of accurately determining the conductivity profiles of beryllium diffused silicon samples. Four-point probe measurements on samples having depth conductivities are interpreted in terms of conductivity profiles, based on an exact solution of the problem of exponentially depth dependent conductivity. Applications include surface conductivity determination where the form of the conductivity profile is known, and conductivity profile determination from probe measurements taken as the sample surface is progressively lapped away. The application is limited to samples having conductivity monotonically decreasing with depth from the probed surface.

Franks, R. K.↗
DOE OSTI2014

Combining low-energy electron microscopy and scanning probe microscopy techniques for surface science: Development of a novel sample-holder

We introduce an experimental facility dedicated to surface science that combines Low-Energy Electron Microscopy/Photo-Electron Emission Microscopy (LEEM/PEEM) and variable-temperature Scanning Probe Microscopy techniques. A technical challenge has been to design a sample-holder that allows to exploit the complementary specifications of both microscopes and to preserve their optimal functionality. Experimental demonstration is reported by characterizing under ultrahigh vacuum with both techniques: Au(111) surface reconstruction and a two-layer thick graphene on 6H-SiC(0001). A set of macros to analyze LEEM/PEEM data extends the capabilities of the setup.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
DOE OSTI2016

Generalized spectral method for near-field optical microscopy

Electromagnetic interaction between a sub-wavelength particle (the “probe”) and a material surface (the “sample”) is studied theoretically. The interaction is shown to be governed by a series of resonances corresponding to surface polariton modes localized near the probe. The resonance parameters depend on the dielectric function and geometry of the probe as well as on the surface reflectivity of the material. Calculation of such resonances is carried out for several types of axisymmetric probes: spherical, spheroidal, and pear-shaped. For spheroids, an efficient numerical method is developed, capable of handling cases of large or strongly momentum-dependent surface reflectivity. Application of the method to highly resonant materials, such as aluminum oxide (by itself or covered with graphene), reveals a rich structure of multi-peak spectra and nonmonotonic approach curves, i.e., the probe-sample distance dependence. These features also strongly depend on the probe shape and optical constants of the model. For less resonant materials such as silicon oxide, the dependence is weak, so that the spheroidal model is reliable. The calculations are done within the quasistatic approximation with radiative damping included perturbatively.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2017

Quantification of in-contact probe-sample electrostatic forces with dynamic atomic force microscopy

Here, atomic force microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity is harnessed in several AFM imaging modes. Here, we demonstrate a cantilever-resonance-based method to quantify electrostatic forces on a probe in the probe-sample junction in the presence of a surface potential or when a bias voltage is applied to the AFM probe. We find that the electrostatic forces acting on the probe tip apex can produce signals equivalent to a few pm of surface displacement. In combination with modeling, the measurements of the force were used to access the strength of the electrical field at the probe tip apex in contact with a sample. We find an evidence that the electric field strength in the junction can reach ca. 1 V nm –1 at a bias voltage of a few volts and is limited by non-ideality of the tip-sample contact. This field is sufficiently strong to significantly influence material states and kinetic processes through charge injection, Maxwell stress, shifts of phase equilibria, and reduction of energy barriers for activated processes. Besides, the results provide a baseline for accounting for the effects of local electrostatic forces in electromechanical AFM measurements as well as offer additional means to probe ionic mobility and field-induced phenomena in solids.

36 MATERIALS SCIENCE↗
NASA NTRS2018

Precious Dust Two Mission Converge on Asteroid Sample Returns

Far-flung spacecraft deliver incredible views of distant worlds. But there's nothing like bringing samples back to Earth. Instruments carried by spacecraft have limitations-of power, complexity, size, and number. Their investigations leave many fundamental questions unanswered, questions that we might be able to answer if only we had samples. This summer marks the beginning of an exciting new era in sample-return missions: NASA's OSIRIS-REx spacecraft arrives at asteroid Bennu, and the Japanese Hayabusa2 spacecraft arrives at asteroid Ryugu. Both are primitive asteroids-dark remnants of Solar System formation that carry carbon and water-a type of asteroid that's never been visited before. After thoroughly mapping their respective asteroids for geology and mineralogy, each probe will collect surface samples and return them to Earth. I can't wait to study them in my laboratory. Cosmic-dust pioneer Kazu Tomeoka introduced me to the dream of sample-return missions 20 years ago. In those days, the only returned extraterrestrial samples were from the Moon. He said to his students, "In the near future, we will be able to collect samples from asteroids and comets. There will be no need to wait for meteorites or cosmic dust to come and fall from the sky. And some of you might be the first to look at those samples." This inspired my life's work: laboratory analysis of returned astromaterials.

Nakamura-Messenger, Keiko↗
DOE OSTI2014

Formation of a memristor matrix based on titanium oxide and investigation by probe-nanotechnology methods

The results of investigation of a memristor-matrix model on the basis of titanium-oxide nanoscale structures (ONSs) fabricated by methods of focused ion beams and atomic-force microscopy (AFM) are presented. The effect of the intensity of interaction between the AFM probe and the sample surface on the memristor effect in the titanium ONS is shown. The memristor effect in the titanium ONS is investigated by an AFM in the mode of spreading-resistance map. The possibility of the recording and erasure of information in the submicron cells is shown on the basis of using the memristor effect in the titanium ONS, which is most promising for developing the technological processes of the formation of resistive operation memory cells.

36 MATERIALS SCIENCE↗
DOE OSTI2017

Constant-Distance Mode Nanospray Desorption Electrospray Ionization Mass Spectrometry Imaging of Biological Samples with Complex Topography

A new approach for constant distance mode mass spectrometry imaging of biological samples using nanospray desorption electrospray ionization (nano-DESI MSI) was developed by integrating a shear-force probe with nano-DESI probe. The technical concept and basic instrumental setup as well as general operation of the system are described. Mechanical dampening of resonant oscillations due to the presence of shear forces between the probe and the sample surface enables constant-distance imaging mode via a computer controlled closed feedback loop. The capability of simultaneous chemical and topographic imaging of complex biological samples is demonstrated using living Bacillus Subtilis ATCC 49760 colonies on agar plates. The constant-distance mode nano-DESI MSI enabled imaging of many metabolites including non-ribosomal peptides (surfactin, plipastatin and iturin) and iron-bound heme on the surface of living bacterial colonies ranging in diameter from 10 mm to 13 mm with height variations of up to 0.8 mm above the agar plate. Co-registration of ion images to topographic images provided higher-contrast images. Constant-mode nano-DESI MSI is ideally suited for imaging biological samples of complex topography in their native state.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
DOE OSTI2015

Co-registered Topographical, Band Excitation Nanomechanical, and Mass Spectral Imaging Using a Combined Atomic Force Microscopy/Mass Spectrometry Platform

The advancement of a hybrid atomic force microscopy/mass spectrometry imaging platform demonstrating for the first time co-registered topographical, band excitation nanomechanical, and mass spectral imaging of a surface using a single instrument is reported. The mass spectrometry-based chemical imaging component of the system utilized nanothermal analysis probes for pyrolytic surface sampling followed by atmospheric pressure chemical ionization of the gas phase species produced with subsequent mass analysis. We discuss the basic instrumental setup and operation and the multimodal imaging capability and utility are demonstrated using a phase separated polystyrene/poly(2-vinylpyridine) polymer blend thin film. The topography and band excitation images showed that the valley and plateau regions of the thin film surface were comprised primarily of one of the two polymers in the blend with the mass spectral chemical image used to definitively identify the polymers at the different locations. Data point pixel size for the topography (390 nm x 390 nm), band excitation (781 nm x 781 nm), mass spectrometry (690 nm x 500 nm) images was comparable and submicrometer in all three cases, but the data voxel size for each of the three images was dramatically different. The topography image was uniquely a surface measurement, whereas the band excitation image included information from an estimated 10 nm deep into the sample and the mass spectral image from 110-140 nm in depth. Moreover, because of this dramatic sampling depth variance, some differences in the band excitation and mass spectrometry chemical images were observed and were interpreted to indicate the presence of a buried interface in the sample. The spatial resolution of the mass spectral image was estimated to be between 1.5 m 2.6 m, based on the ability to distinguish surface features in that image that were also observed in the other images.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
DOE OSTI2012

Neutron and X-Ray Studies of Advanced Materials V: CENTENNIAL Symposium

In 2012 the diffraction community will celebrate 100 years since the prediction of X-ray diffraction by M. Laue, and following his suggestion the first beautiful diffraction experiment by W. Friedrich and P. Knipping. The significance of techniques based on the analysis of the diffraction of X-rays, neutrons, electrons and Mossbauer photons discovered later, has continued to increase in the past 100 years. The aim of this symposium is to provide a forum for discussion of using state-of-the-art neutron and X-ray scattering techniques for probing advanced materials. These techniques have been widely used to characterize materials structures across all length scales, from atomic to nano, meso, and macroscopic scales. With the development of sample environments, in-situ experiments, e.g., at temperatures and applied mechanical load, are becoming routine. The development of ultra-brilliant third-generation synchrotron X-ray sources, together with advances in X-ray optics, has created intense X-ray microbeams, which provide the best opportunities for in-depth understanding of mechanical behavior in a broad spectrum of materials. Important applications include ultra-sensitive elemental detection by X-ray fluorescence/absorption and microdiffraction to identify phase and strain with submicrometer spatial resolution. X-ray microdiffraction is a particularly exciting application compared with alternative probes of crystalline structure, orientation and strain. X-ray microdiffraction is non-destructive with good strain resolution, competitive or superior spatial resolution in thick samples, and with the ability to probe below the sample surface. Advances in neutron sources and instrumentation also bring new opportunities in neutron scattering research. In addition to characterizing the structures, neutrons are also a great tool for elucidating the dynamics of materials. Because neutrons are highly penetrating, neutrons have been used to map stress in engineering systems. Neutrons have also played a vital role in our understanding of the magnetism and magnetic properties. Specialized instruments have been built to gain physical insights of the fundamental mechanisms governing phase transformation and mechanical behaviors of materials. The application of those techniques, in combination with theoretical simulations and numerical modeling, will lead to major breakthroughs in materials science in the foreseeable future that will contribute to the development of materials technology and industrial innovation.

36 MATERIALS SCIENCE↗
NASA NTRS2006

NASA's 2004 In-Space Propulsion Refocus Studies for New Frontiers Class Missions

The New Frontiers (NF) program is designed to provide opportunities to fulfill the science objectives for top priority, medium class missions identified in the Decadal Solar System Exploration Survey. This paper assesses the applicability of the In-Space Propulsion s (ISP) Solar Electric Propulsion (SEP) technologies for representative NF class missions that include a Jupiter Polar Orbiter with Probes (JPOP), Comet Surface Sample Return (CSSR), and two different Titan missions. The SEP technologies evaluated include the 7-kW, 4,100-second NASA's Evolutionary Xenon Thruster (NEXT), the 3-kW, 2,700-second Hall thruster, and two different NASA Solar Electric Propulsion Technology Readiness (NSTAR) thrusters that are variants of the Deep Space 1 (DS1) thruster. One type of NSTAR, a 2.6-kW, 3,100-second thruster, will be the primary propulsion system for the DAWN mission that is scheduled to launch in 2006; the other is an "enhanced", higher power variant (3.8-kW, 4,100-second) and is so-called because it uses NEXT system components such as the NEXT power processing unit (PPU). The results show that SEP is applicable for the CSSR mission and a Titan Lander mission. In addition, NEXT has improved its applicability for these types of missions by modifying its thruster performance relative to its performance at the beginning of this study.

Witzberger, Kevin E.↗
DOE OSTI2012

Using eigenmodes to perform the inverse problem associated with resonant ultrasound spectroscopy

In principle, resonant ultrasonic spectroscopy (RUS) can be used to characterize any parameter that influences the mechanical resonant response of a sample. Examples include the elastic constants, sample dimensions, and crystal orientation. Extracting the parameter of interest involves performing the inverse problem, which typically entails an iterative routine that compares calculated and measured eigenfrequencies. Here, we propose an alternative method based on laser-based resonant ultrasound spectroscopy (LRUS) that uses the eigenmodes. LRUS uses a pulsed laser to thermoelastically excite ultrasound and an interferometer to detect out-of-plane displacement associated with ultrasonic resonances. By raster scanning the probe along the sample surface, an image of the out-ofplane displacement pattern (i.e., eigenmode) is obtained. As an example of this method, we describe a technique to calculate the crystallographic orientation of a single-crystal high-purity copper sample. The crystallographic orientation is computed by comparing theoretical and experimental eigenmodes. The computed angle is shown to be in very good agreement with the angle obtained using electron backscatter diffraction. In addition, a comparison is made using eigenfrequencies and eigenmodes to calculate the crystallographic orientation. It is found for this particular application, the eigenmode method has superior sensitivity to crystal orientation.

11 NUCLEAR FUEL CYCLE AND FUEL MATERIALS↗
DOE OSTI2022

Analysis of solid uranium particulates on cotton swipes with an automated microextraction-ICP-MS system

Here, an automated microextraction method coupled to an inductively coupled plasma – mass spectrometer (ICP-MS) was developed for the direct analysis of solid uranium particulates on the surface of cotton swipes. The microextraction probe extracts particulates from the sample surface, in a flowing solvent, and directs the removed analyte to an ICP-MS for isotopic determination. The automated system utilizes a mechanical XY stage that is software controlled with the capability of saving and returning to specific locations and a camera focused to the swipe surface for optimal viewing of the extracted locations (i.e., material present). Here, particulates (n = 135) were extracted and measured by ICP-MS, including 35 depleted uranyl nitrate hexahydrate (UN) (used for mass bias corrections), 50 uranyl fluoride (UO 2 F 2 ), and 50 uranyl acetate (UAc) particulates. Blank extractions were performed on the cotton swipes between triplicate sample analyses. Between each swipe extraction, the probe was sent between two wells containing 10% and 5% HNO 3 to clean the probe head and to eliminate any analyte carryover between particulates. The measured 235 U/ 238 U and 234 U/ 238 U isotope ratios for the UO 2 F 2 particulates were 0.00725(8) and 0.000054(4), a percent relative difference (% RD) of –0.041% and –1.7% from the reference isotope ratios determined in-lab through multi-collector ICP-MS analysis of dissolved aliquots of the U material. The UAc samples had a measured 235 U/ 238 U isotope ratio of 0.00206(7), a –0.96% relative difference from the reference value of 0.00208(1). The 234 U/ 238 U and 236 U/ 238 U isotope ratios were 0.000008(1) and 0.000031(4), –5.1% RD and –4.3% RD, respectively. The automated sample stage enabled seamless and rapid particle analysis, leading to a significant increase in throughput versus what was previously possible. Additionally, the saved location capability reduced user sampling error as sampling locations were easily stored and recalled. Analysis of U particles on the swipe surface – including blanks, mass bias, and triplicate extractions – was completed in less than an hour without any sample preparation necessary.

47 OTHER INSTRUMENTATION↗
DOE OSTI2022

Capture probe

A system and method for sampling a sample material includes a device for directing sample into a capture probe. The device for supplying sample material to the probe can be a device for radiating energy to the surface to eject sample from the sample material. A probe includes an outer probe housing having an open end. A liquid supply conduit has an outlet positioned to deliver liquid to the open end. An exhaust conduit removes liquid from the open end of the housing. The liquid supply conduit can be connectable to a liquid supply for delivering liquid at a first volumetric flow rate to the open end of the housing. A liquid exhaust system can be in fluid connection with the liquid exhaust conduit for removing liquid from the liquid exhaust conduit at a second volumetric flow rate such that gas with sample is withdrawn with the liquid.

Kertesz, Vilmos↗
DOE OSTI2014

Transmission Geometry Laser Ablation into a Non-Contact Liquid Vortex Capture Probe for Mass Spectrometry Imaging

RATIONALE: Capture of material from a laser ablation plume into a continuous flow stream of solvent provides the means for uninterrupted sampling, transport and ionization of collected material for coupling with mass spectral analysis. Reported here is the use of vertically aligned transmission geometry laser ablation in combination with a new non-contact liquid vortex capture probe coupled with electrospray ionization for spot sampling and chemical imaging with mass spectrometry. Methods: A vertically aligned continuous flow liquid vortex capture probe was positioned directly underneath a sample surface in a transmission geometry laser ablation (355 nm, 10 Hz, 7 ns pulse width) setup to capture into solution the ablated material. The outlet of the vortex probe was coupled to the Turbo V ion source of an AB SCIEX TripleTOF 5600+ mass spectrometer. System operation and performance metrics were tested using inked patterns and thin tissue sections. Glass slides and slides designed especially for laser capture microdissection, viz., DIRECTOR slides and PEN 1.0 (polyethylene naphthalate) membrane slides, were used as sample substrates. Results: The estimated capture efficiency of laser ablated material was 24%, which was enabled by the use of a probe with large liquid surface area (~ 2.8 mm2) and with gravity to help direct ablated material vertically down towards the probe. The swirling vortex action of the liquid surface potentially enhanced capture and dissolution of not only particulates, but also gaseous products of the laser ablation. The use of DIRECTOR slides and PEN 1.0 (polyethylene naphthalate) membrane slides as sample substrates enabled effective ablation of a wide range of sample types (basic blue 7, polypropylene glycol, insulin and cyctochrome c) without photodamage using a UV laser. Imaging resolution of about 6 m was demonstrated for stamped ink on DIRECTOR slides based on the ability to distinguish features present both in the optical and in the chemical image. This imaging resolution was 20 times better than the previous best reported results with laser ablation/liquid sample capture mass spectrometry imaging. Using thin sections of brain tissue the chemical image of a selected lipid was obtained with an estimated imaging resolution of about 50 um. Conclusions: A vertically aligned, transmission geometry laser ablation liquid vortex capture probe, electrospray ionization mass spectrometry system provides an effective means for spatially resolved spot sampling and imaging with mass spectrometry.

DIRECTOR slides↗
DOE OSTI2018

Green’s function for a sharpened and metal-coated dielectric probe

In apertureless scanning-probe optical microscopy and in the case of more traditional scanned optical probes coated with a metal that is thin near the probe tip (in lieu of an aperture), samples are probed via interaction between the probe and surface. In the nanometer-scale region between the tip and the sample, the field can be approximated by quasi-electrostatic analytics. Hence, the coated probe can be modeled as in the present case as a hyperboloid of revolution without the need for hyperboloidal wave functions in the near zone. The solutions to Laplace’s equation and in general Green’s function with the application of the boundary conditions, therefore, yield an appropriate approximation and allow a completely analytical solution for the resonance effects upon the probe tip to be obtained. In conclusion, the large field enhancements due to the sharpness of the tip and to surface plasmon fields may thus be analytically examined.

47 OTHER INSTRUMENTATION↗
DOE OSTI2017

2D-imaging of sampling-probe perturbations in laminar premixed flames using Kr X-ray fluorescence

The perturbation of the temperature field caused by a quartz sampling probe has been investigated in a fuel-rich low-pressure premixed ethylene/oxygen/argon/krypton flame using X-ray fluorescence. The experiments were performed at the 7-BM beamline at the Advanced Photon Source (APS) at the Argonne National Laboratory where a continuous beam of X-rays at 15 keV was used to excite krypton atoms that were added to the unburnt flame gases in a concentration of 5% (by volume). The resulting krypton X-ray fluorescence at 12.65 keV was collected and the spatially resolved signal was subsequently converted into the local temperature of the imaged spot. One and two dimensional scans of the temperature field were obtained by translating the entire flame chamber through a pre-programmed sequence of positions on high precision translation stages and measuring the X-ray fluorescence at each location. Multiple measurements were performed at various separations between the burner surface and probe tip, representing sampling positions from the preheat, reaction, and postflame zones of the low-pressure flame. Distortions of up to 1000 K of the burner-probe centerline flame temperature were found with the tip of the probe in the preheat zone and distortions of up to 500 K were observed with it in the reaction and postflame zones. Furthermore, perturbations of the temperature field have been revealed that radially reach as far as 20 mm from the burner-probe centerline and about 3 mm in front of the probe tip. Finally, these results clearly reveal the limitations of one-dimensional models for predicting flame-sampling experiments and comments are made with regard to model developments and validations based on quantitative speciation data from low-pressure flames obtained via intrusive sampling techniques.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
DOE OSTI2023

Multislice forward modeling of coherent surface scattering imaging on surface and interfacial structures

To study nanostructures on substrates, surface-sensitive reflection-geometry scattering techniques such as grazing incident small angle X-ray scattering are commonly used to yield an averaged statistical structural information of the surface sample. Grazing incidence geometry can probe the absolute three-dimensional structural morphology of the sample if a highly coherent beam is used. Coherent surface scattering imaging (CSSI) is a powerful yet non-invasive technique similar to coherent X-ray diffractive imaging (CDI) but performed at small angles and grazing-incidence reflection geometry. A challenge with CSSI is that conventional CDI reconstruction techniques cannot be directly applied to CSSI because the Fourier-transform-based forward models cannot reproduce the dynamical scattering phenomenon near the critical angle of total external reflection of the substrate-supported samples. To overcome this challenge, we have developed a multislice forward model which can successfully simulate the dynamical or multi-beam scattering generated from surface structures and the underlying substrate. The forward model is also demonstrated to be able to reconstruct an elongated 3D pattern from a single shot scattering image in the CSSI geometry through fast-performing CUDA-assisted PyTorch optimization with automatic differentiation.

77 NANOSCIENCE AND NANOTECHNOLOGY↗