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At least 55 records · Page 3

Lunar sample analysis

The surface composition of two samples from the highly shocked, glass-coated lunar basalt (12054) and from four glass-coated fragments from the 1-2 mm (14161) fines were examined by X-ray photoemission spectroscopy to determine whether the agglutination process itself is responsible for the difference between their surface and bulk compositions. Auger electron spectroscopy of glass balls from the 15425 and 74001 fines were analyzed to understand the nature, extent, and behavior of volatile phases associated with lunar volcanism. Initial results indicate that (1) volatiles, in the outer few atomic layers sampled, vary considerably from ball to ball; (2) variability over the surface of individual balls is smaller; (3) the dominant volatiles on the balls are S and Zn; and (4) other volatiles commonly observed are P, Cl, and K.

Housley, R. M.↗

Geochemical and spectral characterization of naturally altered rock surfaces

The possibility of using the visible-near infrared region for compositional analysis of remotely sensed rock surfaces is studied. This would allow mapping rock type both on the Earth's surface and on other planetary surfaces. Reflectance spectroscopy, economic geology, optical depth determination, and X-ray diffraction mineralogy are discussed.

Chang, L. L. Y.↗

Photoelectron Spectroscopy for Identification of Chemical States

The technique of X-ray photoelectron spectroscopy and the fundamental electronic interactions constituting the basis of the method will be discussed. The method provides information about chemical states ("oxidation states") of atoms in molecules. In addition, quantitative elemental analysis can be performed using the same method. On the basis of this information identification of chemical species is possible. Examples of applications are discussed with particular references to the study of smog particulate matter.

Novakov, T.↗

Chemical composition of the SiO2/InSb interface as determined by X-ray photoelectron spectroscopy

In connection with the relatively poor insulating characteristics of the native oxides of most III-V compound semiconductors, there has been interest in the development of deposited dielectric layers for surface passivation and MOS device fabrication on III-V compound semiconductor substrates. The chemical system of SiO2 deposited on single-crystal InSb substrates has been proposed for the fabrication of IR CCD. The considered investigation is concerned with a detailed examination of the chemical nature of the interactions between deposited and native oxides using X-ray photoelectron spectroscopy (XPS) in conjunction with a chemical-etching technique for depth profiling. The compositional structure of the interfaces obtained in the SiO2/native oxide/InSb system is derived on the basis of an intensity analysis of XPS spectra. Thermal oxidation of the InSb substrate is found to result in an In-rich native oxide and excess elemental Sb at the native oxide/substrate interface.

Vasquez, R. P.↗

Surface chemistry of iron sliding in air and nitrogen lubricated with hexadecane and hexadecane containing dibenzyl-dilsulfide

Wear experiments were conducted on iron sliding in hexadecane and hexadecane plus one weight percent dibenzyl dilsulfide (DBDS) in atmospheres of air and nitrogen at room temperature. The wear scars and the wear debris were analyzed by X-ray photoelectron spectroscopy. The presence of air reduced wear but increased friction, while DBDS reduced friction but had little effect on wear except that the wear increased somewhat when DBDS was used in air. Wear scar analysis indicated that oxygen and sulfur competed chemically for the surface, with the oxide predominating. Low wear was associated with a thick oxide layer and low friction with a thin predominantly sulfide layer. Analysis of the wear debris indicated the presence of a sulfate in the high wear case (hexadecane plus DBDS in air), and showed the presence of an organic sulfide in the low wear case (Hexadecane plus DBDS in nitrogen).

Wheeler, D. R.↗

Determination of physical and chemical states of lubricants in concentrated contacts, part 2

Infrared emission spectroscopy through a window in an operating bearing continued to provide most of the information gathered on the state of lubricants subjected to elastohydrodynamic (EHD) conditions. Other measurements were traction, scanning electron microscopy and elemental surface analysis X-rays. A very significant finding was the decomposition of a naphthenic oil lubricant in the presence of small concentrations of an organic chloride. Olefins and aromatics were formed in ever increasing amounts prior to total lubricant failure. An aromatic fluid also failed in the presence of chloride. A correlation was found between changes of the alignment of lubricant molecules evidence by infrared polarization and changes of traction under varying EHD stresses.

Lauer, J. L.↗

Tribological properties and surface chemistry of silicon carbide at temperatures to 1500 C

Silicon carbide surfaces were heated to 1500 C in a vacuum and analyzed at room temperature with X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES). The basic unit of the surfaces was considered as a plane of a tetrahedron of either SiC4 and CSi4 composition. AES spectra were obtained from 250-1500 C, with an analysis depth of 1 nm revealed the presence of little Si and mostly graphite. XPS analysis depth was 2 nm or less, and Si was found in the second 1 nm. Sliding friction tests with single-crystal silicon carbide in contact with iron in a vacuum were characterized by a stock-slip value. The coefficient of friction increased with increasing temperature up to 400 C, then decreased with increasing temperature from 400-600 C. Reheating surfaces to 800 C after preheating them to that temperature produced no changes in AES readings. It is concluded that the maximum density of silicon and silicon-carbide is at 800 C, and the higher the sliding temperature, the more metal that is transferred.

Miyoshi, K.↗

X-ray astronomical spectroscopy

The current status of the X-ray spectroscopy of celestial X-ray sources, ranging from nearby stars to distant quasars, is reviewed. Particular emphasis is placed on the role of such spectroscopy as a useful and unique tool in the elucidation of the physical parameters of the sources. The spectroscopic analysis of degenerate and nondegenerate stellar systems, galactic clusters and active galactic nuclei, and supernova remnants is discussed.

Holt, S. S.↗

X-ray line widths and coronal heating

Preliminary results of spectroscopy and imaging of a solar active region and flare plasma in soft X-ray emission lines are presented. Observed X-ray line widths in a nonflaring active region are broader than the Doppler width corresponding to the local electron temperature. An analysis of 41 soft X-ray flares within a single active region reveals a preference for flares to occur at locations that already show enhanced X-ray emission and to favor magnetic complexity over high gradient. However, flares do not appear to be directly responsible for the heating and X-ray production of the active regions.

Acton, L. W.↗

High resolution EUV spectroscopy of 56 Pegasi (KO 2p + wd)

The hypothesis that X-ray and UV emission by 56 Pegasi (K0II p + wd) originates in a conventional chromosphere, transition region and corona, as opposed to Schindler's hypothesis of accretion of the cool stellar wind onto the white dwarf companion, is discussed. Analysis of IUE data indicates that within the uncertainties associated with determining the stellar radius and abundances, the chromosphere, transition region, and corona of 56 Peg are similar to that of Beta Draconis both in structure and energy balance. The accretion hypothesis is not a unique explanation of the observed spectral properties and the white dwarf companion may not play a direct role. Furthermore, 56 Peg, according to current values of V-R and luminosity class, is on the nonsolar side of the Linsky-Haisch dividing line whereas Beta Draconis is on the solar side.

Jordan, C.↗

An investigation of adhesive/adherend and fiber matrix interactions

Research during the report period focused on continued scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS) of lap shear samples and flatwise tensile specimens and on the surface characterization of TiO2, Ti 6-4, and Ti powders with particular emphasis on their interaction with primer solutions of both polyphenylquinoxaline and LaRC-13 polyimide. The use of SEM and XPS in the analysis of Ti 6-4 adherend surfaces is described as well as differences in Ti 6-4 surface composition after different chemical pretreatments. Analysis of fractured surfaces is used to established the failure mode. The surface acidity of Ti 6-4 coupons can be established by reflectance visible spectroscopy using indicator dyes.

Beck, B.↗

Accretion flows in binary X-ray systems

Recent developments in the study of accretion flows in binary X-ray systems are reviewed, concentrating on issues concerning the gas flows rather than the radiation mechanisms. A model for Her X-1 is presented which illustrates the main structures expected to exist in the case where mass transfer is by Roche-lobe overflow and the X-ray source is a rotating magnetized neutron star. A model for Cyg X-1 is given which shows the accretion-flow structures to be expected if the compact object is a black hole, including an accretion wake and a very small accretion disk around the black hole. Physical parameters of the accretion flows in these two instances are examined along with some scale lengths that may be derived from these parameters by dimensional analysis. Detailed attention is given to neutron-star magnetospheres (for slow, intermediate, and fast rotators), accretion-disk structure, accretion from stellar winds, and the relationship between X-rays and the gas dynamics of accretion flows. It is suggested that accretion flows in binary X-ray systems be observed directly by means of high-resolution UV and X-ray spectroscopy.

Mccray, R.↗

Oxygen impurity effects at metal/silicide interfaces - Formation of silicon oxide and suboxides in the Ni/Si system

The effect of implanted oxygen impurities on the Ni/Ni2Si interface is investigated using X-ray photoelectron spectroscopy, He-4(+) backscattering and O(d, alpha)-16 N-14 nuclear reactions. Oxygen dosages corresponding to concentrations of 1, 2, and 3 atomic percent were implanted into Ni films evaporated on Si substrates. The oxygen, nickel, and silicon core lines were monitored as a function of time during in situ growth of the Ni silicide to determine the chemical nature of the diffusion barrier which forms in the presence of oxygen impurities. Analysis of the Ni, Si, and O core levels demonstrates that the formation of SiO2 is responsible for the Ni diffusion barrier rather than Ni oxide or mixed oxides, such as Ni2SiO4. It is determined that 2.2 x 10 to the 16th O/qu cm is sufficient to prevent Ni diffusion under UHV annealing conditions.

Grunthaner, P. J.↗

Metal-dielectric interactions

Metal direlectric surface interactions and dielectric films on metal substrates were investigated. Since interfacial interaction depends so heavily on the nature of the surfaces, analytical surface tools such as Auger emission spectroscopy, X-ray photoelectron spectroscopy and field ion microscopy were used to assist in surface and interfacial characterization. The results indicate that with metals contacting certain glasses in the clean state interfacial, bonding produces fractures in the glasses while when a film such as water is present, fractures occur in the metal near the interface. Friction forces were used to measure the interfacial bond strengths. Studies with metals contacting polymers using field ion microscopy revealed that strong bonding forces could develop being between a metal and polymer surface with polymer transferring to the metal surface in various ways depending upon the forces applied to the surface in contact. With the deposition of refractory carbides, silicides and borides onto metal and alloy substrates the presence of oxides at the interface or active gases in the deposition plasma were shown to alter interfacial properties and chemistry. Auger ion depth profile analysis indicated the chemical composition at the interface and this could be related to the mechanical, friction, and wear behavior of the coating.

Buckley, D. H.↗

Stellar crystal X-ray spectroscopy on OSO-8

The large-area graphite crystal X-ray spectrometer on the OSO-8 satellite is described, and its response to stellar line and continuum radiation is discussed. A high resolution X-ray spectrum of Sco X-1 obtained from a preliminary analysis of quick look data shows a strong, smooth continuum with an absence of emission or absorption features over the energy range 2.2 to 8 keV. Upper limits are set on narrow line emission from highly ionized states of S, Ca, and Fe.

Kestenbaum, H. L.↗

Definition and detailed characterization of lunar surface units using remote observations

Remote sensing techniques are reviewed in terms of their application to the study of the lunar surface. These techniques include: reflectance spectroscopy (UV and IR), X-ray and gamma-ray analysis, alpha-particle spectroscopy, thermal emission, polarimetry, photography, and visual observation. Each technique is indexed with respect to its usefulness in either describing the appearance and location of a feature, classifying the feature in terms of a broader category, or supplying additional quantitative data. Special attention is given to the mare deposits of the Imbrium basin.

Head, J. W.↗