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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 55 records · Page 3
All sourcesNASA NTRSDOE OSTI
DOE OSTI2025

Automating Bug Report Classification with Few Shot Learning

Orthogonal defect classification (ODC) is a method used to categorize software defects, providing valuable insights into the development process. This study focuses on automating the classification of software bug reports into different ODC defect types using few shot learning, a machine learning approach that requires minimal labeled data. Previous research has manually classified bug reports or used traditional machine learning algorithms like linear support vector machine, achieving limited success. Our approach uses few shot learning to improve classification accuracy and efficiency. The results show a harmonic mean of recall and precision (i.e., the F1 score) of around 0.6 which is a performance improvement over previous methods. The results highlight the potential benefit of few shot learning techniques and their application in enhancing the safety and reliability of nuclear digital instrumentation and control (DI&C) systems. Future work will explore incorporating advanced techniques to supplement the model's training data and achieve better results.

42 - ENGINEERING↗
DOE OSTI2025

Multimodal Defect Imaging of Pure Tungsten Components Fabricated via Electron Beam Powder Bed Fusion

The utilization of additive manufacturing (AM) techniques for refractory materials in high-temperature environments has significantly expanded because of the ability to fabricate geometrically complex components. Electron beam powder bed fusion (EB-PBF), which provides lower residual stress, a cleaner vacuum environment, and better efficiency for high melting point, is one of the best-suited AM methods to produce advanced refractory components. However, the property variation attributed to the heterogeneous microstructure and process-induced defects has hindered the widespread adoption of EB-PBF-produced material like tungsten. While numerous in-situ monitoring and defect detection methods have been demonstrated for EB-PBF, a workflow that compares and evaluates process-induced abnormalities from different imaging perspectives is still limited. This study examines a feature-embedded tungsten component manufactured via the EB-PBF process to demonstrate the defect detection capabilities of a multimodal defect imaging workflow. The predefined and process-induced defects are evaluated by harnessing various imaging techniques, including in-situ electron imaging, layerwise near-infrared (NIR) imaging, post-build high-energy x-ray computed tomography (CT), and conventional destructive metallography. The results highlight the strengths and limitations of distinctive defect imaging techniques concerning specific defect types, sizes, and conditions. It was found that electron imaging can provide more abnormal detection capabilities while maintaining a higher measuring accuracy, against the conventional metallography in this case study, compared with NIR and CT imaging techniques.

36 MATERIALS SCIENCE↗
NASA NTRS1986

Evaluation of multilayer printed wiring boards by metallographic techniques: An illustrated guide to the preparation and inspection of plated-through hole test coupons based on the requirements of Mil-P-55110D

This work is an illustrated handbook containing the rationale and procedure for the evaluation of multilayer printed wiring board construction integrity with respect to plated-through holes in accordance with the requirements of MIL-P-55110D, Printed Wiring Boards. It is intended as a practical aid for those concerned with determining the construction integrity of multilayer boards for high reliability applications. Photomicrographs of cross sectioned holes illustrate defect types, acceptable and unacceptable conditions, and methods of measurement. A procedure for specimen preparation is given, and appropriate paragraphs of the military specification are included and explained.

Jellison, J.↗
NASA NTRS1991

Fatigue damage accumulation in nickel prior to crack initiation

The accumulation of lattice defects during fatigue cycling of nickel was investigated by electrical resistivity measurements, positron annihilation lifetime spectroscopy and transmission electron microscopy. Dislocations and vacancy clusters were found to be the main defect types. During cycling of axial and flexural samples at constant load amplitude, the dislocations form a saturated structure early in the fatigue life. This saturated structure consists of a cellular dislocation matrix, in which persistent slip bands (PSBs) begin to operate after the saturation has been established. Vacancies and vacancy clusters are formed during fatigue as a consequence of repetitive dislocation glide in the PSB structure. When PSBs operate, the matrix is assumed to be dormant, allowing vacancies to accumulate preferentially in the PSBs. The increase in vacancy concentration then accounts for the monotonic accumulation of fatigue damage, which points to the importance of vacancy accumulation as a precursor to crack nucleation.

Grobstein, T. L.↗
NASA NTRS1996

Study Thermographic Flaw Detection

The development of thermographic inspection methods for use on aerospace structures is under investigation. Several different material systems, structural geometries and defect types have been included in this study so as to establish a baseline from which future IRT testing can be made. This study examines various thermal loading techniques in an attempt to enhance the likelihood of capturing and identifying critically sized flaws under 'non-laboratory' actual working conditions. Qualification techniques and calibration standards are also being investigated to standardize the thermographic method. In conjunction with the thermographic inspections, advanced image processing techniques including digital filtering and neural networks have been investigated to increase the ability of 91 detecting and sizing flaws. Here, the digitized thermographic images are mathematically manipulated through various filtering techniques and/or artificial neural mapping schemes to enhance its overall quality, permitting accurate flaw identification even when the signal-to-noise ratio is low.

Walker, James L.↗
NASA NTRS1996

Study Thermographic Flaw Detection

The development of thermographic inspection methods for use on aerospace structures is under investigation. Several different material systems, structural geometries and defect types have been included in this study so as to establish a baseline from which future Infrared Thermography(IRT) testing can be made. This study examines various thermal loading techniques in an attempt to enhance the likelihood of capturing and identifying critically sized flaws under 'non laboratory' actual working conditions. Qualification techniques and calibration standards are also being investigated to standardize the thermographic method. In conjunction with the thermographic inspections, advanced image processing techniques including digital filtering and neural networks have been investigated to increase the ability of detecting and sizing flaws. Here, the digitized thermographic images are mathematically manipulated through various filtering techniques and/or artificial neural mapping schemes to enhance its overall quality, permitting accurate flaw identification even when the signal-to-noise ratio is low.

Walker, James L.↗
NASA NTRS1997

Electrochemical Characterization of Semiconductor Materials and Structures

For a period covering October 1, 1995 through August 12, 1996, the research group at CSU has conducted theoretical and experimental research on "Electrochemical Characterization of Semiconductor Materials and Structures. " The objective of this investigation was to demonstrate the applicability of electrochemical techniques for characterization of complex device structures based on InP and GaAs, Ge, InGaAs, InSb, InAs and InSb, including: (1) accurate EC-V net majority carrier concentration depth profiling, and (2) surface and bulk structural and electrical type defect densities. Our motivation for this R&D effort was as follows: "Advanced space solar cells and ThermoPhotoVoltaic (TPV) cells are fabricated using a large variety of III-V materials based on InP and GaAs for solar cells and low bandgap materials such as Ge, InGaAs, InAs and InSb for TPV applications. At the present time for complex device structures using these materials, however, there is no simple way to assess the quality of these structures prior to device fabrication. Therefore, process optimization is a very time consuming and a costly endeavor". Completion of this R&D effort would have had unquestionable benefits for space solar cell and TPV cells, since electrochemical characterization of the above cell structures, if properly designed can provide many useful structural and electrical material information virtually at any depth inside various layers and at the interfaces. This, could have been applied for step-by-step process optimization, which could have been used for fabrication of new generation high efficiency, low cost space PV and TPV cells.

Source record↗
NASA NTRS1998

Study Methods to Characterize and Implement Thermography Nondestructive Evaluation (NDE)

The limits and conditions under which an infrared thermographic nondestructive evaluation can be utilized to assess the quality of aerospace hardware is demonstrated in this research effort. The primary focus of this work is on applying thermography to the inspection of advanced composite structures such as would be found in the International Space Station Instrumentation Racks, Space Shuttle Cargo Bay Doors, Bantam RP-1 tank or RSRM Nose Cone. Here, the detection of delamination, disbond, inclusion and porosity type defects are of primary interest. In addition to composites, an extensive research effort has been initiated to determine how well a thermographic evaluation can detect leaks and disbonds in pressurized metallic systems "i.e. the Space Shuttle Main Engine Nozzles". In either case, research into developing practical inspection procedures was conducted and thermographic inspections were performed on a myriad of test samples, subscale demonstration articles and "simulated" flight hardware. All test samples were fabricated as close to their respective structural counterparts as possible except with intentional defects for NDE qualification. As an added benefit of this effort to create simulated defects, methods were devised for defect fabrication that may be useful in future NDE qualification ventures.

Walker, James L.↗
NASA NTRS2010

Nondestructive Evaluation Methods for the Ares I Common Bulkhead

A large scale bonding demonstration test article was fabricated to prove out manufacturing techniques for the current design of the NASA Ares I Upper Stage common bulkhead. The common bulkhead serves as the single interface between the liquid hydrogen and liquid oxygen portions of the Upper Stage propellant tank. The bulkhead consists of spin-formed aluminum domes friction stir welded to Y-rings and bonded to a perforated phenolic honeycomb core. Nondestructive evaluation methods are being developed for assessing core integrity and the core-to-dome bond line of the common bulkhead. Detection of manufacturing defects such as delaminations between the core and face sheets as well as service life defects such as crushed or sheared core resulting from impact loading are all of interest. The focus of this work will be on the application of thermographic, shearographic, and phased array ultrasonic methods to the bonding demonstration article as well as various smaller test panels featuring design specific defect types and geometric features.

Walker, James↗
NASA NTRS2010

Evaluation of Solid Modeling Software for Finite Element Analysis of Woven Ceramic Matrix Composites

Three computer programs, used for the purpose of generating 3-D finite element models of the Repeating Unit Cell (RUC) of a textile, were examined for suitability to model woven Ceramic Matrix Composites (CMCs). The programs evaluated were the open-source available TexGen, the commercially available WiseTex, and the proprietary Composite Material Evaluator (COMATE). A five-harness-satin (5HS) weave for a melt-infiltrated (MI) silicon carbide matrix and silicon carbide fiber was selected as an example problem and the programs were tested for their ability to generate a finite element model of the RUC. The programs were also evaluated for ease-of-use and capability, particularly for the capability to introduce various defect types such as porosity, ply shifting, and nesting of a laminate. Overall, it was found that TexGen and WiseTex were useful for generating solid models of the tow geometry; however, there was a lack of consistency in generating well-conditioned finite element meshes of the tows and matrix. TexGen and WiseTex were both capable of allowing collective and individual shifting of tows within a ply and WiseTex also had a ply nesting capability. TexGen and WiseTex were sufficiently userfriendly and both included a Graphical User Interface (GUI). COMATE was satisfactory in generating a 5HS finite element mesh of an idealized weave geometry but COMATE lacked a GUI and was limited to only 5HS and 8HS weaves compared to the larger amount of weave selections available with TexGen and WiseTex.

Nemeth, Noel N.↗
NASA NTRS2014

Structural Characterization of Lateral-grown 6H-SiC am-plane Seed Crystals by Hot Wall CVD Epitaxy

The performance of commercially available silicon carbide (SiC) power devices is limited due to inherently high density of screw dislocations (SD), which are necessary for maintaining polytype during boule growth and commercially viable growth rates. The NASA Glenn Research Center (GRC) has recently proposed a new bulk growth process based on axial fiber growth (parallel to the c-axis) followed by lateral expansion (perpendicular to the c-axis) for producing multi-faceted m-plane SiC boules that can potentially produce wafers with as few as one SD per wafer. In order to implement this novel growth technique, the lateral homoepitaxial growth expansion of a SiC fiber without introducing a significant number of additional defects is critical. Lateral expansion is being investigated by hot wall chemical vapor deposition (HWCVD) growth of 6H-SiC am-plane seed crystals (0.8mm x 0.5mm x 15mm) designed to replicate axially grown SiC single crystal fibers. The post-growth crystals exhibit hexagonal morphology with approximately 1500 m (1.5 mm) of total lateral expansion. Preliminary analysis by synchrotron white beam x-ray topography (SWBXT) confirms that the growth was homoepitaxial, matching the polytype of the respective underlying region of the seed crystal. Axial and transverse sections from the as grown crystal samples were characterized in detail by a combination of SWBXT, transmission electron microscopy (TEM) and Raman spectroscopy to map defect types and distribution. X-ray diffraction analysis indicates the seed crystal contained stacking disorders and this appears to have been reproduced in the lateral growth sections. Analysis of the relative intensity for folded transverse acoustic (FTA) and optical (FTO) modes on the Raman spectra indicate the existence of stacking faults. Further, the density of stacking faults is higher in the seed than in the grown crystal. Bundles of dislocations are observed propagating from the seed in m-axis lateral directions. Contrast extinction analysis of these dislocation lines reveals they are edge type basal plane dislocations that track the growth direction. Polytype phase transition and stacking faults were observed by high-resolution TEM (HRTEM), in agreement with SWBXT and Raman scattering.

Single Crystal↗
DOE OSTI2026

Role of Wadsley Defects and Cation Disorder to Enhance MoNb 12 O 33 Diffusion

Wadsley-Roth (WR) niobates have emerged as high-rate anode materials that can combine rapid ionic diffusion with good electronic conductivity. WR compounds have been defect-enhanced by limited annealing, however, such materials often contain multiple types of defects. In particular, both Wadsley defects (variable block size) and transition metal disorder have the potential to modify transport rates, however the corresponding effects are not well understood mechanistically. Here, MoNb 12 O 33 (MNO) was calcined at two different temperatures to compare a defect-rich condition (MNO-800) with a proximal order-rich condition (MNO-900) as assessed through XRD, XANES, EXAFS, and STEM characterizations. Galvanostatically cycled lithium half cells of MNO-800 exhibited additional capacity (307 mAhg −1 at 0.1C, 4.66% higher) and improved high-rate capacity of 200 mAhg −1 at 10C. ICI-based overpotential analysis identified solid state diffusion as the dominant rate limiting process where MNO-800 correspondingly exhibited ∼3X faster capacity-weighted diffusivity. A machine-learning interatomic potential was trained to density functional theory and then applied with molecular dynamics (MLIP-MD) to examine the possible roles of Wadsley defects and transition metal disorder. For both defect-types, Li was found to populate and activate fast diffusion paths from window sites at lower extents of lithiation as compared to the order-rich model.

defect↗
NASA NTRS1979

Characterization of defect growth structures in ion plated films by scanning electron microscopy

Gold and copper films (0.2-2 micron thick) are ion plated on very smooth stainless steel 304 and mica surfaces. The deposited films are examined by SEM to identify the morphological growth of defects. Three types of coating defects are distinguished: nodular growth, abnormal or runaway growth, and spits. The potential nucleation sites for defect growth are analyzed to determine the cause of defect formation. It is found that nuclear growth is due to inherent surface microdefects, abnormal or runaway growth is due to external surface inclusions, and spits are due to nonuniform evaporation and ejection of droplets. All these defects have adverse effects on the coatings.

Spalvins, T.↗
NASA NTRS1985

High purith low defect FZ silicon

The most common intrinsic defects in dislocation-free float zone (FZ) silicon crystals are the A- and B-type swirl defects. The mechanisms of their formation and annihilation have been extensively studied. Another type of defect in dislocation-free FZ crystals is referred to as a D-type defect. Concentrations of these defects can be minimized by optimizing the growth conditions, and the residual swirls can be reduced by the post-growth extrinsic gettering process. Czochralski (Cz) silicon wafers are known to exhibit higher resistance to slip and warpage due to thermal stress than do FZ wafers. The Cz crystals containing dislocations are more resistant to dislocation movement than dislocated FZ crystals because of the locking of dislocations by oxygen atoms present in the Cz crystals. Recently a transverse magnetic field was applied during the FZ growth of extrinsic silicon. Resultant flow patterns, as revealed by striation etching and spreading resistance in Ga-doped silicon crystals, indicate strong effects of the transverse magnetic field on the circulation within the melt. At fields of 5500 gauss, the fluid flow in the melt volume is so altered as to affect the morphology of the growing crystal.

Kimura, H.↗
NASA NTRS1994

Scaling effects of defects in fiber-reinforced composites

Material defects may be introduced willingly or unwillingly during material manufacturing and structural component fabrication stages. Their presence in the material plays a dominant role in determining the material's strength and the associate failure mechanisms. In the sense that the size and the number of defects may increase with the volume of the material, the effect of dimensional scaling may manifest itself in the dependence of material strength on volume. Or, alternatively, there may exist a scaling effect of material defects. In fiber-reinforced composites, manufacturing or fabrication defects may come in several forms: matrix voids, matrix microcracks, fiber misalignment, broken fibers, or interface disbonds, just to mention a few. These are interacting and competing defects in the sense that one type of defect may become dominant under one stress condition and another type of defect may become dominant under a different stress condition. This happens because the fiber reinforcement network, together with the distribution of defects, constitutes the prime microstructure of the composite, and there exist continued interactions between the evolving microstructure and the distribution of defects. In the process, the scaling effects of defects are complicated by this interaction. In this presentation, the scaling effects of defects in fiber-reinforced composites will be briefly discussed with the introduction of the concept of effective defects. It is then shown with the aid of some actual experimental and analysis results that the scaling effects are very much present, but they are regulated by the characteristic dimension of the composite microstructure due to the aforementioned microstructure-defect interaction effect.

Wang, A. S. D.↗