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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 55 records · Page 3
All sourcesNASA NTRSDOE OSTI
NASA NTRS2014

A Study on the Effects of Ball Defects on the Fatigue Life in Hybrid Bearings

Hybrid ball bearings using silicon nitride ceramic balls with steel rings are increasingly being used in space mechanism applications due to their high wear resistance and long rolling contact fatigue life. However, qualitative and quantitative reports of the effects of ball defects that cause early fatigue failure are rare. We report on our approach to study these effects. Our strategy includes characterization of defects encountered in use, generation of similar defects in a laboratory setting, execution of full-scale bearing tests to obtain lifetimes, post-test characterization, and related finite-element modeling to understand the stress concentration of these defects. We have confirmed that at least one type of defect of appropriate size can significantly reduce fatigue life. Our method can be used to evaluate other defects as they occur or are encountered.

Tang, Ching-Yao↗
NASA NTRS1987

Microscopy of epitaxially grown beta-SiC on 001-plane silicon

Various defects occurring in epitaxially grown layers of beta-SiC are characterized by TEM, and the mechanisms of growth and defect formation are discussed. In particular, attention is given to the following types of defects: misfit dislocations, interfacial twins, antiphase boundaries, threading dislocations, and wide stacking faults. Details of the experimental procedure are given.

Pirouz, P.↗
NASA NTRS1982

Technical and investigative support for high density digital satellite recording systems

Dropout and defect classification are discussed with emphasis on how surface defects responsible for electronic dropouts were identified, what affect various defects could have on the application of tapes to satellite tape recorders (STR), and what type of defects might be field correctable after production of the tape but prior to installation in the STR.

Schultz, R. A.↗
NASA NTRS1998

Electronic Properties of Carbon Nanotubes and Junctions

Metallic and semiconducting Single Wall Carbon Nanotubes (CNT) have recently been characterized using scanning tunneling microscopy (STM) and the manipulation of individual CNT has been demonstrated. These developments make the prospect of using CNT as molecular wires and possibly as electronic devices an even more interesting one. We have been modeling various electronic properties such as the density of states and the transmission coefficient of CNT wires and junctions. These studies involve first calculating the stability of junctions using molecular dynamics simulations and then calculating the electronic properties using a pi-electron tight binding Hamiltonian. We have developed the expertise to calculate the electronic properties of both finite-sized CNT and CNT systems with semi-infinite boundary conditions. In this poster, we will present an overview of some of our results. The electronic application of CNT that is most promising at this time is their use as molecular wires. The conductance can however be greatly reduced because of reflection due to defects and contacts. We have modeled the transmission through CNT in the presence of two types of defects: weak uniform disorder and strong isolated scatterers. We find that the conductance is affected in significantly different manners due to these defects Junctions of CNT have also been imaged using STM. This makes it essential to derive rules for the formation of junctions between tubes of different chirality, study their relative energies and electronic properties. We have generalized the rules for connecting two different CNT and have calculated the transmission and density of states through CNT junctions. Metallic and semiconducting CNT can be joined to form a stable junction and their current versus voltage characteristics are asymmetric. CNT are deformed by the application of external forces including interactions with a substrate or other CNT. In many experiments, these deformation are expected to occur naturally. We will present some preliminary results of our calculations of the modification of CNT electronic properties as a result of deformations.

Anantram, M. P.↗
NASA NTRS2004

Research Infusion Collaboration: Finding Defect Patterns in Reused Code

The 'Finding Defect Patterns in Reused Code' Research Infusion Collaboration was performed by Jet Propulsion Laboratory/Caltech under Contract 104-07-02.679 102 197 08.14.4. This final report describes the collaboration and documents the findings, including lessons learned.The research infusion collaboration characterized, using Orthogonal Defect Classification, defect reports for code that will be reused in mission-critical software on Deep Space Network Antenna controllers. Code reuse is estimated to be 90%, so it is important to identify systemic defects, or patterns, prior to reuse of this code. The work also identified ways to avoid certain types of defects and to test more efficiently.The primary objectives of the project were:to analyze defect patterns of the code to be reused based on the defects'Orthogonal Defect Classification (ODC)and to achieve a successful infusion of ODC to a project.

orthogonal defect classification (ODC)↗
NASA NTRS2002

Evolutionary Design of a Robotic Material Defect Detection System

During the post-flight inspection of SSME engines, several inaccessible regions must be disassembled to inspect for defects such as cracks, scratches, gouges, etc. An improvement to the inspection process would be the design and development of very small robots capable of penetrating these inaccessible regions and detecting the defects. The goal of this research was to utilize an evolutionary design approach for the robotic detection of these types of defects. A simulation and visualization tool was developed prior to receiving the hardware as a development test bed. A small, commercial off-the-shelf (COTS) robot was selected from several candidates as the proof of concept robot. The basic approach to detect the defects was to utilize Cadmium Sulfide (CdS) sensors to detect changes in contrast of an illuminated surface. A neural network, optimally designed utilizing a genetic algorithm, was employed to detect the presence of the defects (cracks). By utilization of the COTS robot and US sensors, the research successfully demonstrated that an evolutionarily designed neural network can detect the presence of surface defects.

Ballard, Gary↗
NASA NTRS1974

Cytogenic studies of blood (experiment M111)

The Skylab M111 experiment was a continuation of the preflight and postflight chromosomal analyses of the flight crews that have been performed since the Gemini 3 mission. The experiment was designed to determine whether some space flight parameter produces cytogenetic effects in human cells and to provide biological radiation dosimetric capability in the event of significant radiation exposure to a flight crew. On each of the Skylab flights, blood lymphocytes for analysis of chromosomes for structural defects were obtained from each of the prime crewmembers and from a ground-based control group before and after flight. Two types of defects were recorded. The minor defects included the following aberrations: chromatid fragments, chromosome fragments, and deletions. Structural rearrangements such as dicentrics, exchanges, ring chromosomes, and translocations were photographed, and the cells were karyotyped to delineate, when possible, the chromosome or chromosomes involved in the rearrangement. Result seems to indicate that the flight itself was not a major contributing factor.

Lockhart, L. H.↗
NASA NTRS1974

SEM evaluation of metallization on semiconductors

A test method for the evaluation of metallization on semiconductors is presented and discussed. The method has been prepared in MIL-STD format for submittal as a proposed addition to MIL-STD-883. It is applicable to discrete devices and to integrated circuits and specifically addresses batch-process oriented defects. Quantitative accept/reject criteria are given for contact windows, other oxide steps, and general interconnecting metallization. Figures are provided that illustrate typical types of defects. Apparatus specifications, sampling plans, and specimen preparation and examination requirements are described. Procedures for glassivated devices and for multi-metal interconnection systems are included.

Fresh, D. L.↗
NASA NTRS1974

Influence of material quality and process-induced defects on semiconductor device performance and yield

An overview of major causes of device yield degradation is presented. The relationships of device types to critical processes and typical defects are discussed, and the influence of the defect on device yield and performance is demonstrated. Various defect characterization techniques are described and applied. A correlation of device failure, defect type, and cause of defect is presented in tabular form with accompanying illustrations.

Porter, W. A.↗
NASA NTRS1989

Screening of metal matrix composites using ultrasonic C-scans

Ultrasonic C-scans can be used to find some types of defects in continuous fiber-reinforced metal matrix composites such as boron/aluminum composites. These defects are related to the fatigue behavior and fracture location of each inspected specimen. The C-scan technique determined the relative amount of defects in boron/aluminum composites. The defects were primarily identified as gaps in the fiber spacing. Those specimens with higher defect densities had shorter fatigue lives, lower fatigue endurance limits, and greater reductions in the elastic unloading modulus (that is, stiffness) because of fatigue cycling. This type of data could be used to set accept/reject levels for a composite panel based on C-scan indications.

Johnson, W. S.↗
NASA NTRS1990

Defect sensitivity of filament-wound structures in compression

Compression testing of 12-ply graphite/bismaleimide laminated plates with induced and natural defects is discussed, and emphasis is placed on resultant changes in strength and stiffness. Ply drops, ply cuts, and fiber crossovers are studied by comparison with a quasi-isotropic control group. It is observed that, as expected, failure initiates at the defects and progresses via delamination, sublaminate buckling, angle-ply cracking, and longitudinal ply failure. The ultimate stress is reduced by approximately 40 percent for all types of defects except the unsymmetrical cut-ply specimens which averages a 54-percent reduction. The average stiffness reduction of 10 percent is observed for specimens with induced defects. Fiber crossovers are found to reduce the laminate strength and stiffness significantly.

Jensen, David W.↗
NASA NTRS2017

Development and Validation of NDE Standards for NASA’s Advanced Composites Project

The adoption of composite materials in aircraft manufacturing for use in structural applications continues to increase but is still relatively new to the industry. Composite components have large development and certification costs in comparison to metallic structures. Traditional methods of nondestructive evaluation (NDE) used for isotropic materials such as metals may not be adequate for composite applications and therefore is a contributing factor to the cost and complexity of developing new structural composites. Additionally, the defects of interest in composite materials are significantly different from metals. Thus, good quality composite reference standards are essential to obtaining reliable and quantifiable NDE results. Ideally, reference standards contain flaws or damage whose NDE indications most closely represent those created by actual flaws/damage. They should also be easy to duplicate and inexpensive to manufacture. NASA’s Advanced Composites Project, working with industry partners, developed a set of composite standards that contain a range of validated defects representing those typically found in aerospace composite materials. This paper will provide an overview of the standards fabricated, the manufacturing plans used to fabricate them, the types of defects included, and validation testing that has performed. Also discussed is an inter-laboratory “round-robin” test that is being performed on these standards. The paper will describe a guidance document being compiled to outline relevant inspection procedures for challenging and critical defects unique to composites where conventional techniques may not be appropriate.

Cramer, K. Elliott↗
NASA NTRS1972

Evaluation of nondestructive testing techniques for the space shuttle nonmetallic thermal protection system

A program was conducted to evaluate nondestructive analysis techniques for the detection of defects in rigidized surface insulation (a candidate material for the Space Shuttle thermal protection system). Uncoated, coated, and coated and bonded samples with internal defects (voids, cracks, delaminations, density variations, and moisture content), coating defects (holes, cracks, thickness variations, and loss of adhesion), and bondline defects (voids and unbonds) were inspected by X-ray radiography, acoustic, microwave, high-frequency ultrasonic, beta backscatter, thermal, holographic, and visual techniques. The detectability of each type of defect was determined for each technique (when applicable). A possible relationship between microwave reflection measurements (or X-ray-radiography density measurements) and the tensile strength was established. A possible approach for in-process inspection using a combination of X-ray radiography, acoustic, microwave, and holographic techniques was recommended.

Tiede, D. A.↗
NASA NTRS1983

Observation of defects in mercury cadmium telluride crystals grown by chemical vapor transport

A mixture of nitric and hydrochloric acids was found to yield etch pits on mercury cadmium telluride crystals grown by chemical vapor transport using iodine or mercuric iodide as the transport agent. Two types of pits were observed by optical microscopy: triangular pyramidal and round saucer shaped pits. Transmission electron microscopy confirmed that two types of defects were present: dislocations and second phase occlusions. The present study suggests that the defects are near the crystal surface and therefore will probably not significantly affect the electrical characteristics.

Irene, E. A.↗
NASA NTRS1989

Improved defect analysis of Gallium Arsenide solar cells using image enhancement

A new technique has been developed to capture, digitize, and enhance the image of light emission from a forward biased direct bandgap solar cell. Since the forward biased light emission from a direct bandgap solar cell has been shown to display both qualitative and quantitative information about the solar cell's performance and its defects, signal processing techniques can be applied to the light emission images to identify and analyze shunt diodes. Shunt diodes are of particular importance because they have been found to be the type of defect which is likely to cause failure in a GaAs solar cell. The presence of a shunt diode can be detected from the light emission by using a photodetector to measure the quantity of light emitted at various current densities. However, to analyze how the shunt diodes affect the quality of the solar cell the pattern of the light emission must be studied. With the use of image enhancement routines, the light emission can be studied at low light emission levels where shunt diode effects are dominant.

Kilmer, Louis C.↗
NASA NTRS1979

Influence of alignment and surface defects on the performance of X-ray telescopes

The effects of misalignment and surface deformations on the image quality of a grazing incidence telescope with six nested subsystems are investigated. The axial rms-spot size serves as a measure for the image quality. The surface deformations are simulated by ellipsoidal and sinusoidal deviations from the ideal surface. Misalignments are tilts, decenters, and despaces of the individual elements. The effects of each type of defect are analyzed in a single two-element system. The full nested system is then analyzed in the presence of all possible defects on all 12 elements, whereby the magnitude of the defects is randomized within a given upper limit.

Korsch, D.↗
NASA NTRS2002

Scanning Electron Microscope Mapping System Developed for Detecting Surface Defects in Fatigue Specimens

An automated two-degree-of-freedom specimen positioning stage has been developed at the NASA Glenn Research Center to map and monitor defects in fatigue specimens. This system expedites the examination of the entire gauge section of fatigue specimens so that defects can be found using scanning electron microscopy (SEM). Translation and rotation stages are driven by microprocessor-based controllers that are, in turn, interfaced to a computer running custom-designed software. This system is currently being used to find and record the location of ceramic inclusions in powder metallurgy materials. The mapped inclusions are periodically examined during interrupted fatigue experiments. The number of cycles to initiate cracks from these inclusions and the rate of growth of initiated cracks can then be quantified. This information is necessary to quantify the effect of this type of defect on the durability of powder metallurgy materials. This system was developed with support of the Ultra Safe program.

Bonacuse, Peter J.↗