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NASA NTRS2011

Evaluation of Diffraction by a Rounded Surface

Wide-angle heliospheric imagers such as those carried on the SMEI and STEREO spacecraft require highly effective baffle systems to exclude diffracted light from the solar disk as well as other sources of stray light. Buffington (2000, Appl. Opt. 39, 2683-2686) has proposed replacing multi-vane baffle systems with a curved surface that can be thought of as the limiting case of closely spaced vanes. Buffington s experimental data showed that the diffractive performance of a continuous baffle is consistent with the limiting form expected from multi-vane diffraction on dimensional grounds, but a detailed prediction was not possible because multi-vane diffraction calculations assume that the diffractive edges act independently, an assumption that breaks down for a continuous surface. I describe analytic calculations of diffraction from a smooth rounded surface based on the approach of Vogler (1985, Radio Sci. 20, 582-590).

Rabin, Douglas M.↗

NASA NTRS1981

A new method for focusing and imaging X-rays and gamma-rays with diffraction crystals

Bent diffraction crystals in which the intercrystalline-plane spacing is varied as a function of position in the crystal are used to focus monochromatic radiation from a point source or parallel beam down to a point image. Conversely, radiation from a point source can be focused into an outgoing parallel beam. The Bragg angle for diffraction of monochromatic radiation will now vary as a function of position in the crystal and this new degree of freedom is used to obtain focusing and imaging of the diffracted beam. This approach to focusing and imaging is applied to the design of a large-area, high resolution X-ray telescope that is also a high resolution monochromator with the unique feature that the width of the energy increment that is diffracted can be controlled and varied during the operation of the instrument. The field can be scanned with a wide energy increment and then switched to a narrow energy increment for the high resolution work. Both transmission and reflection type diffraction crystals can be used.

Smither, R. K.↗

NASA NTRS1984

Real-time X-ray Diffraction: Applications to Materials Characterization

With the high speed growth of materials it becomes necessary to develop measuring systems which also have the capabilities of characterizing these materials at high speeds. One of the conventional techniques of characterizing materials was X-ray diffraction. Film, which is the oldest method of recording the X-ray diffraction phenomenon, is not quite adequate in most circumstances to record fast changing events. Even though conventional proportional counters and scintillation counters can provide the speed necessary to record these changing events, they lack the ability to provide image information which may be important in some types of experiment or production arrangements. A selected number of novel applications of using X-ray diffraction to characterize materials in real-time are discussed. Also, device characteristics of some X-ray intensifiers useful in instantaneous X-ray diffraction applications briefly presented. Real-time X-ray diffraction experiments with the incorporation of image X-ray intensification add a new dimension in the characterization of materials. The uses of real-time image intensification in laboratory and production arrangements are quite unlimited and their application depends more upon the ingenuity of the scientist or engineer.

Rosemeier, R. G.↗

NASA NTRS1988

Structural anomalies in undoped Gallium Arsenide observed in high resolution diffraction imaging with monochromatic synchrotron radiation

Novel, streak-like disruption features restricted to the plane of diffraction have recently been observed in images obtained by synchrotron radiation diffraction from undoped, semi-insulating gallium arsenide crystals. These features were identified as ensembles of very thin platelets or interfaces lying in (110) planes, and a structural model consisting of antiphase domain boundaries was proposed. We report here the other principal features observed in high resolution monochromatic synchrotron radiation diffraction images: (quasi) cellular structure; linear, very low-angle subgrain boundaries in (110) directions, and surface stripes in a (110) direction. In addition, we report systematic differences in the acceptance angle for images involving various diffraction vectors. When these observations are considered together, a unifying picture emerges. The presence of ensembles of thin (110) antiphase platelet regions or boundaries is generally consistent not only with the streak-like diffraction features but with the other features reported here as well. For the formation of such regions we propose two mechanisms, operating in parallel, that appear to be consistent with the various defect features observed by a variety of techniques.

Steiner, B.↗

NASA NTRS1989

Structural anomalies in undoped gallium arsenide observed in high-resolution diffraction imaging with monochromatic synchrotron radiation

Steiner, B.↗

NASA NTRS1993

Correcting for diffraction in the far-infrared reflectance measurement of rough surfaces

The manner in which diffraction can increase the reflectance measured from very rough surfaces is shown by observations of diffracted light within the instrument profile of a far-IR reflectometer system. A correction to the calibration signal based on numerical integration of the diffracted part of the instrument profile is described. Diffraction correction factors as large as 2.94 have been found with small optics at long wavelength (630 microns). The effect of diffraction on diffuse reflectance measurements of a very rough perfect reflector is shown at wavelengths from 56 to 200 microns.

Smith, Sheldon M.↗

NASA NTRS1994

Nondestructive evaluation of fatigue damage in aluminum 2024 by x-ray diffraction

Aluminum alloys are widely used in the automobile and aerospace industries. This is due to their attractive low density-high modulus and low density-high strength characteristics. Unfortunately, cyclic stress-strain deformations alter the microstructure of aluminum alloys when they are placed into service. These structural changes can lead to fatigue damage and ultimately service failure. Since x-ray diffraction analysis is known to be a sensitive nondestructive indicator of structural changes due to deformations, this technique is being used to evaluate changes in the microstructure of cycled aluminum 2024 commercial alloys. Line shapes, widths, and positions in an x-ray diffraction pattern depend on microstructural properties such as grain size, grain orientation, residual stress, microstrain, etc. Changes in the microstructure due to fatigue will appear as changes in the diffraction pattern. One parameter used to characterize a reflection in a diffraction pattern is the full width at half maximum (FWHM). Preliminary x-ray diffraction results on cycled Al 2024 indicate that the (111) and (222) reflections of the matrix phase do not show any variations in the FWHM due to an increase in the fatigue cycles. However, the FWHM of the (200) and (400) reflections of the same phase unexpectedly showed a dramatic decrease. These results can be interpreted as due to the relaxation of some initial nonuniform residual stresses in the matrix phase lattice. Further work is in progress to evaluate the FWHM of the second phase of the cycled alloys.

Ferguson, Milton W.↗

NASA NTRS1996

Multipath analysis diffraction calculations

This report describes extensions of the Kirchhoff diffraction equation to higher edge terms and discusses their suitability to model diffraction multipath effects of a small satellite structure. When receiving signals, at a satellite, from the Global Positioning System (GPS), reflected signals from the satellite structure result in multipath errors in the determination of the satellite position. Multipath error can be caused by diffraction of the reflected signals and a method of calculating this diffraction is required when using a facet model of the satellite. Several aspects of the Kirchhoff equation are discussed and numerical examples, in the near and far fields, are shown. The vector form of the extended Kirchhoff equation, by adding the Larmor-Tedone and Kottler edge terms, is given as a mathematical model in an appendix. The Kirchhoff equation was investigated as being easily implemented and of good accuracy in the basic form, especially in phase determination. The basic Kirchhoff can be extended for higher accuracy if desired. A brief discussion of the method of moments and the geometric theory of diffraction is included, but seems to offer no clear advantage in implementation over the Kirchhoff for facet models.

Statham, Richard B.↗

NASA NTRS2002

Maximizing Macromolecule Crystal Size for Neutron Diffraction Experiments

A challenge in neutron diffraction experiments is growing large (greater than 1 cu mm) macromolecule crystals. In taking up this challenge we have used statistical experiment design techniques to quickly identify crystallization conditions under which the largest crystals grow. These techniques provide the maximum information for minimal experimental effort, allowing optimal screening of crystallization variables in a simple experimental matrix, using the minimum amount of sample. Analysis of the results quickly tells the investigator what conditions are the most important for the crystallization. These can then be used to maximize the crystallization results in terms of reducing crystal numbers and providing large crystals of suitable habit. We have used these techniques to grow large crystals of Glucose isomerase. Glucose isomerase is an industrial enzyme used extensively in the food industry for the conversion of glucose to fructose. The aim of this study is the elucidation of the enzymatic mechanism at the molecular level. The accurate determination of hydrogen positions, which is critical for this, is a requirement that neutron diffraction is uniquely suited for. Preliminary neutron diffraction experiments with these crystals conducted at the Institute Laue-Langevin (Grenoble, France) reveal diffraction to beyond 2.5 angstrom. Macromolecular crystal growth is a process involving many parameters, and statistical experimental design is naturally suited to this field. These techniques are sample independent and provide an experimental strategy to maximize crystal volume and habit for neutron diffraction studies.

Judge, R. A.↗

NASA NTRS2003

Phase Sensitive X-Ray Diffraction Imaging Study of Protein Crystals

The study of defects and growth of protein crystals is of importance in providing a fundamental understanding of this important category of systems and the rationale for crystallization of better ordered crystals for structural determination and drug design. Yet, as a result of the extremely weak scattering power of x-rays in protein and other biological macromolecular crystals, the extinction lengths for those crystals are extremely large and, roughly speaking, of the order of millimeters on average compared to the scale of micrometers for most small molecular crystals. This has significant implication for x-ray diffraction and imaging study of protein crystals, and presents an interesting challenge to currently available x-ray analytical techniques. We proposed that coherence-based phase sensitive x-ray diffraction imaging could provide a way to augment defect contrast in x-ray diffraction images of weakly diffracting biological macromolecular crystals. I shall examine the principles and ideas behind this approach and compare it to other available x-ray topography and diffraction methods. I shall then present some recent experimental results in two model protein systems-cubic apofemtin and tetragonal lysozyme crystals to demonstrate the capability of the coherence-based imaging method in mapping point defects, dislocations, and the degree of perfection of biological macromolecular crystals with extreme sensitivity. While further work is under way, it is intended to show that the observed new features have yielded important information on protein crystal perfection and nucleation and growth mechanism otherwise unobtainable.

Hu, Z. W.↗

NASA NTRS2008

Micron-Accurate Laser Fresnel-Diffraction Ranging System

Two versions of an optoelectronic system undergoing development are depicted. The system is expected to be capable of measuring a distance between 2 and 10 m with an error of no more than 1 micrometer. The system would be designed to exploit Fresnel diffraction of a laser beam. In particular, it would be designed to take advantage of the fact that a Fresnel diffraction pattern is ultrasensitive to distance. The two versions would differ in the following respects: In version 1, the focus of the telescope would be in the Fresnel region, and the telescope would have a small depth of focus. As a consequence, the Fresnel pattern would be imaged directly onto the photodetector array; in version 2, a multielement lens module would displace the Fresnel region from the vicinity of the pinhole to the vicinity of the optical receiver. As the distance to be measured varied, the location of the receiver relative to the displaced Fresnel-diffraction region would vary, thereby causing the Fresnel diffraction pattern on the focal plane to vary. The multielement lens module would also correct for aberrations. The processing of the digitized Fresnel diffraction pattern in the computer might be accelerated by using only parts of the pattern or even only one small part - the central pixel. As the distance from the pinhole increased, the central pixel would rapidly cycle between maximum and minimum light intensity. This in itself would not be sufficient to uniquely determine the distance. However, by varying the size of the pinhole or the wavelength of the laser, one could obtain a second cycle of variation of intensity that, in conjunction with the first cycle, could enable a unique determination of distance. Alternatively, for a single wavelength and a single pinhole size, it should suffice to consider the data from only two different key pixels in the Fresnel pattern.

Lehner, David↗

NASA NTRS2013

Compatibility of a Diffractive Pupil and Coronagraphic Imaging

Detection and characterization of exo-earths require direct-imaging techniques that can deliver contrast ratios of 10(exp 10) at 100 milliarc-seconds or smaller angular separation. At the same time, astrometric data is required to measure planet masses and can help detect planets and constrain their orbital parameters. To minimize costs, a single space mission can be designed using a high efficiency coronograph to perform direct imaging and a diffractive pupil to calibrate wide-field distortions to enable high precision astrometric measurements. This paper reports the testing of a diffractive pupil on the high-contrast test bed at the NASA Ames Research Center to assess the compatibility of using a diffractive pupil with coronographic imaging systems. No diffractive contamination was found within our detectability limit of 2x10(exp -7) contrast outside a region of 12lambda/D and 2.5x10(exp -6) within a region spanning from 2 to 12lambda/D. Morphology of the image features suggests that no contamination exists even beyond the detectability limit specified or at smaller working angles. In the case that diffractive contamination is found beyond these stated levels, active wavefront control would be able to mitigate its intensity to 10(exp -7) or better contrast.

Bendek, Eduardo↗

NASA NTRS2015

Nanostructure Diffraction Gratings for Integrated Spectroscopy and Sensing

The present disclosure pertains to metal or dielectric nanostructures of the subwavelength scale within the grating lines of optical diffraction gratings. The nanostructures have surface plasmon resonances or non-plasmon optical resonances. A linear photodetector array is used to capture the resonance spectra from one of the diffraction orders. The combined nanostructure super-grating and photodetector array eliminates the use of external optical spectrometers for measuring surface plasmon or optical resonance frequency shift caused by the presence of chemical and biological agents. The nanostructure super-gratings can be used for building integrated surface enhanced Raman scattering (SERS) spectrometers. The nanostructures within the diffraction grating lines enhance Raman scattering signal light while the diffraction grating pattern of the nanostructures diffracts Raman scattering light to different directions of propagation according to their wavelengths. Therefore, the nanostructure super-gratings allows for the use of a photodetector array to capture the surface enhanced Raman scattering spectra.

Guo, Junpeng↗

NASA NTRS2016

Scattering and Diffraction of Electromagnetic Radiation: An Effective Probe to Material Structure

Scattered electromagnetic waves from material bodies of different forms contain, in an intricate way, precise information on the intrinsic, geometrical and physical properties of the objects. Scattering theories, ever deepening, aim to provide dependable interpretation and prediction to the complicated interaction of electromagnetic radiation with matter. There are well-established multiple-scattering formulations based on classical electromagnetic theories. An example is the Generalized Multi-particle Mie-solution (GMM), which has recently been extended to a special version ̶ the GMM-PA approach, applicable to finite periodic arrays consisting of a huge number (e.g., >>106) of identical scattering centers [1]. The framework of the GMM-PA is nearly complete. When the size of the constituent unit scatterers becomes considerably small in comparison with incident wavelength, an appropriate array of such small element volumes may well be a satisfactory representation of a material entity having an arbitrary structure. X-ray diffraction is a powerful characterization tool used in a variety of scientific and technical fields, including material science. A diffraction pattern is nothing more than the spatial distribution of scattered intensity, determined by the distribution of scattering matter by way of its Fourier transform [1]. Since all linear dimensions entered into Maxwell's equations are normalized by wavelength, an analogy exists between optical and X-ray diffraction patterns. A large set of optical diffraction patterns experimentally obtained can be found in the literature [e.g., 2,3]. Theoretical results from the GMM-PA have been scrutinized using a large collection of publically accessible, experimentally obtained Fraunhofer diffraction patterns. As far as characteristic structures of the patterns are concerned, theoretical and experimental results are in uniform agreement; no exception has been found so far. Closely connected with the spatial distribution of scattered intensities are cross sections, such as for extinction, scattering, absorption, and radiation pressure, as a critical type of key quantity addressed in most theoretical and experimental studies of radiative scattering. Cross sections predicted from different scattering theories are supposed to be in general agreement. For objects of irregular shape, the GMM-PA solutions can be compared with the highly flexible Discrete Dipole Approximation (DDA) [4,5] when dividing a target to no more than ~106 unit cells. Also, there are different ways to calculate the cross sections in the GMM-PA, providing an additional means to examine the accuracy of the numerical solutions and to unveil potential issues concerning the theoretical formulations and numerical aspects. To solve multiple scattering by an assembly of material volumes through classical theories such as the GMM-PA, the radiative properties of the component scatterers, the complex refractive index in particular, must be provided as input parameters. When using a PA to characterize a material body, this involves the use of an adequate theoretical tool, an effective medium theory, to connect Maxwell's phenomenogical theory with the atomistic theory of matter. In the atomic theory, one regards matter as composed of interacting particles (atoms and molecules) embedded in the vacuum [6]. However, the radiative properties of atomic-scaled particles are known to be substantially different from bulk materials. Intensive research efforts in the fields of cluster science and nanoscience attempt to bridge the gap between bulk and atom and to understand the transition from classical to quantum physics. The GMM-PA calculations, which place virtually no restriction on the component-particle size, might help to gain certain insight into the transition.

Xu, Yu-Lin↗

NASA NTRS2016

Nanostructure Diffraction Gratings for Integrated Spectroscopy and Sensing

Guo, Junpeng↗

NASA NTRS2018

Evaluation of X-Ray Reflectors by Optical Diffraction Patterns

Performance of X-ray reflectors affects that of X-ray mirrors. Modern X-ray mirrors have thousands of reflectors to gain large effective area. Evaluation of the reflectors is an important process in production of the mirrors. A diffraction pattern dominates reflector image when the parallel optical beam illuminates the reflector along its optical axis because the reflectors are used at grazing incident angles of around 1 deg and their effective width are 1–10 mm. A diffraction pattern from the entire reflector surface can be acquired at once with the aid of a lens. The diffraction pattern holds information of the surface profiles of the reflectors. To quantitatively evaluate the reflectors with the diffraction pattern, we created a diffraction pattern model by the wave optics with the ideal surface profile and fitted it to data. As a result, a correlation between fitting residual and the normal vector distribution of the surface profile was found. With our method, the reflectors can be evaluated and sorted out more efficiently.

Hayashi, Takayuki↗

NASA NTRS2006

Effects of diffraction and static wavefront errors on high-contrast imaging from the Thirty Meter Telescope

High-contrast imaging, particularly direct detection of extrasolar planets, is a major science driver for the next generation of extremely large telescopes such as the segmented Thirty Meter Telescope. This goal requires more than merely diffraction-limited imaging, but also attention to residual scattered light from wavefront errors and diffraction effects at the contrast level of 10-8-10-9. Using a wave-optics simulation of adaptive optics and a diffraction suppression system we investigate diffraction from the segmentation geometry, intersegment gaps, obscuration by the secondary mirror and its supports. We find that the large obscurations pose a greater challenge than the much smaller segment gaps. In addition the impact of wavefront errors from the primary mirror, including segment alignment and figure errors, are analyzed. Segment-to-segment reflectivity variations and residual segment figure error will be the dominant error contributors from the primary mirror. Strategies to mitigate these errors are discussed.

segmented mirrors↗

NASA NTRS1967

Fresnel diffraction plates are simple and inexpensive

Fresnel plate demonstrates diffraction phenomena simply and inexpensively. A large number of identical diffracting apertures are made in random orientation on photographic film. When a small source of light is viewed through the plate, the diffraction pattern typical of the diffracting aperture is readily seen.

Hoover, R. B.↗