Search NASA⌕ Search

SEARCH · Search NASA

Results for “metrology”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 55 records · Page 3
All sourcesNASA NTRSDOE OSTI
DOE OSTI2022

Cross-Cutting Metrology Tools for In Operando Characterization of Carrier Dynamics in Photovoltaic Devices (Final Technical Report)

Understanding the nature of recombination and its dependence on defects and interfaces is essential for engineering materials and contacts for higher V oc and photovoltaic (PV) efficiency. Time-resolved photoluminescence (TRPL) has conventionally been used to evaluate recombination, but not all materials are strongly emissive or otherwise suitable. Time-resolved terahertz spectroscopy is a pump – probe method that presents valuable complementary information, wherein an optical pump pulse photoexcites carriers within the absorber and the transient photoconductivity is probed with a terahertz pulse. Until now, experimental constraints have prohibited the use of terahertz probes to interrogate full device stacks, and measurements were instead made on exfoliated films or films grown on unconventional substrates. However, interfaces are critical to the behavior of photoexcited carriers in solar cells, and the substrates themselves often influence the film growth and bulk properties. Therefore, it is important to probe the behavior of PV absorbers as close as possible to their normal operating conditions. Here we have developed cross-cutting metrology that enable in operando characterization of carrier dynamics and recombination mechanisms in working PV devices. Through a combination of complementary non-contact TRTS and TRPL experiments and modeling, we have obtained key parameters including photoexcited carrier bulk lifetime and interface and back surface recombination velocities with greater precision and accuracy than can be achieved with conventional TRPL alone. By varying pulsed photoexcitation conditions, the contributions of interface and bulk recombination mechanisms can be determined. We have developed and refined this characterization approach by investigating CdTe PVs, which is a well-established technology but with significant margin for further improvements in efficiency. Results were published in Journal of Applied Physics (DOI: 10.1063/5.0064730) and Proceedings of the IEEE PVSC (DOI: 10.1109/PVSC43889.2021.9518559). After validating the approach, we have applied it to correlate recombination rates to processing conditions and material properties, including composition and defects as well as interfaces and surface treatments. Such feedback can inform processing and design choices to enable higher PV efficiency, not only for CdTe, but also CdSe x Te 1-x , CIGS, perovskites, kesterites, and future technologies. A perspective on predicting solar cell performance from terahertz spectroscopy was published in Advanced Energy Materials (DOI: 10.1002/aenm.202102776). The cross-cutting metrology tools developed here will enable determination of the locus and mechanism of performance-limiting recombination in thin film PV devices. This feedback can guide the engineering of PV devices with higher V oc and efficiency, thereby leading to reductions in levelized cost of electricity to meet the SunShot 2030 target of $0.03/kWh for utility-scale PV. Lower costs will enable rapid expansion of renewable electricity generation that is nearly free of carbon emissions. Reducing carbon emissions of the electricity sector is one of the most important solutions to climate change. The project’s specific focus on CdTe PV can benefit First Solar, the US company that is the global leader in CdTe technology, through both technology and workforce development.

14 SOLAR ENERGY↗
DOE OSTI2024

Dual-Image Color Normalization to Enable High-Performance Concentrating Solar Optical Metrology

Concentrating Solar Power (CSP) requires precision mirrors, and these in turn require metrology systems to measure their optical slope. In this project we studied a color-based approach to the correspondence problem, which is the association of points on an optical target with their corresponding points seen in a reflection. This is a core problem in deflectometry-based metrology, and a color solution would enable important new capabilities. We modeled color as a vector in the [R,G,B] space measured by a digital camera, and explored a dual-image approach to compensate for inevitable changes in illumination color. Through a series of experiments including color target design and dual-image setups both indoors and outdoors, we collected reference/measurement image pairs for a variety of configurations and light conditions. We then analyzed the resulting image pairs by selecting example [R,G,B] pixels in the reference image, and seeking matching [R,G,B] pixels in the measurement image. Modulating a tolerance threshold enabled us to assess both match reliability and match ambiguity, and for some configurations, orthorectification enabled us to assess match accuracy. Using direct-direct imaging, we demonstrated color correspondence achieving average match accuracy values of 0.004 h, where h is the height of the color pattern. We found that wide-area two-dimensional and linear one-dimensional color targets outperformed hybrid linear/lateral gradient targets in the cases studied. Introducing a mirror degraded performance under our current techniques, and we did not have time to evaluate whether matches could be reliably achieved despite varying light conditions. Nonetheless, our results thus far are promising.

14 SOLAR ENERGY↗
DOE OSTI2021

A Comprehensive Open-Source R Software For Statistical Metrology Calculations: From Uncertainty Evaluation To Risk Analysis

Whether calibrating equipment or inspecting products on the factory floor, metrology requires many complicated statistical calculations to achieve a full understanding and evaluation of measurement uncertainty and quality. In order to assist its workforce in performing these calculations in a consistent and rigorous way, the Primary Standards Lab at Sandia National Laboratories (SNL) has developed a free and open-source software package for computing various metrology calculations from uncertainty propagation to risk analysis. In addition to propagating uncertainty through a measurement model using the well-known Guide to Expression of Uncertainty in Measurement or Monte Carlo approaches, evaluating the individual Type A and Type B uncertainty components that go into the measurement model often requires other statistical methods such as analysis of variance or determining uncertainty in a fitted curve. Once the uncertainty in a measurement has been calculated, it is usually evaluated from a risk perspective to ensure the measurement is suitable for making a particular conformance decision. Finally, SNL’s software can perform all these calculations in a single application via an easy-to-use graphical interface, where the different functions are integrated so the results of one calculation can be used as inputs to another calculation.

97 MATHEMATICS AND COMPUTING↗
DOE OSTI2022

Multi-pitch nano-accuracy surface profiler for strongly curved X-ray mirror metrology

We present our recent research and development effort on the Multi-Pitch Nano-accuracy Surface Profiler (MPNSP). This metrology instrument is developed to characterize strongly curved X-ray mirrors proposed to achieve diffraction-limited soft X-ray focusing for scientific applications at the synchrotron beamlines. The measurement process consists of forward-and-backward scans on the test mirror surface along its tangential direction at multiple pitch angles. Our research and development in this work aim to take the challenge of measuring strongly curved X-ray mirrors with a typical total slope range ≳10 mrad, while maintaining the Root Mean Square (RMS) value of measurement repeatability and self-consistency at 50 nrad RMS level. We first introduce the mechanical design, followed by a brief review of the mathematical model and the optimization algorithm for the MPNSP technique. By detecting the rotation axis of the mirror pitch with a machine vision approach, we can determine and then reduce the vertical distance between the pitch rotation axis and the test mirror surface to a sub-mm level. In addition, we describe a practical data acquisition procedure for strongly curved X-ray mirrors with a total slope range larger than the slope measuring range of the autocollimator used in the instrument. As a result, the proposed MPNSP measurements with different mirror orientations achieve remarkable self-consistency and reproducibility of < 50 nrad RMS in slope and < 0.5 nm RMS in height.

42 ENGINEERING↗
DOE OSTI2026

Improvements in optical metrology for high-performance variable-line-spacing x-ray gratings

Here, we discuss a project to develop a precision metrology system for variable-line-spacing x-ray gratings using interferometric microscopes. We are developing test standards and calibration techniques to measure and correct for geometrical distortion and blur, and data processing techniques to combine multiple measurements and measure line spacing with high accuracy.

Calibration methods↗
DOE OSTI2024

Achieving the Heisenberg limit with Dicke states in noisy quantum metrology

Going beyond the standard quantum limit in noisy quantum metrology is an important and challenging task. Here we show how Dicke states can be used to surpass the standard quantum limit and achieve the Heisenberg limit in open quantum systems. The system we study has qubits symmetrically coupled to a resonator, and our objective is to estimate the coupling between the qubits and the resonator. The time-dependent quantum Fisher information with respect to the coupling is studied for this open quantum system where the same decay rates are assumed on all qubits. We show that when the system is initialized to a Dicke state with an optimal excitation number one can go beyond the standard quantum limit and achieve the Heisenberg limit even for finite values of the decays on the qubit and the resonator, particularly when the qubits and resonator are strongly coupled. We compare our results against the highly entangled GHZ state and a completely separable state and show that the GHZ state performs quite poorly, whereas under certain noise conditions the separable state is able to go beyond the standard quantum limit due to subsequent interactions with a resonator.

open quantum systems & decoherence↗
DOE OSTI2025

Interplay Between Time and Energy in Bosonic Noisy Quantum Metrology

Quantum entanglement and coherence often allow for protocols that outperform classical ones in estimating a system’s parameter. When using infinite-dimensional probes (such as a bosonic mode), one could, in principle, obtain infinite precision in a finite time for both classical and quantum protocols, which makes it hard to quantify potential quantum advantage. However, such a situation is unphysical, as it would require infinite resources, so one needs to impose some additional constraint: typically the average energy employed by the probe is finite. Here we treat both energy and time as a resource, showing that, in the presence of noise, there is a nontrivial interplay between the average energy and the time devoted to the estimation. Our results are valid for the most general metrological schemes (e.g., adaptive schemes, which may involve entanglement with external ancillae or any kind of continuous measurement). We apply recently derived precision bounds for all parameters characterizing the paradigmatic case of a bosonic mode, subject to Lindbladian noise. We show how the time employed in the estimation should be partitioned in order to achieve the best possible precision. In most cases, the optimal performance may be obtained without the necessity of adaptivity or entanglement with ancilla. We compare results with classical strategies. Interestingly, for temperature estimation, applying a fast-prepare-and-measure protocol with Fock states provides better scaling with the number of photons than any classical strategy.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2025

Harnessing on-machine metrology data for prints with a surrogate model for laser powder directed energy deposition

In this study, we leverage the massive amount of multi-modal on-machine metrology data generated from Laser Powder Directed Energy Deposition (LP-DED) to construct a comprehensive surrogate model of the 3D printing process. By employing Dynamic Mode Decomposition with Control (DMDc), a data-driven technique, we capture the complex physics inherent in this extensive dataset. This physics-based surrogate model emphasizes thermodynamically significant quantities, enabling us to accurately predict key process outcomes. The model ingests 21 process parameters, including laser power, scan rate, and position, while providing outputs such as melt pool temperature, melt pool size, and other essential observables. Furthermore, it incorporates uncertainty quantification to provide bounds on these predictions, enhancing reliability and confidence in the results. We then deploy the surrogate model on a new, unseen part and monitor the printing process as validation of the method. Our experimental results demonstrate that the predictions align with actual measurements with high accuracy, confirming the effectiveness of our approach. Furthermore, this methodology not only facilitates real-time predictions but also operates at process-relevant speeds, establishing a basis for implementing feedback control in LP-DED.

Digital twins↗
DOE OSTI2022

A Quantitative Method for In Situ Pump-Beam Metrology in 4D Ultrafast Electron Microscopy

In this work, we report a method for measuring spot size and focusing conditions of the femtosecond (fs) excitation laser in situ at the specimen location in 4D ultrafast electron microscopy (UEM). The method makes use of threshold laser ablation behaviors of thin amorphous carbon membranes. For Gaussian beam profiles and for ablation threshold fluence values, we analytically derive expressions describing the relationship between ablated hole size and the actual laser spot size. Using these expressions, we developed experimental procedures for characterizing the shape and spot size of the pump beam at the specimen. We demonstrate the viability of the approach for incident excitation wavelengths of 343 nm and 515 nm, thus illustrating the applicability of the method to a range of optical wavelengths without modification. Further, we show that by measuring ablated hole size as a function of focusing condition, a full metrological characterization of the Gaussian beam propagation properties can be performed. Finally, we find good agreement for spot sizes determined with this method and with those determined by extrapolation from measurements taken outside the microscope column. Overall, this method is a simple, cost-effective means for accurate and precise determination of key pump-beam parameters in situ at the specimen location in UEM experiments.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
DOE OSTI2026

Metrology for femtosecond pulsed x-ray heating in diamond anvil cell experiments at the European XFEL: Revisiting the iron phase diagram up to 150 GPa

The development of pulsed intense x-ray sources, such as free electron laser, offers new avenues for high pressure experiments. Here, we study the feasibility and metrology of x-ray heating in diamond anvil cells at the European x-ray free electron laser. This method enables one to volumetrically heat the sample while inhibiting chemical migration and probing the crystallographic structure of the sample throughout the heating with a high repetition rate. We focus our study on iron, whose phase diagram is well established up to 100 GPa, to explore the possibilities and limitations of this technique. We volumetrically heat iron samples at starting pressures ranging from 10 to 138 GPa, using the x-ray beam pulsed at 4.5 MHz in a serial pump-and-probe experimental design. Experimental challenges arise from temperature gradients within the sample, changes in temperature at the 100 ns timescale, the difficulty of direct temperature estimates, the effect of thermal pressure, and the presence of metastable crystallites due to rapid cycles of heating and cooling. Hence, we develop a multi-crystal-like data processing method that allows us to account for sample heterogeneity in probed conditions. We then calibrate our measurements using known physical properties of iron under pressure. Thermal pressure in our experiments increases from 4% of the isochoric prediction at 10 GPa to 23% at 138 GPa, and we show that our data are in agreement with most previous observations of iron in this pressure range. The method can now be implemented at higher pressures and temperatures and on materials with unknown phase diagrams.

Materials science↗
DOE OSTI2025

Nuclear spin metrology with nitrogen vacancy center in diamond for axion dark matter detection

We present a method to directly detect the axion dark matter using nitrogen vacancy centers in diamonds. In particular, we use metrology leveraging the nuclear spin of nitrogen to detect axion-nucleus couplings. This is achieved through protocols designed for dark matter searches, which introduce a novel approach of quantum sensing techniques based on the nitrogen vacancy center. Although the coupling strength of the magnetic fields with nuclear spins is three orders of magnitude smaller than that with electron spins for conventional magnetometry, the axion interaction strength with nuclear spins is the same order of magnitude as that with electron spins. Furthermore, we can take advantage of the long coherence time by using the nuclear spins for the axion dark matter detection. Our method has the potential to be sensitive to a broad frequency range ≲ 100 Hz corresponding to the axion mass m a ≲ 4 × 10 − 13 eV . We present the detection limit of our method for both the axion-neutron and the axion-proton couplings and discuss its significance in comparison with other proposed ideas. We also show that the sensitivities of the NV center sensor to various spin species will open up new directions for constructing protocols that can mitigate magnetic noise effects. Published by the American Physical Society 2025

Chigusa, So (ORCID:0000000160054447)↗
DOE OSTI2025

Quantum metrology of low-frequency electromagnetic modes with frequency upconverters

We present the RF Quantum Upconverter (RQU) and describe its application to quantum metrology of electromagnetic modes between dc and the very high frequency band (VHF) ( ≲ 300 MHz). The RQU uses a Josephson interferometer made up of superconducting loops and Josephson junctions to implement a parametric interaction between a low-frequency electromagnetic mode (between dc and VHF) and a mode in the microwave C Band ( ∼ 5 GHz), analogous to the radiation pressure interaction between electromagnetic and mechanical modes in cavity optomechanics. We analyze RQU performance with quantum amplifier theory and show that the RQU can operate as a quantum-limited op-amp in this frequency range. It can also use nonclassical measurement protocols equivalent to those used in cavity optomechanics, including back-action evading (BAE) measurements, sideband cooling, and two-mode squeezing. These protocols enable experiments using dc VHF electromagnetic modes as quantum sensors with sensitivity better than the standard quantum limit (SQL). We demonstrate signal upconversion from low frequencies to the microwave C band using an RQU and show a phase-sensitive gain (extinction ratio) of 46.9 dB , which is a necessary step towards the realization of full BAE. Published by the American Physical Society 2025

Kuenstner, Stephen E. (ORCID:0000000346128846)↗
DOE OSTI2026

WFSUITE: A PYTHON SOFTWARE SUITE FOR X-RAY WAVEFRONT SENDING AND AT-WAVELENGTH METROLOGY

SF-26-025 WFSuite is a graphical and command-line toolkit for coded-mask-based X-ray wavefront sensing and phase reconstruction at synchrotron beamlines. It integrates analysis tools for both relative and absolute speckle-based measurements. In the relative metrology module, WFSuite implements Wavelet-transform-based X-ray Speckle Tracking (WXST) and Wavelet-transform-based Speckle Vector Tracking (WSVT) methods to retrieve differential phase and wavefront distortions by comparing speckle patterns recorded with and without the test sample. In the absolute phase module, WFSuite uses coded-mask speckle patterns and replaces the measured reference with a numerically simulated one, enablingsingle-shot wavefront reconstruction using either WXST or a neural-network-based method (SPINNet).

Rebuffi, Luca [Argonne National Laboratory (ANL), ↗
DOE OSTI2021

Synchrotron X-ray metrology of dopant distribution and oxidation state in high pressure CVD grown TM 2+ :ZnSe optical fibers

High pressure chemical vapor deposition (HPCVD) has shown to be a promising method for producing Cr 2+ :ZnSe and Fe 2+ :ZnSe mid-IR optical fiber lasers. The oxidation state of the dopants and their spatial homogeneity are critical for the characterization of effective fiber laser performance; however, this is challenging for small fiber cores and small doping concentrations. We demonstrate using synchrotron micro X-ray fluorescence (XRF) mapping to study the distribution of the dopants throughout the fiber cross-sections. Furthermore, we study the local chemical environment of these unique fiber structures using micro X-ray near edge absorption spectroscopy (XANES). Our study reveals that transition metal doped ZnSe deposited using HPCVD has nanoscale dopant aggregation although the material is chemically identical to the commercially produced diffusion doped laser crystals, as indicated by the presence +2 oxidation state of the dopants. This work demonstrates the power of synchrotron-based X-ray techniques for use as metrology tools for improving the performance of laser materials in fiber geometry.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
DOE OSTI2022

Nonlocal subpicosecond delay metrology using spectral quantum interference

Precise knowledge of position and timing information is critical to support elementary protocols such as entanglement swapping on quantum networks. While approaches have been devised to use quantum light for such metrology, they largely rely on time-of-flight (ToF) measurements with single-photon detectors and, therefore, are limited to picosecond-scale resolution owing to detector jitter. In this work, we demonstrate an approach to distributed sensing that leverages phase modulation to map changes in the spectral phase to coincidence probability, thereby overcoming the limits imposed by single-photon detection. By extracting information about the joint biphoton phase, we measure a generalized delay—the difference in signal–idler arrival, relative to local radio frequency (RF) phase modulation. For nonlocal ranging measurements, we achieve (2$σ$) precision of ±0.04 ps and for measurements of the relative RF phase, (2$σ$) precision of ±0.7°. We complement this fine timing information with ToF data from single-photon time-tagging to demonstrate absolute measurement of time delay. By relying on off-the-shelf telecommunications equipment and standard quantum resources, this approach has the potential to reduce overhead in practical quantum networks.

42 ENGINEERING↗