Search NASA⌕ Search

SEARCH · Search NASA

Results for “process controls”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 55 records · Page 3

Methods of measurement for semiconductor materials, process control, and devices

The development of methods of measurement for semiconductor materials, process control, and devices is discussed. The following subjects are also presented: (1) demonstration of the high sensitivity of the infrared response technique by the identification of gold in a germanium diode, (2) verification that transient thermal response is significantly more sensitive to the presence of voids in die attachment than steady-state thermal resistance, and (3) development of equipment for determining susceptibility of transistors to hot spot formation by the current-gain technique.

Bullis, W. M.↗

Interoperability for Space Mission Monitor and Control: Applying Technologies from Manufacturing Automation and Process Control Industries

Various issues associated with interoperability for space mission monitor and control are presented in viewgraph form. Specific topics include: 1) Space Project Mission Operations Control Architecture (SuperMOCA) goals and methods for achieving them; 2) Specifics on the architecture: open standards ad layering, enhancing interoperability, and promoting commercialization; 3) An advertisement; 4) Status of the task - government/industry cooperation and architecture and technology demonstrations; and 5) Key features of messaging services and virtual devices.

Jones, Michael K.↗

SAFE-OCC: A novelty detection framework for Convolutional Neural Network sensors and its application in process control

Herein we present a novelty detection framework for Convolutional Neural Network (CNN) sensors that we call Sensor-Activated Feature Extraction One-Class Classification (SAFE-OCC). We show that this framework enables the safe use of computer vision sensors in process control architectures. Emergent control applications use CNN models to map visual data to a state signal that can be interpreted by the controller. Incorporating such sensors introduces a significant system operation vulnerability because CNN sensors can exhibit high prediction errors when exposed to novel (abnormal) visual data. Unfortunately, identifying such novelties in real-time is nontrivial. To address this issue, the SAFE-OCC framework leverages the convolutional blocks of the CNN to create an effective feature space to conduct novelty detection using a desired one-class classification technique. This approach engenders a feature space that directly corresponds to that used by the CNN sensor and avoids the need to derive an independent latent space. We demonstrate the effectiveness of SAFE-OCC via simulated control environments.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Statistical Process Control and Analysis on the Water Content Measurements in NASA Glenn’s Icing Research Tunnel

The Icing Research Tunnel at NASA Glenn follows the recommended practice for calibration outlined in SAE’s ARP5905. The calibration team has followed the schedule of a full calibration every five years with a check calibration done every six months following. The liquid water content of the IRT has maintained stability within the stated specifications of variation within +/- 10% of the curve fit equation generated from calibration data. Using past measurements and data trends, IRT characterization engineers wanted to develop methods for the ability to know when data were not within variation. Trends can be observed in the liquid water content measurement process by constructing statistical process control charts. This paper describes data processing procedures for the Multi-Element Sensor in the IRT, including collision efficiency corrections, canonical correlation analysis, process for rejection of data, and construction of control charts. Data are presented to display the control capability to meet defined liquid water content specifications of the IRT with the Multi-Element Sensor mounted in the center of the test section.

Statistical Process Control↗

Statistical Process Control and Analysis on the Water Content Measurements in NASA Glenn’s Icing Research Tunnel

The Icing Research Tunnel at NASA Glenn follows the recommended practice for calibration outlined in SAE’s ARP5905. The calibration team has followed the schedule of a full calibration every five years with a check calibration done every six months following. The liquid water content of the IRT has maintained stability within the stated specifications of variation within +/- 10% of the curve fit equation generated from calibration data. Using past measurements and data trends, IRT characterization engineers wanted to develop methods for the ability to know when data were not within variation. Trends can be observed in the liquid water content measurement process by constructing statistical process control charts. This paper describes data processing procedures for the Multi-Element Sensor in the IRT, including collision efficiency corrections, canonical correlation analysis, process for rejection of data, and construction of control charts. Data are presented to display the control capability to meet defined liquid water content specifications of the IRT with the Multi-Element Sensor mounted in the center of the test section.

Statistical Process Control↗

Derivation of sequential, real-time, process-control programs

The use of weakest-precondition predicate transformers in the derivation of sequential, process-control software is discussed. Only one extension to Dijkstra's calculus for deriving ordinary sequential programs was found to be necessary: function-valued auxiliary variables. These auxiliary variables are needed for reasoning about states of a physical process that exists during program transitions.

Marzullo, Keith↗

Methods of measurement for semiconductor materials, process control, and devices

Activities directed toward the development of methods of measurement for semiconductor materials, process control, and devices are described. Topics investigated include: measurements of transistor delay time; application of the infrared response technique to the study of radiation-damaged, lithium-drifted silicon detectors; and identification of a condition that minimizes wire flexure and reduces the failure rate of wire bonds in transistors and integrated circuits under slow thermal cycling conditions. Supplementary data concerning staff, standards committee activities, technical services, and publications are included as appendixes.

Bullis, W. M.↗

Methods of measurement for semiconductor materials, process control, and devices

Activities directed toward the development of methods of measurement for semiconductor materials, process control, and devices are described. Accomplishments include the determination of the reasons for differences in measurements of transistor delay time, identification of an energy level model for gold-doped silicon, and the finding of evidence that it does not appear to be necessary for an ultrasonic bonding tool to grip the wire and move it across the substrate metallization to make the bond. Work is continuing on measurement of resistivity of semiconductor crystals; study of gold-doped silicon; development of the infrared response technique; evaluation of wire bonds and die attachment; measurement of thermal properties of semiconductor devices, delay time, and related carrier transport properties in junction devices, and noise properties of microwave diodes; and characterization of silicon nuclear radiation detectors.

Bullis, W. M.↗

TRA Warm Waste Treatment Facility Process Controller Replacement

This poster details the work I did to replace the TRA Warm Waste Treatment System Process Controller. Additionally, my poster explains what Warm waste is, how the warm waste treatment system functions, and the next steps moving forward in the engineering process.

12 MANAGEMENT OF RADIOACTIVE AND NON-RADIOACTIVE W↗

Existence of a robust optimal control process for efficient measurements in a two-qubit system

The verification of quantum entanglement is essential for quality control in quantum communication. In this work we propose an efficient protocol to directly verify the two-qubit entanglement of a known target state through a single-expectation-value measurement. Our method provides exact entanglement quantification using the concurrence measure without performing quantum state tomography. We prove the existence of a unitary transformation that drives a known initial state of a two-qubit system to a designated final state, where the trace over a chosen observable directly yields the concurrence of the initial state. Furthermore, we implement an optimal control process of that transformation and demonstrate its effectiveness through numerical simulations. We also show that this process is robust to environmental noise. Our approach offers advantages in directly verifying entanglement with low circuit depth, making it suitable for industrial-scale quality control of entanglement generation. Our results presented here provide mathematical justification for our earlier computational experiments.

Rodriguez, Ricardo [McPherson Coll.] (ORCID:000000↗

Knowledge-based process control and diagnostics for orbital cryogen transfer

AFDex is a rule based system designed to provide intelligent process control, diagnosis, and error recovery for a Shuttle based cryogenic experiment, SHOOT (Superfluid Helium On-Orbit Transfer). This paper describes the AFDex system in the context of traditional associative, model-based, and qualitative systems and discusses the implications of this first expert system in space.

Raymond, Eric A.↗