Feasibility study of vacuum gauging using electron-induced soft X-rays
Vacuum gage feasibility using electron-induced soft X rays
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Vacuum gage feasibility using electron-induced soft X rays
The effect of irradiation on the light transmittance of ethylene-propylene-A (FEP-A) was investigated by measuring the short-circuit current of the cells after each of several electron dose increments, immediately after total irradiation, and 16 hours after total irradiation. Results indicated no apparent overall loss in transmission due to irradiation of FEP-A. However, filter wheel measurements revealed a 'darkening' of the FEP-A at the blue end of the spectrum. Some embrittlement of the FEP-A occurred at an accumulated dose of 67,500,000 rads.
A two dimensional nonstationary model of the propagation of a relativistic electron beam injected into a vacuum is considered. Collision effects are ignored and there are no external fields. Two types of the electron current propagation are shown from the computer simulation of the Maxwell-Vlasov equations.
Vacuum evaporated tin microscopic particles on carbon substrate used as standard for electron microscope alignment
Research into processing techniques for fabrication of vacuum microelectronic devices has been carried out, with special emphasis being given to the growth of silicon dioxide thin films. Oxide films ranging from 30 nm to approximately 2 micrometers have been grown on single crystal silicon wafers. Metal-oxide-semiconductor capacitor test structures have been made from some of these oxide films, and current-versus-voltage plots for these structures have been measured. It has been observed that the rate of applied voltage across the oxide films produces marked differences in measured leakage current. Breakdown fields across two of the thinnest oxide films have been measured and are comparable with highest values reported in literature. Several silicon wafers were processed to make field- emitter array diodes, and were delivered to collaborators at NASA-Lewis Research Center for final fabrication steps and testing.
Vacuum ultraviolet multiplets of C I, C II, and O I were produced by electron impact of CO2. Absolute emission cross sections for these multiplets were measured from threshold to 350 eV. The electrostatically focussed electron gun used in this series of experiments is described in detail. The atomic multiplets which were produced by dissociative excitation of CO2 and the cross sections at 100 eV are given. The dependence of the excitation functions on electron energy shows that these multiplets are produced by electric-dipole-allowed transitions in CO2.
Vacuum ultraviolet multiplets of C I, C II, and O I were produced by electron impact on CO2. Absolute emission cross sections for these multiplets were measured from threshold to 350 eV. The electrostatically focused electron gun used is described in detail. The atomic multiplets which were produced by dissociative excitation of CO2 and the cross sections at 100 eV are presented. The dependence of the excitation functions on electron energy shows that these multiplets are produced by electric-dipole-allowed transitions in CO2.
Vacuum UV emission features dissociative excitation by electron impact on molecular hydrogen and oxygen, measuring excitation cross sections from threshold to 350 eV
A scale model of a satellite was tested in a large vacuum facility under electron bombardment and vacuum ultraviolet radiation to investigate the charging of dielectric materials on curved surfaces. The model was tested both stationary and rotating relative to the electron sources as well as grounded through one megohm and floating relative to the chamber. Surface potential measurements are presented and compared with the predictions of computer modelling of the stationary tests. Discharge activity observed during the stationary tests is discussed and signals from sensing devices located inside and outside of the model are presented.
A scale model of a satellite was tested in a large vacuum facility under electron bombardment and vacuum ultraviolet radiation to investigate the charging of dielectric materials on curved surfaces. The model was tested both stationary and rotating relative to the electron sources as well as grounded through one megohm and floating relative to the chamber. Surface potential measurements are presented and compared with the predictions of computer modelling of the stationary tests. Discharge activity observed during the stationary tests is discussed and signals from sensing devices located inside and outside of the model are presented.
The electron excitation function for the H2(a 3Sigma(g)(+) - b 3Sigma(u)(+)) continuum emission has been measured from 11 to 30 eV at 195.0 nm. The emission cross, section data have been combined with electron energy loss cross section measurements to extend the experimental data to 60 eV. The excitation cross section has been estimated by normalizing the data to the electron energy loss cross section at 20 eV and using a model to account for emission from the entire band system. The spin forbidden excitation of the a 3Sigma(g)(+) state is a major dissociative channel of H2 at low energy with a peak cross section of 1.7 +/- 0.85 x 10 exp -17 sq cm at 15.5 eV. The FWHM of the cross section is 7 eV. The high energy dependence of the cross section has a rapid 1/E-cubed fall off with electron energy, E, above 50 eV. A modified Born approximation analysis was applied to the data to provide an analytic model.
The threshold behavior of the ultraviolet photon excitation function for electron impact on carbon monoxide was studied for the pseudo-resonance signal reported elsewhere. Time of flight spectrometer techniques were not able to confirm the resonant feature in excited CO states under electron impact.
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The cross sections for the He I 1s2 1S-1snp 1P0 series have been measured using a relative flow method, with the absolute scale fixed by the H Ly-alpha dissociative excitation cross section standard. The results are compared with those obtained using a relative cross section data analysis by modified Born approximation, and good agreement is found. Cross sections for the ionization-excitation of the He II 121.51 nm and He II 164.04 nm transmissions have been measured, and the results strongly suggest that theoretical calculations of the reactions differ fundamentally from physical reality. The failure of the theory to describe experimental results stems from the neglect in the theory of electron correlation effects between the two orbital electrons.
Measurements of the VUV emission cross sections of SO2 from 40 to 200 nm in the laboratory in a crossed beam experiment are reported. The wavelength range comprised the EUV spectrum, from 40 to 120 nm, and the FUV spectrum, from 120 to 200 nm. The studies included the measurement of excitation functions of the strongest multiplets from 0 to 1 keV impact energy and the identification of dissociation processes from the analysis of the threshold excitation function. It is shown that the FUV emission cross sections for dissociative excitation of atomic multiplets are generally much larger in the FUV than in the EUV. The emission cross sections measured are important for the preparation and data analysis of spacecraft observations of Io to be obtained for the 1990s.
Electron energy effects on reflectance degradation and recovery of thermal control materials in vacuum, reporting test results for various protective coatings
Vacuum ultraviolet radiation from N-plus and O-plus - electron recombination in high temperature air