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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 541 records · Page 30

Petrology of some lithic fragments from Luna 20.

Microscopic and electron microprobe studies were made of polished thin sections of part of a 30-mg sample of 250- to 500-micron lunar soil returned by Luna 20 from a point between Mare Fecunditatis and Mare Crisium. Very fine-grained lithic (crystalline) rock fragments, composing about one-fifth of the total sample, have mineralogical compositions equivalent to various types of gabbro, anorthositic gabbro, gabbroic anorthosite, and troctolite, with minor basalt. The textures now observed in these fragments are in large part metamorphic. Twenty-seven electron microprobe analyses of minerals from these fragments are presented, including olivine, plagioclase, pyroxene, spinel, nickel-iron, and a Zr-Ti-REE mineral possibly similar to 'phase B' of Lovering and Wark (1971). Analyses of seven melt inclusions and 28 defocused beam analyses of lithic fragments are also given. Some of the fragments contain 'gas' inclusions which, along with the fine grain size, are believed to indicate final crystallization under low pressure near surface conditions.

Roedder, E.↗

NASA's challenge for tomorrow

The early space probes provided our first detailed look at the planets, and demonstrated the critical role played by parts technology. The advanced orbital platform under development, the Space Station Freedom (which represents a pivotal step in the space program) contains about 5 million Electrical, Electronic and Electromechanical (EEE) parts. Thus, EEE parts continue to be crucial to mission success. The NASA EEE parts program establishes and directs policy and integration throughout the Agency. The EEE program structure, issues and solutions are described. The challenge presented by advanced electronic devices is discussed.

Barney, Daniel L.↗

Manufacturing Processes for Permanent Magnets: Part II—Bonding and Emerging Methods

Abstract Permanent magnets produce magnetic fields and maintain the field even in the presence of an opposing magnetic field. They are widely used in electric machines, electronics, and medical devices. Part I reviews the conventional manufacturing processes for commercial magnets, including Nd-Fe-B, Sm-Co, alnico, and ferrite in cast and sintered forms. In Part II, bonding, emerging advanced manufacturing processes, as well as magnet recycling methods are briefly reviewed for their current status, challenges, and future directions.

Cui, Jun (ORCID:0000000179118172)↗

Electronics for Piezoelectric Smart Structures

This paper briefly presents work addressing some of the basic considerations for the electronic components used in smart structures incorporating piezoelectric elements. After general remarks on the application of piezoelectric elements to the problem of structural vibration control, three main topics are described. Work to date on the development of techniques for embedding electronic components within structural parts is presented, followed by a description of the power flow and dissipation requirements of those components. Finally current work on the development of electronic circuits for use in an 'active wall' for acoustic noise is introduced.

Warkentin, D. J.↗

Electronic Tongue for Quantitation of Contaminants in Water

An assembly of sensors, denoted an electronic tongue, is undergoing development as a prototype of compact devices for use in measuring concentrations of contaminants in water. Thus far, the electronic tongue has been tested on ions of Cu, Zn, Pb, and Fe and shown to respond to concentrations as low as about 10 parts per million. This electronic tongue is expected to be capable of measuring concentrations of other metal ions and organic compounds. Potential uses for electronic tongues include monitoring the chemical quality of water in a variety of natural, industrial, and laboratory settings; detecting micro-organisms indirectly by measuring microbially influenced corrosion; and characterizing compounds of interest to the pharmaceutical and food industries. This version of the electronic tongue includes a heater, a temperature sensor, an array of ion-specific electrodes, an oxidation/ reduction sensor pair, an electrical-conductivity sensor, and an array of galvanic cells, all on one compact ceramic substrate. Special-purpose electronic excitation and readout circuitry for the sensors has also been constructed. The main advantage of the electronic tongue, relative to electrodes of this type used traditionally to assess water quality, is extreme ruggedness. The types of measurements that can be performed by use of the sensors on the electronic tongue are quite varied. The best combination of types of measurements for a given application depends on the specific contaminants that one seeks to detect. Experimental studies to identify such combinations were in progress at the time of reporting the information for this article.

Buehler, Marlin↗

Terrestrial Sources of X-Ray Radiation and Their Effects on NASA Flight Hardware

X-rays are an energetic and penetrating form of ionizing electromagnetic radiation, which can degrade NASA flight hardware. The main concern posed by such radiation is degradation of active electronic devices and, in some cases, diodes. Non-electronic components are only damaged at doses that far exceed the point where any electronic device would be destroyed. For the purposes of this document, flight hardware can be taken to mean an entire instrument, the flight electronics within the instrument or the individual microelectronic devices in the flight electronics. This document will discuss and describe the ways in which NASA flight hardware might be exposed to x-rays, what is and isn't a concern, and how to tell the difference. First, we must understand what components in flight hardware may be vulnerable to degradation or failure as a result of being exposed to ionizing radiation, such as x-rays. As stated above, bulk materials (structural metals, plastics, etc.) are generally only affected by ionizing radiation at very high dose levels. Likewise, passive electronic components (e.g. resistors, capacitors, most diodes) are strongly resistant to exposure to x-rays, except at very high doses. The main concerns arise when active components, that is, components like discrete transistors and microelectronic devices, are exposed to ionizing radiation. Active components are designed to respond to minute changes in currents and voltages in the circuit. As such, it is not surprising that exposure to ionizing radiation, which creates ionized and therefore electrically active particles, may degrade the way the hardware performs. For the most part, the mechanism for this degradation is trapping of the charges generated by ionizing radiation by defects in dielectric materials in the hardware. As such, the degree of damage is a function of both the quantity of ionizing radiation exposure and the physical characteristics of the hardware itself. The metric that describes the level of exposure to ionizing radiation is total ionizing dose (TID). The unit of TID is the rad, which is defined as 100 ergs absorbed per gram of material. Dose can be expressed in other units, for example grays (gy), where 1 gy = 100 rads. The actual fluence of radiation needed to deliver a rad depends on the absorbing material, so units of dose are usually stated in reference to the material of interest. That is, for microelectronic devices, the unit of dose is generally rad (Si) or rad (SiO2). However, the definition of absorbed dose in this fashion has the advantage that the type of radiation causing the ionization can be normalized so that a realistic and adequate comparison can be made. The sensitivity of microelectronic parts to TID varies over many orders of magnitude. (Note: Doses to humans are typically expressed in rems-or roentgen-equivalent-man-which measures tissue damage, and depends on the type of radiation, as well as the dose in rads.) Thus far, the "softest" parts tested at NASA showed damage at 500 rads (Si), while parts that are radiation-hardened by design can remain functional to doses on the order of 107 rads (Si). This broad range of sensitivity highlights one of the most important considerations when considering the effects of radiation on electronic parts: In order to determine whether a radiation exposure is a concern for a particular part, one must understand the technologies used in the part and their vulnerabilities to TID damage. A NASA radiation expert should be consulted to obtain such information.

X-ray↗

A study of ignition and simulation circuits for arcjet thrusters, part 1

A 1 kW electronic load was programmed to simulate the nonlinear i-v (volt-ampere) characteristics of an arcjet, both ignited and unignited. The simulator was tested and found to closely resemble an arcjet both for large transients and small perturbances up to about 40 kHz. No attempt was made to simulate the ignition process itself. The dynamic behavior of the arcjet (and the simulator) was shown to differ significantly from that of a resistor bank. Previous research led to the design and construction of a 1 kW arcjet power supply. A high voltage ignition circuit was added to this hardware, and tests on a 1 kW arcjet were performed at NASA-Lewis. All tests were successful and no ignition failures were observed. Circuit documentation and test results are included.

Stuart, Thomas A.↗

Electron Impact Excitation Cross Section Measurement for n=3 to n=2 Line Emission in Fe(17+) to Fe(23+)

We have measured the electron impact excitation cross sections for the strong iron L-shell 3 --> 2 lines of Fe XVIII to Fe XXIV at the EBIT-I electron beam ion trap using a crystal spectrometer and NASA-Goddard Space Flight Centers 6 x 6 pixel array microcalorimeter. The cross sections were determined by direct normalization to the well established cross section of radiative electron capture through a sophisticated model analysis which results in the excitation cross section for the strong Fe L-shell lines at multiple electron energies. This measurement is part of a laboratory X-ray astrophysics program utilizing the Livermore electron beam ion traps EBIT-I and EBIT-II.

Chen, H.↗

Application of Temperature-Controlled Thermal Atomization for Printing Electronics in Space

Additive Manufacturing (AM) is a technology that builds three dimensional objects by adding material layer-upon-layer throughout the fabrication process. The Electrical, Electronic and Electromechanical (EEE) parts packaging group at Marshall Space Flight Center (MSFC) is investigating how various AM and 3D printing processes can be adapted to the microgravity environment of space to enable on demand manufacturing of electronics. The current state-of-the art processes for accomplishing the task of printing electronics through non-contact, direct-write means rely heavily on the process of atomization of liquid inks into fine aerosols to be delivered ultimately to a machine's print head and through its nozzle. As a result of cumulative International Space Station (ISS) research into the behaviors of fluids in zero-gravity, our experience leads us to conclude that the direct adaptation of conventional atomization processes will likely fall short and alternative approaches will need to be explored. In this report, we investigate the development of an alternative approach to atomizing electronic materials by way of thermal atomization, to be used in place of conventional aerosol generation and delivery processes for printing electronics in space.

Wu, Chih-Hao↗

p -Azaquinodimethane: A Versatile Quinoidal Moiety for Functional Materials Discovery

The past 50 years of discovery in organic electronics have been driven in large part by the donor–acceptor design principle, wherein electron-rich and electron-poor units are assembled in conjugation with each other to produce small band gap materials. While the utility of this design strategy is undoubtable, it has been largely exhausted as a frontier of new avenues to produce and tune novel functional materials to meet the needs of the ever-increasing world of organic electronics applications. Its sister strategy of joining quinoidal and aromatic groups in conjugation has, by comparison, received much less attention, to a great extent due to the categorically poor stability of quinoidal conjugated motifs. In 2017 though, the p-azaquinodimethane (AQM) motif was first unveiled, which showed a remarkable level of stability despite being a close structural analogue to p-quinodimethane, a notably reactive compound. In contrast, dialkoxy AQM small molecules and polymers are stable even under harsh conditions and could thus be incorporated into conjugated polymers. When polymerized with aromatic subunits, these AQM-based polymers show notably reduced band gaps that follow reversed structure–property trends to some of their donor–acceptor polymer counterparts and yield organic field-effect transistor (OFET) hole mobilities above 5 cm 2 V –1 s –1 . Additionally, in an ongoing study, these AQM-based compounds are also showing promise as singlet fission (SF) active materials due to their mild diradicaloid character. An expanded world of AQMs was accessed through their ditriflate derivatives, which were first used to produce ionic AQMs (iAQMs) sporting two directly attached cationic groups that significantly affect the AQM motif’s electronics, producing strongly electron-withdrawing quinoidal building blocks. Conjugated polyelectrolytes (CPEs) created with these iAQM building blocks exhibit optical band gaps stretching into the near-infrared I (NIR-I) region and showed exemplary behavior as photothermal therapy agents. In contrast to these stable AQM examples, the synthetic exploration of AQMs also produced examples of more typical diradicaloid reactivity but in forms that were controllable and produced intriguing and high-value products. With certain substitution patterns, AQMs were found to dimerize to form highly substituted [2.2]paracyclophanes in distinctly more appreciable yields than typical cyclophane formation reactions. Certain AQM ditriflates, when crystallized, undergo light-induced topochemical polymerization to form ultrahigh molecular weight (>10 6 Da) polymers that showed excellent performances as dielectric energy storage materials. These same AQM ditriflates could be used to produce the strongly electron-donating redox-active pentacyclic structure: pyrazino[2,3-b:5,6-b']diindolizine (PDIz). Importantly, the PDIz motif allowed for the synthesis of exceedingly small band gap (0.7 eV) polymers with absorbances reaching all the way into the NIR-II region that were also found to produce strong photothermal effects. Both as stable quinoidal building blocks and through their controllable diradicaloid reactivity, AQMs have already proven to be versatile and effective as functional organic electronics materials.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Electron-proton spectrometer quality assurance procedures for equipment and parts

Quality control procedures are established for personnel who are concerned with receiving, storage, transfer, inspection, and use of flight or mission related hardware for the electron/proton spectrometer (EPS) program. While general guidelines, designed to cover all situations, exist, this document provides guidelines and procedures specifically designed to supplement the quality assurance activity on the EPS Program. It is the purpose of this document to insure that all equipment, parts and other hardware received and/or used in the EPS program meet or surpass the standards and requirements established by cognizant authorities.

Gleeson, P.↗

Three-dimensional relativistic field-electron interaction in a multicavity high-power klystron. Part 2: Working Equations

A high power multicavity klystron amplifier was designed and a computation package containing all equations and procedures needed is presented. The rigorously derived three dimensional relativistic axisymmetric equations of motion are used to compute the bunched current and the induced RF gap voltage for all interaction cavities except the input and second cavities, where the linear space charge wave theory data are employed in order to reduce the computation time. Both distance step and time step integration methods are used to compute the Fourier coefficients of both the beam current and induced current.

Kosmahl, H. G.↗

Electromagnetic processes in the atmosphere of pulsars

The work consists of two parts. The first deals with the fine structure of radio pulses. Based on kinetic theory, processes occurring in the plasma shell of a pulsar when external electromagnetic radiation is present are investigated. It is shown that electromagnetic waves cause electrons to drift relative to ions, and initiate longitudinal oscillations. A dispersion equation describing the longitudinal oscillations in magnetized plasma is derived. Conditions for excitation of oscillations are found. Correlation functions of electron density are calculated, along with the coefficients of electromagnetic wave scattering. It is shown that variations in the amplitude of pulsar pulses are associated with scintillations caused by fluctuations in the plasma electron density. The second part of the study presents a mechanism for the radio emission of pulsars. The model of a rotating and a pulsating star, a neutron star with dipolar or more complex magnetic field, is examined.

Yukhimuk, A. K.↗

Effect of Surface Treatments on Electron Beam Freeform Fabricated Aluminum Structures

Electron beam freeform fabrication (EBF3) parts exhibit a ridged surface finish typical of many layer-additive processes. This, post-processing is required to produce a net shape with a smooth surface finish. High speed milling wire electrical discharge machining (EDM), electron beam glazing, and glass bead blasting were performed on EBF3-build 2219 aluminum alloy parts to reduce or eliminate the ridged surface features. Surface roughness, surface residual stress state, and microstructural characteristics were examined for each of the different surface treatment to assess the quality and effect of the surface treatments on the underlying material. The analysis evaluated the effectivenes of the different surface finishing techniques for achieving a smooth surface finish on an electron beam freeform fabricated part.

Taminger, Karen M. B.↗

Lunar Gateway Charging and Effects on Low-Energy Electron Measurements

The Electron Electrostatic Analyzer (EEA) is part of the HERMES instrument suite on Lunar Gateway and is designed to measure electrons in the energy range from 1 eV to 18 keV. Electrons in this range can be deflected or blocked from entering a detector by electric fields from a charged spacecraft platform, so many heliophysics missions (MMS, Cluster, etc.) use active potential control to minimize stray electric fields which would corrupt low-energy plasma measurements. Gateway, however, does not have such capabilities so the surface charging effects will influence the electron data. Further, some elements of Gateway partially block the instrument’s field of view to space. The effects of the Gateway platform on the low-energy electron population must be understood to maximize the accuracy of the EEA data. To investigate the electrostatic environment near Gateway and its effects on the EEA measurements, we use Nascap-2K to model the expected charging of Gateway under representative solar wind, magnetosheathic, and magnetospheric conditions. Next, we use the potential and electric field outputs from Nascap-2K along with in-house particle tracing codes to investigate how low-energy electrons are perturbed, blocked, or deflected by the spacecraft. We discuss how these perturbations impact the plasma moments computed from the EEA data and possible approaches for correcting the charging effects including application of advanced methods such as neural networks. In addition to electrons from the space environment being influenced by the electrostatic environment around Gateway, photoelectrons generated on Gateway surfaces will also be measured by EEA. We are investigating how knowledge of the potentials of various Gateway surfaces can be extracted from these measured photoelectrons using advanced numerical modeling and analysis. Such information would be valuable for validating charging models and planning mission operations around the platform. Finally, we discuss how the specific workflow developed for Gateway can be extended to a generalized process that is applicable to other future missions. As the space industry prepares for human exploration beyond low-Earth orbit, the need to obtain accurate space weather data from rideshare science payloads is critical. Our process for removing platform effects from the science data serves as a pathfinder for leveraging advanced simulations to maximize science returns and ensure the safety and success of future crewed missions.

Miles Bengtson↗