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At least 559 records · Page 31

Particle track record of Apollo 15 green soil and rock.

Track densities, track stability, and uranium contents have been measured in lunar samples containing abundant green glass spherules from stations 6a and 7 of the Apollo 15 mission. This glass is rather homogeneous in its track registration properties but nonuniform in its uranium content, specific gravity, and bulk etching rate. The major components of a soil sample, 15401, are found to have had an unusually short surface exposure (500,000 yr) and to have been stirred at least once, but not often during its lifetime. A nearby soil clod, 15426, appears to have been brought to the surface in the same event. 15405, the rock upon which 15401 was perched, has recorded deformation features and track densities compatible with its surface residence having begun at the same time.

Fleischer, R. L.↗

Mariner 9 observations of the surface of Mars in the north polar region.

During the Mariner 9 extended mission the recession of the north polar ice caps was monitored for 130 days. The edge of the cap displayed a peculiar polygonal outline during most of this period. Regional topographic control is suggested as the most likely cause of the polygonality. Whereas densely cratered terrain dominates the south polar region, moderately cratered plains underlie the polar deposits in the north polar region. The mottled cratered plains have been mantled by light deposits located in annular rings south of 70 N. The erosional boundaries between these deposits and the subjacent cratered plains are gradational, show no local topographic relief, and display a spiral serrated circumpolar pattern suggesting eolian erosion. Smooth plains and 'etch-pitted' plains underlie the central polar layered deposits in both polar regions. In addition, these plains have one other morphological variant in the north. Here they display a pattern of very coherent ripple-like waveforms varying in wavelength from several hundred meters to a few kilometers.

Soderblom, L. A.↗

Mechanical erasure of particle tracks - A tool for lunar microstratigraphic chronology.

Mechanical erasure of particle tracks caused by impact deformation is shown to be a common feature of lunar soil grains. Etching of lunar pyroxenes reveals deformation markings that are evidence of prior impact events. The soil microstratigraphic chronology can be derived if it is assumed that the minimum track density in a thin soil layer is commonly found in grains where such erasure was caused by the impact that deposited the soil. With Apollo 12 core samples as examples, the minimum track density found in each layer is used to calculate the longest exposure that layer could have received since it was last disturbed. By summing the upper limits on the exposure times of the different layers, a lower limit on the average deposition rate was estimated to be 0.35 cm/m.y.

Fleischer, R. L.↗

Thin-film temperature sensor.

A new device has been developed for sensing small and rapid temperature changes accompanying biochemical reactions. The active element consists of an evaporated thin-film capacitor having a relatively strong temperature dependence. This dependence is derived from electron trapping effects in the thin amorphous dielectric film. A voltage output of at least 50 mV/deg can be obtained prior to amplification by using a resonant ac bridge circuit operating at 100 kHz. The corresponding noise output for a 10 kHz bandwidth can with an optimum circuit be as low as 4 microvolts. Therefore, the minimum detectable temperature change would be 80 microdegrees at 10 kHz. Rapid thermal response is assured by supporting the thin-film capacitor on a thin anodic tantalum oxide film suspended across an electrolytically etched window in a tantalum foil.

Maserjian, J.↗

Full-flow fluid filter

Etched-disk filter was developed with fluid passageways in configuration which allows relatively unrestricted flow of fluid and has stagnation areas for collection of impurities. In addition, filter housing without center post was developed to improve flow characteristics.

Toth, L. R.↗

Integrated circuit package with lead structure and method of preparing the same

A beam-lead integrated circuit package assembly including a beam-lead integrated circuit chip, a lead frame array bonded to projecting fingers of the chip, a rubber potting compound disposed around the chip, and an encapsulating molded plastic is described. The lead frame array is prepared by photographically printing a lead pattern on a base metal sheet, selectively etching to remove metal between leads, and plating with gold. Joining of the chip to the lead frame array is carried out by thermocompression bonding of mating goldplated surfaces. A small amount of silicone rubber is then applied to cover the chip and bonded joints, and the package is encapsulated with epoxy resin, applied by molding.

Kennedy, B. W.↗

A method for determining the preferred orientation of crystallites normal to a surface

Techniques representing the angular distribution of a particular direction in a crystallographic reference frame or analytical methods were developed. The data required by these techniques for displaying preferred orientation is obtained by measuring the orientation of a large number of crystallites. This may be done visually using etch-pit or Laue techniques which, experimentally, are both tedious and difficult. The intensities of X ray diffraction maxima are proportional to the number of crystallites whose crystallographic plane normals bisect the incident and diffracted beams. Parameters used in calculating powder patterns are also presented.

Snyder, R. L.↗

Further development of chemical vapor deposition process for production of large diameter carbon-base monofilaments

The development of large diameter carbon-base monofilament in the 50 micron to 250 micron diameter range using the chemical vapor deposition process is described. The object of this program was to determine the critical process variables which control monofilament strength, monofilament modulus, and monofilament diameter. It was confirmed that wide scatter in the carbon substrate strength is primarily responsible for the scatter in the monofilament strength. It was also shown through etching experiments that defective substrate surface conditions which can induce low strength modular growth in the monofilament layers are best controlled by processing improvements during the synthesis of the substrate. Modulus was found to be linearily proportional to monofilament boron content. Filament modulus was increased to above 27.8MN/sq cm but only by a considerable increase in monofilament boron content to 60 wt. % or more. Monofilament diameter depended upon dwell time in the synthesis apparatus. A monofilament was prepared using these findings which had the combined properties of a mean U.T.S. of 398,000 N/sq cm, a modulus of 18.9 MN/sq cm (24,000,000 psi), and a diameter of 145 microns. Highest measured strength for this fiber was 451,000 N/sq cm (645,000 psi).

Hough, R. L.↗

Surface topographical effects on the structural growth of thick sputtered metal and alloy coatings

Thick sputtered S-Monel, silver, and 304 stainless steel coatings were deposited on mica and metal substrates with various surface finishes to investigate the structural growth of the coating by scanning electron microscopy. The geometry and the surface structure of the nodules are characterized. Compositional changes within the coating were analyzed by X-ray dispersion microscopy. Defects in the surface finish (i.e., scratches, inclusions, etc.) act as preferential nucleation sites and form isolated and complex nodules and various surface overgrowths in the coating. The nodule boundaries are very vulnerable to chemical etching and these nodules do not disappear after full annealing. Further, they have undesirable effects on mechanical properties; cracks are initiated at the nodules when the coating is stressed by mechanical forces. These effects are illustrated by micrographs. Nodular growth within a coating can be minimized or eliminated by reducing the surface roughness.

Spalvins, T.↗

High reliability sheathed, beryllia insulated, tungsten-rhenium alloy thermocouple assemblies; their fabrication and EMF stability

Tantalum sheathed, BeO insulated, W-3% Re/W-25% Re thermocouple assemblies were fabricated and their emf drift determined during 2059 hours of exposure at 2073 K in a gaseous helium environment. The sheathed thermocouple assemblies were constructed from aged thermoelements, specially heat-treated BeO insulators, and specially cleaned and etched tantalum sheaths. Their thermal emf drifts ranged from the equivalent of only -0.3 to -0.8 K drift per 1000 hours of exposure at 2073 K. No evidence of any gross chemical attack or degradation of the component materials was found. The emf drift and material behavior of some unsheathed, BeO insulated, W-3% Re/W-25% Re thermocouples at 2250 and 2400 K were also determined. Unsheathed thermocouples tested in an argon environment at 2250 K for 1100 hours and at 2400 K for 307 hours exhibited changes in thermal emf that typically ranged from the equivalent of a few degrees K to as much as +11 K. Post-test examinations of these thermocouples revealed some undesirable material degradation and interaction which included erosion of the BeO insulators and contamination of the thermoelements by tantalum from the tantalum blackbody enclosure in which the thermocouples were contained.

Burns, G. W.↗

Gravitational effects of process-induced dislocations in silicon

Matters pertaining to semiconductor device fabrication were studied in terms of the influence of gravity on the production of dislocations in silicon wafers during thermal cycling in a controlled ambient where no impurities are present and oxidation is minimal. Both n-type and p-type silicon wafers having a diameter of 1.25 in to 1.5 in, with fixed orientation and resistivity values, were used. The surface dislocation densities were measured quantitatively by the Sirtl etch technique. The results show two significant features of the plastic flow phenomenon as it is related to gravitational stress: (1) the density of dislocations generated during a given thermal cycle is directly related to the duration of the cycle; and (2) the duration of the thermal cycle required to produce a given dislocation density is inversely related to the equilibrium temperature. Analysis of the results indicates that gravitational stress is instrumental in process-induced defect generation.

Porter, W. A.↗

Fission track astrology of three Apollo 14 gas-rich breccias

The three Apollo 14 breccias 14301, 14313, and 14318 all show fission xenon due to the decay of Pu-244. To investigate possible in situ production of the fission gas, an analysis was made of the U-distribution in these three breccias. The major amount of the U lies in glass clasts and in matrix material and no more than 25% occurs in distinct high-U minerals. The U-distribution of each breccia is discussed in detail. Whitlockite grains in breccias 14301 and 14318 found with the U-mapping were etched and analyzed for fission tracks. The excess track densities are much smaller than indicated by the Xe-excess. Because of a preirradiation history documented by very high track densities in feldspar grains, however, it is impossible to attribute the excess tracks to the decay of Pu-244. A modified track method has been developed for measuring average U-concentrations in samples containing a heterogeneous distribution of U in the form of small high-U minerals. The method is briefly discussed, and results for the rocks 14301, 14313, 14318, 68815, 15595, and the soil 64421 are given.

Graf, H.↗

Surface topographical effects on the structural growth of thick sputtered metal and alloy coatings

Thick sputtered S-Monel, silver, and 304 stainless steel coatings were deposited on mica and metal substrates with various surface finishes to investigate the structural growth of the coating by scanning electron microscopy. The geometry and the surface structure of the nodules are characterized. Compositional changes within the coating were analyzed by X-ray dispersion miscroscopy. Defects in the surface finish act as preferential nucleation sites and form isolated and complex nodules and various surface overgrowths in the coating. The nodule boundaries are very vulnerable to chemical etching, and these nodules do not disappear after full annealing. Further, they have undesirable effects on mechanical properties; cracks are initiated at the nodules when the coating is stressed by mechanical forces.

Spalvins, T.↗

Surface photovoltage method extended to silicon solar cell junction

The conventional surface photovoltage (SPV) method is extended to the measurement of the minority carrier diffusion length in diffused semiconductor junctions of the type used in a silicon solar cell. The minority carrier diffusion values obtained by the SPV method agree well with those obtained by the X-ray method. Agreement within experimental error is also obtained between the minority carrier diffusion lengths in solar cell diffusion junctions and in the same materials with n-regions removed by etching, when the SPV method was used in the measurements.

Wang, E. Y.↗

Observation of transiron solar-flare nuclei in an Apollo 16 command-module window

The first measurements of the fluence of solar particles with nuclear charges not less than 32 and 44 are presented, along with the enhancement factors found. Using a track-etching technique, these transiron nuclei were detected in a window from the Apollo 16 command module which was exposed outside the magnetosphere during the solar-particle event of Apr. 18, 1972.

Shirk, E. K.↗

Method of forming aperture plate for electron microscope

An electron microscope is described with an electron source a condenser lens having either a circular aperture for focusing a solid cone of electrons onto a specimen or an annular aperture for focusing a hollow cone of electrons onto the specimen. It also has objective lens with an annular objective aperture, for focusing electrons passing through the specimen onto an image plane. A method of making the annular objective aperture using electron imaging, electrolytic deposition and ion etching techniques is included.

Heinemann, K.↗

Redshift antenna project

The layout of a center frequency 2203.1 MHz antenna is presented. The four to one taped layout was photograph reduced and a single section was etched. Initial impedance and frequency mismatches were corrected, and impedance plots of each of the two sections are shown. With the 2203.1 MHz layout as a reference, initial layouts were made for the remaining two frequencies 2117.7 and 2299.7 MHz, and single sections were fabricated.

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