MIL-M-38510/470 test vectors: Fault detection efficiency measurement via hardware fault simulation
The stuck fault detection efficiency of the test vectors developed for the MIL-M-38510/470 NASA was measured using a hardware stuck fault simulator for the 1802 microprocessor. Thirty-nine stuck faults were not detected out of a total of 874 injected into the combinatorial and sequential parts of the microprocessor. Since undetected faults can create catastrophic errors in equipment designed for high reliability applications, it is recommended that the MIL-M-38510/470 NASA be enhanced with additional test vectors so as to achieve 100% stuck fault detection efficiency.