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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 595 records · Page 33
All sourcesNASA NTRSDOE OSTI
NASA NTRS1966

Bypass rod transfers heat developed in thermionic diode

In a thermionic diode, a cesium tube joining the emitter-collector area and the cesium reservoir is fitted with a copper bypass rod held in place by two standoff brackets. The rod transfers heat from the emitter-collector to the reservoir without going through the ceramic seal structure which surrounds the cesium tube and cannot sustain large temperature gradients.

Lazaridis, L. J.↗
NASA NTRS1966

Chemical regeneration of emitter surface increases thermionic diode life

Chemical regeneration of sublimated emitter electrode increases the operating efficiency and life of thermionic diodes. A gas which forms chemical compounds with the sublimated emitter material is introduced into the space between the emitter and the collector. The compounds migrate to the emitter where they decompose and redeposit the emitter material.

Breiteieser, R.↗
NASA NTRS1966

Computer program searches characteristic data of diodes and transistors

Semiconductor information storage and retrieval system provides a comprehensive, accurate, and ready reference to characteristic data of diodes and transistors. The system can be used to supply a complete listing of technical component information necessary for circuit designers, reliability engineers, and quality assurance personnel.

Source record↗
NASA NTRS1967

Laboratory pulse modulator uses minority carrier storage diodes

Pulse modulator is capable of continuously variable pulse width over a 10 to 1 range of 1.0 microsecond to 0.1 microsecond and operates over a wide range of pulse repetition rates. Pulse width diversity is obtained by operating step-recovery diodes in the reverse conduction mode.

Source record↗
NASA NTRS1967

Development of reliability prediction technique for semiconductor diodes

New fundamental technique of reliability prediction for semiconductor diodes based on realistic mathematical models can be applied to component failure rate prediction including mechanical degradation, electrical degradation, environmental stress factors, and electrical load stress factors.

Ryerson, C. M.↗
NASA NTRS1967

Thin film diodes

Design, and performance of gold-silver-gold film diode

Eschwei, M.↗