Search NASA⌕ Search

SEARCH · Search NASA

Results for “structural failure”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 613 records · Page 34
All sourcesNASA NTRSDOE OSTI
DOE OSTI2024

Unrecoverable lattice rotation governs structural degradation of single-crystalline cathodes

Transitioning from polycrystalline to single-crystalline nickel-rich cathodes has garnered considerable attention in both academia and industry, driven by advantages of high tap density and enhanced mechanical properties. However, cathodes with high nickel content (>70%) suffer from substantial capacity degradation, which poses a challenge to their commercial viability. Here, leveraging multiscale spatial resolution diffraction and imaging techniques, we observe that lattice rotations occur universally in single-crystalline cathodes and play a pivotal role in the structure degradation. These lattice rotations prove unrecoverable and govern the accumulation of adverse lattice distortions over repeated cycles, contributing to structural and mechanical degradation and fast capacity fade. These findings bridge the previous knowledge gap that exists in the mechanistic link between fast performance failure and atomic-scale structure degradation.

36 MATERIALS SCIENCE↗
NASA NTRS1996

Using Statistical Penalties In The Tsai-Wu Failure Criterion

Improved methods of applying statistical penalties when using Tsai-Wu failure criterion lead to more accurate predictions of failures of composite-material structural components under stress, and provide better safety factors for designing such components. Intended to ensure proper use of statistical penalties with respect to failure hypersurface.

Richardson, D. E.↗
NASA NTRS2011

A Damage Tolerance Comparison of Composite Hat-Stiffened and Honeycomb Sandwich Structure for Launch Vehicle Interstage Applications

In this study, a direct comparison of the compression-after-impact (CAI) strength of impact-damaged, hat-stiffened and honeycomb sandwich structure for launch vehicle use was made. The specimens used consisted of small substructure designed to carry a line load of approx..3,000 lb/in. Damage was inflicted upon the specimens via drop weight impact. Infrared thermography was used to examine the extent of planar damage in the specimens. The specimens were prepared for compression testing to obtain residual compression strength versus damage severity curves. Results show that when weight of the structure is factored in, both types of structure had about the same CAI strength for a given damage level. The main difference was that the hat-stiffened specimens exhibited a multiphase failure whereas the honeycomb sandwich structure failed catastrophically.

Nettles, A. T.↗
DOE OSTI2021

Interfacial Atomistic Mechanisms of Lithium Metal Stripping and Plating in Solid–State Batteries

All-solid-state batteries based on a Li metal anode represent a promising next-generation energy storage system, but are currently limited by low current density and short cycle life. Further research to improve the Li metal anode is impeded by the lack of understanding in its failure mechanisms at lithium–solid interfaces, in particular, the fundamental atomistic processes responsible for interface failure. Here, using large-scale molecular dynamics simulations, the first atomistic modeling study of lithium stripping and plating on a solid electrolyte is performed by explicitly considering key fundamental atomistic processes and interface atomistic structures. In the simulations, the interface failure initiated with the formation of nano-sized pores, and how interface structures, lithium diffusion, adhesion energy, and applied pressure affect interface failure during Li cycling are observed. By systematically varying the parameters of solid-state lithium cells in the simulations, the parameter space of applied pressures and interfacial adhesion energies that inhibit interface failure during cycling are mapped to guide selection of solid-state cells. Furthermore, this study establishes the atomistic modeling for Li stripping and plating, and predicts optimal solid interfaces and new strategies for the future research and development of solid-state Li-metal batteries.

25 ENERGY STORAGE↗
NASA NTRS2006

Mode I Toughness Measurements of Core/Facesheet Bonds in Honeycomb Sandwich Structures

Composite sandwich structures will be used in many future applications in aerospace, marine and offshore industries due to the fact that the strength and stiffness to mass ratios surpass any other structural type. Sandwich structure also offers advantages over traditional stiffened panels such as ease of manufacturing and repair. During the last three decades, sandwich structure has been used extensively for secondary structure in aircraft (fuselage floors, rudders and radome structure). Sandwich structure is also used as primary structure in rotorcraft, the most common example being the trailing edge of rotor blades. As with other types of composite construction, sandwich structure exhibits several types of failure mode such as facesheet wrinkling, core crushing and sandwich buckling. Facesheet/core debonding has also been observed in the marine and aerospace industry. During this failure mode, peel stresses applied to an existing facesheet/core debond or an interface low in toughness, results in the facesheet being peeled from the core material, possibly leading to a significant loss in structural integrity of the sandwich panel. In an incident during a test on a liquid hydrogen fuel tank of the X-33 prototype vehicle, the outer graphite/epoxy facesheet and honeycomb core became debonded from the inner facesheet along significant areas, leading to failure of the tank. As a consequence of the accident; significant efforts were made to characterize the toughness of the facesheet/core bond. Currently, the only standardized method available for assessing the quality of the facesheet/core interface is the climbing drum peel test (ASTM D1781). During this test a sandwich beam is removed from a panel and the lip of one of the facesheets is attached to a drum, as shown in Fig. 1. The drum is then rotated along the sandwich beam, causing the facesheet to peel from the core. This method has two major drawbacks. First, it is not possible to obtain quantitative fracture data from the test and so the results can only be used in a qualitative manner. Second, only sandwich structure with thin facesheets can be tested (to facilitate wrapping of the facesheet around the climbing drum). In recognition of the need for a more quantitative facesheet/core fracture test, several workers have devised experimental techniques for characterizing the toughness of the facesheet/core interface. In all of these cases, the tests are designed to yield a mode I-dominated fracture toughness of the facesheet/core interface in a manner similar to that used to determine mode I fracture toughness of composite laminates. In the current work, a modified double cantilever beam is used to measure the mode I-dominated fracture toughness of the interface in a sandwich consisting of glass/phenolic honeycomb core reinforced with graphite epoxy facesheets. Two specimen configurations were tested as shown in Fig 2. The first configuration consisted of reinforcing the facesheets with aluminum blocks (Fig. 2a). In the second configuration unreinforced specimens were tested (Fig. 2b). Climbing drum peel tests were also conducted to compare the fracture behavior observed between this test and the modified double cantilever beam. This paper outlines the test procedures and data reduction strategies used to compute fracture toughness values from the tests. The effect of specimen reinforcement on fracture toughness of the facesheet/core interface is discussed.

Nettles, Alan T.↗
NASA NTRS2000

MEMS Reliability Assurance Activities at JPL

An overview of Microelectromechanical Systems (MEMS) reliability assurance and qualification activities at JPL is presented along with the a discussion of characterization of MEMS structures implemented on single crystal silicon, polycrystalline silicon, CMOS, and LIGA processes. Additionally, common failure modes and mechanisms affecting MEMS structures, including radiation effects, are discussed. Common reliability and qualification practices contained in the MEMS Reliability Assurance Guideline are also presented.

Kayali, S.↗
NASA NTRS1980

Development of a facility for large-scale testing of multistory buildings

Current experimental research pertaining to response of structures subjected to lateral loads such as strong winds or earthquake motions is limited to either tests of single structural components or small scale multistory structures. The feasibility of developing a facility where large scale multistory structures could be loaded to failure is discussed. The test facility would consist of a series of hydraulic actuators mounted on reaction frames currently in use at the Marshall Space Flight Center for structural testing of spacecraft components. The actuators would be controlled from signals computed by an on-line analysis of measured data. This method of loading could be used to simulate inertial forces resisted by a structure behaving in the non linear range of response subjected to motion at the base or to impulses along the height as would occur during a strong earthquake or wind.

Abrams, D. P.↗
NASA NTRS1994

FAA/NASA International Symposium on Advanced Structural Integrity Methods for Airframe Durability and Damage Tolerance

International technical experts in durability and damage tolerance of metallic airframe structures were assembled to present and discuss recent research findings and the development of advanced design and analysis methods, structural concepts, and advanced materials. The symposium focused on the dissemination of new knowledge and the peer-review of progress on the development of advanced methodologies. Papers were presented on: structural concepts for enhanced durability, damage tolerance, and maintainability; new metallic alloys and processing technology; fatigue crack initiation and small crack effects; fatigue crack growth models; fracture mechanics failure, criteria for ductile materials; structural mechanics methodology for residual strength and life prediction; development of flight load spectra for design and testing; and advanced approaches to resist corrosion and environmentally assisted fatigue.

Harris, Charles E.↗
NASA NTRS1994

FAA/NASA International Symposium on Advanced Structural Integrity Methods for Airframe Durability and Damage Tolerance, part 2

The international technical experts in the areas of durability and damage tolerance of metallic airframe structures were assembled to present and discuss recent research findings and the development of advanced design and analysis methods, structural concepts, and advanced materials. The principal focus of the symposium was on the dissemination of new knowledge and the peer-review of progress on the development of advanced methodologies. Papers were presented on the following topics: structural concepts for enhanced durability, damage tolerance, and maintainability; new metallic alloys and processing technology; fatigue crack initiation and small crack effects; fatigue crack growth models; fracture mechanics failure criteria for ductile materials; structural mechanics methodology for residual strength and life prediction; development of flight load spectra for design and testing; and corrosion resistance.

Harris, Charles E.↗
DOE OSTI2020

Degradation of REBCO coated conductors due to a combination of epoxy impregnation, thermal cycles, and quench: Characteristics and a method of alleviation

REBa2Cu3Ox (REBCO) coated conductors are an enabling technology for >1 GHz nuclear magnetic resonance spectrometers that need >23.5 T solenoids, compact high-field fusion reactors beyond the International Thermonuclear Experimental Reactor, and 20 T class accelerator magnets. An in-depth understanding of stress and strain management is critically needed for these applications. Here, we report experimental data and an analysis of damages of REBCO-coated conductors in several scenarios relevant for their applications in high-field magnets and unique to their multi-layer thin film structure. The examined scenarios include failure induced by quench, failure induced by epoxy impregnation, and failure induced by a combination of epoxy impregnation and quench. The root cause is film blistering and peeling induced by thermally interfacial stresses characteristic of multilayered heteroepitaxial thin film structures on thick substrates utilized. The quantitative stress analysis is introduced using simple and easy to use formulas and clearly indicates how materials and structural characteristics affect the magnitude and the distribution of stresses and deflections. Finally, a simple method is introduced for removing degradation of REBCO coated conductors due to epoxy impregnation. Our data and analysis help our understanding of the practical limit of REBCO-coated conductors and can be utilized as a guidance for the physical design of REBCO coated conductors and high-current cables assembled from them and for minimizing damages.

Yin, Shijian (ORCID:0000000224312274)↗
NASA NTRS1985

Testing of a failure accommodation system on a highly flexible grid

This paper presents a scheme for on-line failure detection in systems with appreciable structural dynamics. The design is suboptimal because of extensive computational requirements of optimal schemes. To accomplish failure detection, the innovations sequence of a finite order Kalman filter is examined. Because of the heavy dependence of the system on the zero-mean character of the innovations sequence of the filter much attention has been given to the design and evaluation of the Kalman filters used. The filter designs are based on modal models of the structural dynamics. Two modal models were considered, one based on an analytic finite element model and the other based on empirically derived frequency and damping. Experiments using a grid structure are presented which illustrate operation and performance of the filter designs based on these models. The general character of the results presented is that appreciable errors exist in the filter design based on the finite element model. Substantial improvement results if the design model is modified to include empirically derived frequency and damping.

Montgomery, R. C.↗
NASA NTRS2000

X-33 LH2 Tank Failure Investigation Findings

This presentation focuses on the tank history, test objectives, failure description, investigation and conclusions. The test objectives include verify structural integrity at 105% expected flight load limit varying the following parameters: cryogenic temperature; internal pressure; and mechanical loading. The Failure description includes structural component of the aft body, quad-lobe design, and sandwich - honeycomb graphite epoxy construction.

Niedermeyer, Mindy↗
NASA NTRS1981

Research in the comprehension of engineering lectures by non-native speakers

Failure by foreign students to perceive the rhetorical structure or overall organization of an engineering lecture, rendering them unable to understand it, is discussed. Equally serious failure by such students to perceive the organizing role of theory in structuring the activities in their field is reported. Failure to identify the role of theory in the problem-solving process that underlies engineering is emphasized. Engineering was not seen as a series of on-going problems where each stage of solution exposed new problems to be solved. Implications for course planners and material designers are discussed.

Olsen, L. A.↗
NASA NTRS2009

Explosion/Blast Dynamics for Constellation Launch Vehicles Assessment

An assessment methodology is developed to guide quantitative predictions of adverse physical environments and the subsequent effects on the Ares-1 crew launch vehicle associated with the loss of containment of cryogenic liquid propellants from the upper stage during ascent. Development of the methodology is led by a team at Sandia National Laboratories (SNL) with guidance and support from a number of National Aeronautics and Space Administration (NASA) personnel. The methodology is based on the current Ares-1 design and feasible accident scenarios. These scenarios address containment failure from debris impact or structural response to pressure or blast loading from an external source. Once containment is breached, the envisioned assessment methodology includes predictions for the sequence of physical processes stemming from cryogenic tank failure. The investigative techniques, analysis paths, and numerical simulations that comprise the proposed methodology are summarized and appropriate simulation software is identified in this report.

Baer, Mel↗
NASA NTRS1991

Software reliability experiments data analysis and investigation

The objectives are to investigate the fundamental reasons which cause independently developed software programs to fail dependently, and to examine fault tolerant software structures which maximize reliability gain in the presence of such dependent failure behavior. The authors used 20 redundant programs from a software reliability experiment to analyze the software errors causing coincident failures, to compare the reliability of N-version and recovery block structures composed of these programs, and to examine the impact of diversity on software reliability using subpopulations of these programs. The results indicate that both conceptually related and unrelated errors can cause coincident failures and that recovery block structures offer more reliability gain than N-version structures if acceptance checks that fail independently from the software components are available. The authors present a theory of general program checkers that have potential application for acceptance tests.

Walker, J. Leslie↗
NASA NTRS1982

Test chips for custom ICs - Six kinds of test structures

Microelectronic test chips contain a number of test structures that are used for a variety of purposes in fabricating integrated circuits. For convenience, their use is divided into six groups: layout-rule evaluating, process-parameter extraction, device-parameter extraction, circuit-parameter extraction, initial-fabrication failure analysis, and reliability failure analysis. A given test structure can be used to gather information in a number of these groups. Examples are given here of the kinds of parameters that can be obtained in each of these groups. A table is included summarizing various device failures common to bulk CMOS and indicating failure mechanisms appearing after wafer fabrication and after stress.

Buehler, M. G.↗
NASA NTRS1998

Analysis of a Memory Device Failure

The recent failure of a vintage memory device presented a unique challenge to failure analysts. Normally device layouts, fabrication parameters and other technical information were available to assist the analyst in the analysis. However, this device was out of production for many years and the manufacturer was no longer in business, so the information was not available. To further complicate this analysis, the package leads were all but removed making additional electrical testing difficult. Under these conditions, new and innovative methods were used to analyze the failure. The external visual exam, radiography, PIND, and leak testing were performed with nominal results. Since electrical testing was precluded by the short lead lengths, the device was delidded to expose the internal structures for microscopic examination. No failure mechanism was identified. The available electrical data suggested an ESD or low level EOS type mechanism which left no visible surface damage. Due to parallel electrical paths, electrical probing on the chip failed to locate the failure site. Two non-destructive Scanning Electron Microscopy techniques, CIVA (Charge Induced Voltage Alteration) and EBIC (Electron Beam Induced Current), and a liquid crystal decoration technique which detects localized heating were employed to aid in the analysis. CIVA and EBIC isolated two faults in the input circuitry, and the liquid crystal technique further localized two hot spots in regions on two input gates. Removal of the glassivation and metallization revealed multiple failure sites located in the gate oxide of two input transistors suggesting machine (testing) induced damage.

Nicolas, David P.↗