Ion and electron temperatures in the SUMMA mirror device by emission spectroscopy
Ion temperatures were obtained in the SUMMA mirror device by observing the Doppler-broadened charge-exchange component of the 667.8and 587.6-nm He lines in He plasma and the H alpha and H beta lines in H2 plasma. The second moment of the line profiles was used as the parameter to determine ion temperature. Corrections for magnetic splitting, fine structure, monochromator slit function, and variation in charge-exchange cross section with energy are derived and included. Even for constant cross section, no magnetic splitting or fine structure, and infinitely narrow slit function, the line profile is not Gaussian, because the excitation results from a change-exchange process. Comparison is made with temperatures from a neutral particle analyzer.-