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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 73 records · Page 4

Check-Standard Testing Across Multiple Transonic Wind Tunnels with the Modern Design of Experiments

This paper reports the result of an analysis of wind tunnel data acquired in support of the Facility Analysis Verification & Operational Reliability (FAVOR) project. The analysis uses methods referred to collectively at Langley Research Center as the Modern Design of Experiments (MDOE). These methods quantify the total variance in a sample of wind tunnel data and partition it into explained and unexplained components. The unexplained component is further partitioned in random and systematic components. This analysis was performed on data acquired in similar wind tunnel tests executed in four different U.S. transonic facilities. The measurement environment of each facility was quantified and compared.

Deloach, Richard↗

Historical Evolution of NASA Standard Materials Testing with Hypergolic Propellants and Ammonia (NASA Standard 6001 Test 15)

The NASA Johnson Space Center White Sands Test Facility (WSTF) has performed testing of hazardous and reactive aerospace fluids, including hypergolic propellants, with materials since the 1960s with the Apollo program. Amongst other test activities, Test 15 is a NASA standard test for evaluating the reactivity of materials with selected aerospace fluids, in particular hydrazine, monomethylhydrazine, uns-dimethylhydrazine, Aerozine 50, dinitrogen tetroxide oxidizers, and ammonia. This manuscript provides an overview of the history of Test 15 over a timeline ranging from prior to its development and first implementation as a NASA standard test in 1974 to its current refinement. Precursor documents to NASA standard tests, as they are currently known, are reviewed. A related supplementary test, international standardization, and enhancements to Test 15 are also discussed. Because WSTF was instrumental in the development and implementation of Test 15, WSTF experience and practices are referred to in this manuscript.

Greene, Benjamin↗

Standards for Radiation Effects Testing: Ensuring Scientific Rigor in the Face of Budget Realities and Modern Device Challenges

An overview is presented of the space radiation environment and its effects on electrical, electronic, and electromechanical parts. Relevant test standards and guidelines are listed. Test standards and guidelines are necessary to ensure best practices, minimize and bound systematic and random errors, and to ensure comparable results from different testers and vendors. Test standards are by their nature static but exist in a dynamic environment of advancing technology and radiation effects research. New technologies, failure mechanisms, and advancement in our understanding of known failure mechanisms drive the revision or development of test standards. Changes to standards must be weighed against their impact on cost and existing part qualifications. There must be consensus on new best practices. The complexity of some new technologies exceeds the scope of existing test standards and may require development of a guideline specific to the technology. Examples are given to illuminate the value and limitations of key radiation test standards as well as the challenges in keeping these standards up to date.

Test Standard↗

Effect of Sample Thickness on the Tensile Strength of Small Graphite Discs

This report formally documents the completion of the Advanced Reactor Technologies (ART) Level 3 Milestone (M3TG-24OR0501054), “Continue activities related to Split Disc-DIC - complete analysis of effect of sample thickness on one fine grain graphite,” due May 31, 2024. Details within this report outline the status of activities aimed at elucidating the effect of sample thickness on the tensile strength measurement using the small-disc, split-disc testing standard in support of the US Department of Energy’s ART Graphite R&D Program. The ASTM D8289, Standard Test Method for Tensile Strength Estimate by Disc Compression of Manufactured Graphite, was developed to provide an alternative means for testing tensile strength on smaller specimens, which are compatible with available irradiation capsule volumes, and other compatibility measurements. ASTM D8289 specifies that acceptable specimen diameter can range from 6 to 12.7 mm and that the maximum allowed sample thickness should be half of the diameter. However, information is limited with respect to the effect of thickness on the measured splitting tensile strength. This report documents efforts to understand the effect of sample thickness on splitting tensile strength. The work involved testing Ø12.7 mm samples of fine-grain graphites 2114 and IG-110 of different thicknesses (6.35, 5, 4, and 3 mm). The digital image correlation (DIC) method was applied to the samples, along with the ASTM D8289 Standard, to help interpret the measured results.

36 MATERIALS SCIENCE↗

Graphite Oxidation Rate Study on ET-10 and ETU-10 Grades - Task 4: QA Support and Testing for Structural Graphite Oxidation

INL performed targeted oxidation tests to measure oxidation rates for samples of ET-10 and ETU-10 graphite under CRADA No. 21CRA22 Mod. 3, Annex A, “Tritium Testing to Support Kairos Power Advanced Reactor Demonstration” (04/02/2024). All testing was conducted within INL’s Carbon Characterization Laboratory (CCL) using test standard ASTM D7542-21 "Standard Test Method for Air Oxidation of Carbon and Graphite in the Kinetic Regime" [ASTM International, 2021]. Kairos Power provided all test specimens through its graphite vendor Ibiden, Inc. to INL and ASTM specimen specified dimensions. Information within this report only provides the Arrhenius oxidation rate plots as a function of temperature for each graphite grade tested. The raw mass loss per time data will be provided on the Nuclear Data Management and Analysis System (NDMAS) portal located on the INL information system.

36 MATERIALS SCIENCE↗

Dose Rate Effects in Linear Bipolar Transistors

Dose rate effects are examined in linear bipolar transistors at high and low dose rates. At high dose rates, approximately 50% of the damage anneals at room temperature, even though these devices exhibit enhanced damage at low dose rate. The unexpected recovery of a significant fraction of the damage after tests at high dose rate requires changes in existing test standards. Tests at low temperature with a one-second radiation pulse width show that damage continues to increase for more than 3000 seconds afterward, consistent with predictions of the CTRW model for oxides with a thickness of 700 nm.

linear integrated circuit↗