Impact of duration and missing data on the long-term photovoltaic degradation rate estimation
Accurate quantification of photovoltaic (PV) system degradation rate (R D ) is essential for lifetime yield predictions. Although R D is a critical parameter, its estimation lacks a standardized methodology that can be applied on outdoor field data. The purpose of this paper is to investigate the impact of time period duration and missing data on R D by analyzing the performance of different techniques applied to synthetic PV system data at different linear R D patterns and known noise conditions. The analysis includes the application of different techniques to a 10-year synthetic dataset of a crystalline Silicon PV system, with emulated degradation levels and imputed missing data. Here, the analysis demonstrated that the accuracy of ordinary least squares (OLS), year-on-year (YOY), autoregressive integrated moving average (ARIMA) and robust principal component analysis (RPCA) techniques is affected by the evaluation duration with all techniques converging to lower R D deviations over the 10-year evaluation, apart from RPCA at high degradation levels. Moreover, the estimated R D is strongly affected by the amount of missing data. Filtering out the corrupted data yielded more accurate R D results for all techniques. It is proven that the application of a change-point detection stage is necessary and guidelines for accurate R D estimation are provided.