Analytical description of an imperfect Fabry-Perot etalon
A novel method is presented for the investigation of Fabry-Perot etalon defects, incorporating the effects of microsurface imperfection, bowing, and departure from parallelism, as well as the effect of finite aperture on the etalon, into the perturbation function. The tolerance imperfections of reflective layers can be incorporated into the transfer coefficients of a noncorrugated thin-film system, and any defect can be investigated either separately or in combination with others through the use of the appropriate analytical or numerical simulation of the corrugated function. In the context of numerical computation, the present method permits the simulation and evaluation of different specific situations. The expressions derived for the transfer coefficients of a corrugated, equidistant thin film system may be applicable to other branches of applied optics.