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At least 73 records · Page 4

The Athena Microscopic Imager Investigation

The Athena science payload on the Mars Exploration Rovers (MER) includes the Microscopic Imager (MI) [1]. The MI is a fixed-focus camera mounted on the end of an extendable instrument arm, the Instrument Deployment Device (IDD; see Figure 1).The MI was designed to acquire images at a spatial resolution of 30 microns/pixel over a broad spectral range (400 - 700 nm; see Table 1). Technically, the microscopic imager is not a microscope: it has a fixed magnification of 0.4 and is intended to produce images that simulate a geologist s view through a common hand lens. In photographers parlance, the system makes use of a macro lens. The MI uses the same electronics design as the other MER cameras [2, 3] but has optics that yield a field of view of 31 31 mm across a 1024 1024 pixel CCD image (Figure 2). The MI acquires images using only solar or skylightillumination of the target surface. A contact sensor is used to place the MI slightly closer to the target surface than its best focus distance (about 66 mm), allowing concave surfaces to be imaged in good focus. Because the MI has a relatively small depth of field (3 mm), a single MI image of a rough surface will contain both focused and unfocused areas. Coarse focusing will be achieved by moving the IDD away from a rock target after the contact sensor is activated. Multiple images taken at various distances will be acquired to ensure good focus on all parts of rough surfaces. By combining a set of images acquired in this way, a completely focused image can be assembled. Stereoscopic observations can be obtained by moving the MI laterally relative to its boresight. Estimates of the position and orientation of the MI for each acquired image will be stored in the rover computer and returned to Earth with the image data. The MI optics will be protected from the Martian environment by a retractable dust cover. The dust cover includes a Kapton window that is tinted orange to restrict the spectral bandpass to 500-700 nm, allowing color information to be obtained by taking images with the dust cover open and closed. The MI will image the same materials measured by other Athena instruments (including surfaces prepared by the Rock Abrasion Tool), as well as rock and soil targets of opportunity. Subsets of the full image array can be selected and/or pixels can be binned to reduce data volume. Image compression will be used to maximize the information contained in the data returned to Earth. The resulting MI data will place other MER instrument data in context and aid in petrologic and geologic interpretations of rocks and soils on Mars.

K E Herkenhoff

CHAMP - Camera, Handlens, and Microscope Probe

CHAMP (Camera, Handlens And Microscope Probe) is a novel field microscope capable of color imaging with continuously variable spatial resolution from infinity imaging down to diffraction-limited microscopy (3 micron/pixel). As an arm-mounted imager, CHAMP supports stereo-imaging with variable baselines, can continuously image targets at an increasing magnification during an arm approach, can provide precision range-finding estimates to targets, and can accommodate microscopic imaging of rough surfaces through a image filtering process called z-stacking. Currently designed with a filter wheel with 4 different filters, so that color and black and white images can be obtained over the entire Field-of-View, future designs will increase the number of filter positions to include 8 different filters. Finally, CHAMP incorporates controlled white and UV illumination so that images can be obtained regardless of sun position, and any potential fluorescent species can be identified so the most astrobiologically interesting samples can be identified.

Mungas, G. S.

Compact Microscope Imaging System Developed

The Compact Microscope Imaging System (CMIS) is a diagnostic tool with intelligent controls for use in space, industrial, medical, and security applications. The CMIS can be used in situ with a minimum amount of user intervention. This system, which was developed at the NASA Glenn Research Center, can scan, find areas of interest, focus, and acquire images automatically. Large numbers of multiple cell experiments require microscopy for in situ observations; this is only feasible with compact microscope systems. CMIS is a miniature machine vision system that combines intelligent image processing with remote control capabilities. The software also has a user-friendly interface that can be used independently of the hardware for post-experiment analysis. CMIS has potential commercial uses in the automated online inspection of precision parts, medical imaging, security industry (examination of currency in automated teller machines and fingerprint identification in secure entry locks), environmental industry (automated examination of soil/water samples), biomedical field (automated blood/cell analysis), and microscopy community. CMIS will improve research in several ways: It will expand the capabilities of MSD experiments utilizing microscope technology. It may be used in lunar and Martian experiments (Rover Robot). Because of its reduced size, it will enable experiments that were not feasible previously. It may be incorporated into existing shuttle orbiter and space station experiments, including glove-box-sized experiments as well as ground-based experiments.

McDowell, Mark

Operation of a Cartesian Robotic System in a Compact Microscope with Intelligent Controls

A Microscope Imaging System (CMIS) with intelligent controls is disclosed that provides techniques for scanning, identifying, detecting and tracking microscopic changes in selected characteristics or features of various surfaces including, but not limited to, cells, spheres, and manufactured products subject to difficult-to-see imperfections. The practice of the present invention provides applications that include colloidal hard spheres experiments, biological cell detection for patch clamping, cell movement and tracking, as well as defect identification in products, such as semiconductor devices, where surface damage can be significant, but difficult to detect. The CMIS system is a machine vision system, which combines intelligent image processing with remote control capabilities and provides the ability to autofocus on a microscope sample, automatically scan an image, and perform machine vision analysis on multiple samples simultaneously.

McDowell, Mark

Tracking of cells with a compact microscope imaging system with intelligent controls

A Microscope Imaging System (CMIS) with intelligent controls is disclosed that provides techniques for scanning, identifying, detecting and tracking microscopic changes in selected characteristics or features of various surfaces including, but not limited to, cells, spheres, and manufactured products subject to difficult-to-see imperfections. The practice of the present invention provides applications that include colloidal hard spheres experiments, biological cell detection for patch clamping, cell movement and tracking, as well as defect identification in products, such as semiconductor devices, where surface damage can be significant, but difficult to detect. The CMIS system is a machine vision system, which combines intelligent image processing with remote control capabilities and provides the ability to auto-focus on a microscope sample, automatically scan an image, and perform machine vision analysis on multiple samples simultaneously.

McDowell, Mark

Tracking of Cells with a Compact Microscope Imaging System with Intelligent Controls

A Microscope Imaging System (CMIS) with intelligent controls is disclosed that provides techniques for scanning, identifying, detecting and tracking microscopic changes in selected characteristics or features of various surfaces including, but not limited to, cells, spheres, and manufactured products subject to difficult-to-see imperfections. The practice of the present invention provides applications that include colloidal hard spheres experiments, biological cell detection for patch clamping, cell movement and tracking, as well as defect identification in products, such as semiconductor devices, where surface damage can be significant, but difficult to detect. The CMIS system is a machine vision system, which combines intelligent image processing with remote control capabilities and provides the ability to autofocus on a microscope sample, automatically scan an image, and perform machine vision analysis on multiple samples simultaneously

McDowell, Mark

Development and Optical Testing of the Camera, Hand Lens, and Microscope Probe with Scannable Laser Spectroscopy (CHAMP-SLS)

Conducting high resolution field microscopy with coupled laser spectroscopy that can be used to selectively analyze the surface chemistry of individual pixels in a scene is an enabling capability for next generation robotic and manned spaceflight missions, civil, and military applications. In the laboratory, we use a range of imaging and surface preparation tools that provide us with in-focus images, context imaging for identifying features that we want to investigate at high magnification, and surface-optical coupling that allows us to apply optical spectroscopic analysis techniques for analyzing surface chemistry particularly at high magnifications. The camera, hand lens, and microscope probe with scannable laser spectroscopy (CHAMP-SLS) is an imaging/spectroscopy instrument capable of imaging continuously from infinity down to high resolution microscopy (resolution of approx. 1 micron/pixel in a final camera format), the closer CHAMP-SLS is placed to a feature, the higher the resultant magnification. At hand lens to microscopic magnifications, the imaged scene can be selectively interrogated with point spectroscopic techniques such as Raman spectroscopy, microscopic Laser Induced Breakdown Spectroscopy (micro-LIBS), laser ablation mass-spectrometry, Fluorescence spectroscopy, and/or Reflectance spectroscopy. This paper summarizes the optical design, development, and testing of the CHAMP-SLS optics.

Fluorescence

ELM: Europa Luminescence Microscope

The Europa Luminescence Microscope (ELM) is an automated fluorescence and bright-field microscope designed to meet key objectives defined in the 2016 NASA Europa Lander Study Report, including the identification and characterization of morphological biosignatures. ELM’s heritage stems from a 2U cubesat fluorescence microscope, the Fluorescence Analysis for In situ Research imager, designed and built at NASA Ames Research Center, for the autonomous study of microbial biology in low Earth orbit. For ELM implementation, a sample is autonomously manipulated with a microfluidic system using in-line 10, 1.0, and 0.2 μm pore-size filters to capture successively smaller particles for imaging. For bright-field imaging, ELM uses deep-ultraviolet, ultraviolet and visible light to image organic and inorganic structures with submicron resolution. The ability to detect biosignatures as small as 0.2 μm in size is achieved by imaging native fluorescence and using fluorescence microscopy stains to identify key structural and functional indicators of microbial life (proteins, lipids, nucleic acids). For fluorescence imaging, ELM uses 265, 370, 470, and 530 nm LEDs with five emission bands. The use of multiple excitation and emission wavelengths for native fluorescence imaging enables the detection of a wide range of molecular species and their rough classification. Excitation at 265 nm allows for the detection of smaller polycyclic aromatic hydrocarbons (PAH), aromatic amino acids, and proteins with little to no interference from mineral fluorescence, given proper emission band selection. 370 and 470 nm light excites increasingly larger PAH structures and larger aromatic biomolecules that may be present (e.g., protective pigments). Similarly, inorganic fluorescence can be characterized and separated from organic fluorescence, allowing the recognition and in some cases classification, of minerals and other abiotic particles. ELM is based upon work supported by the NASA COLDTech and ICEE-2 programs.

Richard C Quinn

Europa Luminescence Microscope

The Europa Luminescence Microscope (ELM) is an automated fluorescence and dark-field mi-croscope designed to meet key objectives defined in the NASA Europa Lander Study Report, includ-ing the identification and characterization of morphological biosignatures. ELM’s heritage stems from a 2U cubesat fluorescence microscope, the Fluorescence Analysis for In-situ Research (FLAIR) im-ager, designed and built at NASA Ames Research Center, for the autonomous study of microbial bi-ology in low Earth orbit. For the ELM implementation, a sample is autonomously manipulated with a microfluidic system using in-line filter sets to capture successively smaller particles on 10, 1.0, and 0.1 µm pore-size filters for imaging. For darkfield imaging, ELM uses ultraviolet and visible light to image organic and inorganic structures with submicron resolution. The ability to detect structural and chemical biosignatures as small as 0.2 µm in size is achieved by imaging native fluorescence and us-ing fluorescence microscopy stains to identify key molecular and structural indicators of microbial life (proteins, lipids, nucleic acids). To excite fluorescence, ELM uses LEDs with wavelengths centered near 265, 370, 470, and 530 nm and five emission bands. The use of multiple excitation and emission wavelengths for native fluorescence imaging not only enables the detection of different molecular species, but also their rough classification. Excitation at 265 nm allows for the detection of smaller polyaromatic hydrocarbons (PAHs; 1-5 rings), aromatic amino acids, and proteins with little to no interference from mineral fluorescence, given proper emission band selection. 370 and 470 nm light excites increasingly larger PAH structures (e.g., coronene) and larger aromatic biomolecules that may be present (e.g., protective pigments). Similarly, inorganic fluorescence can be characterized and sep-arated from organic fluorescence, allowing the recognition and in some cases classification, of miner-als and other abiotic particles. ELM is based upon work supported by the NASA COLDTech and ICEE-2 programs.

Microscope

Toward the fabrication of a 5 μm resolution Wolter microscope for the National Ignition Facility

Advancements in computer-controlled polishing, metrology, and replication have led to a x-ray mirror fabrication process that is capable of producing high-resolution Wolter microscopes. The mirror is a nickel-cobalt replicated full-shell mirror that was electroformed from a finely figured and polished mandrel. This mandrel was designed and fabricated for a 8 m source-to-detector distance microscope, with 10× magnification. A computer controlled polishing process corrected the low-frequency mandrel figure to < 2.0 nm RMS error. The mandrel design was optimized to reduce shell distortions that occur mainly < 20 mm from the shell ends. This design, in combination with improved replication tooling design and refined bath parameters informed by a detailed COMSOL model, have led to reductions in replication errors in the mirror shell. X-ray tests performed on a pair of mirror shells replicated from the mandrel have demonstrated < 10 μm FWHM source plane imaging resolution. Here we discuss the development process, highlight results from metrology and x-ray testing, and define a path for achieving 5 μm FWHM resolution.

Grazing Incidence, Wolter Microscope, X-ray Optics

Alignment microscope for rotating laser scanner

Microscopic assembly for alignment of rotary laser focuses on small film area along scan line at oblique angle. Suitable choice of angle and location of optical components project laser beam line as X coordinate reticle. Coordination with horizontal recticle line included microscope facilitates Y coordinate position indexing.

Maciel, A., Jr.

Using the scanning electron microscope on the production line to assure quality semiconductors

The use of the scanning electron microscope to detect metallization defects introduced during batch processing of semiconductor devices is discussed. A method of determining metallization integrity was developed which culminates in a procurement specification using the scanning microscope on the production line as a quality control tool. Batch process control of the metallization operation is monitored early in the manufacturing cycle.

Adolphsen, J. W.

Optical analysis of a compound quasi-microscope for planetary landers

A quasi-microscope concept, consisting of facsimile camera augmented with an auxiliary lens as a magnifier, was introduced and analyzed. The performance achievable with this concept was primarily limited by a trade-off between resolution and object field; this approach leads to a limiting resolution of 20 microns when used with the Viking lander camera (which has an angular resolution of 0.04 deg). An optical system is analyzed which includes a field lens between camera and auxiliary lens to overcome this limitation. It is found that this system, referred to as a compound quasi-microscope, can provide improved resolution (to about 2 microns ) and a larger object field. However, this improvement is at the expense of increased complexity, special camera design requirements, and tighter tolerances on the distances between optical components.

Wall, S. D.

Automatically-focusing microscope system for live tissue observation

System includes focus-sensing arrangement which controls servo to keep microscope constantly focused on target. Microscope objective is moved along optical axis. System includes two video cameras that are used as transducers for sensing focus. Incoming visual image is split by beam splitter so that one-half of information is fed to each camera.

Mansour, M. N.

Study of radiation damage and structure of Luna 16 sample particles using high-resolution electron microscopes

Using an electron scanning microscope and a high voltage microscope, a study was made of the radiation damage and structure of micron sized grains and grains separated from the 200-mesh fraction of the L-16-19 surface material sample. Then the structural features were compared with those found by studying with the same techniques grains separated from 20 different samples of lunar dust taken from the Apollo 11, Apollo 12, Apollo 14, and Apollo 15 collections. The L-16-19 sample is similar to the most intensely irradiated samples returned to earth by Apollo craft.

Borg, J.