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DOE OSTI2021

HIBP Applications to Advance Understanding of Plasma Transport Physics (2011-2017) (and subsequently titled) Development of Beam Measurements to Advance Understanding of Transients and Improve Validation (2017-2020) (Final Technical Report)

This is the Final Technical Report for the DoE Measurement Innovation (previously Diagnostic Development) grant DE-SC0006077 titled HIBP Applications to Advance Understanding of Plasma Transport Physics (2011-2017), and subsequently titled Development of Beam Measurements to Advance Understanding of Transients and Improve Validation (2017-2020). The grant was funded by the Office of Fusion Energy Sciences (FES) for the period 1 May 2011–17 July 2020. Work performed through the grant has resulted in diagnostic innovations and new measurement capabilities that will improve understanding of transport, magnetic equilibrium, and electric fields in magnetically confined plasmas. We have developed novel hardware and advanced techniques to expand beam-based diagnostic capabilities, and extend measurements to new operating regimes. Some have been realized using a Heavy Ion Beam Probe (HIBP) having traditional features, while other applications have joined our innovations with subsets of advantageous HIBP features. This work has established smaller, more economical detection systems and, in doing so, may enable substantial extension of scenarios in which beam-based diagnostics are deployed. Key Measurement Innovations include: Computer Models and Simulations of HIBP Applications-Computer modeling and simulating of HIBP applications is central to predicting interaction of beam particles with plasmas, designing diagnostic systems, and anticipating measurement characteristics. We have extended the capability and improved measurement fidelity of the HIBP diagnostic on the Madison Symmetric Torus (MST) reversed field pinch (RFP); simulated feasibility of HIBP operation in the Helically Symmetric eXperiment (HSX) optimized stellarator; and investigated the plausibility of HIBP measurements in the ASDEX Upgrade tokamak. We have also developed a new technique that uses ion optics to model a finite phase-space beam. It yields more realistic (than traditional method) estimates of sample volume characteristics, which influence measurement resolution and sensitivity. Extension of Diagnostic Capabilities and Measurements on the MST RFP-Capabilities have been extended using the first and only HIBP installation on an RFP. Challenges associated with operation of the diagnostic on MST include the three-dimensional nature of particle trajectories, temporal topology and amplitude changes in the plasma equilibrium, and strong particle and radiative emission from the plasma. We have addressed these challenges through development of detailed and higher precision diagnostic simulations, calibrated subtraction of noise to resolve secondary ion signals, and implementation of hardware that enables higher fidelity measurement of plasma fluctuations. Development of New Hardware and Measurement Techniques - We have advanced beam-based measurement capabilities via development of new detectors and techniques to determine the poloidal magnetic flux ψ in the plasma, and enable placement of detectors close to the plasma and thus allow a smaller and less expensive diagnostic. We have demonstrated measurement of ψ, an ability that was made possible by development of highly effective noise reduction techniques. We also modeled the effect of non-ideal and instrumentation effects by developing a virtual (simulated) diagnostic. Application of beam-based diagnostics on various devices and multiple magnetic configurations (e.g. stellarator, tokamak, and reversed field pinch) enables investigation of critical physics issues and measurements resulting in the broad parameter space data needed to test and validate theory & modeling.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗

DOE OSTI2024

The Electron Spectro-Microscopy (ESM) Beamline at NSLS-II

Photoelectron spectroscopy is a primary tool for the study of the electronic structure of materials and the chemical composition of surfaces. High-resolution angle-resolved photoemission spectroscopy (ARPES) has the unique ability to map the energy bands in momentum space. Furthermore, going beyond the single particle picture, the self-energy corrections caused by correlations in solids can be extracted from the analysis of the emission line shape. The current level of refinement, in terms of energy and angular resolution (ΔE < 1 meV, Δθ < 0.1°), makes the technique sensitive to the lowest energy excitations and the dynamics of electrons, which in turn virtually determine all the macroscopic properties of any system and govern the chemical, electrical, magnetic, and physical processes. Similarly important, X-ray photoelectron microscopy (XPEEM), combined with the low-energy electron microscopy (LEEM), is indispensable in probing the complexity of chemical, structural, electronic and magnetic properties of surfaces and shallow interfaces, with the spatial resolution of few tens of nanometer (nm). The Electron-Spectro-Microscopy beamline (ESM) has been recently commissioned at NSLS-II and is now in operation. The primary spectroscopic technique is photoemission, performed over a wide energy range with control of light polarization and in a variety of flux/resolution conditions. The beamline has two experimental end stations that allow to perform ARPES and XPEEM/LEEM, separately. The ARPES end station focuses on high energy-resolution work, with spot-size of a few microns. The XPEEM/LEEM end station is a full-field microscope (XPEEM) operating either with the synchrotron generated X-rays (XPEEM), or with an internal electron gun (LEEM). Spatial resolution is crucial in studies of newly synthesized complex materials since they are often initially available only as small specimens (typically micron size). Furthermore, chemical inhomogeneities on surfaces are often an integral part of surface chemical processes. Finally, the ESM beamline with X-ray spots of few microns is optimized to study the electronic structure of novel materials with microscopy capabilities.

47 OTHER INSTRUMENTATION↗

DOE OSTI2021

The case for digital twins in metal additive manufacturing

The digital twin (DT) is a relatively new concept that is finding increased acceptance in industry. A DT is generally considered as comprising a physical entity, its virtual replica, and two-way digital data communications in-between. Its primary purpose is to leverage the process intelligence captured within digital models—or usually their faster-solving surrogates—towards generating increased value from the physical entities. The surrogate models are created using machine learning based on data obtained from the field, experiments and digital models, which may be physics-based or statistics-based. Anomaly detection and correction, and diagnostic closed-loop process control are examples of how a process DT can be deployed. In the manufacturing industry, its use can achieve improvements in product quality and process productivity. Metal additive manufacturing (AM) stands to gain tremendously from the use of DTs. This is because the AM process is inherently chaotic, resulting in poor repeatability. However, a DT acting in a supervisory role can inject certainty into the process by actively keeping it within bounds through real-time control commands. Closed-loop feedforward control is achieved by observing the process through sensors that monitor critical parameters and, if there are any deviations from their respective optimal ranges, suitable corrective actions are triggered. The type of corrective action (e.g. a change in laser power or a modification to the scanning speed) and its magnitude are determined by interrogating the surrogate models. Because of their artificial intelligence (AI)-endowed predictive capabilities, which allow them to foresee a future state of the physical twin (e.g. the AM process), DTs proactively take context-sensitive preventative steps, whereas traditional closed-loop feedback control is usually reactive. Apart from assisting a build process in real-time, a DT can help with planning the build of a part by pinpointing the optimum processing window relevant to the desired outcome. Again, the surrogate models are consulted to obtain the required information. In this article, we explain how the application of DTs to the metal AM process can significantly widen its application space by making the process more repeatable (through quality assurance) and cheaper (by getting builds right the first time).

36 MATERIALS SCIENCE↗