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This guide will show how DC power optimizers and microinverters (both known as module-level power electronics) are being used in new and/or retrofit, single and multifamily homes.
Potential induced degradation (PID) is a reliability issue affecting photovoltaic (PV) modules, mainly when PV strings operate under high voltages in hot/humid conditions. Polarization-type PID (PID-p) has been known to decrease module performance quickly. PID-p can be reduced or recovered under the light in some cases, but this effect, as expected, would be less pronounced on the rear side of bifacial PV modules receiving lower irradiance. As bifacial PV modules are projected to dominate the PV market within the next 10 years, it is crucial to understand the PID-p issue in bifacial modules better. In this study, we performed indoor PID testing to induce PID-p on 14 commercial bifacial p-PERC modules with three different module constructions from three manufacturers. Here, four rounds (+ve and –ve polarities for front and rear sides) of PID testing are done at 25°C, 54% relative humidity (RH) for 168 h using the aluminum foil method. Each module side (front cell side and back cell side) is tested individually under both negative and positive voltage bias. The results show that the highest degradation of 32% in maximum power (Pmax) at standard test conditions (1000 W/m 2 ) and 51% at low irradiance (200 W/m 2 ) has been observed in some cases. Recovery under sunlight is also done, and outcomes show a near-complete recovery in Pmax. This study presents an extensive experimental methodology and a detailed analysis to systematically and simultaneously/sequentially evaluate multiple construction types of bifacial modules to the PID-p susceptibility and recovery.
The Mir Cooperative Solar Array (MCSA), produced jointly by the United States and Russia, was deployed on the Mir Russian space station on May 25, 1996. The MCSA is a photovoltaic electrical power system that can generate up to 6 kW. The power from the MCSA is needed to extend Mir's lifetime and to support experiments conducted there by visiting U.S. astronauts. The MCSA was brought to Mir via the Space Shuttle Atlantis on the STS-74 mission, launched November 12, 1995. This cooperative venture combined the best technology of both countries: the United States provided high-efficiency, lightweight photovoltaic panel modules, whereas Russia provided the array structure and deployment mechanism. Technology developed in the Space Station Freedom Program, and now being used in the International Space Station, was used to develop MCSA's photovoltaic panel. Performance data obtained from MCSA operation on Mir will help engineers better understand the performance of the photovoltaic panel modules in orbit. This information will be used to more accurately predict the performance of the International Space Station solar arrays. Managed by the NASA Lewis Research Center for NASA's International Space Station Program Office in Houston, Texas, the MCSA Project was completed on time and under budget despite a very aggressive schedule.
Direct current (DC) power optimizers and microinverters (together known as module-level power electronics, or MLPE) are one of the fastest growing market segments in the solar industry. According to GTM Research in The Global PV Inverter Landscape 2015, over 55% of all residential photovoltaic (PV) installations in the United States used some form of MLPE in 2014.
Traditional Glass-Backsheet (GB) photovoltaic (PV) modules have been the industry standard for a long time, but the Glass-Glass (GG) modules are quickly rising in popularity. PV modules installed in hot-humid climates with high string voltages can undergo potential induced degradation (PID). So far, to the best of our knowledge, only fresh modules with strong interfacial adhesion have been investigated for PID. However, in reality, the PV modules have weak interfacial adhesion after a few years of field exposure. Therefore, it is essential to evaluate PV modules with weakened interfaces. In this study, we investigated the PID susceptibility of PV modules with weakened interfaces after subjecting them to 2000 hours of damp heat (DH2000) at 85°C/85% relative humidity (RH) in an accelerated environmental chamber. Fresh GG modules were also stressed for PID to compare with PID degradation of DH-stressed modules. Pre- and post-characterization tests were done before, between, and after each stress method to determine the changes in electrical performance, cell metallization properties, and hotspot properties. It is observed that fresh GG modules showed little/no degradation (less than 1%) in maximum power (Pmax), whereas the GG modules that underwent sequential DH and PID degraded by 11% to 12%. Potential mechanisms for these degradations are also presented. Furthermore, the results presented in this study are critical for the industry, considering that the bifacial modules with GG construction will be dominant in the next 10 years.
In this chapter, we describe luminescence and thermal imaging in the context of thin-film PV devices. First, we discuss both traditional and developing experimental designs, including dark LIT (DLIT), illuminated LIT, PL using different illumination configurations, traditional EL performed under forward -bias current injection, and contactless EL induced with sub -cell illumination patterns. Next, we provide some brief theoretical background to highlight relationships between fundamental materials properties and the resulting luminescence and thermal images. Finally, we give examples of thin-film PV PL, EL, and LIT images to demonstrate the utility of these imaging methods ranging from understanding the microstructure of active layers to managing the quality and reliability of full PV modules.
We report photovoltaic (PV) modules of the same make and model are often assembled with different bills of materials (BOMs). In this correspondence, we revisit two case studies of utility-scale silicon PV systems in which these differing BOMs were associated with faster-than-expected degradation. In one of the sites, we found that different metallization paste had been used for grid lines in some cells leading to loss of contact to the cell and severe series resistance degradation. We provide details on the observation of this mechanism at two additional sites not described in the original article. In a second case study, we found that two different types of cell had been used, and that they could be distinguished by their back contact. Cells with uniform back contacts suffered from light and elevated temperature induced degradation (LeTID), while those with local back contacts did not. We also briefly describe BOM variations observed at other sites to illustrate the extent of the challenge. Our results from both sites underscore that variations in BOM, even among modules of the same make and model can lead to reliability challenges.
The direct current bias for photovoltaic (PV) modules interconnected in series-strings may include both high voltage negative ("HV-") and positive ("HV+") polarity with respect to the electrical ground. Multiple degradation modes, resulting in quantifiable optical loss, were found to occur during HV-/HV+ sequential stress, including: corrosion of the external glass surface, encapsulant delamination (at its interfaces with the glass and the PV cell), internal haze formation (resulting from a chemical interaction between the glass and the encapsulant), corrosion and migration of the gridlines, and corrosion of the silicon nitride (SixNy) antireflective coating on the cell. The effects of these separate modes were examined using monolithic (e.g., glass or PV cell) and laminated-coupon (glass/encapsulant/glass or glass/encapsulant/cell/encapsulant/backsheet) specimens. Characterizations during and after unbiased accelerated testing at 85 degrees C/85% relative humidity included: spectrophotometry, optical microscopy, electron microscopy, and ellipsometry. For some module components (i.e., the glass and the SixNy coating), the optical performance was determined through iterative analysis of empirical measurements. Concentrating on just their spectral effect, a novel model was then developed to estimate the transfer of light to the PV cell and the return of light from the PV module with simultaneous degradation mechanisms, which was compared to a mini-module previously subjected to HV-/HV+ stress. The model suggests one-third of the current loss observed for the mini-module can be attributed to the optical degradation of the packaging materials. The dominant degradation modes include encapsulant delamination and corrosion of the SixNy coating. Recommendations are given so that the optical model may be improved relative to accelerated testing and validated relative to field aging.
The goal of this Technical Specification is to provide a guideline for manufacturers of photovoltaic (PV) modules to produce modules that, once the design is proven to meet the quality and reliability requirements, replicate the design on an industrial scale without compromising its consistency with the requirements.
Reduced strength of attachment of the encapsulant resulting from the outdoor environment, including ultraviolet (UV) radiation, may decrease photovoltaic (PV) module lifetime by enabling widespread corrosion of internal components. To date, few studies exist showing how the adhesion of PV components varies with environmental stress. We have conducted an interlaboratory experiment to provide an understanding that will be used to develop climatic specific module tests. Factors examined in the study included the UV light source (lamp type), temperature, and humidity to be proposed for use in accelerated aging tests. A poly (ethylene-co-vinyl acetate) (EVA) formulation often used in veteran PV installations was studied using a compressive shear test - to quantify the strength of attachment at the EVA/glass interface. Replicate laminated glass/polymer/glass coupon specimens were weathered at 12 institutions using a variety of indoor chambers or field aging. Shear strength, shear strain, and toughness were measured using a mechanical load-frame for the compressive shear test, with subsequent optical imaging and electron microscopy of the separated surfaces.
Some may say that PV modules are moving toward being a simple commodity, but most major PV customers ask: 'How can I minimize chances of a module recall?' Or, 'How can I quantify the added value of a 'premium' module?' Or, 'How can I assess the value of an old PV system that I'm thinking of purchasing?' These are all questions that PVQAT (the International PV Quality Assurance Task Force) and partner organizations are working to answer. Defining standard methods for ensuring minimal acceptable quality of PV modules, differentiating modules that provide added value in the toughest of environments, and creating a process (e.g. through IECRE [1]) that can follow a PV system from design through installation and operation are tough tasks, but having standard approaches for these will increase confidence, reduce costs, and be a critical foundation of a mature PV industry. This paper summarizes current needs for new tests, some challenges for defining those tests, and some of the key efforts toward development of international standards, emphasizing that meaningful quantification of reliability (as in defining a service life prediction) must be done in the context of a specific product with design parameters defined through a quality management system.
Natural soiling and the subsequent requisite cleaning of photovoltaic (PV) modules result in abrasion damage to the cover glass. The durability of the front glass has important economic consequences, including determining the use of antireflective and/or antisoiling coatings as well as the method and frequency of operating maintenance (cleaning). The abrasion of coatings and glass has been explored in a field study, including the soiling-prone locations of Dubai (United Arab Emirates), Kuwait City (Kuwait), Mesa (Arizona), Mumbai (India), and Sacramento (California). Dry-brush-cleaned specimens will be compared to those subjected to artificial-brush testing. The characteristics of material integrity, surface energy, optical transmittance, surface roughness, and scratch size were examined using an optical microscope, contact goniometer (for water), spectrophotometer, interferometer, and atomic force microscope (AFM), respectively. The findings of this study will be used to provide feedback regarding the cleaning equipment, cleaning methods, and coatings used in the PV industry. The study here will also be used to aid in developing an abrasion standard for the PV industry.
Here, we present a synergistic approach to modulate organic–perovskite interfaces and their photovoltaic behaviors by tuning the properties of n-contact fullerenes layered atop of perovskite. Fullerenes with excited charge transfer are found to not only suppress fullerene photoluminescence, but also enhance molecular polarization and transport capabilities. This results in optimized perovskite–fullerene contact.
A model, suitable for a row or multiple rows of photovoltaic (PV) modules, is presented for estimating the backside irradiance for bifacial PV modules. The model, which includes the effects of shading by the PV rows, is based on the use of configuration factors to determine the fraction of a source of irradiance that is received by the backside of the PV module. Backside irradiances are modeled along the sloped height of the PV module, but assumed not to vary along the length of the PV row. The backside irradiances are corrected for angle-ofincidence losses and may be added to the front side irradiance to determine the total irradiance resource for the PV cell. Model results are compared with the measured backside irradiances for NREL and Sandia PV systems, and with results when using ray tracing software.
Bifacial photovoltaic (PV) modules have the advantage of using light reflected off of the ground to contribute to power production. Predicting the energy gain is challenging and requires complex models to do so accurately. Often, module degradation over time is neglected in models for the sake of simplicity or is underestimated. Comparing outdoor and indoor current–voltage (I–V) performance for bifacial modules is more challenging than for monofacial modules, as there are additional variables to consider such as rear albedo non-uniformity, cell mismatch, and their effects on temperature. This challenge is compounded when heterogeneous degradation modes occur, such as polarization-type potential-induced degradation (PID-p). To examine the effects of PID-p on I–V predictions using an empirical data-driven approach, 16 bifacial PERC modules are installed outdoors on racks with different albedo conditions. A subset is exposed to high-voltage biases of −1500 V or +1500 V. Outdoor data are traced at irradiance ranges of 150–250 W/m 2 , 500–600 W/m 2 , and 900–1000 W/m 2 . These curves are corrected using control module temperature, wire resistivity, and module resistance measured indoors. We examine several methods to transform indoor I–V curves to accurately, and more simply than existing methods, approximate outdoor performance for bifacial modules without and with varying levels of PID-p degradation. This way, bifacial performance modeling can be more accessible and informed by fielded, degraded modules. Distributions of percent errors between indoor and outdoor performance parameters and Mean Absolute Percent Errors (MAPEs) are used to assess method quality. Results including low-irradiance data (150–250 W/m 2 ) are discussed but are filtered for quantifying method quality as these data introduce substantial errors. The method with the most optimal tradeoff between low MAPE and analysis simplicity involves measuring the front side of a module indoors at an irradiance equal to plane-of-array irradiance plus the product of module bifaciality and albedo irradiance. This method gives MAPE values of 1–6.5% for non-degraded and 1.6–5.9% for PID-p degraded module performance.
A model, suitable for a row or multiple rows of photovoltaic (PV) modules, is presented for estimating the backside irradiance for bifacial PV modules. The model, which includes the effects of shading by the PV rows, is based on the use of configuration factors to determine the fraction of a source of irradiance that is received by the backside of the PV module. Backside irradiances are modeled along the sloped height of the PV module, but assumed not to vary along the length of the PV row. The backside irradiances are corrected for angle-of-incidence losses and may be added to the front side irradiance to determine the total irradiance resource for the PV cell. Model results are compared with the measured backside irradiances for NREL and Sandia PV systems, and with results when using ray tracing software.
The optical degradation of encapsulants from ultraviolet (UV) radiation has historically resulted in a significant loss in performance throughout the life of a photovoltaic (PV) module. International Electrotechnical Commission (IEC) test methods have recently been developed to screen for PV encapsulants prone to loss in optical performance. The present study was performed to benchmark polymeric packaging materials relative to IEC 62788-1-4 (covering the measurement of optical transmittance) and IEC 62788-1-7 (on the durability of transmittance), provide feedback toward improvement of the methods, and develop insight regarding optical degradation. Contemporary materials were examined, including poly(ethylene-co-vinyl acetate) (EVA), thermoplastic polyolefin (TPO), polyolefin elastomer (POE), and polyvinyl butyral (PVB) encapsulants; a poly(ethene-co-tetrafluoroethene)/poly(ethylene terephthalate) (ETFE/PET) transparent backsheet; and a polystyrene (PS) working reference material. The use of silica-, specialty-, and rolled-glass was also compared in laminated coupons. Specimen size was separately examined from 2.5 to 12.5 cm. Weathering was performed with a xenon source, using IEC TS 62788-7-2 methods A2, A3, A4, and A5 (chamber temperature of 55 degrees C, 65 degrees C, 75 degrees C, or 85 degrees C), respectively. Characterizations were made using a UV-visible-near-infrared (UV-VIS-NIR) spectrophotometer (transmittance and reflectance, with and without an integrating sphere), a UV-VIS fluorescence spectrophotometer, a camera, and an optical microscope. Performance was analyzed, including solar weighted transmittance, yellowness index, UV cut-off wavelength, and haze (scattering). Separate Arrhenius analyses were performed to assess retention of transmittance and changes in yellowness index. The activation energy for both characteristics was found to range from 15-80 kJ mol-1, with an average of 48 kJ mol-1, similar to the average of 45 kJ mol-1 identified in the previous international PV Quality Assurance Task Force (PVQAT) Task Group 5 (TG5) study of more traditional encapsulants. The separate degradation modes of discoloration and scattering were distinguished in the encapsulants using a comprehensive spectral characterization. Based on these results, the IEC 62788-1-7 pass/fail criteria of 5% change in transmittance was confirmed to identify a known bad encapsulant.
Abstract Novel methods for advancing reliability testing of photovoltaic (PV) modules and materials have recently been developed. Combined-accelerated stress testing (C-AST) is one such method which has demonstrated reliable reproduction of some field-failures which were not reproducible by standard certification tests. To increase confidence and assist in the development of C-AST, and other new testing protocols, it is important to validate that the failure modes observed and mechanisms induced are representative of those observed in the field, and not the product of unrealistic stress conditions. Here we outline a method using appropriate materials characterization and modelling to validate the failure mechanisms induced in C-AST such that we can increase confidence in the test protocol. The method is demonstrated by applying it to a known cracking failure of a specific polyamide (PA)-based backsheet material. We found that the failure of the PA-based backsheet was a result of a combination of stress factors. Photo-oxidation from ultra-violet (UV) radiation exposure caused a reduction in fracture toughness, which ultimately lead to the cracking failure. We show that the chemical and structural changes observed in the backsheet following C-AST aging were also observed in field-aged samples. These results increase confidence that the conditions applied in C-AST are representative of the field and demonstrates our approach to validating the failure mechanisms induced.