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Statistical limiter, which protects test specimens during random vibration testing, differentiates between peak acceleration levels that are normal components of vibration signal and those that exhibit damaging characteristics. Device aborts test only when statistical properties of vibration signal change significantly or when catastrophic transient occurs.
A hemispherical inlet flow control device was tested on a 50.8 cm. (20-inch) diameter fan stage in the NASA-Lewis anechoic chamber. The control device used honeycomb and wire mesh to reduce turbulence intensities entering the fan. Far field acoustic power level results show about a 5 db reduction in blade passing tone and about 10 dB reduction in multiple pure tone sound power at 90% design fan speed with the inlet device in place. Hot film cross probes were inserted in the inlet to obtain data for two components of the turbulence at 65 and 90% design fan speed. Without the flow control device, the axial intensities were below 1.0%, while the circumferential intensities were almost twice this value. The inflow control device significantly reduced the circumferential turbulence intensities and also reduced the axial length scale.
A hemispherical inlet flow control device was tested on a 50.8 cm. (20-inch) diameter fan stage in the NASA-Lewis Anechoic Chamber. The control device used honeycomb and wire mesh to reduce turbulence intensities entering the fan. Far field acoustic power level results showed about a 5 dB reduction in blade passing tone and about 10 dB reduction in multiple pure tone sound power at 90% design fan speed with the inlet device in place. Hot film cross probes were inserted in the inlet to obtain data for two components of the turbulence at 65 and 90% design fan speed. Without the flow control device the axial intensities were below 1.0%, while the circumferential intensities were almost twice this value. The inflow control device significantly reduced the circumferential turbulence intensities and also reduced the axial length scale.
Various methods and devices for obtaining experimental data on heat flux density over wide ranges of temperature and pressure are examined. Laboratory tests and device fabrication details are supplemented by theoretical analyses of heat-conduction and thermoelectric effects, providing design guidelines and information relevant to further research and development. A theory defining the measure of correspondence between transducer signal and the measured heat flux is established for individual (isolated) heat flux transducers subject to space and time-dependent loading. An analysis of the properties of stacked (series-connected) transducers of various types (sandwich-type, plane, and spiral) is used to derive a similarity theory providing general governing relationships. The transducers examined are used in 36 types of derivative devices involving direct heat loss measurements, heat conduction studies, radiation pyrometry, calorimetry in medicine and industry and nuclear reactor dosimetry.
A device for testing fasteners such as nuts and bolts is described which consists of a fixed base plate having a number of threaded and unthreaded holes of varying size for receiving the fasteners to be tested, a torque marking paper taped on top the fixed base plate for marking torque-angle indicia, a torque wrench for applying torque to the fasteners being tested, and an indicator for showing the torque applied to the fastener. These elements provide a low cost, nondestructive device for verifying the strength of bolts and nuts.
As we continue to advance in exploring space frontiers, technology must also advance. The need for faster data recovery and data processing is crucial. In this, the less equipment used, and lighter that equipment is, the better. Because integrated circuits become more sensitive in high altitude, experimental verification and quantification is required. The Center for Applied Radiation Research (CARR) at Prairie View A&M University was awarded a grant by NASA to participate in the NASA ER-2 Flight Program, the APEX balloon flight program, and the Student Launch Program. These programs are to test anomalous errors in integrated circuits due to single event effects (SEE). CARR had already begun experiments characterizing the SEE behavior of high speed and high density SRAM's. The research center built a error testing system using a PC-104 computer unit, an Iomega Zip drive for storage, a test board with the components under test, and a latchup detection and reset unit. A test program was written to continuously monitor a stored data pattern in the SRAM chip and record errors. The devices under test were eight 4Mbit memory chips totaling 4Mbytes of memory. CARR was successful at obtaining data using the Electronic TestBed System (EBS) in various NASA ER-2 test flights. These series of high altitude flights of up to 70,000 feet, were effective at yielding the conditions which single event effects usually occur. However, the data received from the series of flights indicated one error per twenty-four hours. Because flight test time is very expensive, the initial design proved not to be cost effective. The need for orders of magnitude with more memory became essential. Therefore, a project which could test more memory within a given time was created. The goal of this project was not only to test more memory within a given time, but also to have a system with a faster processing speed, and which used less peripherals. This paper will describe procedures used to build an updated Electronic Testbed System.
We have created and tested a compact integrated X-ray beam intensity and position monitor using Ar-gas scintillation. The light generated inside the device's cavity is detected by diametrically opposed PIN diodes located above and below the beam. The intensity is derived from the sum of the top and bottom signals, while the beam position is calculated from the difference-over-sum of the two signals. The device was tested at Cornell High Energy Synchrotron Source with both 17 keV and 59 keV x-rays. For intensity monitoring, the Ar-scintillation monitor performance is comparable to standard ion chambers in terms of precision. As an X-ray beam position monitor the new device response is linear with vertical beam position over a 2 mm span with a precision of 2 {mu}m.
A set of addressable test structures, each of which uses addressing schemes to access individual elements of the structure in a matrix, is used to test the quality of a wafer before integrated circuits produced thereon are diced, packaged and subjected to final testing. The electrical characteristic of each element is checked and compared to the electrical characteristic of all other like elements in the matrix. The effectiveness of the addressable test matrix is in readily analyzing the electrical characteristics of the test elements and in providing diagnostic information.
In the framework of the European I SMART project, we have designed and made new SiC-based nuclear radiation detectors able to operate in harsh environments and to detect both fast and thermal neutrons. In this paper, we report experimental results of fast neutron irradiation campaign at high temperature (106 deg. C) in quasi-realistic working conditions. Our device does not suffer from high temperature, and spectra do show strong stability, preserving features. These experiments, as well as others in progress, show the I SMART SiC-based device skills to operate in harsh environments, whereas other materials would strongly suffer from degradation. Work is still demanded to test our device at higher temperatures and to enhance efficiency in order to make our device fully exploitable from an industrial point of view. (authors)
Stability and accuracy of the PHIL platform has been a common problem and challenging issue for a long time, thus continuous efforts and research have been devoted to developing interface algorithms to improve upon this. Some of existing works exhibit promising solutions to compensate the errors in the PHIL platform. However, there is a need to harmonize various solutions into a standard framework that provides a general solution for various PHIL test beds and that can be reused with minimum modifications to avoid extra effort. A good way to do this is by using application function blocks (AFBs), which are model-based and can be developed as a standard library component, thus achieving satisfactory reusability and reconfigurability for various platforms. Since PHIL simulation has the flexibility of the software simulation, proper functions can be easily implemented in the digital real-time simulator (DRTS) to preprocess the reference signal before sending it to the power amplifier. Therefore, this paper aims to develop standard AFBs in DRTS for the PHIL interface to test grid-connected inverters. The PHIL interface algorithm is separated into five AFBs that will be presented in detail in this paper.
The aim of this project was to evaluate and characterize the performance of a MOLEKULE AIR air cleaner unit. The testing protocol comprised the evaluation of an unused Molekule Air unit operating at maximum (“boost” setting) fan speed setting. The device was tested over initial short-term periods of 70-80 h of continuous operation. The tested air cleaner was challenged in separate experiments with a well-characterized mixture of volatile organic compounds (VOCs), and with ozone. All tests were performed at realistic pollutant levels in a 20-m 3 environmental stainless-steel chamber. Variables controlled and measured in this study included the chamber temperature, relative humidity, the composition and concentration of the challenge VOCs, and the concentrations of ozone. Potential formation of byproducts was also investigated to assess the overall performance.
In-flight calibration for the solr and Earth flux channels was examined. Earth Radiation on Budget (ERB) channel components were exposed to the space environment and then retrieved and resubmitted to radiometric calibration after exposure. It is suggested that corrections may be applied to ERB results and information will be obtained to aid in the selection of components for future operational solar and Earth radiation budget experiments. To assure that these high accuracy devices are measuring real variations and are not responding to changes induced by the space environment, it is desirable to test such devices radiometrically after exposure to the best approximation of the orbital environment.
This submission of data includes all the 1/50th scale testing data completed on the Wave Energy Prize for Float Inc. During the testing of its 1/50th-scale device, Float Inc. Berger ABAM was deemed ineligible due to the fact that they brought a device with them to test and did not ship the device by the deadline stipulated in the Wave Energy Prize Rules. Because of this, analysis, results, and judging were not completed for this team/device. This submission included files such as: - 1/50th test data (raw & processed) - 1/50th test data video and pictures - 1/50th Test plans and testing documents
Two LANL FTS (Filter Test System ) devices for nuclear material storage canisters are fully operational. One is located in PF-4 ( i.e. the TA-55 FTS) while the other is located at the Radiation Protection Division’s Aerosol Engineering Facility ( i.e. the TA-3 FTS). The systems are functionally equivalent , with the TA-3 FTS being the test-bed for new additions and for resolving any issues found in the TA-55 FTS. There is currently one unresolved issue regarding the TA-55 FTS device. The canister lid clamp does not give a leak tight seal when testing the 1 QT (quart) or 2 QT SAVY lids. An adapter plate is being developed that will ensure a correct test configuration when the 1 or 2 QT SAVY lid s are being tested .
The temperature-dependent characteristics of the third-generation 10-kV/20-A SiC MOSFET including the static characteristics and switching performance are carried out in this paper. The steady-state characteristics, including saturation current, output characteristics, antiparallel diode, and parasitic capacitance, are tested. Here, a double pulse test platform is constructed including a circuit breaker and gate drive with >10-kV insulation and also a hotplate under the device under test for temperature-dependent characterization during switching transients. The switching performance is tested under various load currents and gate resistances at a 7-kV dc-link voltage from 25 to 125 C and compared with previous 10-kV MOSFETs. A simple behavioral model with its parameter extraction method is proposed to predict the temperature-dependent characteristics of the 10-kV SiC MOSFET. The switching speed limitations, including the reverse recovery of SiC MOSFET's body diode, overvoltage caused by stray inductance, crosstalk, heat sink, and electromagnetic interference to the control are discussed based on simulations and experimental results.
Evaluation of solar simulators using enclosed sources, in-house measurement facility for testing proposed devices to produce solar simulation, and related research programs
A 3D silicon sensor fabricated at Stanford with electrodes penetrating throughout the entire silicon wafer and with active edges was tested in a 1.4 T magnetic field with a 180 GeV/c pion beam at the CERN SPS in May 2009. The device under test was bump-bonded to the ATLAS pixel FE-I3 readout electronics chip. Three readout electrodes were used to cover the 400 {micro}m long pixel side, this resulting in a p-n inter-electrode distance of {approx} 71 {micro}m. Its behavior was confronted with a planar sensor of the type presently installed in the ATLAS inner tracker. Time over threshold, charge sharing and tracking efficiency data were collected at zero and 15{sup o} angles with and without magnetic field. The latest is the angular configuration expected for the modules of the Insertable B-Layer (IBL) currently under study for the LHC phase 1 upgrade expected in 2014.
Previous research efforts have demonstrated small area (0.04 cm) GaAs on Si (GaAs/Si) solar cells with AM0 efficiencies in excess of 17%. These results were achieved on Si substrates coated with a step graded buffer of Si(x),Ge(1-x) alloys graded to 100% Ge. Recently, a 100-fold increase in device area was accomplished for these devices in preparation for on-orbit testing of this technology aboard Materials International Space Station Experiment number 5 (MISSE5). The GaAs/Si MISSE5 experiment contains five (5) GaAs/Si test devices with areas of lcm(exp 2) and 4cm(exp 4) as well as two (2) GaAs on GaAs control devices. Electrical performance data, measured on-orbit for three (3) of the test devices and one (1) of the control devices, will be telemetered to ground stations daily. After approximately one year on orbit, the MISSE5 payload will be returned to Earth for post flight evaluation. This paper will discuss the development of the GaAs/Si devices for the MISSE5 flight experiment and will present recent ground and on-orbit performance data.