Fabrication and Testing of Thick Film CVD Niobium-Lined Copper SRF Cavities for High-Gradient Applications, Phase II
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We studied the role of O concentration with depth in the performance of Nb SRF cavities. An ensemble of electropolished 1.3 GHz cavities, which initially showed high field Q-slope (HFQS), was subjected to sequential testing and treatment with in-situ low temperature baking at various temperatures. We find that increasing the bake duration causes (i) an increase in the onset of HFQS until it is absent up to quench (ii) a non-monotonic relationship with the quench field (iii) an evolution of the RBCS toward a non-equilibrium behavior that drives anti-Q slope. Our data is qualitatively explained by assuming an O diffusion model and suggests that the mitigation of HFQS that arises from 120 C in-situ LTB is mediated by the diffusion of O from the native oxide which prevents the precipitation of proximity-coupled Nb nano-hydrides, in turn enabling higher quench fields. The decrease in quench field for cavities in which O has been diffused >90 nm from the RF surface may be due to a reduction of the field limit in the SS bilayer structure. We also suggest that the evolution of the RBCS occurs due to the absence of proximity coupled inclusions, bringing about non-equilibrium effects.
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Here, a new approach aims to fabricate parts with targeted, site-specific properties for a wide range of applications in extreme environments within the aviation, space, and energy sectors.
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A functionally graded material is formed by pipetting individual micro-or-nano-litter droplets with a variety of materials including multi-nanostructured material (nanowires, carbon nanotubes, enzymes, multi-element and/or multi-color, multi-biomolecules) and UV polymerization of the flat hydrogel meniscus surface formed at the carrier fluid interface. After step-by-step droplet pipetting and subsequent layer-by-layer UV polymerization via a digital mask, the complete fabricated part without supporting layers is taken out of the carrier fluid while the un-cured micro-litter residue is conveniently suctioned out of the carrier fluid.
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Abstract not provided.
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