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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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NASA NTRS2011

Policies and Procedures for Accessing Archived NASA Lunar Data via the Web

The National Space Science Data Center (NSSDC) was established by NASA to provide for the preservation and dissemination of scientific data from NASA missions. This paper describes the policies specifically related to lunar science data. NSSDC presently archives 660 lunar data collections. Most of these data (423 units) are stored offline in analog format. The remainder of this collection consists of magnetic tapes and discs containing approximately 1.7 TB of digital lunar data. The active archive for NASA lunar data is the Planetary Data System (PDS). NSSDC has an agreement with the PDS Lunar Data Node to assist in the restoration and preparation of NSSDC-resident lunar data upon request for access and distribution via the PDS archival system. Though much of NSSDC's digital store also resides in PDS, NSSDC has many analog data collections and some digital lunar data sets that are not in PDS. NSSDC stands ready to make these archived lunar data accessible to both the research community and the general public upon request as resources allow. Newly requested offline lunar data are digitized and moved to near-line storage devices called digital linear tape jukeboxes. The data are then packaged and made network-accessible via FTP for the convenience of a growing segment of the user community. This publication will 1) discuss the NSSDC processes and policies that govern how NASA lunar data is preserved, restored, and made accessible via the web and 2) highlight examples of special lunar data requests.

James, Nathan L.↗
NASA NTRS2002

Impact of lossy compression on diagnostic accuracy of radiographs for periapical lesions

OBJECTIVES: The purpose of this study was to evaluate the lossy Joint Photographic Experts Group compression for endodontic pretreatment digital radiographs. STUDY DESIGN: Fifty clinical charge-coupled device-based, digital radiographs depicting periapical areas were selected. Each image was compressed at 2, 4, 8, 16, 32, 48, and 64 compression ratios. One root per image was marked for examination. Images were randomized and viewed by four clinical observers under standardized viewing conditions. Each observer read the image set three times, with at least two weeks between each reading. Three pre-selected sites per image (mesial, distal, apical) were scored on a five-scale score confidence scale. A panel of three examiners scored the uncompressed images, with a consensus score for each site. The consensus score was used as the baseline for assessing the impact of lossy compression on the diagnostic values of images. The mean absolute error between consensus and observer scores was computed for each observer, site, and reading session. RESULTS: Balanced one-way analysis of variance for all observers indicated that for compression ratios 48 and 64, there was significant difference between mean absolute error of uncompressed and compressed images (P <.05). After converting the five-scale score to two-level diagnostic values, the diagnostic accuracy was strongly correlated (R (2) = 0.91) with the compression ratio. CONCLUSION: The results of this study suggest that high compression ratios can have a severe impact on the diagnostic quality of the digital radiographs for detection of periapical lesions.

NASA Discipline Space Human Factors↗
NASA NTRS1989

Impact of device level faults in a digital avionic processor

This study describes an experimental analysis of the impact of gate and device-level faults in the processor of a Bendix BDX-930 flight control system. Via mixed mode simulation, faults were injected at the gate (stuck-at) and at the transistor levels and, their propagation through the chip to the output pins was measured. The results show that there is little correspondence between a stuck-at and a device-level fault model, as far as error activity or detection within a functional unit is concerned. In so far as error activity outside the injected unit and at the output pins are concerned, the stuck-at and device models track each other. The stuck-at model, however, overestimates, by over 100 percent, the probability of fault propagation to the output pins. An evaluation of the Mean Error Durations and the Mean Time Between Errors at the output pins shows that the stuck-at model significantly underestimates (by 62 percent) the impact of an internal chip fault on the output pins. Finally, the study also quantifies the impact of device fault by location, both internally and at the output pins.

Suk, Ho Kim↗
NASA NTRS1988

Impact of device level faults in a digital avionic processor

This paper describes an experimental analysis of the impact of gate and device-level faults in the processor of a flight control system. Via mixed mode simulation faults were injected both at the gate (stuck-at) and at the transistor levels, and their propagation through the chip to the output pins was measured. The results show that there is little correspondence between a stuck-at and a device-level fault model insofar as error activity or detection within a functional unit is concerned. Insofar as error activity outside the injected unit and at the output pins are concerned, the stuck-at and device models track each other, although the stuck-at model overestimates, by over one hundred percent, the probability of fault propagation to the output pins. The stuck-at model significantly underestimates the impact of an internal chip fault on the output pins.

Kim, S.↗
NASA NTRS1986

Testing Electronic Devices for Single-Event Upset

Report prepared describes equipment and summarizes both pretest and onsite procedures for testing of digital electronic devices for susceptibility to single-event upset. Term "single-event upset" denotes variety of temporary or permanent bit flips or latchup induced by single particles of ionizing radiation. Vacuum chamber houses device under test while exposed to ion beam. Vacuum chamber and associated equipment must be brought to ion-beam facility for test.

Nichols, D. K.↗
NASA NTRS1995

Silicon Micromachining in RF and Photonic Applications

Texas Instruments (TI) has developed membrane and micromirror devices since the late 1970s. An eggcrate space membrane was used as the spatial light modulator in the early years. Discrete micromirrors supported by cantilever beams created a new era for micromirror devices. Torsional micromirror and flexure-beam micromirror devices were promising for mass production because of their stable supports. TI's digital torsional micromirror device is an amplitude modulator (known as the digital micromirror device (DMD) and is in production development, discussed elsewhere. We also use a torsional device for a 4 x 4 fiber-optic crossbar switch in a 2 cm x 2 cm package. The flexure-beam micromirror device is an analog phase modulator and is considered more efficient than amplitude modulators for use in optical processing systems. TI also developed millimeter-sized membranes for integrated optical switches for telecommunication and network applications. Using a member in radio frequency (RF) switch applications is a rapidly growing area because of the micromechanical device performance in microsecond-switching characteristics. Our preliminary membrane RF switch test structure results indicate promising speed and RF switching performance. TI collaborated with MIT for modeling of metal-based micromachining.

Lin, Tsen-Hwang↗
NASA NTRS1991

3-D CFD in a day - The laser digitizer project

The computation of airflow over complex configurations requires a complete description of the geometry. This can be obtained from CAD data, from blueprints, or from actual models. In any case, the time required is currently estimated at 4 to 6 months. It is proposed to shorten this time by a factor of 10 to 100 through the use of automated software, a fast, highly parallel computer and a three-dimensional laser digitizer. This device can provide (x,y,z) coordinates of surface points at rates exceeding 14,500/sec. Thus, it is possible to digitize an entire model in a few minutes. The accuracy of measurement on a flat white surface is better than 0.005 inches. Higher accuracy is available at higher cost. This work discusses the challenges which remain to be addressed. In particular, the surface point data need to be converted into a surface description, the surface description needs to be made into a surface grid, and the surface grid used to make a volume grid for the flow solver. Algorithms are kept in place or in mind for all of these problems. Integration of the more mature flow solution and visualization algorithms then allows generation of solution graphics directly from a wind tunnel model.

Merriam, Marshal↗