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At least 91 records · Page 5

Microwave radiometric aircraft observations of the Fabry-Perot interference fringes of an ice-water system

Airborne stepped-frequency microwave radiometer (SFMR) observations of the Fabry-Perot interference fringes of ice-water systems are discussed. The microwave emissivity at normal incidence of a smooth layered dielectric medium over a semi-infinite dielectric medium is examined for the case of ice over water as a function of ice thickness and attenuation coefficient, and the presence of quarter-wavelength oscillations in emissivity as the ice thickness and frequency are varied is pointed out. Experimental observations of pronounced quarter-wavelength oscillations in radiometric brightness temperature due to the Fabry-Perot interference fringes over smooth sea ice and lake ice varying in roughness as the radiometer frequencies were scanned are then presented.

Harrington, R. F.↗

Chemical composition of the SiO2/InSb interface as determined by X-ray photoelectron spectroscopy

In connection with the relatively poor insulating characteristics of the native oxides of most III-V compound semiconductors, there has been interest in the development of deposited dielectric layers for surface passivation and MOS device fabrication on III-V compound semiconductor substrates. The chemical system of SiO2 deposited on single-crystal InSb substrates has been proposed for the fabrication of IR CCD. The considered investigation is concerned with a detailed examination of the chemical nature of the interactions between deposited and native oxides using X-ray photoelectron spectroscopy (XPS) in conjunction with a chemical-etching technique for depth profiling. The compositional structure of the interfaces obtained in the SiO2/native oxide/InSb system is derived on the basis of an intensity analysis of XPS spectra. Thermal oxidation of the InSb substrate is found to result in an In-rich native oxide and excess elemental Sb at the native oxide/substrate interface.

Vasquez, R. P.↗

Role of energetic particles in charging/discharging of spacecraft dielectrics

The role that energetic particles in the substorm plasma have on the charging and discharging of typical dielectric layers used on spacecraft was investigated using spectra and pitch angle distributions measured in situ on the SCATHA spacecraft prior to and during a few kilovolt differential charging event in eclipse conditions. The particle spectra was input to deposition codes that determine the dose rate as a function of depth in Kapton and Teflon layers used in an experiment on SCATHA. The calculated ambient dose rates of a few rads/sec throughout the bulk of the samples are sufficiently high that radiation damage levels are reached on the time scale of 1 year. Surface dose is a factor of 100 higher. Bulk conductivity profiles were obtained from the dose rates using empirical relationships. The radiation induced bulk conductivities calculated at the peak charging time are found to be smaller than the intrinsic dark conductivity range of solar conditioned Kapton but higher than the corresponding value for Teflon.

Reagan, J. B.↗

High frequency scattering by a thin dielectric slab

The geometrical theory of diffraction (GTD) is applied to the problem of a source in the presence of a three-dimensional thin dielectric slab. It is assumed that the reflection and transmission properties of the slab are known, and the slab is not lossy and/or multilayered. Two-dimensional thin dielectric layer scattering is analyzed when diffraction emanates from a single point, the source is not near the slab, and random energy approaching tangentially due to transmission is negligible. Coefficients are obtained for the scattering and the GTD solution is extended to the three dimensional case after development of a ray fixed coordinate system. The results are applied to a half wavelength dipole mounted above a square polystyrene covered ground plane.

Burnside, W. D.↗

Derivation and application of a class of generalized impedance boundary conditions, part 2

Boundary conditions involving higher order derivatives are presented by simulating surfaces whose reflection coefficients are known analytically, numerically, or experimentally. Procedures for determining the coefficients of the derivatives are discussed, along with the effect of displacing the surface where the boundary conditions are applied. Provided the coefficients satisfy a duality relation, equivalent forms of the boundary conditions involving tangential field components are deduced, and these provide the natural extension to non-planar surfaces. As an illustration, the simulation of metal-backed uniform and three-layer dielectric coatings is given. It is shown that fourth order conditions are capable of providing an accurate simulation for the uniform coating at least a quarter of a wavelength in thickness. Provided, though, some compromise in accuracy is acceptable, it is also shown that a third order condition may be sufficient for practical purposes when simulating uniform coatings.

Volakis, J. L.↗

Microwave microstrip resonator measurements of Y1Ba2Cu3O(7-x) and Bi2Sr2Ca1Cu2O(8-y) thin films

Radio frequency (RF) surface resistance measurement experiments on high T(sub c) thin films were performed. The method uses a microstrip resonator comprising a top gold conductor strip, an alumina dielectric layer, and a separate superconductivity ground plane. The surface resistance of the superconducting ground plane can be determined, with reference to a gold calibration standard, from the measured quality factor of the half-wave resonator. Initial results near 7 GHz over the temperature range from 25 to 300 K are presented for YBa2Cu3O(7-x) and Bi2Sr2CaCu2O(8-y) thin film samples deposited by an electron beam flash evaporation process. The RF surface resistance at 25 K for both materials in these samples was found to be near 25 milliohms.

Lichtenberg, Christopher L.↗

Analysis of finite phased arrays of circular microstrip patches

A method is presented for analyzing a finite planar array of circular microstrip patches fed by coaxial probes. The self- and mutual impedances between array elements are calculated using the method of moments with the dyadic Green's function for a dielectric layer on a ground plane. The patch circuits are determined by using the reaction integral equation. The active input impedance as well as the active element pattern of the array are computed from a knowledge of the resultant patch currents. The calculated results for two-element and eight-element linear arrays are in good agreement with experimental data. The active reflection coefficient and element pattern for the center and edge elements of a two-dimensional array as a function of scan angle are also presented.

Deshpande, Manohar D.↗

Derivation and application of a class of generalized boundary conditions

Boundary conditions involving higher order derivatives are presented for simulating surfaces whose reflection coefficients are known analytically, numerically, or experimentally. Procedures for determining the coefficients of the derivatives are discussed, along with the effect of displacing the surface where the boundary conditions are applied. Provided the coefficients satisfy a duality relation, equivalent forms of the boundary conditions involving tangential field components are deduced, and these provide the natural extension to nonplanar surfaces. As an illustration, the simulation of metal-backed uniform and three-layer dielectric coatings is given. It is shown that fourth order conditions are capable of providing an accurate simulation for uniform coating at least a quarter of a wavelength in thickness.

Senior, Thomas B. A.↗

Degradation of electro-optic components aboard LDEF

Remeasurement of the properties of a set of electro-optic components exposed to the low-earth environment aboard the Long Duration Exposure Facility (LDEF) indicates that most components survived quite well. Typical components showed some effects related to the space environment unless well protected. The effects were often small but significant. Results for semiconductor infrared detectors, lasers, and LED's, as well as filters, mirrors, and black paints are described. Semiconductor detectors and emitters were scarred but reproduced their original characteristics. Spectral characteristics of multi-layer dielectric filters and mirrors were found to be altered and degraded. Increased absorption in black paints indicates an increase in absorption sites, giving rise to enhanced performance as coatings for baffles and sunscreens.

Blue, M. D.↗

Spectroscopic ellipsometry studies of HF treated Si (100) surfaces

Both ex situ and in situ spectroscopic ellipsometry (SE) measurements were employed to investigate the effect of HF cleaning on Si surfaces. The hydrogen-terminated (H-terminated) Si surface was modeled as an equivalent dielectric layer, and monitored in real time by SE measurements. The SE analyses indicate that, after a 20-sec 9:1 HF dip without rinse, the Si (100) surface was passivated by the hydrogen termination and remained chemically stable. Roughness of the HF-etched bare Si (100) surface was observed, in an ultrahigh vacuum chamber (UHV), and analyzed by the in situ SE. Evidence for desorption of the H-terminated Si surface layer, after being heated to about 550 C in the UHV chamber, is presented and discussed. This is the first use of an ex situ and in situ real-time, nondestructive technique capable of showing state of passivation, the rate of reoxidation, and the surface roughness of the H-terminated Si surfaces.

Yao, Huade↗

Spectroscopic ellipsometry studies of HF treated Si (100) surfaces

Both ex situ and in situ spectroscopic ellipsometry (SE) measurements were employed to investigate the effects of HF cleaning on Si surfaces. The hydrogen-terminated (H-terminated) Si surface was modeled as an equivalent dielectric layer, and monitored in real time by SE measurements. The SE analyses indicate that after a 20-s 9:1 HF dip without rinse, the Si(100) surface was passivated by the hydrogen termination and remained chemically stable. Roughness of the HF-etched bare Si(100) surface was observed, in an ultrahigh vacuum (UHV) chamber, and analyzed by the in situ SE. Evidence for desorption of the H-terminated Si surface-layer, after being heated to approximately 550 C in the UHV chamber, is presented and discussed. This is the first use of an ex situ and in situ real-time, nondestructive technique capable of showing state of passivation, the rate of reoxidation, and the surface roughness of the H-terminated Si surfaces.

Yao, Huade↗

Controlled thermal expansion printed wiring boards based on liquid crystal polymer dielectrics

Dielectric materials based on innovative Liquid Crystal Polymers (LCP's) have been used to fabricate surface mount printed wiring boards (PWB's) with a coefficient of thermal expansion matched to leadless ceramic chip carriers. Proprietary and patented polymer processing technology has resulted in self reinforcing material with balanced in-plane mechanical properties. In addition, LCP's possess excellent electrical properties, including a low dielectric constant (less than 2.9) and very low moisture absorption (less than 0.02%). LCP-based multilayer boards processed with conventional drilling and plating processes show improved performance over other materials because they eliminate the surface flatness problems of glass or aramid reinforcements. Laser drilling of blind vias in the LCP dielectric provides a very high density for use in direct chip attach and area array packages. The material is ideally suited for MCM-L and PCMCIA applications fabricated with very thin dielectric layers of the liquid crystal polymer.

Knoll, Thomas E.↗

Degradation of optical components in space

This report concerns two types of optical components: multilayer filters and mirrors, and self-scanned imaging arrays using charge coupled device (CCD) readouts. For the filters and mirrors, contamination produces a strong reduction in transmittance in the ultraviolet spectral region, but has little or no effect in the visible and infrared spectral regions. Soft substrates containing halides are unsatisfactory as windows or substrates. Materials choice for dielectric layers should also reflect such considerations. Best performance is also found for the harder materials. Compaction of the layers and interlayer diffusion causes a blue shift in center wavelength and loss of throughput. For sensors using CCD's, shifts in gate voltage and reductions in transfer efficiency occur. Such effects in CCD's are in accord with expectations of the effects of the radiation dose on the device. Except for optical fiber, degradation of CCD's represents the only ionizing-radiation induced effect on the Long Duration Exposure Facility (LDEF) optical systems components that has been observed.

Blue, M. D.↗

Arbitrarily shaped dual-stacked patch antennas: A hybrid FEM simulation

A dual-stacked patch antenna is analyzed using a hybrid finite element - boundary integral (FE-BI) method. The metallic patches of the antenna are modeled as perfectly electric conducting (PEC) plates stacked on top of two different dielectric layers. The antenna patches may be of any shape and the lower patch is fed by a coaxial cable from underneath the ground plane or by an aperture coupled microstrip line. The ability of the hybrid FEM technique for the stacked patch antenna characterization will be stressed, and the EM coupling mechanism is also discussed with the aid of the computed near field patterns around the patches.

Gong, Jian↗

Relationships between pigment composition variation and reflectance for plant species from a coastal savannah in California

Advances in imaging spectroscopy have indicated that remotely sensed reflectance measurements of the plant canopy may be used to identify and qualify some classes of canopy biochemicals; however, the manner in which differences in biochemical compositions translate into differences is not well understood. Most frequently, multiple linear regression routines have been used to correlate narrow band reflectance values with measured biochemical concentrations. Although some success has been achieved with such methods for given data sets, the bands selected by multiple regression are not consistent between data sets, nor is it always clear what physical or biological basis underlies the correlation. To examine the relationship between biochemical concentration and leaf reflectance signal we chose to focus on the visible spectrum where the primary biochemical absorbances are due to photosynthetic pigments. Pigments provide a range of absorbance features, occur over a range of concentrations in natural samples, and are ecophysiologically important. Concentrations of chlorophyll, for example, have been strongly correlated to foliar nitrogen levels within a species and to photosynthetic capacity across many species. In addition pigments effectively absorb most of the photosynthetically active radiation between 400-700 nm, a spectral region for which silicon detectors have good signal/noise characteristics. Our strategy has been to sample a variety of naturally occurring species to measure leaf reflectance and pigment compositions. We hope to extend our understanding of pigment reflectance effects to interpret small overlapping absorbances of other biochemicals in the infrared region. For this reason, selected samples were also tested to determine total nitrogen, crude protein, cellulose, and lignin levels. Leaf reflectance spectra measured with AVIRIS bandwidths and wavelengths were compared between species and within species and for differences between seasons, for changes in the the shape of the spectra. We attempt to statistically correlate these shape changes with differences in pigment compositions. In parallel with our comparisons of pigment composition and leaf reflectance, we have modified the PROSPECT leaf reflectance model to test the contributions of pigments or pigment group concentrations. PROSPECT considers a leaf as a multi-layer dielectric plane with an uneven surface. Jacquemoud adapted the basic analysis of Allen for surface effects, a leaf thickness factor, and the absorption of water and chlorophyll (actually all pigments) and the plant matrix. Our modifications to PROSPECT in the forward direction include breaking out the pigment concentration parameter into separate components for chlorophyll a and b and a number of xanthophylls and carotenes, and introducing a shift and convolution function to model the spread and shift from their in vitro measurements to their in vivo state. Further, we have considered how the matrix elements (i.e., all biochemicals and structural effects not modeled explicity) vary with species.

Ustin, Susan L.↗

Reducing Tilt-Related Errors Of Inductive Proximity Sensors

Simple modification of inductive proximity sensor nearly eliminates tilt-related readout error occurring when sensor used to measure thickness of dielectric layer on metal substrate (e.g., to measure thickness of insulating blanket on boiler). Sensor indicates true thickness when equipped with hemispherical contact knob ensuring correct zero-offset distance at measurement location.

Cotty, Glenn M., Jr.↗

Micromechanical Oscillating Mass Balance

A micromechanical oscillating mass balance and method adapted for measuring minute quantities of material deposited at a selected location, such as during a vapor deposition process. The invention comprises a vibratory composite beam which includes a dielectric layer sandwiched between two conductive layers. The beam is positioned in a magnetic field. An alternating current passes through one conductive layers, the beam oscillates, inducing an output current in the second conductive layer, which is analyzed to determine the resonant frequency of the beam. As material is deposited on the beam, the mass of the beam increases and the resonant frequency of the beam shifts, and the mass added is determined.

Altemir, David A.↗

Tailoring Thin Film-Lacquer Coatings for Space Applications

Thin film coatings have the capability of obtaining a wide range of thermal radiative properties, but the development of thin film coatings can sometimes be difficult and costly when trying to achieve highly specular surfaces. Given any space mission's then-nal control requirements, there is often a need for a variation of solar absorptance (alpha(sub s)), emittance (epsilon) and/or highly specular surfaces. The utilization of thin film coatings is one process of choice for meeting challenging thermal control requirements because of its ability to provide a wide variety of alpha(sub s)/epsilon ratios. Thin film coatings' radiative properties can be tailored to meet specific thermal control requirements through the use of different metals and the variation of dielectric layer thickness. Surface coatings can be spectrally selective to enhance radiative coupling and decoupling. The application of lacquer to a surface can also provide suitable specularity for thin film application without the cost and difficulty associated with polishing.

Peters, Wanda C.↗