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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 91 records · Page 5
All sourcesNASA NTRSDOE OSTI
NASA NTRS1980

Predicting the time-temperature dependent axial failure of B/A1 composites

Experimental and theoretical studies were conducted in order to understand and predict the effects of time, temperature, and stress on the axial failure modes of boron fibers and B/A1 composites. Due to the anelastic nature of boron fiber deformation, it was possible to determine simple creep functions which can be employed to accurately describe creep and fracture stress of as-produced fibers. Analysis of damping and strength data for B/6061 A1 composites indicates that fiber creep effects of creep on fiber fracture are measurably reduced by the composite fabrication process. The creep function appropriate for fibers with B/Al composites was also determined. A fracture theory is presented for predicting the time-temperature dependence of the axial tensile strength for metal matrix composites in general and B/A1 composites in particular.

Dicarlo, J. A.↗
NASA NTRS1982

The effects of inherent flaws on the time and rate dependent failure of adhesively bonded joints

Inherent flaws, as well as the effects of rate and time, are shown by tests on viscoelastic adhesive-bonded single lap joints to be as critical in joint failure as environmental and stress concentration effects, with random inherent flaws and loading rate changes resulting in an up to 40% reduction in joint strength. It is also found that the asymptotic creep stress, below which no delayed failure may occur, may under creep loading be as much as 45% less than maximum adhesive strength. Attention is given to test results for the case of titanium-LARC-3 adhesive single-lap specimens.

Sancaktar, E.↗
NASA NTRS1980

Predicting the time-temperature dependent axial failure of B/Al composites

Theoretical and experimental studies are reviewed whose objective was to gain insight into and predict the effects of time, temperature, and stress on the axial failure modes of boron fibers and B/Al composites. Owing to the inelastic nature of boron fiber deformation, it proved possible to develop simple creep functions which can be used to describe accurately the creep and fracture stress of as-produced fibers. Analysis of damping and stress data for B/6061 Al composites indicates that fiber creep and the effects of creep of fiber fracture are measurably reduced by the composite fabrication process.

Dicarlo, J. A.↗
NASA NTRS1984

A Study of DSN Traveling Wave Maser System Reliability

Reliability and availability characteristics of the DSN traveling wave maser (TWM) Assemblies are reported for the years 1981 through 1983, the charcteristics determined are: mean time between failures (MTBF) - 1200 hours; mean time to restore service (MTTRS) - 2.5 hours; and availability - 99.83%. The TWM MTBF is very good as compared to other DSN subsystems and assemblies. The TWM MTTRS is currently about three times as long as the average of other DSN subsystems. The dominant cause of TWM failures is contamination of the helium gas in the closed cycle refrigerators. Station configurations that do not provide TWM redundancy are subject to reception outages for long periods of time. Recommendations are made to improve the TWM Assembly availability characteristics for future mission support operations.

Stevens, R.↗
NASA NTRS2001

Dynamic Fatigue of ULE Glass

Ultra Low Expansion (ULE) glass is used in a number of applications which require a low thermal expansion coefficient. One such application is telescope mirror elements. An allowable stress can be calculated for this material based upon modulus of rupture data; however, this does not take into account the problem of delayed failure. Delayed failure, due to stress corrosion can significantly shorten the lifetime of a glass article. Knowledge of the factors governing the rate of subcritical flaw growth in a given environment enables the development of relations between lifetime, applied stress and failure probability for the material under study. Dynamic fatigue is one method of obtaining the necessary information to develop these relationships. In this study, the dynamic fatigue method was used to construct time-to-failure diagrams for both 230/270 ground and optically polished samples. The grinding and polishing process reduces the surface flaw size and subsurface damage, and relieves residual stress by removing materials with successively smaller grinding media. This resulted in an increase in the strength of the optic during the grinding and polishing sequence. There was also an increase in the lifetime due to grinding and polishing. It was found that using the fatigue parameters determined from the 230/270 grit surface are not significantly different from the optically polished values. Although the lower bound of the polished samples is more conservative, neither time-to-failure curves lie beyond the upper or lower bound of the confidence limits. Therefore, designers preferring conservative limits could use samples without residual stress present (polished samples) to determine the fatigue parameters and inert Weibull parameters from samples with the service condition surface, to determine time-to-failure of the optical element.

Tucker, Dennis S.↗
NASA NTRS1985

The (RH+t) aging correlation. Electrical resistivity of PVB at various temperatures and relative humidities

Electrical products having organic materials functioning as pottants, encapsulants, and insulation coatings are commonly exposed to elevated conditions of temperature and humidity. In order to assess service life potential from this method of accelerated aging, it was empirically observed that service life seems proportional to an aging correlation which is the sum of temperature in degrees Celsius (t), and the relative humidity (RH) expressed in percent. Specifically, the correlation involves a plot of time-to-failure on a log scale versus the variable RH + T plotted on a linear scale. A theoretical foundation is provided for this empirically observed correlation by pointing out that the correlation actually involves a relationship between the electrical resistivity (or conductivity) of the organic material, and the variable RH + t. If time-to-failure is a result of total number of coulombs conducted through the organic material, then the correlation of resistivity versus RH + t is synonymous with the empirical correlation of time-to-failure versus RH + t.

Cuddihy, E. F.↗
NASA NTRS2003

Lifetime Predictions of a Titanium Silicate Glass with Machined Flaws

A dynamic fatigue study was performed on a Titanium Silicate glass to assess its susceptibility to delayed failure and to compare the results with those of a previous study. Fracture mechanics techniques were used to analyze the results for the purpose of making lifetime predictions. The material strength and lifetime was seen to increase due to the removal of residual stress through grinding and polishing. Influence on time-to-failure is addressed for the case with and without residual stress present. Titanium silicate glass otherwise known as ultra-low expansion (ULE)* glass is a candidate for use in applications requiring low thermal expansion characteristics such as telescope mirrors. The Hubble Space Telescope s primary mirror was manufactured from ULE glass. ULE contains 7.5% titanium dioxide which in combination with silica results in a homogenous glass with a linear expansion coefficient near zero. delayed failure . This previous study was based on a 230/270 grit surface. The grinding and polishing process reduces the surface flaw size and subsurface damage, and relieves residual stress by removing the material with successively smaller grinding media. This results in an increase in strength of the optic during the grinding and polishing sequence. Thus, a second study was undertaken using samples with a surface finish typically achieved for mirror elements, to observe the effects of surface finishing on the time-to-failure predictions. An allowable stress can be calculated for this material based upon modulus of rupture data; however, this does not take into account the problem of delayed failure, most likely due to stress corrosion, which can significantly shorten lifetime. Fortunately, a theory based on fracture mechanics has been developed enabling lifetime predictions to be made for brittle materials susceptible to delayed failure. Knowledge of the factors governing the rate of subcritical flaw growth in a given environment enables the development of relations between lifetime, applied stress and failure probability for the material under study. Dynamic fatigue is one method of obtaining the necessary information to develop these relationships. In this study, the dynamic fatigue method was used to construct a time-to-failure diagram for polished ULE glass.

Tucker, Dennis S.↗
NASA NTRS1992

Availability analysis of the traveling-wave maser amplifiers in the deep space network. Part 1: The 70-meter antennas

The results of the reliability and availability analyses of the individual S- and X-band traveling-wave maser (TWM) assemblies and their operational configurations in the 70-meter antennas of NASA's Deep Space Network (DSN) are described. For the period 1990 through 1991, the TWM availability parameters for the Telemetry Data System are: mean time between failures (MTBF), 930 hr; mean time to restore services (MTTRS), 1.4 hr; and the average availability, 99.85 percent. In previously published articles, the performance analysis of the TWM assemblies was confined to the determination of the parameters specified above. However, as the mean down time (MDT) for the repair of TWM's increases, the levels of the TWM operational availabilities and MTTRS are adversely affected. A more comprehensive TWM availability analysis is presented to permit evaluation of both MTBF and MDT effects. Performance analysis of the TWM assemblies, based on their station monthly failure reports, indicates that the TWM's required MTBF and MDT levels of 3000 hr and 36 to 48 hr, respectively, have been achieved by the TWM's only at the Canberra Deep Space Station (DSS 43). The Markov Process technique is employed to develop suitable availability measures for the S- and X-band TWM configurations when each is operated in a two-assembly standby mode. The derived stochastic expressions allow for the evaluation of those configurations' simultaneous availability for the Antenna Microwave Subsystem. The application of these expressions to demonstrate the impact of various levels of TWM maintainability (or MDT) on their configurations' operational availabilities is presented for each of the 70-m antenna stations.

Issa, T. N.↗
NASA NTRS2015

Insulation Resistance Degradation in Ni-BaTiO3 Multilayer Ceramic Capacitors

Insulation resistance (IR) degradation in Ni-BaTiO3 multilayer ceramic capacitors has been characterized by the measurement of both time to failure and direct-current (DC) leakage current as a function of stress time under highly accelerated life test conditions. The measured leakage current-time dependence data fit well to an exponential form, and a characteristic growth time SD can be determined. A greater value of tau(sub SD) represents a slower IR degradation process. Oxygen vacancy migration and localization at the grain boundary region results in the reduction of the Schottky barrier height and has been found to be the main reason for IR degradation in Ni-BaTiO3 capacitors. The reduction of barrier height as a function of time follows an exponential relation of phi (𝑡)=phi (0)e(exp -2Κt), where the degradation rate constant 𝐾=𝐾o𝑒(𝐸𝑘/𝑘𝑇) is inversely proportional to the mean time to failure (MTTF) and can be determined using an Arrhenius plot. For oxygen vacancy electromigration, a lower barrier height phi(0) will favor a slow IR degradation process, but a lower phi(0) will also promote electronic carrier conduction across the barrier and decrease the insulation resistance. As a result, a moderate barrier height phi(0) (and therefore a moderate IR value) with a longer MTTF (smaller degradation rate constant 𝐾) will result in a minimized IR degradation process and the most improved reliability in Ni-BaTiO3 multilayer ceramic capacitors.

dielectric degradation↗
NASA NTRS1979

IC Ku-band Impatt Amplifier

High efficiency GaAs low-high-low IMPATTs were investigated. Theoretical analyses were employed to establish a design window for the material parameters to maximize microwave performance. Single mesa devices yielded typically 2 to 3 W with 16 to 23% efficiency in waveguide oscillator test circuits. IMPATTs with high reliability Pt/TiW/Pt/Au metallizations were subjected to temperature stress, non-rf bias-temperature stress, and rf bias-temperature stress. Assuming that temperature is the driving force behind the dominant failure mechanism, a mean-time-to-failure considerably greater than 500,000 hours is indicated by the stress tests. A 15 GHz, 4W, 56 dB gain microstrip amplifier was realized using GaAs FETs and IMPATTs. Power combining using a 3 db Lange coupler is employed in the power output stage having an intrinsic power-added efficiency of 15.7%. Overall dc-to-rf efficiency of the amplifier is 10.8%. The amplifier has greater than a 250 MHz, 1 db bandwidth; operates over the 0 deg to 50 C (base plate) temperature range with less than 0.5 db change in the power output; weighs 444 grams; and has a volume of 220 cu cm.

Sokolov, V.↗
NASA NTRS1993

Comparative analysis of different configurations of PLC-based safety systems from reliability point of view

The study of a comparative analysis of distinct multiplex and fault-tolerant configurations for a PLC-based safety system from a reliability point of view is presented. It considers simplex, duplex and fault-tolerant triple redundancy configurations. The standby unit in case of a duplex configuration has a failure rate which is k times the failure rate of the standby unit, the value of k varying from 0 to 1. For distinct values of MTTR and MTTF of the main unit, MTBF and availability for these configurations are calculated. The effect of duplexing only the PLC module or only the sensors and the actuators module, on the MTBF of the configuration, is also presented. The results are summarized and merits and demerits of various configurations under distinct environments are discussed.

Tapia, Moiez A.↗
NASA NTRS2014

Time-Dependent Behavior of High-Strength Kevlar and Vectran Webbing

High-strength Kevlar and Vectran webbings are currently being used by both NASA and industry as the primary load-bearing structure in inflatable space habitation modules. The time-dependent behavior of high-strength webbing architectures is a vital area of research that is providing critical material data to guide a more robust design process for this class of structures. This paper details the results of a series of time-dependent tests on 1-inch wide webbing including an initial set of comparative tests between specimens that underwent realtime and accelerated creep at 65 and 70% of their ultimate tensile strength. Variability in the ultimate tensile strength of the webbings is investigated and compared with variability in the creep life response. Additional testing studied the effects of load and displacement rate, specimen length and the time-dependent effects of preconditioning the webbings. The creep test facilities, instrumentation and test procedures are also detailed. The accelerated creep tests display consistently longer times to failure than their real-time counterparts; however, several factors were identified that may contribute to the observed disparity. Test setup and instrumentation, grip type, loading scheme, thermal environment and accelerated test postprocessing along with material variability are among these factors. Their effects are discussed and future work is detailed for the exploration and elimination of some of these factors in order to achieve a higher fidelity comparison.

Jones, Thomas C.↗
NASA NTRS1980

Study of intermittent field hardware failure data in digital electronics

The collection and analysis of data concerning intermittent dailures in digital devices was performed using data from a computer design for shipboard usage. The failure data consisted of actual field failures classified by failure mechanisms and their likelihood of having been intermittent, potentially intermittent, or hard. Each class was studies with respect to computer operation in the ranges of 0 to 2,000 hours, 0 to 5, hours, and 0 to 10,000 hours. The study was done at the computer level as well as the microcircuit level. Results indicate that as age increases, the quasi-intermittent failure rate increases and the mean time to failure descreases.

Oneill, E. J.↗
NASA NTRS1983

Cleanroom certification model

The Cleanroom software development methodology is designed to take the gamble out of product releases for both suppliers and receivers of the software. The ingredients of this procedure are a life cycle of executable product increments, representative statistical testing, and a standard estimate of the MTTF (Mean Time To Failure) of the product at the time of its release. A statistical approach to software product testing using randomly selected samples of test cases is considered. A statistical model is defined for the certification process which uses the timing data recorded during test. A reasonableness argument for this model is provided that uses previously published data on software product execution. Also included is a derivation of the certification model estimators and a comparison of the proposed least squares technique with the more commonly used maximum likelihood estimators.

Currit, P. A.↗
NASA NTRS1994

Hidden Markov Models for Fault Detection in Dynamic Systems

Continuous monitoring of complex dynamic systems is an increasingly important issue in diverse areas such as nuclear plant safety, production line reliability, and medical health monitoring systems. Recent advances in both sensor technology and computational capabilities have made on-line permanent monitoring much more feasible than it was in the past. In this paper it is shown that a pattern recognition system combined with a finite-state hidden Markov model provides a particularly useful method for modelling temporal context in continuous monitoring. The parameters of the Markov model are derived from gross failure statistics such as the mean time between failures. The model is validated on a real-world fault diagnosis problem and it is shown that Markov modelling in this context offers significant practical benefits.

Smyth, Padhraic↗
NASA NTRS2008

Scintillation Breakdowns in Chip Tantalum Capacitors

Scintillations in solid tantalum capacitors are momentarily local breakdowns terminated by a self-healing or conversion to a high-resistive state of the manganese oxide cathode. This conversion effectively caps the defective area of the tantalum pentoxide dielectric and prevents short-circuit failures. Typically, this type of breakdown has no immediate catastrophic consequences and is often considered as nuisance rather than a failure. Scintillation breakdowns likely do not affect failures of parts under surge current conditions, and so-called "proofing" of tantalum chip capacitors, which is a controllable exposure of the part after soldering to voltages slightly higher than the operating voltage to verify that possible scintillations are self-healed, has been shown to improve the quality of the parts. However, no in-depth studies of the effect of scintillations on reliability of tantalum capacitors have been performed so far. KEMET is using scintillation breakdown testing as a tool for assessing process improvements and to compare quality of different manufacturing lots. Nevertheless, the relationship between failures and scintillation breakdowns is not clear, and this test is not considered as suitable for lot acceptance testing. In this work, scintillation breakdowns in different military-graded and commercial tantalum capacitors were characterized and related to the rated voltages and to life test failures. A model for assessment of times to failure, based on distributions of breakdown voltages, and accelerating factors of life testing are discussed.

Teverovsky, Alexander↗
NASA NTRS1977

Life analysis of restored and refurbished bearings

An analysis of the potential life of refurbished and restored bearings was performed. The sensitivity of 10-percent life and mean-time-between-failure to the effects of cumulative fatigue damage and the amount of stressed volume removed in the restoration process were examined. A modified Lundberg-Palmgren theory was used to predict that the expected 10-percent life of a restored bearing, which is dependent on the previous service time and the volume of material removed from the race surfaces, can be between 74 and 100 percent of the new bearing life. Using renewal theory, it is found that the mean time between failure ranged from 90 to 100 percent of that for a new bearing.

Coy, J. J.↗
NASA NTRS1982

Modelling of photodegradation in solar cell modules of substrate and superstrate design made with ethylene-vinyl acetate as pottant material

A computer model which simulates, in principle, the chemical changes in the photooxidation of hydrocarbons using as input data a set of elementary reactions, corresponding kinetic rate data and appropriate initial conditions was developed. The Model was refined and exploited to examine more closely the photooxidation and photostabilization of a hydrocarbon polymer. The results lead to the following observations. (1) The time to failure, tau sub f (chosen as the level of 5% C-H bond oxidation which is within the range anticipated for marked change in mechanical properties) varies as the inverse square root of the light intensity. However, tau sub f is almost unaffected by both the photoinitiator type and concentration. (2) The time to failure decreases with the rate of abstraction of C-H by peroxy radicals but increases with the rate of bimolecular radical termination controlled by diffusion. (3) Of the various stabilization mechanisms considered, the trapping of peroxy radicals is distinctly the most effective, although the concommitant decomposition of hydroperoxide is also desirable.

Somersall, A. C.↗