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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 109 records · Page 6
All sourcesNASA NTRSDOE OSTI
NASA NTRS1998

Introduction to the Special Issue on Microwave Circuits on Silicon Substrates

This article discusses the development of microwave circuits on silicon substrate. Silicon, even though inexpensive, did not provide the performance required for microwave circuits. Instead the development of microwave circuits used GaAs and InP substrates. With the development of commercial usages for microwave circuits, the costs of microwave circuits became an issue. The importance of cost, and the development of Si-device capabilities and fabrication techniques, such as molecular beam epitaxy, and ultra-high chemical vapor deposition. provided the circumstances where the development of microwave circuits on silicon is now possible.

Luy, Johann-Friedrich↗
NASA NTRS2002

On Polymorphic Circuits and Their Design Using Evolutionary Algorithms

This paper introduces the concept of polymorphic electronics (polytronics) - referring to electronics with superimposed built-in functionality. A function change does not require switches/reconfiguration as in traditional approaches. Instead the change comes from modifications in the characteristics of devices involved in the circuit, in response to controls such as temperature, power supply voltage (VDD), control signals, light, etc. The paper illustrates polytronic circuits in which the control is done by temperature, morphing signals, and VDD respectively. Polytronic circuits are obtained by evolutionary design/evolvable hardware techniques. These techniques are ideal for the polytronics design, a new area that lacks design guidelines, know-how,- yet the requirements/objectives are easy to specify and test. The circuits are evolved/synthesized in two different modes. The first mode explores an unstructured space, in which transistors can be interconnected freely in any arrangement (in simulations only). The second mode uses a Field Programmable Transistor Array (FPTA) model, and the circuit topology is sought as a mapping onto a programmable architecture (these experiments are performed both in simulations and on FPTA chips). The experiments demonstrated the synthesis. of polytronic circuits by evolution. The capacity of storing/hiding "extra" functions provides for watermark/invisible functionality, thus polytronics may find uses in intelligence/security applications.

Stoica, Adrian↗
NASA NTRS2001

A Step Response Based Mixed-Signal BIST Approach for Continuous-time Linear Circuits

A new Mixed-Signal Built-in self-test approach that is based upon the step response of a reconfigurable (or multifunction) analog block is presented in this paper. The technique requires the overlapping step response of the Circuit Under Test (CUT) for two circuit configurations. Each configuration can be realized by changing the topology of the CUT or by sampling two CUT nodes with differing step responses. The technique can effectively detect both soft and hard faults and does not require an analog-to-digital converter (ADC) and/or digital-to-analog converter(DAC). It also does not require any precision voltage sources or comparators. This approach does not require any additional analog circuits to realize the test signal generator and sample circuits. The paper is concluded with the application of the proposed approach to a circuit found in the work of Epstein et al and two ITC 97 analog benchmark circuits.

Walker, Alvernon↗
NASA NTRS2004

Design of Timer Circuit for Dynamic Data System

The Branch That I work in is in the Aero Electronic Test Branch, which is part of the Research and Testing Division. The Aero Electronic Test Branch deals with electronic control and instrumentation systems. This branch supports the research and test study of wind tunnels such as the l0x10,9x15, and 8x6. Wind tunnels are used in research to test certain parts of a jet, plane, shuttle or any other flying object in certain test conditions. My assignment is to design a programmable trigger circuit on a 19 standard rack mount that will allow the circuit to latch and hold for a predefined amount of time entered by the user when receiving a signal. It should then re-arm itself within 0.25 seconds after the time is finished. The time should be able to be seen on a display showing the time entered. The time range has to be from 0-600 seconds in 0.01 second increments (600.00). From the information given, counters will be needed to design and build this circuit. A counter, in it s simplest form, is a group of flip flops that can temporarily store bits of information put into the circuit. They can be constructed in many different ways, such as in 4 flip flops (4-bit counter) or 8 flip flops and even higher. Counters are usually cascaded with other counters to reach higher bits, such as 16 or 24 bit counters. The application in which I will use the counters will be to count down from any programmable number that I input either by a keyboard or a thumbwheel. Also, I will use counters that will be used specifically as a frequency divider to divide the pulses that enter the circuit through an input signal from a crystal clock. The pulses will need to be divided so that it will function as a 100Hz clock putting out 100 pulses per second. A switch will be used to load my inputs in and more than likely a button also so that I can stop and hold the count at any point of time. I will use 5 BCD up/down programmable counters, and a certain amount (depending on what kind of "divide by N" counter I use) of frequency dividing counters for the assignment. After the design is carefully made, a task order will be written and then given to the manufacturer to create a rack mount circuit board that will match my specifications given. The applications in which this design will be used for is in the use of the six-component balance signal conditioner for measurement and electronic system control. It can be used as a timer system for the balance signal conditioner in which it does numerous tests for the Wind tunnel research, in which a preset time can be set for how long it performs its tests. Specifically, my design should be applied to the balance signal conditioner used for the 8x6 wind tunnel research. Hopefully this design should aid in more efficient research for the 8x6 wind tunnel.

Young, Nathaniel, III↗
NASA NTRS2007

Capabilities and Testing of the Fission Surface Power Primary Test Circuit (FSP-PTC)

An actively pumped alkali metal flow circuit, designed and fabricated at the NASA Marshall Space Flight Center, is currently undergoing testing in the Early Flight Fission Test Facility (EFF-TF). Sodium potassium (NaK), which was used in the SNAP-10A fission reactor, was selected as the primary coolant. Basic circuit components include: simulated reactor core, NaK to gas heat exchanger, electromagnetic (EM) liquid metal pump, liquid metal flowmeter, load/drain reservoir, expansion reservoir, test section, and instrumentation. Operation of the circuit is based around a 37-pin partial-array core (pin and flow path dimensions are the same as those in a full core), designed to operate at 33 kWt. NaK flow rates of greater than 1 kg/sec may be achieved, depending upon the power applied to the EM pump. The heat exchanger provides for the removal of thermal energy from the circuit, simulating the presence of an energy conversion system. The presence of the test section increases the versatility of the circuit. A second liquid metal pump, an energy conversion system, and highly instrumented thermal simulators are all being considered for inclusion within the test section. This paper summarizes the capabilities and ongoing testing of the Fission Surface Power Primary Test Circuit (FSP-PTC).

Garber, Anne E.↗
NASA NTRS2000

Power supply circuit for an ion engine sequentially operated power inverters

A power supply circuit for an ion engine suitable for a spacecraft has a voltage bus having input line and a return line. The power supply circuit includes a pulse width modulation circuit. A plurality of bridge inverter circuits is coupled to the bus and the pulse width modulation circuit. The pulse width modulation circuit generates operating signals having a variable duty cycle. Each bridge inverter has a primary winding and a secondary winding. Each secondary winding is coupled to a rectifier bridge. Each secondary winding is coupled in series with another of the plurality of rectifier bridges.

Cardwell, Jr., Gilbert I.↗
NASA NTRS1993

Circuit and method for producing a flexible reference voltage

A flexible reference voltage circuit includes a circuit for producing a first digital signal representative of a range of reference voltage levels; a circuit for producing a second digital signal representative of a selected reference voltage level within the range of reference voltage levels; an adder for adding the first and second digital signals to produce a third digital signal; and a digital to analog converter for providing an output voltage in response to the third digital signal. The method of producing a flexible reference voltage performed by the circuit is also claimed. The invention can be used with a differential protection circuit to provide a series of trip level ranges, with a series of selectable trip levels in each range. This is accomplished in a high accuracy circuit which is relatively simple to construct, thereby minimizing size and complexity of the current sensor module, in differential protection applications, or the circuitry, if used in a power system controller. Standard digital logic components can be used to perform the necessary range/level decoding.

Thornton, Roger D.↗
NASA NTRS1995

Device for testing continuity and/or short circuits in a cable

A device for testing current paths is attachable to a conductor. The device automatically checks the current paths of the conductor for continuity of a center conductor, continuity of a shield and a short circuit between the shield and the center conductor. The device includes a pair of connectors and a circuit to provide for testing of the conductive paths of the cable. The pair of connectors electrically connects the conductive paths of a cable to be tested with the circuit paths of the circuit. The circuit paths in the circuit include indicators to simultaneously indicate the results of the testing.

Hayhurst, Arthur R.↗
NASA NTRS2008

Improved Short-Circuit Protection for Power Cells in Series

A scheme for protection against short circuits has been devised for series strings of lithium electrochemical cells that contain built-in short-circuit protection devices, which go into a high-resistance, current-limiting state when heated by excessive current. If cells are simply connected in a long series string to obtain a high voltage and a short circuit occurs, whichever short-circuit protection device trips first is exposed to nearly the full string voltage, which, typically, is large enough to damage the device. Depending on the specific cell design, the damage can defeat the protective function, cause a dangerous internal short circuit in the affected cell, and/or cascade to other cells. In the present scheme, reverse diodes rated at a suitably high current are connected across short series sub-strings, the lengths of which are chosen so that when a short-circuit protection device is tripped, the voltage across it does not exceed its rated voltage. This scheme preserves the resetting properties of the protective devices. It provides for bypassing of cells that fail open and limits cell reversal, though not as well as does the more-expensive scheme of connecting a diode across every cell.

Davies, Francis↗
NASA NTRS2008

Astable Oscillator Circuits using Silicon-on-Insulator Timer Chip for Wide Range Temperature Sensing

Two astable oscillator circuits were constructed using a new silicon-on-insulator (SOI) 555 timer chip for potential use as a temperature sensor in harsh environments encompassing jet engine and space mission applications. The two circuits, which differed slightly in configuration, were evaluated between -190 and 200 C. The output of each circuit was made to produce a stream of rectangular pulses whose frequency was proportional to the sensed temperature. The preliminary results indicated that both circuits performed relatively well over the entire test temperature range. In addition, after the circuits were subjected to limited thermal cycling over the temperature range of -190 to 200 C, the performance of either circuit did not experience any significant change.

Patterson, Richard L.↗
NASA NTRS2009

Device, system and method for a sensing electrical circuit

The invention relates to a driven ground electrical circuit. A driven ground is a current-measuring ground termination to an electrical circuit with the current measured as a vector with amplification. The driven ground module may include an electric potential source V.sub.S driving an electric current through an impedance (load Z) to a driven ground. Voltage from the source V.sub.S excites the minus terminal of an operational amplifier inside the driven ground which, in turn, may react by generating an equal and opposite voltage to drive the net potential to approximately zero (effectively ground). A driven ground may also be a means of passing information via the current passing through one grounded circuit to another electronic circuit as input. It may ground one circuit, amplify the information carried in its current and pass this information on as input to the next circuit.

Vranish, John M.↗
NASA NTRS2006

Cryogenic Pound Circuits for Cryogenic Sapphire Oscillators

Two modern cryogenic variants of the Pound circuit have been devised to increase the frequency stability of microwave oscillators that include cryogenic sapphire-filled cavity resonators. The original Pound circuit is a microwave frequency discriminator that provides feedback to stabilize a voltage-controlled microwave oscillator with respect to an associated cavity resonator. In the present cryogenic Pound circuits, the active microwave devices are implemented by use of state-of-the-art commercially available tunnel diodes that exhibit low flicker noise (required for high frequency stability) and function well at low temperatures and at frequencies up to several tens of gigahertz. While tunnel diodes are inherently operable as amplitude detectors and amplitude modulators, they cannot, by themselves, induce significant phase modulation. Therefore, each of the present cryogenic Pound circuits includes passive circuitry that transforms the AM into the required PM. Each circuit also contains an AM detector that is used to sample the microwave signal at the input terminal of the high-Q resonator for the purpose of verifying the desired AM null at this point. Finally, each circuit contains a Pound signal detector that puts out a signal, at the modulation frequency, having an amplitude proportional to the frequency error in the input signal. High frequency stability is obtained by processing this output signal into feedback to a voltage-controlled oscillator to continuously correct the frequency error in the input signal.

Dick, G. John↗
NASA NTRS2011

Characteristics of Radio-Frequency Circuits Utilizing Ferroelectric Capacitors

Ferroelectric capacitors, most commonly used in memory circuits and variable components, were studied in simple analog radio-frequency circuits such as the RLC resonator and Colpitts oscillator. The goal was to characterize the RF circuits in terms of frequency of oscillation, gain, etc, using ferroelectric capacitors. Frequencies of oscillation of both circuits were measured and studied a more accurate resonant frequency can be obtained using the ferroelectric capacitors. Many experiments were conducted and data collected. A model to simulate the experimental results will be developed. Discrepancies in gain and frequency in these RF circuits when conventional capacitors are replaced with ferroelectric ones were studied. These results will enable circuit designers to anticipate the effects of using ferroelectric components in their radio- frequency applications.

Eskridge, Michael↗
NASA NTRS2011

Global Electric Circuit Diurnal Variation Derived from Storm Overflight and Satellite Optical Lightning Datasets

We have combined analyses of over 1000 high altitude aircraft observations of electrified clouds with diurnal lightning statistics from the Lightning Imaging Sensor (LIS) and Optical Transient Detector (OTD) to produce an estimate of the diurnal variation in the global electric circuit. Using basic assumptions about the mean storm currents as a function of flash rate and location, and the global electric circuit, our estimate of the current in the global electric circuit matches the Carnegie curve diurnal variation to within 4% for all but two short periods of time. The agreement with the Carnegie curve was obtained without any tuning or adjustment of the satellite or aircraft data. Mean contributions to the global electric circuit from land and ocean thunderstorms are 1.1 kA (land) and 0.7 kA (ocean). Contributions to the global electric circuit from ESCs are 0.22 kA for ocean storms and 0.04 kA for land storms. Using our analysis, the mean total conduction current for the global electric circuit is 2.0 kA.

Mach, Douglas M.↗
NASA NTRS2003

Zipper Connectors for Flexible Electronic Circuits

Devices that look and function much like conventional zippers on clothing have been proposed as connectors for flexible electronic circuits. Heretofore, flexible electronic circuits have commonly included rigid connectors like those of conventional rigid electronic circuits. The proposed zipper connectors would make it possible to connect and disconnect flexible circuits quickly and easily. Moreover, the flexibility of zipper connectors would make them more (relative to rigid connectors) compatible with flexible circuits, so that the advantages of flexible circuitry could be realized more fully. Like a conventional zipper, a zipper according to the proposal would include teeth anchored on flexible tapes, a slider with a loosely attached clasp, a box at one end of the rows of mating teeth, and stops at the opposite ends. The tapes would be made of a plastic or other dielectric material. On each of the two mating sides of the zipper, metal teeth would alternate with dielectric (plastic) teeth, there being two metal teeth for each plastic one. When the zipper was closed, each metal tooth from one side would be in mechanical and electrical contact with a designated metal tooth from the other side, and these mating metal teeth would be electrically insulated from the next pair of mating metal teeth by an intervening plastic tooth. The metal teeth would be soldered or crimped to copper tabs. Wires or other conductors connected to electronic circuits would be soldered or crimped to the ends of the tabs opposite the teeth.

Barnes, Kevin N.↗
DOE OSTI2024

Quantum Circuit Cutting for Classical Shadows

Classical shadow tomography is a sample-efficient technique for characterizing quantum systems and predicting many of their properties. Circuit cutting is a technique for dividing large quantum circuits into smaller fragments that can be executed more robustly using fewer quantum resources. We introduce a divide-and-conquer circuit cutting method for estimating the expectation values of observables using classical shadows. We derive a general formula for making predictions using the classical shadows of circuit fragments from arbitrarily cut circuits and provide the sample complexity analysis for the case when observables factorize across fragments. Then, we numerically show that our divide-and-conquer method outperforms traditional uncut shadow tomography when estimating high-weight observables that act non-trivially on many qubits and discuss the mechanisms for this advantage.

97 MATHEMATICS AND COMPUTING↗
DOE OSTI2025

A Polynomial-Time Classical Algorithm for Noisy Quantum Circuits

We provide a polynomial-time classical algorithm for noisy quantum circuits. The algorithm computes the expectation value of any observable for any circuit, with a small average error over input states drawn from an ensemble (e.g., the computational basis). Our approach is based upon the intuition that noise exponentially damps nonlocal correlations relative to local correlations. This enables one to classically simulate a noisy quantum circuit by keeping track of only the dynamics of local quantum information. Our algorithm also enables sampling from the output distribution of a circuit in quasipolynomial time, so long as the distribution anticoncentrates. A number of implications are discussed, including a fundamental limit on the efficacy of noise mitigation strategies: For constant noise rates, any quantum circuit for which error mitigation succeeds in polynomial-time on most input states can also be classically simulated in polynomial-time on most input states. Our algorithms scale exponentially in the inverse noise rate, which is fundamental and makes them impractical for current quantum devices.

decoherence↗
NASA NTRS2018

Printed Circuit Board Inspection and Quality Control - PCB Failure Causes and Cures

This two day workshop will discuss a range of topics, including root cause analysis, physics-of-failure principles and failure mechanisms in printed circuit boards. Printed circuit boards (PCBs) are the baseline for electronics manufacturing upon which electronic components are mounted and formed into electronic systems. PCBs are used in a variety of electronic circuits from simple one-transistor amplifiers to large super computers. A PCB serves three main functions: 1) it provides the necessary mechanical support for the components in the circuit 2) it provides the necessary electrical interconnections, and 3) it bears some form of legend which identifies the components it carries. The failure modes on the PCBs can be categorized in a hierarchical structure, in which the mechanisms and causes are site or location dependant. Specimen preparation techniques, non-destructive and destructive analysis, and materials characterization will also be discussed. The first day of the workshop will present methodologies for identifying potential failure mechanisms in electronics based on the failure history and, systematic approaches to root cause analysis. The second day will cover failure analysis techniques geared towards various failure mechanisms, along with numerous component and PCB assembly failure analysis case studies that illustrate the techniques and analysis. Failure analysis case studies will be used to illustrate the techniques and analysis principles to arrive at the root cause(s) of field failures on printed circuit boards, active components, and assemblies.

Printed circuit boards↗