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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 109 records · Page 6

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NASA NTRS1991

Foundation, excavation and radiation shielding concepts for a 16-m large lunar telescope

NASA is considering a 16-m diameter optical telescope on the moon as a part of the Space Exploration Initiative. Fundamental concepts of engineering activities on the moon and how they can be applied to the establishment of a 16-m large lunar telescope (LLT) are discussed. These fundamental concepts include the engineering response of lunar soils and how they affect construction activities, namely, drilling, blasting, ripping, digging and compaction. A mirror support structure and foundation design concept is proposed. The foundation considered is a multiple contact points spud-can type footing. It does not appear that a deep foundation or the presence of bedrock is required to achieve the telescope foundation stiffness. The LLT system will include a regolith covered housing, the size of a small room, which will contain sensitive electronic equipment including charge coupled devices which need protection from cosmic radiation effects. A brief discussion is made on radiation, radiation transport and radiation effects on electronics and on humans. Radiation protection techniques and the different emplacement schemes for the LLT instrument housing for radiation protection are suggested. A structural concept of an early lunar based telescope is also presented.

Chua, Koon M.↗

NASA NTRS1977

Voltages and currents induced by lightning

Indirect effects of lightning, the damage to or malfunction of electrical equipment that results from lightning flashes, were considered. These effects range from tripped circuit breakers to computer upset, to physical damage to input or output circuits of electronic equipment. Voltages and currents induced by lightning on the electrical wiring of the aircraft were emphasized regardless of whether or not such voltages and currents cause damage or upset of electrical equipment.

Franklin A Fisher↗

NASA NTRS1994

Venus cloud bobber mission: A long term survey of the Venusian surface

We have examined the Venus Balloon concept in order to further develop the ideas and concepts behind it, and to creatively apply them to the design of the major Venus Balloon components. This report presents our models of the vertical path taken by the Venus Balloon and the entry into Venusian atmosphere. It also details our designs of the balloon, gondola, heat exchanger, power generator, and entry module. A vehicle is designed for a ballistic entry into the Venusian atmosphere, and an atmospheric model is created. The model is then used to set conditions. The shape and material of the vehicle are optimized, and the dimensions of the vehicle are then determined. Equipment is chosen and detailed that will be needed to collect and transmit information and control the mission. A gondola is designed that will enable this sensitive electronic equipment to survive in an atmosphere of very high temperature and pressure. This shape and the material of the shell are optimized, and the size is minimized. Insulation and supporting structures are designed to protect the payload equipment and to minimize mass. A method of cooling the gondola at upper altitudes was established. Power needs of the gondola equipment are determined. Power generation options are discussed and two separate thermoelectric generation models are outlined.

Wai, James↗

NASA NTRS2004

Joint Lead-Free Solder Test Program for High Reliability Military and Space Applications

Current and future space and defense systems face potential risks from the continued use of tin-lead solder, including: compliance with current environmental regulations, concerns about potential environmental legislation banning lead-containing products, reduced mission readiness, and component obsolescence with lead surface finishes. For example, the United States Environmental Protection Agency (USEPA) has lowered the Toxic Chemical Release reporting threshold for lead to 100 pounds. Overseas, the Waste Electrical and Electronic Equipment (WEEE) and the Restriction on Hazardous Substances (RoHS) Dicctives in Europe and similar mandates in Japan have instilled concern that a legislative body will prohibit the use of lead in aerospace/military electronics soldering. Any potential banning of lead compounds could reduce the supplier base and adversely affect the readiness of missions led by the National Aeronautics and Space Administration (NASA) and the U.S. Department of Defense (DoD). Before considering lead-free electronics for system upgrades or future designs, however, it is important for the DoD and NASA to know whether lead-free solders can meet their systems' requirements. No single lead-free solder is likely to qualify for all defense and space applications. Therefore, it is important to validate alternative solders for discrete applications. As a result of the need for comprehensive test data on the reliability of lead-free solders, a partnership was formed between the DoD, NASA, and several original equipment manufactures (OEMs) to conduct solder-joint reliability (laboratory) testing of three lead-free solder alloys on newly manufactured and reworked circuit cards to generate performance data for high-reliability (IPC Class 3) applications.

Brown, Christina↗

NASA NTRS1966

Sterilizable electronic packaging, connectors, wires, and cabling accessories

Sterilization effects on soldered and welded joints, electronic equipment processes and materials, electric connectors, and wiring and cabling accessories

ELECTRONIC PACKAGING↗

NASA NTRS1977

Breadboard Facility

In the sixties, Chrysler was NASA's prime contractor for the Saturn I and IB test launch vehicles. The company installed and operated at Huntsville what was known as the Saturn I/IB Development Breadboard Facility. "Breadboard," means an array of electrical and electronic equipment for performing a variety of development and test functions. This work gave Chrysler a broad capability in computerized testing to assure quality control in development of solid-state electronic systems. Today that division is manufacturing many products not destined for NASA, most of them being associated with the company's automotive line. A major project is production and quality-control testing of the "lean-burn" engine, one that has a built-in Computer to control emission timing, and allow the engine to run on a leaner mixture of fuel and air. Other environment-related products include vehicle emission analyzers. The newest of the line is an accurate, portable solid state instrument for testing auto exhaust gases. The exhaust analyzers, now being produced for company dealers and for service

Source record↗

NASA NTRS1980

The potential for damage from the accidental release of conductive carbon fibers from aircraft composites

The paper considers the potential for damage from the accidental release of conductive carbon fibers from aircraft composites. The electrical conductivity of carbon and graphite fibers has led to electrical equipment damage from the inadvertent release of virgin fibers into the atmosphere; an accidental release of carbon fibers from filamentary composites from the burning of crashed commercial airliners could damage electrical and electronic equipment. The experimental and analytical results by NASA of the methods of assessing the extent of potential damage in terms of costs is presented; the NASA materials research program to provide alternate or modified composites to overcome electrical hazards of carbon composites in aircraft structures is described.

Bell, V. L.↗

NASA NTRS1991

Designs for surge immunity in critical electronic facilities

In recent years, Federal Aviation Administration (FAA) embarked on a program replacing older tube type electronic equipment with newer solid state equipment. This replacement program dramatically increased the susceptibility of the FAA's facilities to lightning related damages. The proposal is presented of techniques which may be employed to lessen the susceptibility of new FAA electronic facility designs to failures resulting from lightning related surges and transients as well as direct strikes. The general concept espoused is one of a consistent system approach employing both perimeter and internal protection. It compares the technique presently employed to reduce electronic noise with other techniques which reduce noise while lowering susceptibility to lightning related damage. It is anticipated that these techniques will be employed in the design of an Air Traffic Control Tower in a high isokeraunic area. This facility would be subjected to rigorous monitoring over a multi-year period to provide quantitative data hopefully supporting the advantage of this design.

Roberts, Edward F., Jr.↗

NASA NTRS1995

Wet/Dry Vacuum Cleaner

Vacuum cleaner collects and retains dust, wet debris, and liquids. Designed for housekeeping on Space Station Freedom, it functions equally well in normal Earth Gravity or in microgravity. Generates acoustic noise at comfortably low levels and includes circuitry that reduces electromagnetic interference to other electronic equipment. Draws materials into bag made of hydrophobic sheet with layers of hydrophilic super-absorbing pads at downstream end material. Hydrophilic material can gel many times its own weight of liquid. Blower also provides secondary airflow to cool its electronic components.

Reimers, Harold↗

NASA NTRS2012

Pattern Generator for Bench Test of Digital Boards

All efforts to develop electronic equipment reach a stage where they need a board test station for each board. The SMAP digital system consists of three board types that interact with each other using interfaces with critical timing. Each board needs to be tested individually before combining into the integrated digital electronics system. Each board needs critical timing signals from the others to be able to operate. A bench test system was developed to support test of each board. The test system produces all the outputs of the control and timing unit, and is delivered much earlier than the timing unit. Timing signals are treated as data. A large file is generated containing the state of every timing signal at any instant. This file is streamed out to an IO card, which is wired directly to the device-under-test (DUT) input pins. This provides a flexible test environment that can be adapted to any of the boards required to test in a standalone configuration. The problem of generating the critical timing signals is then transferred from a hardware problem to a software problem where it is more easily dealt with.

Berkun, Andrew C.↗

NASA NTRS1984

The ac power line protection for an IEEE 587 Class B environment

The 587B series of protectors are unique, low clamping voltage transient suppressors to protect ac-powered equipment from the 6000V peak open-circuit voltage and 3000A short circuit current as defined in IEEE standard 587 for Category B transients. The devices, which incorporate multiple-stage solid-state protector components, were specifically designed to operate under multiple exposures to maximum threat levels in this severe environment. The output voltage peaks are limited to 350V under maximum threat conditions for a 120V ac power line, thus providing adequate protection to vulnerable electronic equipment. The principle of operation and test performance data is discussed.

Roehr, W. D.↗

NASA NTRS1989

REDEX: The ranging equipment diagnostic expert system

REDEX, an advanced prototype expert system that diagnoses hardware failures in the Ranging Equipment (RE) at NASA's Ground Network tracking stations is described. REDEX will help the RE technician identify faulty circuit cards or modules that must be replaced, and thereby reduce troubleshooting time. It features a highly graphical user interface that uses color block diagrams and layout diagrams to illustrate the location of a fault. A semantic network knowledge representation technique was used to model the design structure of the RE. A catalog of generic troubleshooting rules was compiled to represent heuristics that are applied in diagnosing electronic equipment. Specific troubleshooting rules were identified to represent additional diagnostic knowledge that is unique to the RE. Over 50 generic and 250 specific troubleshooting rules have been derived. REDEX is implemented in Prolog on an IBM PC AT-compatible workstation. Block diagram graphics displays are color-coded to identify signals that have been monitored or inferred to have nominal values, signals that are out of tolerance, and circuit cards and functions that are diagnosed as faulty. A hypertext-like scheme is used to allow the user to easily navigate through the space of diagrams and tables. Over 50 graphic and tabular displays have been implemented. REDEX is currently being evaluated in a stand-alone mode using simulated RE fault scenarios. It will soon be interfaced to the RE and tested in an online environment. When completed and fielded, REDEX will be a concrete example of the application of expert systems technology to the problem of improving performance and reducing the lifecycle costs of operating NASA's communications networks in the 1990's.

Luczak, Edward C.↗

NASA NTRS1989

REDEX - The ranging equipment diagnostic expert system

Luczak, Edward C.↗

NASA NTRS2005

Apparatus Characterizes Transient Voltages in Real Time

The figure shows a prototype of a relatively inexpensive electronic monitoring apparatus that measures and records selected parameters of lightning-induced transient voltages on communication and power cables. The selected parameters, listed below, are those most relevant to the ability of lightning-induced transients to damage electronic equipment. This apparatus bridges a gap between some traditional transient-voltage recorders that record complete waveforms and other traditional transient-voltage recorders that record only peak values: By recording the most relevant parameters and only those parameters this apparatus yields more useful information than does a traditional peak-value (only) recorder while imposing much smaller data-storage and data-transmission burdens than does a traditional complete-waveform recorder. Also, relative to a complete-waveform recorder, this apparatus is more reliable and can be built at lower cost because it contains fewer electronic components. The transients generated by sources other than lightning tend to have frequency components well below 1 MHz. Most commercial transient recorders can detect and record such transients, but cannot respond rapidly enough for recording lightning-induced transient voltage peaks, which can rise from 10 to 90 percent of maximum amplitude in a fraction of a microsecond. Moreover, commercial transient recorders cannot rearm themselves rapidly enough to respond to the multiple transients that occur within milliseconds of each other on some lightning strikes. One transient recorder, designed for Kennedy Space Center earlier [ Fast Transient-Voltage Recorder (KSC- 11991), NASA Tech Briefs, Vol. 23, No. 10, page 6a (October 1999)], is capable of sampling transient voltages at peak values up to 50 V in four channels at a rate of 20 MHz. That recorder contains a trigger circuit that continuously compares the amplitudes of the signals on four channels to a preset triggering threshold. When a trigger signal is received, a volatile memory is filled with data for a total time of 200 ms. After the data are transferred to nonvolatile memory, the recorder rearms itself within 400 ms to enable recording of subsequent transients. Unfortunately, the recorded data must be retrieved through a serial communication link. Depending on the amount of data recorded, the memory can be filled before retrieval is completed. Although large amounts of data are recorded and retrieved, only a small part of the information (the selected parameters) is usually required. The present transient-voltage recorder provides the required information, without incurring the overhead associated with the recording, storage, and retrieval of complete transient-waveform data. In operation, this apparatus processes transient voltage waveforms in real time to extract and record the selected parameters. An analog-to-digital converter that operates at a speed of as much as 100 mega-samples per second is used to sample a transient waveform. A real-time comparator and peak detector are implemented by use of fast field-programmable gate arrays.

Medelius, Pedro↗

NASA NTRS2004

AIN-Based Packaging for SiC High-Temperature Electronics

Packaging made primarily of aluminum nitride has been developed to enclose silicon carbide-based integrated circuits (ICs), including circuits containing SiC-based power diodes, that are capable of operation under conditions more severe than can be withstood by silicon-based integrated circuits. A major objective of this development was to enable packaged SiC electronic circuits to operate continuously at temperatures up to 500 C. AlN-packaged SiC electronic circuits have commercial potential for incorporation into high-power electronic equipment and into sensors that must withstand high temperatures and/or high pressures in diverse applications that include exploration in outer space, well logging, and monitoring of nuclear power systems. This packaging embodies concepts drawn from flip-chip packaging of silicon-based integrated circuits. One or more SiC-based circuit chips are mounted on an aluminum nitride package substrate or sandwiched between two such substrates. Intimate electrical connections between metal conductors on the chip(s) and the metal conductors on external circuits are made by direct bonding to interconnections on the package substrate(s) and/or by use of holes through the package substrate(s). This approach eliminates the need for wire bonds, which have been the most vulnerable links in conventional electronic circuitry in hostile environments. Moreover, the elimination of wire bonds makes it possible to pack chips more densely than was previously possible.

Savrun, Ender↗

NASA NTRS2011

Prognostics of Power Mosfets Under Thermal Stress Accelerated Aging Using Data-Driven and Model-Based Methodologies

An approach for predicting remaining useful life of power MOSFETs (metal oxide field effect transistor) devices has been developed. Power MOSFETs are semiconductor switching devices that are instrumental in electronics equipment such as those used in operation and control of modern aircraft and spacecraft. The MOSFETs examined here were aged under thermal overstress in a controlled experiment and continuous performance degradation data were collected from the accelerated aging experiment. Dieattach degradation was determined to be the primary failure mode. The collected run-to-failure data were analyzed and it was revealed that ON-state resistance increased as die-attach degraded under high thermal stresses. Results from finite element simulation analysis support the observations from the experimental data. Data-driven and model based prognostics algorithms were investigated where ON-state resistance was used as the primary precursor of failure feature. A Gaussian process regression algorithm was explored as an example for a data-driven technique and an extended Kalman filter and a particle filter were used as examples for model-based techniques. Both methods were able to provide valid results. Prognostic performance metrics were employed to evaluate and compare the algorithms.

Electrolytic capacitors↗

DOE OSTI2022

Analysis of historic fires to determine most frequent challenging events

The fire probabilistic risk assessment framework for nuclear power plants relies on experimental data to determine expected fire behavior or to validate models to predict fire conditions in the plant. To support reducing the uncertainty in this experimental data, a research effort was conducted to identify the most frequent and challenging fire scenarios using historic fire data from nuclear power plants in the United States. To support this effort, an electronic version of the publicly available Updated Fire Event Database developed by Electric Power Research Institute was produced resulting in data on 2111 fire events, 540 events were labelled as being challenging fires with 74.2% of these challenging fire events being due to eleven selected fire types. In conclusion, of these fire types, electrical and electronic equipment, transient combustibles, and liquid fires were the most frequent of the challenging fires. The fire scenario specifics were characterized for each of the eleven selected types and then related to existing fire experiments.

21 SPECIFIC NUCLEAR REACTORS AND ASSOCIATED PLANTS↗

DOE OSTI2021

System Validation Platform Working Directories

A suite of software tools used to interface with power electronic equipment for laboratory testing and device certification. They are typically used as equipment drivers with using the System Validation Platform (SVP) graphical user interface (GUI). Sandia National Laboratories is a multimission laboratory managed and operated by National Technology & Engineering Solutions of Sandia, LLC, a wholly owned subsidiary of Honeywell International Inc., for the U.S. Department of Energy’s National Nuclear Security Administration under contract DE-NA0003525. SAND2021-1185 O

Johnson, JayT↗