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Test techniques for evaluation of how well electrical and electronic equipment withstands the indirect effects of lightning were studied. The existing test techniques, and the philosophy behind some of the existing or evolving standards are discussed. Possible avenues of improvement in test techniques are suggested.
In the sixties, Chrysler was NASA's prime contractor for the Saturn I and IB test launch vehicles. The company installed and operated at Huntsville what was known as the Saturn I/IB Development Breadboard Facility. "Breadboard," means an array of electrical and electronic equipment for performing a variety of development and test functions. This work gave Chrysler a broad capability in computerized testing to assure quality control in development of solid-state electronic systems. Today that division is manufacturing many products not destined for NASA, most of them being associated with the company's automotive line. A major project is production and quality-control testing of the "lean-burn" engine, one that has a built-in Computer to control emission timing, and allow the engine to run on a leaner mixture of fuel and air. Other environment-related products include vehicle emission analyzers. The newest of the line is an accurate, portable solid state instrument for testing auto exhaust gases. The exhaust analyzers, now being produced for company dealers and for service
Simple circuits prevent application of incorrectly polarized or excessive voltages. Connected temporarily or permanently at power-connecting terminals. Devised to protect electrical and electronic equipment installed in spacecraft and subjected to variety of tests in different facilities prior to installation. Basic concept of protective circuits also applied easily to many kinds of electrical and electronic equipment that must be protected against incorrect power connections.
Tests made on two pieces of typical aircraft electronics equipment to ascertain their vulnerability to simulated lightning-induced transient voltages representative of those which might occur in flight when the aircraft is struck by lightning were conducted. The test results demonstrated that such equipment can be interfered with or damaged by transient voltages as low as 21 volts peak. Greater voltages can cause failure of semiconductor components within the equipment. The results emphasize a need for establishment of coordinated system susceptibility and component vulnerability criteria to achieve lightning protection of aerospace electrical and electronic systems.
To understand the mechanical properties of amorphous carbon (a-C)/boron nitride nanotube (BNNT) nanostructures, in situ mechanical tests are conducted inside a transmission electron microscope equipped with an integrated atomic force microscope system. The nanotube structure is modified with amorphous carbon deposited by controlled electron beam irradiation. We demonstrate multiple in situ tensile, compressive, and lap shear tests with a-C/BNNT hybrid nanostructures. The tensile strength of the a-C/BNNT hybrid nanostructure is 5.29 GPa with about 90 vol% of a-C. The tensile strength and strain of the end-to-end joint structure with a-C welding is 0.8 GPa and 5.2% whereas the lap shear strength of the side-by-side joint structure with a-C is 0.25 GPa.
Acceptance checkout equipment spacecraft for centralized control and LEM and CSM systems testing
Considerable controversy has arisen during the recent discussions over a new version of the RTCA DO160C/ED 14C Section 22 document at the European Committee for Aviation Electronics. Section 22 is concerned with lightning waveform tests to equipment. Investigations of some of these controversies with circuit analysis and measurements indicate the impedance characteristics required of the transient generators and the possibility of testing to a voltage limit even for current waveforms.
A system of electronic instrumentation, constituting the equivalent of a two-port vector network analyzer, has been developed for use in on-wafer measurement of key electrical characteristics of semiconductor devices at frequencies from 220 to 325 GHz. A prior system designed according to similar principles was reported in Equipment for On-Wafer Testing at Frequencies Up to 220 GHz (NPO-20760), NASA Tech Briefs, Vol. 25, No. 11 (November 2001), page 42. As one would expect, a major source of difficulty in progressing to the present higher-frequency-range system was the need for greater mechanical precision as wavelengths shorten into the millimeter range, approaching the scale of mechanical tolerances of prior systems. The system (see figure) includes both commercial off-the-shelf and custom equipment. As in the system of the cited prior article, the equipment includes test sets that are extended versions of commercial network analyzers that function in a lower frequency range. The extension to the higher frequency range is accomplished by use of custom frequency-extension modules that contain frequency multipliers and harmonic mixers. On-wafer measurement is made possible by waveguide wafer probes that were custom designed and built for this wavelength range, plus an on-wafer calibration substrate designed for use with these probes. In this case, the calibration substrate was specially fabricated by laser milling. The system was used to make the first on-wafer measurements of a semiconductor device in the frequency range from 220 to 320 GHz. Some of the measurement results showed that the device had gain.
The objectives, equipment, and techniques for the plasma diagnostics package (PDP) carried by the OSS-1 instrument payload of the STS-4 and scheduled for the Spacelab-2 mission are described. The goals of the first flight were to examine the Orbiter-magnetoplasma interactions by measuring the electric and magnetic field strengths, the ionized particle wakes, and the generated waves. The RMS was employed to lift the unit out of the bay in order to allow characterization of the fields, EM interference, and plasma contamination within 15 m of the Orbiter. The PDP will also be used to examine plasma depletion, chemical reaction rates, waves, and energized plasma produced by firing of the Orbiter thrusters. Operation of the PDP was carried out in the NASA Space Environment Simulation Laboratory test chamber, where the PDP was used to assay the fields, fluxes, wave amplitudes, and particle energy spectra. The PDP instrumentation is also capable of detecting thermal ions, thermal electrons suprathermal particles, VHF/UHF EMI levels, and the S-band field strength.
Mechanical plan of radio frequency test console
Flow graph analysis method for examining interactions between thermal and electrical parameters of devices and associated microcircuits
The 587B series of protectors are unique, low clamping voltage transient suppressors to protect ac-powered equipment from the 6000V peak open-circuit voltage and 3000A short circuit current as defined in IEEE standard 587 for Category B transients. The devices, which incorporate multiple-stage solid-state protector components, were specifically designed to operate under multiple exposures to maximum threat levels in this severe environment. The output voltage peaks are limited to 350V under maximum threat conditions for a 120V ac power line, thus providing adequate protection to vulnerable electronic equipment. The principle of operation and test performance data is discussed.
Multichannel integrated circuits cascaded to obtain matched characteristics. Gain and phase characteristics of channels of multichannel, multistage, active, low-pass filter matched by making filter of cascaded multichannel integrated-circuit operational amplifiers. Concept takes advantage of inherent equality of electrical characteristics of nominally-identical circuit elements made on same integrated-circuit chip. Characteristics of channels vary identically with changes in temperature. If additional matched channels needed, chips containing more than two operational amplifiers apiece (e.g., commercial quad operational amplifliers) used. Concept applicable to variety of equipment requiring matched gain and phase in multiple channels - radar, test instruments, communication circuits, and equipment for electronic countermeasures.
Automated, computer-controlled assembly of electronic equipment developed for use in simulation testing of downlink portion of Earth/satellite microwave digital communication system. Designed to show effects upon performance of system of rain-induced fading in received signal and increases in transmitted power meant to compensate for rain-induced fading. Design of communication system improved iteratively in response to results of simulations, leading eventually to design ensuring clear, uninterrupted transmission of digital signals.
The Space Program and military use large quantities Hydrazine (Hz) and monomethyl hydrazine (MMI-I) as rocket propellant. These substances are very toxic and are suspected human carcinogens. The American Conference of Governmental Industrial Hygienist set the threshold limit value to be 10 parts per billion (ppb). Current off-the-shelf portable instruments require 10 to 20 minutes of exposure to detect 10 ppb concentration. This shortcofriing is not acceptable for many operations. A new prototype instrument using a gas sensor array and pattern recognition software technology (i.e., an electronic nose) has demonstrated the ability to identify either Hz or MM}{ and quantify their concentrations at 10 parts per billion in 90 seconds. This paper describes the design of the portable electronic nose (e-nose) instrument, test equipment setup, test protocol, pattern recognition algorithm, concentration estimation method, and laboratory test results.
An automatic radiated susceptibility test system (ARSTS) was developed for NASA Lewis Research Center's Electro-magnetic Interference laboratory. According to MSFC-SPEC 521B, any electrical or electronic equipment that will be transported by the spacelab and space shuttle must be tested for susceptibility to electromagnetic interference. This state-of-the-art automatic test system performs necessary calculations; analyzes, processes, and records a great quantity of measured data; and monitors the equipment being tested in real-time and with minimal user intervention. ARSTS reduces costly test time, increases test accuracy, and provides reliable test results.
The uses of test equipment and techniques used in space research and development programs are discussed. Modifications and adaptations to enlarge the scope of usefulness or divert the basic uses to alternate applications are analyzed. The items of equipment which have been of benefit to professional personnel in the enlargement and improvement of quality control capabilities are identified. Items which have been simplified or made more accurate in conducting measurements are described.
Advantages and disadvantages of computer-based simulations reviewed. Report reviews current methods for evaluation of TERP's. Discusses feasibility, benefits, liabilities of substitution of electronically controlled flight-simulation equipment for flight tests.