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At least 109 records · Page 6

Accelerating Photovoltaic Market Entry with Module Replacement

Today's approach to deploying solar photovoltaics (PV) implicitly assumes that module technology is fixed. Solar panels are installed and expected to operate for the system life of 30 years or more. However, many PV technologies are improving rapidly along several dimensions, including cost, power conversion efficiency, and reliability. Periodic module replacement or planned repowering takes advantage of this technological improvement and counteracts predictable degradation. Here, we show that a module replacement strategy allows a competitive levelized cost of electricity to be achieved with an initial module lifetime of less than 15 years, assuming backward compatibility with the original system design. We also assess the life-cycle environmental impacts of module replacement and find that all commercial PV technologies offer benefits in the majority of impact categories, regardless of the replacement strategy, compared to today's electric generation mix. Module replacement can thus accelerate the market introduction and decarbonization impact of emerging PV technologies that have achieved a competitive module efficiency (=20%), cost (=$0.30/W), and lifetime (=10 years) and have the potential to improve further on all three metrics but lack decades-long field deployment experience.

14 SOLAR ENERGY↗

Photovoltaic failure and degradation modes

The extensive photovoltaic field reliability literature was analyzed and reviewed. Future work is prioritized based upon information assembled from recent installations, and inconsistencies in degradation mode identification are discussed to help guide future publication on this subject. Reported failure rates of photovoltaic modules fall mostly in the range of other consumer products; however, the long expected useful life of modules may not allow for direct comparison. In general, degradation percentages are reported to decrease appreciably in newer installations that are deployed after the year 2000. However, these trends may be convoluted with varying manufacturing and installation quality world-wide. Modules in hot and humid climates show considerably higher degradation modes than those in desert and moderate climates, which warrants further investigation. Delamination and diode/j-box issues are also more frequent in hot and humid climates than in other climates. The highest concerns of systems installed in the last 10 years appear to be hot spots followed by internal circuitry discoloration. Encapsulant discoloration was the most common degradation mode, particularly in older systems. In newer systems, encapsulant discoloration appears in hotter climates, but to a lesser degree. Lastly, thin-film degradation modes are dominated by glass breakage and absorber corrosion, although the breadth of information for thin-film modules is much smaller than for x-Si.

14 SOLAR ENERGY↗

Performance and durability of electrically conductive tape for shingled Si heterojunction technology cells

We report electrically conductive tape (ECT) was characterized and used to assemble shingled cell strings at low temperature to achieve high reliability Pb- and Ag-free interconnections. The volume resistivity for two considered ECTs are 0.13 ± 0.06 mΩ·cm and 0.47 ± 0.20 mΩ·cm and specific contact resistances, 6.85± 2.00 mΩ·cm 2 and 6.30 ± 0.37 mΩ·cm 2 using the emerging IEC 62788-8-1 Technical Specification for assessment of electrically conductive adhesives (ECA). Durability and performance of the technology in glass–glass mini modules were evaluated with temperature cycling, damp heat testing, and combined-accelerated stress testing (CAST). Through temperature cycling (-40°C to 85°C) applying five times the mini module short-circuit current in forward bias and in the multi climate CAST protocol, there was negligible degradation of fill factor after replacing connectors at the modules' cable leads; however, CAST resulted in short circuit current loss attributed to degradation in light collection by the cells, not the ECT. The IEC 61215-2 85°C, 85% relative humidity damp heat testing showed susceptibility of the HJT cells to effects of humidity in the electroluminescence intensity around the module perimeter that degraded power performance by 4% (relative). Contrasting the IEC 61215-2 qualification testing-based damp heat testing with CAST, factors such as the optical stress of CAST may precipitate the degradation of the modules whereas the humidity levels and duration of IEC 61215-2 damp heat testing may lead to excessive levels of humidity diffused into the modules, potentially resulting in degradation that is unrepresentative of the field.

14 SOLAR ENERGY↗

Photovoltaic Manufacturing Consortium (PVMC) – Enabling America’s Solar Revolution

The U.S. Photovoltaic Manufacturing Consortium (US-PVMC) is an industry-led consortium which was created with the mission to accelerate the research, development, manufacturing, field testing, commercialization, and deployment of next-generation solar photovoltaic technologies. Formed as part of the U.S. Department of Energy's (DOE) SunShot initiative, and headquartered in New York State, PVMC is managed by the State University of New York Polytechnic Institute (SUNY Poly) at the Colleges of Nanoscale Science and Engineering. PVMC is a hybrid of industry-led consortium and manufacturing development facility, with capabilities for collaborative and proprietary industry engagement. Through its technology development programs, advanced manufacturing development facilities, system demonstrations, and reliability and testing capabilities, PVMC has demonstrated itself to be a recognized proving ground for innovative solar technologies and system designs. PVMC comprises multiple locations, with the core manufacturing and deployment support activities conducted at the Solar Energy Development Center (SEDC), and the core Si wafering and metrology technologies being headed out of the University of Central Florida. The SEDC provides a pilot line for proof-of-concept prototyping, offering critical opportunities to demonstrate emerging concepts in PV manufacturing, such as evaluations of innovative materials, system components, and PV system designs. The facility, located in Halfmoon NY, encompasses 40,000 square feet of dedicated PV development space. The infrastructure and capabilities housed at PVMC includes PV system level testing at the Prototype Demonstration Facility (PDF), manufacturing scale cell & module fabrication at the Manufacturing Development Facility (MDF), cell and module testing, reliability equipment on its PV pilot line, all integrated with a PV performance database and analytical characterizations for PVMC and its partners test and commercial arrays. Additional development and deployment support are also housed at the SEDC, such as cost modeling and cost model based development activities for PV and thin film modules, components, and system level designs for reduced LCOE through lower installation hardware costs, labor reductions, soft costs and reduced operations and maintenance costs. The progression of the consortium activities started with infrastructure and capabilities build out focused on CIGS thin film photovoltaics, with a particular focus on flexible cell and module production. As marketplace changes and partners objectives shifted, the consortium shifted heavily towards deployment and market pull activities including Balance of System, cost modeling, and installation cost reduction efforts along with impacts to performance and DER operational costs. The consortium consisted of a wide array of PV supply chain companies from equipment and component suppliers through national developers and installers with a particular focus on commercial scale deployments (typically 25 to 2MW installations). With DOE funding ending after the fifth budget period, the advantages and disadvantages of such a consortium is detailed along with potential avenues for self-sustainability is reviewed.

14 SOLAR ENERGY↗

Accelerated testing of module-level power electronics for long-term reliability

This work has applied a suite of long-term-reliability accelerated tests to a variety of module-level power electronics (MLPE) devices (such as microinverters and optimizers) from five different manufacturers. This dataset is one of the first (only the paper by Parker et al. entitled “Dominant factors affecting reliability of alternating current photovoltaic modules,” in Proc. 42nd IEEE Photovoltaic Spec. Conf., 2015, is reported for reliability testing in the literature), as well as the largest, experimental sets in public literature, both in the sample size (five manufacturers including both dc/dc and dc/ac units and 20 units for each test) and the number of experiments (six different experimental test conditions) for MLPE devices. The accelerated stress tests (thermal cycling test per IEC 61215 profile, damp heat test per IEC 61215 profile, and static temperature tests at 100 and 125 °C) were performed under powered and unpowered conditions. The first independent long-term experimental data regarding damp heat and grid transient testing, as well as the longest term (>9 month) testing of MLPE units reported in the literature for thermal cycling and high-temperature operating life, are included in these experiments. Additionally, this work is the first to show in situ power measurements, as well as periodic efficiency measurements over a series of experimental tests, demonstrating whether certain tests result in long-term degradation or immediate catastrophic failures. Lastly, the result of this testing highlights the performance of MLPE units under the application of several accelerated environmental stressors.

14 SOLAR ENERGY↗

Reversible Ferroelectric Polarization Modulation of Chiral Molecular Ferroelectrics by Circularly Polarized Light

Abstract The optical modulation of ferroelectric polarization constitutes a transformative, non‐contact strategy for the precise manipulation of ferroelectric properties, heralding advancements in optically stimulated ferroelectric devices. Despite its potential, progress in this domain is constrained by material limitations and the intricate nature of the underlying mechanisms. Recent studies have achieved efficient regulation of ferroelectric polarization and thermal conductivity in chiral ferroelectric thin films through the application of left‐ and right‐handed circularly polarized light (LCP and RCP). Differential absorption of circularly polarized light (CPL) induces nonequilibrium carrier dynamics, generating distinctive interfacial electrostatic fields that enable precise control of ultrathin ferroelectric films. For (R)‐BINOL−DIPASi and (S)‐BINOL−DIPASi (C 26 H 26 O 2 Si), polarization changes surpass 23%, exhibiting opposite response under LCP and RCP excitation. In R chiral films, remnant polarization decreases from 1.05 µC cm − 2 under LCP to 0.85 µC cm − 2 under RCP, whereas in S chiral films, polarization increases from 0.85 µC cm − 2 under LCP to 0.98 µC cm − 2 under RCP. This reversible modulation facilitates reliable switching between ON and OFF states, presenting the potential of chiral ferroelectric materials for flexible, high‐speed integrated photonic sensor technologies.

Chemistry↗

Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules

This paper elucidates the behavior and underlying mechanism of potential-induced degradation (PID) on the rear side of p-type monocrystalline silicon bifacial passivated emitter and rear cell (PERC) photovoltaic modules. At 50 degrees C, 30% relative humidity, and -1000 V bias to the solar cells with aluminium foil on the rear glass surface, the rear-side performance of bifacial PERC modules at standard testing conditions degraded dramatically after 40 hours with a 40.4%, 36.2%, and 7.2% loss in maximum power (Pmpp), short-circuit current (Isc), and open-circuit voltage (Voc), respectively. The front-side standard testing condition performance, on the other hand, showed less degradation; Pmpp, Isc, and Voc dropped by 12.0%, 5.2%, and 5.3%, respectively. However, negligible degradation was observed when the solar cells were positively biased. Based on I-V characteristics, electroluminescence, external quantum efficiency measurements, and the effective minority-carrier lifetime simulation, the efficiency loss is shown to be caused by the surface polarization effect; positive charges are attracted to the passivation/antireflection stack on the rear surface and reduce its field effect passivation performance. Extended PID testing to 100 hours showed an increase in device performances (relative to 40 hours) due to the formation of an inversion layer along the rear surface. In addition, replacing ethylene-vinyl acetate copolymer with polyolefin elastomer films significantly slows down the progression of PID, whereas a glass/transparent backsheet design effectively protects the rear side of bifacial PERC modules from PID. Furthermore, PID on the rear side of bifacial PERC modules is fully recoverable, and light greatly promotes recovery of the observed PID.

14 SOLAR ENERGY↗

Mechanisms of adhesion degradation at the photovoltiac module's cell metallization-encapsulant interface

Adhesion measurements and chemical characterization of the encapsulant/silver metallization interface of a photovoltaic (PV) module through temperature, humidity, and voltage bias exposures were conducted. Results demonstrate two independent degradation mechanisms: (a) with voltage bias, the ionic conduction of Na + ions through the encapsulant results in the formation of sodium silicate at the silver metallization surface, thereby weakening that interface and (b) with moisture ingress, dissociation of the silane bonding to silver in the silver oxide similarly weakens this interface resulting in significantly lower debond energies.

14 SOLAR ENERGY↗

Acceleration Factors for Combined‐Accelerated Stress Testing of Photovoltaic Modules

Combined‐accelerated stress testing (C‐AST) is developed to establish the durability of photovoltaic (PV) products, including for degradation modes that are not a priori known or examined in standardized tests. C‐AST aims to comprehensively represent the sample, stress factors, and their combinations using levels at the statistical tails of the natural environment. Acceleration factors for relevant climate sequences within the C‐AST cycle with respect to the Florida USA climate are estimated for selected degradation mechanisms. It is found that for degradation of the outer backsheet polymer layer, the acceleration factor of the tropical climate sequence (the longest of the climate sequences) is f ( T , G ) = 17.3 with ultraviolet photodegradation; for polyethylene terephthalate hydrolysis (backsheets), f ( T , RH ) = 426; for electrochemical corrosion (PV cell), f ( I ) = 14.1; and for PbSn solder fatigue f (Δ T , r ( T )) = 17.3. Here, T is the module temperature, G is the broadband spectrum irradiance on the plane of array of the module, RH is the relative humidity on the module surface, I is the leakage current through the module packaging, and r ( T ), the number of temperature reversals. The methods discussed herein are generally applicable for evaluating acceleration factors in other accelerated test methods.

14 SOLAR ENERGY↗

Book: Advanced Nano and Micro materials for Photovoltaics: future and emerging technologies, Chapter 11: "Multifunctional Optical Coatings and Light Management for Photovoltaics"

In this chapter, we present a discussion of three main topics in coatings and light management for PV. First, we will cover the basic principles behind light management and broadly discuss approaches that can be used to mitigate reflective losses. Additionally, we build further on this topic by exploring the specific antireflection techniques used by PV glass and module manufacturers. Next, we explore antisoiling coatings, a relatively understudied area until recently. We comment on the distinctly different approaches to antisoiling coatings currently being explored by the PV community and the pros and cons of each. In addition, antisoiling coatings can also serve as antireflective coatings, providing a route to multifunctional coatings. Finally, we comment briefly on possible rich areas for new research efforts that we believe will provide a meaningful impact on solar module efficiency, reliability, and durability.

32 ENERGY CONSERVATION, CONSUMPTION, AND UTILIZATI↗

Encapsulant Adhesion to Surface Metallization on Photovoltaic Cells

Delamination of encapsulant materials from PV cell surfaces often appears to originate at regions with metallization. Using a fracture mechanics based metrology, the adhesion of ethylene vinyl acetate (EVA) encapsulant to screen-printed silver metallization was evaluated. At room temperature, the fracture energy Gc [J/m2] of the EVA/silver interface (952 J/m2) was ~70% lower than that of the EVA/antireflective (AR) coating (>2900 J/m2) and ~60% lower than that of the EVA to the surface of cell (2265 J/m2). After only 300 h of damp heat aging, the adhesion energy of the silver interface dropped to and plateaued at ~50-60 J/m2 while that of the EVA/AR coating and EVA/cell remained mostly unchanged. Elemental surface analysis showed that the EVA separates from the silver in a purely adhesive manner, indicating that bonds at the interface were likely displaced in the presence of humidity and chemical byproducts at elevated temperature, which in part accounts for the propensity of metalized surfaces to delaminate in the field.

14 SOLAR ENERGY↗

Investigation of the Impact of Illumination on the Polarization-Type Potential-Induced Degradation of Crystalline Silicon Photovoltaic Modules

Accelerated potential-induced degradation (PID) testing of photovoltaic modules is conventionally conducted in the dark and at high temperature and humidity levels without considering the influence of illumination. This study investigates the impact of illumination on the polarization-type PID (PID-p) on two different types of encapsulated (glass/backsheet) crystalline silicon solar cells: 1) n-type bifacial passivated emitter rear totally diffused (the front side is facing glass and PID-stressed); and 2) p-type bifacial passivated emitter and rear cell (the rear side is facing glass and PID-stressed). The samples are stressed under the conditions of -1000 V, 40 degrees C, and 40% relative humidity and at different irradiance levels (xenon lamps). While the type-A modules show no reduction in PID-p sensitivity under illumination up to 800 W/m 2 , PID-p in the type-B modules is arrested by the light at an irradiance level as low as 10 W/m 2 . Furthermore, PID-degraded type-B modules (degradation induced in the dark) exhibit a rapid recovery (full recovery in 20 min) upon exposure to light (40 W/m 2 ). External quantum efficiency measurements on the type-B modules show that ultraviolet from 300 to 400 nm is mainly responsible for the fast recovery.

14 SOLAR ENERGY↗

Trial-Run of a Junction-Box Attachment Test for Use in Photovoltaic Module Qualification: Preprint

Engineering robust adhesion of the junction box (j-box) is a hurdle typically encountered by photovoltaic module manufacturers during product development and manufacturing process control. There are historical incidences of adverse effects (e.g., fires) caused when the j-box/adhesive/module system has failed in the field. The addition of a weight to the j-box during the 'damp-heat,' 'thermal-cycle,' or 'creep' tests within the IEC qualification protocol is proposed to verify the basic robustness of the adhesion system. The details of the proposed test are described, in addition to a trial-run of the test procedure. The described experiments examine four moisture-cured silicones, four foam tapes, and a hot-melt adhesive used in conjunction with glass, KPE, THV, and TPE substrates. For the purpose of validating the experiment, j-boxes were adhered to a substrate, loaded with a prescribed weight, and then subjected to aging. The replicate mock-modules were aged in an environmental chamber (at 85 degrees C/85% relative humidity for 1000 hours; then 100 degrees C/<10% relative humidity for 200 hours) or fielded in Golden (CO), Miami (FL), and Phoenix (AZ) for one year. Attachment strength tests, including pluck and shear test geometries, were also performed on smaller component specimens.

14 SOLAR ENERGY↗

Decay of Electrostatic Force of Dust Particles on Photovoltaic Modules

Photovoltaic (PV) energy yield loss due to solar module soiling has become increasingly important as solar module deployment is now at the hundreds of gigawatts scale and continues to grow rapidly. We have reported on direct measurements-using atomic force microscopy (AFM)-of strong electric-field-induced attraction and adhesion force (Fes) of dust particles onto solar panel that are 1 to 2 orders of magnitude stronger than the van der Waals and water capillary forces, corroborated by observing the increase in system voltage-induced soiling rate. Here, we report another characteristic of Fes on soiling-long lasting or slow decay after turning off the high voltage applied to solar panels. The Fes decay time varies in a wide time range of 1 to 10 hours, depending on two factors: 1) either/both the cell or/and particle were charged with high voltage before the voltages were turned off; and 2) how the cell was connected to the ground after the voltage was turned off-either connected through the power supply electronics, directly connected to the ground, or electrically floated. The Fes decay is understood in terms of 1) net electrical charge dissipations in both particle and cell, 2) thermal disordering of dipole polarization in the module glass dielectrics, and 3) charge redistribution by the electrostatic interaction of particle and module glass. This long-lasting Fes for hours can significantly affect the solar panel soiling after sunset, especially combined with water condensation.

14 SOLAR ENERGY↗

Reliability Evaluation of Concentrator Photovoltaic Modules per IEC Qualification Specifications

This project is related to the qualification testing of new generation CPV (concentrator photovoltaics) modules at lower testing costs and lower turnaround time. In this project, the first testing program was completed for two CPV manufacturers, the second testing program was completed for two manufacturers at 65% of the actual testing cost and at less than 3 months of testing turnaround time and the third testing program was completed for two manufacturers at 65% of the actual testing cost and at less than 3 months of testing turnaround time. Due to their financial situation and restructuring, Amonix (one of the CPV manufacturers) intermittently terminated the test programs.

14 SOLAR ENERGY↗