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NASA NTRS2016

The NASA Electronic Parts and Packaging (NEPP) Program: An Overview

This presentation provides an overview of the NEPP Program. The NEPP Mission is to provide guidance to NASA for the selection and application of microelectronics technologies; Improve understanding of the risks related to the use of these technologies in the space environment; Ensure that appropriate research is performed to meet NASA mission assurance needs. NEPP's Goals are to provide customers with appropriate and cost-effective risk knowledge to aid in: Selection and application of microelectronics technologies; Improved understanding of risks related to the use of these technologies in the space environment; Appropriate evaluations to meet NASA mission assurance needs; Guidelines for test and application of parts technologies in space; Assurance infrastructure and support for technologies in use by NASA space systems.

parts assurance↗

NASA NTRS2012

Comparison of Aircraft Models and Integration Schemes for Interval Management in the TRACON

Reusable models of common elements for communication, computation, decision and control in air traffic management are necessary in order to enable simulation, analysis and assurance of emergent properties, such as safety and stability, for a given operational concept. Uncertainties due to faults, such as dropped messages, along with non-linearities and sensor noise are an integral part of these models, and impact emergent system behavior. Flight control algorithms designed using a linearized version of the flight mechanics will exhibit error due to model uncertainty, and may not be stable outside a neighborhood of the given point of linearization. Moreover, the communication mechanism by which the sensed state of an aircraft is fed back to a flight control system (such as an ADS-B message) impacts the overall system behavior; both due to sensor noise as well as dropped messages (vacant samples). Additionally simulation of the flight controller system can exhibit further numerical instability, due to selection of the integration scheme and approximations made in the flight dynamics. We examine the theoretical and numerical stability of a speed controller under the Euler and Runge-Kutta schemes of integration, for the Maintain phase for a Mid-Term (2035-2045) Interval Management (IM) Operational Concept for descent and landing operations. We model uncertainties in communication due to missed ADS-B messages by vacant samples in the integration schemes, and compare the emergent behavior of the system, in terms of stability, via the boundedness of the final system state. Any bound on the errors incurred by these uncertainties will play an essential part in a composable assurance argument required for real-time, flight-deck guidance and control systems,. Thus, we believe that the creation of reusable models, which possess property guarantees, such as safety and stability, is an innovative and essential requirement to assessing the emergent properties of novel airspace concepts of operation.

Neogi, Natasha↗

NASA NTRS2011

Investigation of the Semicoa SCF9550 and the International Rectifier IRHM57260SE for Single-Event Gate Rapture and Single-Event Burnout : NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance

Single-event-effect test results for hi-rel total-dose-hardened power MOSFETs are presented in this report. TheSCF9550 from Semicoa and the IRHM57260SE from International Rectifier were tested to NASA test condition/standards and requirements.The IRHM57260SE performed much better when compared to previous testing. These initial results confirm that parts from the Temecula line are marginally comparable to the El Segundo line. The SCF9550 from Semicoa was also tested and represents the initial parts offering from this vendor. Both parts experienced single-event gate rupture (SEGR) and single-event burnout (SEB). All of the SEGR was from gate to drain.

Single Event Gate Rupture↗

NASA NTRS2015

Inclusion of Radiation Environment Variability in Total Dose Hardness Assurance Methodology

Variability of the space radiation environment is investigated with regard to parts categorization for total dose hardness assurance methods. It is shown that it can have a significant impact. A modified approach is developed that uses current environment models more consistently and replaces the design margin concept with one of failure probability.

radiation hardness assurance↗

NASA NTRS2016

The NASA Electronic Parts and Packaging (NEPP) Program: An Overview

NASA Electronic Parts and Packaging (NEPP) Program↗

NASA NTRS2016

The NASA Electronic Parts and Packaging (NEPP) Program: An Overview

Technology Evaluation↗

NASA NTRS2021

Systems Engineering and Assurance Modeling (SEAM): A Web-Based Solution for Integrated Mission Assurance

We present an overview of the Systems Engineering and Assurance Modeling (SEAM) platform, a web-browser-based tool which is designed to help engineers evaluate the radiation vulnerabilities and develop an assurance approach for electronic parts in space systems. The SEAM framework consists of three interconnected modeling tools, a SysML compatible system description tool, a Goal Structuring Notation (GSN) visual argument tool, and Bayesian Net and Fault Tree extraction and export tools. The SysML and GSN sections also have a coverage check application that ensures that every radiation fault identified on the SysML side is also addressed in the assurance case in GSN. The SEAM platform works on space systems of any degree of radiation hardness but is especially helpful for assessing radiation performance in systems with commercial-off-the-shelf (COTS) electronic components.

SEAM↗

NASA NTRS2018

NASA Electronic Parts and Packaging (NEPP) Program - Resources for SmallSats on EEE Parts

From the outside looking in, the NEPP program supports NASA's traditional approach to providing electrical, electronic, and electromechanical (EEE) assurance for space missions. Standards (military and commercial) for EEE parts are based on risk averse methodologies, drive higher costs and schedules, and, in general, provide devices that significantly lag behind commercial devices in performance aspects (speed, power efficiency, etc...). This is NOT the model most small missions realistically can use. However, when you look behind the curtain, NEPP has been considering the risk trade space for small missions for over five years and has consistently provided resources that the small mission regime would find useful. In this paper, we provide a brief overview of these resources as well as NEPP's current research/development efforts that are relevant. While we'll primarily discuss radiation assurance related issues such as data availability and usage, assurances processes for not only the radiation effects side, but also the EEE parts reliability will be touched upon.

Parts assurance↗

NASA NTRS1968

Training manuals for nondestructive testing using magnetic particles

Training manuals containing the fundamentals of nondestructive testing using magnetic particle as detection media are used by metal parts inspectors and quality assurance specialists. Magnetic particle testing involves magnetization of the test specimen, application of the magnetic particle and interpretation of the patterns formed.

Source record↗

NASA NTRS1969

Handbooks for nondestructive testing using ultrasonics

Four handbooks have been prepared for use in teaching metal parts inspectors and quality assurance technicians the fundamentals of nondestructive testing using ultrasonic detection methods. The handbooks may be used in the shop or laboratory, or as study texts in technical schools and in the home.

Source record↗

NASA NTRS1990

Space Shuttle aft propulsion system enhancements

The characteristics of an aft propulsion system for the Space Shuttle Orbiter that would combine the propellant storage and pressurization systems of the Orbital Maneuvering System (OMS) and the Reaction Control System (RCS) are discussed. The paper describes the current OMS and RCS design development, the operation and flight experience, and the status of the aft propulsion system study (which is a part of the NASA Assured Shuttle Availability Program). Diagrams of the OMS, the RCS, and the integrated aft propulsion system are presented.

Hooper, John C., III↗

NASA NTRS1991

Quality and security - They work together

This paper describes the importance of considering computer security as part of software quality assurance practice. The intended audience is primarily those professionals involved in the design, development, and quality assurance of software. Many issues are raised which point to the need ultimately for integration of quality assurance and computer security disciplines. To address some of the issues raised, the NASA Automated Information Security program is presented as a model which may be used for improving interactions between the quality assurance and computer security community of professionals.

Carr, Richard↗

NASA NTRS1991

An instrument for spatial conductivity measurements of high Tc superconducting (HTSC) materials

High T(sub c) Superconducting (HTSC) thin films are suggested for use in a number of aerospace applications such as an IR bolometer and as electromagnetic shielding. As part of its flight assurance role, the Materials Branch of the Goddard Space Flight Center has initiated development of an instrument capable of measuring variations in conductivity for flat samples using an eddy current testing device and an X-Y positioning table. This instrument was used to examine bulk HTSC samples. System changes that would enable characterization of thin film materials are discussed.

Vansant, T.↗

NASA NTRS2000

NASA Electronic Parts and Packaging Program

NEPP program objectives are to: (1) Access the reliability of newly available electronic parts and packaging technologies for usage on NASA projects through validations, assessments, and characterizations, and the development of test methods/tools; (2)Expedite infusion paths for advanced (emerging) electronic parts and packaging technologies by evaluations of readiness for manufacturability and project usage consideration; (3) Provide NASA projects with technology selection, application, and validation guidelines for electronic parts and packaging hardware and processes; nd (4) Retain and disseminate electronic parts and packaging quality assurance, reliability validations, tools, and availability information to the NASA community.

Kayali, Sammy↗

NASA NTRS2008

SiC vs. Si for High Radiation Environments: NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance

Commercial silicon carbide and silicon Schottky barrier power diodes have been subjected to 203 MeV proton irradiation and the effects of the resultant displacement damage on the I-V characteristics have been observed. Changes in forward bias I-V characteristics are reported for fluences up to 4 x 10(exp 14) p/cm2. For devices of both material types, the series resistance is observed to increase as the fluence increases. The changes in series resistance result from changes in the free carrier concentration due to carrier removal by the defects produced. A simple model is presented that allows calculation of the series resistance of the device and then relates the carrier removal rate to the changes in series resistance. Using this model to calculate the carrier removal rate in both materials reveals that the carrier removal rate in silicon is less than that in silicon carbide, indicating that silicon is the more radiation tolerant material.

Schottky barrier power diodes↗

NASA NTRS2008

Technology Infusion of CodeSonar into the Space Network Ground Segment (RII07)

The NASA Software Assurance Research Program (in part) performs studies as to the feasibility of technologies for improving the safety, quality, reliability, cost, and performance of NASA software. This study considers the application of commercial automated source code analysis tools to mission critical ground software that is in the operations and sustainment portion of the product lifecycle.

Benson, Markland↗

NASA NTRS2011

Users Guide on Scaled CMOS Reliability: NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance

Reliability of advanced CMOS technology is a complex problem that is usually addressed from the standpoint of specific failure mechanisms rather than overall reliability of a finished microcircuit. A detailed treatment of CMOS reliability in scaled devices can be found in Ref. 1; it should be consulted for a more thorough discussion. The present document provides a more concise treatment of the scaled CMOS reliability problem, emphasizing differences in the recommended approach for these advanced devices compared to that of less aggressively scaled devices. It includes specific recommendations that can be used by flight projects that use advanced CMOS. The primary emphasis is on conventional memories, microprocessors, and related devices.

Scaled CMOS↗

NASA NTRS2011

Single-Event Effect (SEE) Survey of Advanced Reconfigurable Field Programmable Gate Arrays: NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance

The NEPP Reconfigurable Field-Programmable Gate Array (FPGA) task has been charged to evaluate reconfigurable FPGA technologies for use in space. Under this task, the Xilinx single-event-immune, reconfigurable FPGA (SIRF) XQR5VFX130 device was evaluated for SEE. Additionally, the Altera Stratix-IV and SiliconBlue iCE65 were screened for single-event latchup (SEL).

Xilinx Single-Event Effects (SEE) Test Consortium↗