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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 109 records · Page 6
All sourcesNASA NTRSDOE OSTI
NASA NTRS1991

Apparatus Circulates Sterilizing Gas

Apparatus circulates sterilizing gas containing ethylene oxide and chlorofluorocarbon through laboratory or medical equipment. Confines sterilizing gas, circulating it only through parts to be treated. Consists of two units. One delivers ethylene oxide/chlorofluorocarbon gas mixture and removes gas after treatment. Other warms, humidifies, and circulates gas through equipment to be treated. Process provides reliable sterilization with negligible residual toxicity from ethylene oxide. Particularly suitable for sterilization of interiors of bioreactors, heart/lung machines, dialyzers, or other equipment including complicated tubing.

Cross, John H.↗
NASA NTRS1989

Effect of grinding on the fatigue life of titanium alloy (5 Al-2.5 Sn) under dry and wet conditions

The principal factors in the performance of aerospace materials are strength-to-weight ratio, fatigue life, fracture toughness, survivability and, of course, reliability. Machining processes and, in particular, grinding under adverse conditions have been found to cause damage to surface integrity and affect the residual stress distribution in the surface and subsurface region. These effects have a direct bearing on the fatigue life. In this investigation the effects of grinding conditions on the fatigue life of Titanium 5 Al-2.5Sn were studied. This alloy is used in ground form in the manufacturing of some critical components in the space shuttle's main engine. It is essential that materials for such applications be properly characterized for use in severe service conditions. Flat sub-size specimens 0.1 inch thick were ground on a surface grinding machine equipped with a variable speed motor at speeds of 2000 to 6000 rpm using SiC wheels of grit sizes 60 and 120. The grinding parameters used in this investigation were chosen from a separate study. The ground specimens were then fatigued at a selected stress and the resulting lives were compared with that of the virgin material. The surfaces of the specimens were examined under a scanning electron microscope, and the roughness and hardness were measured using a standard profilometer and microhardness tester, respectively. The fatigue life of the ground specimens was found to decrease with the increase in speed for both dry and wet conditions. The fatigue life of specimens ground under wet conditions showed a significant increase at the wheel speed of 2000 rpm for both the grit sizes and thereafter decreased with increase profilometry, microhardness measurements and scanning electron microscopic examination.

Rangaswamy, Partha↗
NASA NTRS1991

Delta VLBI data performance in the Galileo spacecraft Earth flyby of December 1990

The performance of the delta very long baseline interferometry (Delta VLBI) data type during the recent Earth flyby of the Galileo spacecraft is presented. First, the data are given significance by showing why the mission design requires an accurate flyby. Then, the data's performance is analyzed, including its operational features, as well as its accuracy. Finally, the effectiveness of these data in improving the accuracy of flyby is shown. Comparisons are made between the expected and actual performances of the data. The processing time, reliability, and accuracy of these data were very good, and a solid gain was made in the encounter accuracy.

Gray, D. L.↗
NASA NTRS2001

Life Prediction Issues in Thermal/Environmental Barrier Coatings in Ceramic Matrix Composites

Issues and design requirements for the environmental barrier coating (EBC)/thermal barrier coating (TBC) life that are general and those specific to the NASA Ultra-Efficient Engine Technology (UEET) development program have been described. The current state and trend of the research, methods in vogue related to the failure analysis, and long-term behavior and life prediction of EBCITBC systems are reported. Also, the perceived failure mechanisms, variables, and related uncertainties governing the EBCITBC system life are summarized. A combined heat transfer and structural analysis approach based on the oxidation kinetics using the Arrhenius theory is proposed to develop a life prediction model for the EBC/TBC systems. Stochastic process-based reliability approach that includes the physical variables such as gas pressure, temperature, velocity, moisture content, crack density, oxygen content, etc., is suggested. Benefits of the reliability-based approach are also discussed in the report.

Shah, Ashwin R.↗
NASA NTRS2004

Virtual Sensors: Using Data Mining to Efficiently Estimate Spectra

Detecting clouds within a satellite image is essential for retrieving surface geophysical parameters, such as albedo and temperature, from optical and thermal imagery because the retrieval methods tend to be valid for clear skies only. Thus, routine satellite data processing requires reliable automated cloud detection algorithms that are applicable to many surface types. Unfortunately, cloud detection over snow and ice is difficult due to the lack of spectral contrast between clouds and snow. Snow and clouds are both highly reflective in the visible wavelen,ats and often show little contrast in the thermal Infrared. However, at 1.6 microns, the spectral signatures of snow and clouds differ enough to allow improved snow/ice/cloud discrimination. The recent Terra and Aqua Moderate Resolution Imaging Spectro-Radiometer (MODIS) sensors have a channel (channel 6) at 1.6 microns. Presently the most comprehensive, long-term information on surface albedo and temperature over snow- and ice-covered surfaces comes from the Advanced Very High Resolution Radiometer ( AVHRR) sensor that has been providing imagery since July 1981. The earlier AVHRR sensors (e.g. AVHRR/2) did not however have a channel designed for discriminating clouds from snow, such as the 1.6 micron channel available on the more recent AVHRR/3 or the MODIS sensors. In the absence of the 1.6 micron channel, the AVHRR Polar Pathfinder (APP) product performs cloud detection using a combination of time-series analysis and multispectral threshold tests based on the satellite's measuring channels to produce a cloud mask. The method has been found to work reasonably well over sea ice, but not so well over the ice sheets. Thus, improving the cloud mask in the APP dataset would be extremely helpful toward increasing the accuracy of the albedo and temperature retrievals, as well as extending the time-series of albedo and temperature retrievals from the more recent sensors to the historical ones. In this work, we use data mining methods to construct a model of MODIS channel 6 as a function of other channels that are common to both MODIS and AVHRR. The idea is to use the model to generate the equivalent of MODIS channel 6 for AVHRR as a function of the AVHRR equivalents to MODIS channels. We call this a Virtual Sensor because it predicts unmeasured spectra. The goal is to use this virtual channel 6. to yield a cloud mask superior to what is currently used in APP . Our results show that several data mining methods such as multilayer perceptrons (MLPs), ensemble methods (e.g., bagging), and kernel methods (e.g., support vector machines) generate channel 6 for unseen MODIS images with high accuracy. Because the true channel 6 is not available for AVHRR images, we qualitatively assess the virtual channel 6 for several AVHRR images.

Srivastava, Ashok↗
NASA NTRS2012

The Development of NASA's Fault Management Handbook

NASA is developing a FM Handbook to establish guidelines and to provide recommendations for defining, developing, analyzing, evaluating, testing, and operating FM systems. It establishes a process for developing FM throughout the lifecycle of a mission and provides a basis for moving the field toward a formal and consistent FM methodology to be applied on future programs. This paper describes the motivation for, the development of, and the future plans for the NASA FM Handbook.

safety improvements↗
NASA NTRSDate not supplied

A Misperception in Reliability Growth Modelling

The Duane reliability growth model is n(t)/t = k t^-alpha (1) The reliability growth rate is alpha, the downward slope of n(t)/t versus t. It usually varies from 0.2 to 0.6. k is a constant. Crow used a 56-failure data set to illustrate reliability growth.1 A graphical Duane model fit to this data gives n(t)/t = 0.640 t^-0.283 (2) A problem in using the Duane-Crow reliability growth model is that it assumes that reliability growth continues and the failure rate decreases throughout the test period. It is more usual that reliability growth stops when the failure rated is low enough. Growth testing is often followed by testing with a low constant failure rate due to rare or uncorrectable failure modes. As more and more low constant rate acceptable failures accumulate after the period of reliability growth, the reliability growth time exponent alpha decreases toward zero. This occurs if constant rate failures are treated as occurring during the reliability growth period. It is more accurate to model a period of initial reliability growth followed by testing without repair to more accurately determine the final constant failure rate. This is done in the abcd model. n(t)/t = a t^-b + c from t = 0 to td (3) = c + d after td, where d = a td^-b (4) The term a t^-b describes the continuous reliability growth that continues out to time td and c is the constant uncorrected failure rate. The parameter d represents an additional constant failure rate due to correctable but uncorrected failure modes. After the reliability growth process is terminated, the failure rate n(t)/t = c + d.

Harry W Jones↗
NASA NTRS1991

Development of high Tc (greater than 110K) Bi, Tl and Y-based materials as superconducting circuit elements

This report is presented in two parts. Part 1 deals primarily with Bi-based materials and a small amount of work on a Y-based composition while Part 2 covers work on Tl-based materials. In Part 1, a reliable and reproducible process for producing bulk bismuth-based superconductors has been developed. It is noted however, that a percentage of the tapecast material experiences curling and fracturing after a 30 hour sintering period and is thus in need of further examination. The Bi-Sr-Ca-Cu-O (BSCCO) material has been characterized by critical temperature data, X-ray diffraction data, and surface morphology. In the case of T sub c, it is not critical to anneal the material. It appears that the BSCCO material has the possibility of producing a better grounding strap than that of the 123 material. Attempts to reproduce near room temperature superconductors in the Y-Ba-Cu-O system were unsuccessful. In Part 2, several methods of processing the high temperature superconductor Tl2Ba2Ca2Cu3O10 were investigated; i.e., different precursor compositions were sintered at various sintering times and temperatures. The highest superconductig temperature was found to be 117.8K when fired at 900 C for three hours. Higher sintering temperatures produced a melted sample which was nonsuperconducting at liquid nitrogen temperature. Also, a preliminary study found Li2O substitutions for copper appeared to increase the transition temperature and create fluxing action upon sintering. It was suggested that lower sintering temperatures might be obtained with lithium additions to produce reliable Tl2Ba2Ca2Cu3O10 processing methods.

Haertling, Gene H.↗
NASA NTRS1983

Structural control research and experiments at NASA/LaRC

Research progress in the area of structural dynamics and control using the flexible beam facility at the NASA Langley Research Center is reviewed. Particular attention is placed on the progress in adaptive control and reliability improvements using advanced control concepts. Both theoretical and experimental results are given to indicate the nature of the work being undertaken. In the adaptive control area, emphasis is placed on parameter and system identification and in comparison of competing on-line algorithms. Also, results are presented for on-line modal control laws that are interfaced to a parameter identification scheme. This provides an on-line distributed adaptive control system. In the reliability area, a design process is outlined that incorporates reliability over the design mission life.

Montgomery, R. C.↗
NASA NTRS1990

A highly reliable, autonomous data communication subsystem for an advanced information processing system

The need to meet the stringent performance and reliability requirements of advanced avionics systems has frequently led to implementations which are tailored to a specific application and are therefore difficult to modify or extend. Furthermore, many integrated flight critical systems are input/output intensive. By using a design methodology which customizes the input/output mechanism for each new application, the cost of implementing new systems becomes prohibitively expensive. One solution to this dilemma is to design computer systems and input/output subsystems which are general purpose, but which can be easily configured to support the needs of a specific application. The Advanced Information Processing System (AIPS), currently under development has these characteristics. The design and implementation of the prototype I/O communication system for AIPS is described. AIPS addresses reliability issues related to data communications by the use of reconfigurable I/O networks. When a fault or damage event occurs, communication is restored to functioning parts of the network and the failed or damage components are isolated. Performance issues are addressed by using a parallelized computer architecture which decouples Input/Output (I/O) redundancy management and I/O processing from the computational stream of an application. The autonomous nature of the system derives from the highly automated and independent manner in which I/O transactions are conducted for the application as well as from the fact that the hardware redundancy management is entirely transparent to the application.

Nagle, Gail↗
NASA NTRS2016

Dye Penetrant Crack Detectability in External Corners in Presence of Fillet Radius

NASA uses special dye penetrant nondestructive evaluation process to provide reliable detection of very small cracks. Typically the surface crack lengths sizes are 0.030' and 0.050' for special dye penetrant process. Qualification requires demonstration of crack detection on a set of cracks with average crack size smaller than or equal to the qualification crack size. The demonstration is called point estimate demonstration. A set of corner cracks can be used to determine reliably detectable corner crack using the point estimate demonstration method. However, dye penetrant demonstration on surface cracks can be used to assess reliably detectable corner crack sizes by using similarity in the penetrant process. The paper provides similarity analysis approach for determining the reliably detectable corner crack sizes for given a point estimate demonstrated surface crack size.

Koshti, Ajay M.↗
NASA NTRS1997

Commercialization of Kennedy Space Center Instrumentation Developed to Improve Safety, Reliability, Cost Effectiveness of Space Shuttle Processing, Launch, and Landing

Priorities and achievements of the Kennedy Space Center (KSF) Instrumentation Laboratories in improving operational safety and decreasing processing costs associated with the Shuttle vehicle are addressed. Technologies that have been or are in the process of technology transfer are reviewed, and routes by which commercial concerns can obtain licenses to other KSF Instrumentation Laboratory technologies are discussed.

Helms, William R.↗
NASA NTRS2000

Dimpled ball grid array process development for space flight applications

A 472 dimpled ball grid array (D-BGA) package has not been used in past space flight environments, therefore it was necessary to develop a process that would yield robust and reliable solder joints. The process developing assembly, inspection and rework techniques, were verified by conducting environmental tests. Since the 472 D-BGA packages passed the above environmental tests within the specifications, the process was successfully developed for space flight electronics.

solder joints↗
NASA NTRS1989

Gallium arsenide processing for gate array logic

The development of a reliable and reproducible GaAs process was initiated for applications in gate array logic. Gallium Arsenide is an extremely important material for high speed electronic applications in both digital and analog circuits since its electron mobility is 3 to 5 times that of silicon, this allows for faster switching times for devices fabricated with it. Unfortunately GaAs is an extremely difficult material to process with respect to silicon and since it includes the arsenic component GaAs can be quite dangerous (toxic) especially during some heating steps. The first stage of the research was directed at developing a simple process to produce GaAs MESFETs. The MESFET (MEtal Semiconductor Field Effect Transistor) is the most useful, practical and simple active device which can be fabricated in GaAs. It utilizes an ohmic source and drain contact separated by a Schottky gate. The gate width is typically a few microns. Several process steps were required to produce a good working device including ion implantation, photolithography, thermal annealing, and metal deposition. A process was designed to reduce the total number of steps to a minimum so as to reduce possible errors. The first run produced no good devices. The problem occurred during an aluminum etch step while defining the gate contacts. It was found that the chemical etchant attacked the GaAs causing trenching and subsequent severing of the active gate region from the rest of the device. Thus all devices appeared as open circuits. This problem is being corrected and since it was the last step in the process correction should be successful. The second planned stage involves the circuit assembly of the discrete MESFETs into logic gates for test and analysis. Finally the third stage is to incorporate the designed process with the tested circuit in a layout that would produce the gate array as a GaAs integrated circuit.

Cole, Eric D.↗
NASA NTRS1996

In-situ Frequency Dependent Dielectric Sensing of Cure

With the expanding use of polymeric materials as composite matrices, adhesives, coatings and films, the need to develop low cost, automated fabrication processes to produce consistently high quality parts is critical. Essential to the development of reliable, automated, intelligent processing is the ability to continuously monitor the changing state of the polymeric resin in-situ in the fabrication tool. This final report discusses work done on developing dielectric sensing to monitor polymeric material cure and which provides a fundamental understanding of the underlying science for the use of frequency dependent dielectri sensors to monitor the cure process.

Kranbuehl, David E.↗
NASA NTRS2015

Addressing Unison and Uniqueness of Reliability and Safety for Better Integration

For a long time, both in theory and in practice, safety and reliability have not been clearly differentiated, which leads to confusion, inefficiency, and sometime counter-productive practices in executing each of these two disciplines. It is imperative to address the uniqueness and the unison of these two disciplines to help both disciplines become more effective and to promote a better integration of the two for enhancing safety and reliability in our products as an overall objective. There are two purposes of this paper. First, it will investigate the uniqueness and unison of each discipline and discuss the interrelationship between the two for awareness and clarification. Second, after clearly understanding the unique roles and interrelationship between the two in a product design and development life cycle, we offer suggestions to enhance the disciplines with distinguished and focused roles, to better integrate the two, and to improve unique sets of skills and tools of reliability and safety processes. From the uniqueness aspect, the paper identifies and discusses the respective uniqueness of reliability and safety from their roles, accountability, nature of requirements, technical scopes, detailed technical approaches, and analysis boundaries. It is misleading to equate unreliable to unsafe, since a safety hazard may or may not be related to the component, sub-system, or system functions, which are primarily what reliability addresses. Similarly, failing-to-function may or may not lead to hazard events. Examples will be given in the paper from aerospace, defense, and consumer products to illustrate the uniqueness and differences between reliability and safety. From the unison aspect, the paper discusses what the commonalities between reliability and safety are, and how these two disciplines are linked, integrated, and supplemented with each other to accomplish the customer requirements and product goals. In addition to understanding the uniqueness in reliability and safety, a better understanding of unison and commonalities will further help in understanding the interaction between reliability and safety. This paper discusses the unison and uniqueness of reliability and safety. It presents some suggestions for better integration of the two disciplines in terms of technical approaches, tools, techniques, and skills to enhance the role of reliability and safety in supporting a product design and development life cycle. The paper also discusses eliminating the redundant effort and minimizing the overlap of reliability and safety analyses for an efficient implementation of the two disciplines.

Huang, Zhaofeng↗