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At least 109 records · Page 6

Dynamical diffraction imaging (topography) with X-ray synchrotron radiation

By contrast to electron microscopy, which yields information on the location of features in small regions of materials, X-ray diffraction imaging can portray minute deviations from perfect crystalline order over larger areas. Synchrotron radiation-based X-ray optics technology uses a highly parallel incident beam to eliminate ambiguities in the interpretation of image details; scattering phenomena previously unobserved are now readily detected. Synchrotron diffraction imaging renders high-resolution, real-time, in situ observations of materials under pertinent environmental conditions possible.

Kuriyama, M.↗

Fast-current-heating devices to study in situ phase formation in metallic glasses by using high-energy synchrotron radiation

Details of fast-resistive-heating setups, controlled heating ranging from ~10 1 K s –1 to ~10 3 K s –1 , to study in situ phase transformations (on heating and on cooling) in metallic glasses by high-energy synchrotron x-ray diffraction are discussed here. Both setups were designed and custom built at the Leibniz Institute for Solid State and Materials Research Dresden (IFW Dresden) and have been implemented at the P02.1 Powder Diffraction and Total Scattering Beamline and the P21.1 Swedish Materials Science Beamline at PETRA III storage ring, DESY, Hamburg. The devices are interchangeable at both beamlines. Joule heating is triggered automatically and is timed with the incident beam and detector. The crystallization process can be controlled via a feedback circuit by monitoring the change in the time-dependent resistivity and temperature of glasses. Different ambient atmospheres, such as vacuum and inert gases (He and Ar), can be used to control oxidation and cooling. The main focus of these devices is on understanding the crystallization mechanism and kinetics in metallic glasses, which are brittle and for which fast heating gives defined glass–crystal composites with enhanced plasticity. As an example, phase-transformation sequence(s) in a prototyped Cu–Zr-based metallic glass is described on heating, and a crystalline phase beneficial to the plasticity is identified.

47 OTHER INSTRUMENTATION↗

Quantized synchrotron radiation in strong magnetic fields

Spectra from electrons making synchrotron transitions in high magnetic fields are calculated using the exact quantum transition rates for Landau states up to n = 500, and the results are compared with spectra calculated from the classical formula and the asymptotic quantum formula. The behavior of the transition rates are examined at low and high harmonics as a function of the spin state of the electron. The calculations confirm those of Herold, Ruder, and Wunner (1982) for low Landau states, extending them to higher states and individual spin state transitions. The results also confirm the dominance of ground-state transitions at high field strengths noted by White (1976). Single particle emissivities for electrons with both spin-up and spin-down in the initial state are calculated using these transition rates. Spectra for thermal electron distributions at transrelativistic temperatures and for steady state injection of monoenergetic electrons with isotropic pitch angles are also presented.

Harding, Alice K.↗

Modeling Jupiter's synchrotron radiation

We have constructed a computer model to simulate synchrotron emission from relativistic electrons trapped in Jupiter's magnetic field.

Synchrotron emmission magnetic field↗

Detailed diffraction imaging of x-ray optics crystals with synchrotron radiation

Rocking curve topography at the Advanced Photon Source’s beamline 1-BM measures the x-ray reflection from large (many cm 2 ) flat crystals on a sub-mm scale with microradian angular resolution. The $(01\bar{1}1)$ reflection at 8 keV is uniform across the crystal and close to theory for three thick quartz wafers well-polished with increasingly finer grit. However, the reflection is non-uniform for some ~ 0.1mmthin, bendable crystals that are made flat by optical contact with a flat substrate. Here, these thin crystals are bent to serve in certain x-ray diagnostics of plasmas, and similar non-uniformities could then occur in bent crystals as well. The same detail in x-ray reflection in bent crystals is unachievable with the existing topography setup: one way to get the desired resolution is with a standard microfocusing approach.

47 OTHER INSTRUMENTATION↗

Evaluation of an event-driven 3FI ASIC for spectroscopic X-ray detection with synchrotron radiation

The novel design and evaluation on the NSLS-II beamline of the 3FI application-specific integrated circuit (ASIC) bump-bonded to a simple, planar, 2D segmented silicon sensor are presented. The ASIC was developed for full-field fluorescence spectral X-ray imaging (3FI). It is a small-scale prototype that features a square array of 32 × 32 pixels, and the size of the pixels is 100 µm × 100 µm. The ASIC was implemented in a 65 nm CMOS integrated circuit fabrication process. Each pixel incorporates a charge-sensitive amplifier, a shaping filter, a discriminator, a peak detector and a sample-and-hold circuit, allowing detection of events and storage of signal amplitudes. The system operates in a frameless event-driven readout mode, outputting analog values for threshold-triggered events, allowing high-speed multi-element X-ray fluorescence data acquisition. The 3FI ASIC achieves per-channel spectrometric performance at a power consumption of only 200 µW per pixel, with nearly all dissipation confined to the analog front-end. An energy resolution is measured at the level of 308 eV full width at half-maximum (FWHM) at 8.04 keV (Cu Kα), and 138 eV FWHM at 3.69 keV (Ca Kα). This per-pixel capability makes the prototype suitable for in situ trace element microanalysis in biological and environmental studies. Moreover, the frameless architecture of the detector is designed to address limitations of conventional X-ray fluorescence microscopy, which typically requires mechanical scanning, by enabling continuous high-throughput data acquisition in future full-field implementations.

47 OTHER INSTRUMENTATION↗

X-ray diffraction imaging (topography) of electroopticcrystals by synchrotron radiation

Information of special interest to crystal growers and device physicists now available from monochromatic synchrotron diffraction imaging (topography) is reviewed. Illustrations are taken from a variety of electro-optic crystals. Aspects of the detailed understanding of crystal growth processes obtainable from carefully selected samples are described. Finally, new experimental opportunities now available for exploitation are indicated.

Steiner, Bruce↗

Nonthermal synchrotron radiation and pair annihilation in gamma-ray bursts

A self-consistent Monte Carlo simulation of quantized synchrotron emission, pair production, and pair annihilation in strong (2 x 10 to the 12th G or greater) magnetic fields is presented as a model of the production of annihilation lines in gamma-ray burst sources. The calculation determines the self-consistent photon spectrum and pair distribution functions resulting from a nonthermal injection of electrons into a region of homogeneous, strong magnetic field. The results indicate that the appearance of observable annihilation features in gamma-ray burst spectra requires isotropic or fan-beamed injection of electrons with energies of at least 5 MeV. The lines are narrow because higher energy electrons escape annihilation and do not contribute to Doppler-broadening. Injection beamed along the field did not produce observable annihilation lines in any of the cases studied. As a result, emission at energies much greater than 1 MeV produced through beaming seems to be incompatible with observable annihilation in this model. These results are discussed in relation to observed features in gamma-ray burst spectra.

Preece, Robert↗

Diffraction imaging (topography) with monochromatic synchrotron radiation

Structural information of special interest to crystal growers and device physicists is now available from high resolution monochromatic synchrotron diffraction imaging (topography). In the review, the importance of superior resolution in momentum transfer and in space is described, and illustrations are taken from a variety of crystals: gallium arsenide, cadmium telluride, mercuric iodide, bismuth silicon oxide, and lithium niobate. The identification and understanding of local variations in crystal growth processes are shown. Finally, new experimental opportunities now available for exploitation are indicated.

Steiner, Bruce↗

Reflectance calibrations of AXAF mirror samples at absorption edges using synchrotron radiation

We are developing a system to calibrate reflectances of witness coupons to the AXAF flight mirrors at the National Synchrotron Light Source over the 0.05-12 keV energy range. These witness coupons will be coated in the same process as the AXAF mirror elements. One of the key issues is the accurate determination of mirror efficiencies across the absorption edges of the mirror coating elements. We present a series of reflectance measurements with 2 eV resolution of a nickel-coated flat mirror in the region of the Ni L-II (870 eV) and L-III (853 eV) absorption edges. Scans of reflectance versus grazing angle at fixed energies in this region show distinct interference fringes at grazing angles larger than the critical angle which are extinguished as the photon energy is increased beyond the low point of the L-III edge, indicating total absorption of the evanescent wave within the Ni film. At 51 arc minutes grazing angle, measured reflectance decreases smoothly by 35 percent and then recovers in an 8 eV band at the L-III edge. We have also measured reflectances in the M absorption edge region for gold, platinum, and iridium coated mirrors. We derive optical parameters n and k specific to the film for comparison to the existing data tables.

Graessle, D. E.↗

Feasibility study of the use of synchrotron radiation in the calibration of AXAF - Initial reflectivity results

The 1-percent calibration accuracy goal of the Advanced X-ray Astrophysics Facility is being approached by way of an experiment at the National Synchrotron Light Source that will demonstrate the accuracy achievable in reflectance measurements conducted on coated flat mirrors in the 50 eV-12 keV energy range. The coatings will be of commercially produced Au, Ni, and Ir, deposited either by sputtering or by e-beam deposition. Optical constants will be estimated via the reflectance vs. angle-of-incidence method.

Graessle, D. E.↗

PKS 2155-304 - Relativistically beamed synchrotron radiation from a BL Lacertae object

The previously reported variability by a factor of two in less than a day is confirmed for the newly discovered BL Lac object PKS 2155-304, by means of the HEAO 1 A-2 experiment's medium- and high-energy detectors. An interpretation of the overall spectrum from radio through X-rays in terms of a synchrotron self-Compton model yields a good description of the data if relativistic beaming is allowed for. The presence of jets is inferred without their direct observation through consideration of the spectrum, combined with an estimate of the size of the source.

Urry, C. M.↗

PKS 2155-304 relativistically beamed synchrotron radiation from BL LAC object

The newly discovered BL Lacertae object, PKS 2155-304, was observed with the medium and high intensity energy detectors of the HEAO-1 A2 experiment. The variability by a factor of two in less than a day reported by Snyder, et al (1979) is confirmed. Two spectra, obtained a year apart, while the satellite was in scanning mode, are well fit by simple power laws with energy spectral index alpha sub 1 equals approximately 1.4. A third spectrum, of higher statistical quality, obtained while the satellite was pointed at its source, has has two components. An acceptable fit was obtained using a two power law model, with indices alpha sub 1 equals 2.0 (+1.2, -0.6) and alpha sub 2 equals -1.5 (+1.5, -2.3). An interpretation of the overall spectrum from radio through X-rays in terms of a synchrotron self-Compton model gives a good description of the data if allowance is made for relativistic beaming. Thus, from a consideration of the spectrum, combined with an estimate of the size of the source, the presence of jets is inferred without their observation.

Urry, C. M.↗