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At least 109 records · Page 6
All sourcesNASA NTRSDOE OSTI
NASA NTRS2017

Parametric Failures in COTS Capacitors

Insertion of COTS components into hi-rel systems require extensive environmental testing of the parts that often results in parametric failures. Based on experience with commercial and hi-rel PME and BME ceramic capacitors and polymer and MnO2 cathode tantalum capacitors, this presentation discusses two major reasons for parametric failures. One is due to the marketing pressure that forces manufacturers to squeeze performance of COTS components thus leaving insufficient margin between the rated and actual characteristics. Another, and probably a more serious reason is degradation of characteristics caused by physico-chemical processes in materials under environmental stresses. Reliability assessment requires development of models to predict behavior of the parts during applications based on accelerated testing that might be outside the specified conditions and target applications. Examples of models developed to simulate and predict wear-out failures are presented. Risks associated with overstressing during HALT are discussed.

Teverovsky, Alexander↗
NASA NTRSDate not supplied

Degradation of Aluminum and Tantalum Wet Electrolytic Capacitors during High Temperature Storage

Aluminum electrolytic capacitors (AEC) are available to higher ranges of capacitance and voltage compared to tantalum electrolytic capacitors (TEC). However, evaporation of the electrolyte during operation or storage of conventional AEC that is accelerated with temperature does not allow use of these parts in space electronics. Instead, for systems requiring large value capacitors and high operating voltages, designers must use banks of TECs that increases substantially the size and weight of electronic modules. Development of hermetically sealed AECs might be beneficial for space systems provided the necessary reliability is assured. Increase in leakage current during storage of AEC is well known and is often explained by dissolution of aluminum oxide in electrolyte. However, other possible mechanisms of this effect have not been discussed. Although hermetically sealed TEC have been used in space systems for years, there is a lack of information about the effects of storage on their characteristics that is of great interest as a comparison for aluminum capacitors. This work explores degradation of AC characteristics (capacitance, dissipation factor, and equivalent series resistance) and DC characteristics (leakage and absorption currents) in different types of aluminum and tantalum hermetically sealed capacitors during long-term storage at high temperatures (100 °C, 125 °C, and 150 °C). It is shown that leakage currents are degrading in both types of capacitors, but this degradation is reversible after bias application. Mechanisms of degradation are discussed, and explanations based on the processes common for both types of capacitors are suggested. Problems associated with assessments of hermeticity and evaporation of the electrolyte in hermetically sealed capacitors are analyzed.

Alexander Teverovsky↗
NASA NTRS2011

Failure Modes in Capacitors When Tested Under a Time-Varying Stress

Power-on failure has been the prevalent failure mechanism for solid tantalum capacitors in decoupling applications. A surge step stress test (SSST) has been previously applied to identify the critical stress level of a capacitor batch to give some predictability to the power-on failure mechanism [1]. But SSST can also be viewed as an electrically destructive test under a time-varying stress (voltage). It consists of rapidly charging the capacitor with incremental voltage increases, through a low resistance in series, until the capacitor under test is electrically shorted. When the reliability of capacitors is evaluated, a highly accelerated life test (HALT) is usually adopted since it is a time-efficient method of determining the failure mechanism; however, a destructive test under a time-varying stress such as SSST is even more time efficient. It usually takes days or weeks to complete a HALT test, but it only takes minutes for a time-varying stress test to produce failures. The advantage of incorporating a specific time-varying stress profile into a statistical model is significant in providing an alternative life test method for quickly revealing the failure mechanism in capacitors. In this paper, a time-varying stress that mimics a typical SSST has been incorporated into the Weibull model to characterize the failure mechanism in different types of capacitors. The SSST circuit and transient conditions for correctly surge testing capacitors are discussed. Finally, the SSST was applied for testing Ta capacitors, polymer aluminum capacitors (PA capacitors), and multi-layer ceramic (MLC) capacitors with both precious metal electrodes (PME) and base metal electrodes (BME). The test results are found to be directly associated with the dielectric layer breakdown in Ta and PA capacitors and are independent of the capacitor values, the way the capacitors were built, and the capacitors manufacturers. The test results also show that MLC capacitors exhibit surge breakdown voltages much higher than the rated voltage and that the breakdown field is inversely proportional to the dielectric layer thickness. The SSST data can also be used to comparatively evaluate the voltage robustness of capacitors for decoupling applications.

Liu, David (Donhang)↗
NASA NTRS1994

Electrical Properties Of Capacitors At High Temperatures

Brief report describes results of experiments in which capacitance and dielectric loss of glass, metallized-polytetrafluoroethylene, and solid-tantalum capacitor measured at temperatures from 20 degrees C to 200 degrees C. Conclusions drawn concerning suitability of capacitors for use at high temperatures; such as in nuclear powerplants, aircraft, equipment for extracting geothermal energy, switching power supplies, and automotive integrated engine electronics.

Baumann, E. D.↗
NASA NTRS1995

Hermetically sealed aluminum electrolytic capacitor

Aluminum electrolytic capacitors are presently not allowed on NASA missions because they outgas water and organic vapors, as well as H2. As a consequence, much larger and heavier packages of tantalum capacitors are used. A hermetically sealed aluminum capacitor has been developed under NASA-MSFC SBIR contracts. This capacitor contains a nongassing electrolyte that was developed for this application so internal pressure would remain low. Capacitors rated at 250 to 540 V have been operated under full load for thousands of hours at 85 and 105 C with good electrical performance and low internal pressure. Electrolyte chemistry and seal engineering concepts will be discussed.

Alwitt, Robert S.↗
NASA NTRS1996

Hermetically Sealed Aluminum Electrolytic Capacitor

Aluminum electrolytic capacitors are presently not allowed on NASA missions because they outgas water and organic vapors, as well as H2. As a consequence, for some applications, much larger and heavier packages of tantalum capacitors must be used. A hermetically sealed aluminum capacitor has been developed. This contains a nongassing electrolyte that was developed for this application so internal pressure would remain low. Capacitors rated from 250 V to 540 V have been operated under full load for thousands of hours at 85 and 105 C with good electrical performance and absence of gas generation. Electrolyte chemistry and seal engineering will be discussed, as well as the extension of this design concept to lower voltage ratings.

Alwitt, Robert S.↗
NASA NTRS1972

Long life assurance study for manned spacecraft long life hardware. Volume 2: Long life assurance studies of EEE parts and packaging

Guidelines for the design, development, and fabrication of electronic components and circuits for use in spacecraft construction are presented. The subjects discussed involve quality control procedures and test methodology for the following subjects: (1) monolithic integrated circuits, (2) hybrid integrated circuits, (3) transistors, (4) diodes, (5) tantalum capacitors, (6) electromechanical relays, (7) switches and circuit breakers, and (8) electronic packaging.

Source record↗
NASA NTRS1972

Long life assurance study for manned spacecraft long life hardware. Volume 5: Long life assurance test and study recommendations

A study was conducted to establish the guidelines to be applied to the selection of equipment for manned spacecraft systems. Recommendations for expansion of the original study are submitted. The subjects considered are: (1) designing to severe dynamic requirements; (2) analysis of in-space failures due to life limitations; (3) accelerated testing of semiconductors; (4) fan life verification; (5) testing of solid tantalum capacitors; (6) testing of teflon valve seats; and (7) electromigration model verification.

Source record↗
NASA NTRS2003

Power Electronics Being Developed for Deep Space Cryogenic Applications

Electronic circuits and systems designed for deep space missions need to operate reliably and efficiently in harsh environments that include very low temperatures. Spacecraft that operate in such cold environments carry a large number of heaters so that the ambient temperature for the onboard electronics remains near 20 C. Electronics that can operate at cryogenic temperatures will simplify system design and reduce system size and weight by eliminating the heaters and their associated structures. As a result, system development and launch cost will be reduced. At the NASA Glenn Research Center, an ongoing program is focusing on the development of power electronics geared for deep space low-temperature environments. The research and development efforts include electrical components design, circuit design and construction, and system integration and demonstration at cryogenic temperatures. Investigations are being carried out on circuits and systems that are targeted for use in NASA missions where low temperatures will be encountered: devices such as ceramic and tantalum capacitors, metal film resistors, semiconductor switches, magnetics, and integrated circuits including dc/dc converters, operational amplifiers, voltage references, and motor controllers. Test activities cover a wide range of device and circuit performance under simple as well as complex test conditions, such as multistress and thermal cycling. The effect of low-temperature conditions on the switching characteristics of an advanced silicon-on-insulator field effect transistor is shown. For gate voltages (VGS) below 2.6 V, drain currents at -190 C are lower than drain currents at room temperature (20 C).

Patterson, Richard L.↗
NASA NTRS2018

Cracking Problems and Mechanical Characteristics of PME and BME Ceramic Capacitors

Most failures in MLCCs are caused by cracking that create shorts between opposite electrodes of the parts. A use of manual soldering makes this problem especially serious for space industry. Experience shows that different lots of ceramic capacitors might have different susceptibility to cracking under manual soldering conditions. This simulates a search of techniques that would allow revealing capacitors that are most robust to soldering-induced stresses. Currently, base metal electrode (BME) capacitors are introduced to high-reliability applications as a replacement of precious metal electrode (PME) parts. Understanding the difference in the susceptibility to cracking between PME and BME capacitors would facilitate this process. This presentation gives a review of mechanical characteristics measured in-situ on MLCCs that includes flexural strength, Vickers hardness, indentation fracture toughness, and the board flex testing and compare characteristics of BME and PME capacitors. A history case related to cracking in PME capacitors that caused flight system malfunctions and mechanisms of failure are considered. Possible qualification tests that would allow evaluation of the resistance of MLCCs to manual soldering are suggested and perspectives related to introduction of BME capacitors discussed.

Reliability↗
NASA NTRS2021

Lessons Learned from Screening and Qualification of COTS Capacitors

A traditional approach to screening and qualification of hi-rel COTS capacitors and its limitations are analyzed. Results of testing of four types of COTS capacitors for L2 projects are summarized. The types include DLA drawing tantalum MnO2 capacitors, high-voltage hermetically sealed polymer tantalum capacitors, multianode COTS+ capacitors, and feedthrough BME ceramic capacitors. Lessons learned from this experience might accelerate processes and reduce risks of inclusion of COTS components in space projects.

reliability↗
NASA NTRS1996

High Energy Density Electrolytic Capacitor

A new type of electrolytic capacitor which combines an electrolytic capacitor anode with an electrochemical capacitor cathode was developed. The resulting capacitor has a four time higher energy density than standard electrolytic capacitors, with comparable electric performance. The prototype, a 480 microFarad, 200 V device, has an energy density exceeding 4 J/cc. Now a 680 microFarad 50 V, MIL-style all tantalum device has been constructed and is undergoing qualification testing. Pending a favorable outcome, work will begin on other ratings. The potential for commercially significant development exists in applying this technology to aluminum-based electrolytic capacitors. It is possible to at least double the energy density of aluminum electrolytics, while using existing manufacturing methods, and without adding material expense. Data presented include electrical characteristics and performance measurements of the 200 V and 50 V hybrid capacitors and results from ongoing qualification testing of the MIL-style tantalum capacitors.

Evans, David A.↗
NASA NTRS1976

Improved wet-slug capacitor

Capacitor uses all-tantalum seals and straight, ungelled, 30-percent sulphuric acid electrolyte to reduce leakage from order of milliamperes to low-microampere region. Design offers better reliability in severe environments encountered in military and industrial electronics systems.

Ward, C. M.↗
NASA NTRS1978

A programmable power processor for a 25 kW power module

The paper presents the concept and major design problems of a programmable power processor for the 25 kW electrical power system for the Shuttle Orbiter. The load will be handled by three parallel power stages operated in phase sequence with each power transistor having its own commutating diode and filter inductor. The power stages will be run at a fixed frequency of 10 kHz with the 'on'-time variable up to 100%. The input filter bank in the breadboard programmable power processor is planned to be a series-parallel combination of tantalum cased tantalum wet-slug capacitors.

Kapustka, R. E.↗
NASA NTRS1998

Evaluation of Capacitors at Cryogenic Temperatures for Space Applications

Advanced electronic systems designed for use in planetary exploration missions must operate efficiently and reliably under the extreme cold temperatures of deep space environment. In addition, spacecraft power electronics capable of cold temperature operation will greatly simplify the thermal management system by eliminating the need for heating units and associated equipment and thereby reduce the size and weight of the overall power system. In this study, film, mica, solid tantalum and electric double layer capacitors were evaluated as a function of temperature from room to liquid nitrogen in terms of their dielectric properties. These properties included capacitance stability and dielectric loss in the frequency range of 50 Hz to 100 kHz. DC leakage current measurements were also performed on the capacitors. The results obtained are discussed and conclusions are made concerning the suitability of the capacitors investigated for low temperature applications.

Patterson, Richard L.↗
DOE OSTI2023

Chemical Profiles of the Oxides on Tantalum in State of the Art Superconducting Circuits

Abstract Over the past decades, superconducting qubits have emerged as one of the leading hardware platforms for realizing a quantum processor. Consequently, researchers have made significant effort to understand the loss channels that limit the coherence times of superconducting qubits. A major source of loss has been attributed to two level systems that are present at the material interfaces. It is recently shown that replacing the metal in the capacitor of a transmon with tantalum yields record relaxation and coherence times for superconducting qubits, motivating a detailed study of the tantalum surface. In this work, the chemical profile of the surface of tantalum films grown on c‐plane sapphire using variable energy X‐ray photoelectron spectroscopy (VEXPS) is studied. The different oxidation states of tantalum that are present in the native oxide resulting from exposure to air are identified, and their distribution through the depth of the film is measured. Furthermore, it is shown how the volume and depth distribution of these tantalum oxidation states can be altered by various chemical treatments. Correlating these measurements with detailed measurements of quantum devices may elucidate the underlying microscopic sources of loss.

36 MATERIALS SCIENCE↗
NASA NTRS1981

Breakdown voltage of discrete capacitors under single-pulse conditions

For electrostatic capacitors the breakdown voltage is inherently related to the properties of the dielectric, with the important parameters being the dielectric field strength which is related to the dielectric constant and the dielectric thickness. These are not necessarily related to the capacitance value and the rated voltage, but generally the larger values of capacitance have lower breakdown voltages. Foil and wet slug electrolytics can withstand conduction currents pulses without apparent damage (in either direction for foil types). For solid tantalums, damage occurs whenever the capacitor charges to the forming voltage.

Domingos, H.↗