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Results for “accelerated life testing”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 109 records · Page 6

A 4-W 56-dB gain microstrip amplifier at 15 GHz utilizing GaAs FET's and IMPATT diodes

Performance results and design considerations are presented for an all solid-state Ku-band power amplifier which is feasible for use in PM communication systems for airborne or spacecraft transmitter applications. A six-stage GaAs FET preamplifier and a driver and balanced power amplifier utilizing GaAs IMPATT diodes operating in the injection locked oscillator mode are discussed. For high power and efficiency Schottky-Read IMPATT's with low-high-low doping profiles are employed. For improved reliability the IMPATT's incorporate a TiW barrier metallization to retard degradation of the IMPATT's. Results of accelerated life testing of the IMPATT devices are also presented.

Sokolov, V.↗

Space environmental effects on materials

Research efforts at NASA-Langley to characterize the durability of composite materials which are candidates for use as components on various space hardware systems are reviewed. The material applications include large space structures, antennas, cables, thermal control coatings, solar reflectors, and satellite power systems. Simulation facilities have been built to study radiation effects on polymer matrix composites, and the dimensional stability of the matrix composites and tension stabilized cables. Numerical models are being developed for radiation effects on the mechanical, physical, and optical properties. Additionally, chemical and microstructural analyses are performed to identify damage mechanisms and the limits of effectiveness of accelerating life tests. It is noted that no residual strength reduction has been detected in polymer films after dosages of 5 billion rads of electron radiation.

Tenney, D. R.↗

Polymers in solar energy utilization

A laser photoacoustic technique (LPAT) has been verified for performing accelerated life testing of outdoor photooxidation of polymeric materials used in solar energy applications. Samples of the material under test are placed in a chamber with a sensitive microphone, then exposed to chopped laser radiation. The sample absorbs the light and converts it to heat by a nonradiative deexcitation process, thereby reducing pressure fluctuations within the cell. The acoustic signal detected by the microphone is directly proportional to the amount of light absorbed by the specimen. Tests were performed with samples of ethylene/methylacrylate copolymer (EMA) reprecipitated from hot cyclohexane, compressed, and molded into thin (25-50 microns) films. The films were exposed outdoors and sampled by LPAT weekly. The linearity of the light absorbed with respect to the acoustic signal was verified.Correlations were established between the photoacoustic behavior of the materials aged outdoors and the same kinds of samples cooled and heated in a controlled environment reactor. The reactor tests were validated for predicting outdoor exosures up to 55 days.

Liang, R. H.↗

Long life nickel electrodes for a nickel-hydrogen cell. I Initial performance

In order to develop a long life nickel electrode for a Ni/H2 cell, an investigation was begun to study the effects of sinter structure and active material loading level on the long life performance of nickel electrodes. This paper is a report on the initial performance of these electrodes as a part of an accelerated life test program. Seven different types of nickel plaques were made which included three levels of both their mechanical strength and median pore size. These plaques were impregnated with three levels of active material loading. The resultant electrodes were tested by a 200-cycle stress test which was conducted in flooded electrolyte, and also for initial performance in a Ni/H2 boiler plate cell. An interesting and unexpected observation was that an increased initial utilization of the active material was due more to its complete discharge to the lower average oxidation state than its increased charge acceptance in the charged state.

Lim, H. S.↗

Thermal Control Working Group report

The Thermal Control Working Group limited its evaluation to issues associated with Earth orbiting and planetary spacecraft with power levels up to 50 kW. It was concluded that the space station technology is a necessary precursor but does not meet S/C 2000 needs (life, high heat flux, long term cryogenics, and survivability). Additional basic and applied research are required (fluid/materials compatibility and two phase system modeling). Scaling, the key issue, must define accelerated life test criteria. The two phase systems require 0g to 1 g correlation. Additional ground test beds are required and combined space environment tests of materials.

Haslett, Robert↗

A high voltage power converter for space astronomy applications

A dc-dc low-power, high-voltage converter for use in space is described which furnishes a commandable, low-noise dc output in the range of 0 to -7500 V. The converter is suitable for biasing of detectors commonly employed in space astronomy, microchannel plates, photomultipliers, and gas discharge detectors. The converter's reliability has been demonstrated by accelerated life testing under thermal vacuum. The electrical and mechanical design, packaging, layout and fabrication techniques, and tests employed are described.

Ray, David C.↗

HgZnTe-based detectors for LWIR NASA applications

The initial goal was to grow and characterize HgZnTe and determine if it indeed had the advantageous properties that were predicted. Researchers grew both bulk and liquid phase epitaxial HgZnTe. It was determined that HgZnTe had the following properties: (1) microhardness at least 50 percent greater than HgCdTe of equivalent bandgap; (2) Hg annealing rates of at least 2 to 4 times longer than HgCdTe; and (3) higher Hg vacancy formation energies. This early work did not focus on one specific composition (x-value) of HgZnTe since NASA was interested in HgZnTe's potential for a variety of applications. Since the beginning of 1989, researchers have been concentrating, however, on the liquid phase growth of very long wavelength infrared (VLWIR) HgZnTe (cutoff approx. equals 17 microns at 65K) to address the requirements of the Earth Observing System (EOS). Since there are no device models to predict the advantages in reliability one can gain with increased microhardness, surface stability, etc., one must fabricate HgZnTe detectors and assess their relative bake stability (accelerated life test behavior) compared with HgCdTe devices fabricated in the same manner. Researchers chose to fabricate HIT detectors as a development vehicle for this program because high performance in the VLWIR has been demonstrated with HgCdTe HIT detectors and the HgCdTe HIT process should be applicable to HgZnTe. HIT detectors have a significant advantage for satellite applications since these devices dissipate much less power than conventional photoconductors to achieve the same responsivity.

Patten, Elizabeth A.↗

Billion shot flashlamp for spaceborne lasers

A billion-shot flashlamp developed under a NASA contract for spaceborne laser missions is presented. Lifetime-limiting mechanisms are identified and addressed. Two energy loadings of 15 and 44 Joules were selected for the initial accelerated life testing. A fluorescence-efficiency test station was used for measuring the useful-light output degradation of the lamps. The design characteristics meeting NASA specifications are outlined. Attention is focused on the physical properties of tungsten-matrix cathodes, the chemistry of dispenser cathodes, and anode degradation. It is reported that out of the total 83 lamps tested in the program, 4 lamps reached a billion shots and one lamp is beyond 1.7 billion shots, while at 44 Joules, 4 lamps went beyond 100 million shots and one lamp reached 500 million shots.

Richter, Linda↗

Advances in high temperature components for AMTEC (Alkali Metal Thermal-to-Electric Converter)

The basic performance of Alkali Metal Thermal-to-Electric Converter (AMTEC) cells is well understood, and quantitative modeling of the electrode performance has been carried out. Tests have been carried out to evaluate the high temperature performance of critical AMTEC components. Progress made in understanding the relative performance of AMTEC components, such as electrodes, electrolytes, working fluids, and seals, as device operating temperature is varied is discussed. Most metallic components are especially subject to corrosion in hot liquid alkali metals containing dissolved oxides. Stability issues of AMTEC components may be addressed by life testing, accelerated testing, and modeling based on known kinetic and thermochemical data.

Williams, R. M.↗

Reliability assessment of multiple quantum well avalanche photodiodes

The reliability of doped-barrier AlGaAs/GsAs multi-quantum well avalanche photodiodes fabricated by molecular beam epitaxy is investigated via accelerated life tests. Dark current and breakdown voltage were the parameters monitored. The activation energy of the degradation mechanism and median device lifetime were determined. Device failure probability as a function of time was computed using the lognormal model. Analysis using the electron beam induced current method revealed the degradation to be caused by ionic impurities or contamination in the passivation layer.

Yun, Ilgu↗

An Acoustic Charge Transport Imager for High Definition Television Applications: Reliability Modeling and Parametric Yield Prediction of GaAs Multiple Quantum Well Avalanche Photodiodes

Reliability modeling and parametric yield prediction of GaAs/AlGaAs multiple quantum well (MQW) avalanche photodiodes (APDs), which are of interest as an ultra-low noise image capture mechanism for high definition systems, have been investigated. First, the effect of various doping methods on the reliability of GaAs/AlGaAs multiple quantum well (MQW) avalanche photodiode (APD) structures fabricated by molecular beam epitaxy is investigated. Reliability is examined by accelerated life tests by monitoring dark current and breakdown voltage. Median device lifetime and the activation energy of the degradation mechanism are computed for undoped, doped-barrier, and doped-well APD structures. Lifetimes for each device structure are examined via a statistically designed experiment. Analysis of variance shows that dark-current is affected primarily by device diameter, temperature and stressing time, and breakdown voltage depends on the diameter, stressing time and APD type. It is concluded that the undoped APD has the highest reliability, followed by the doped well and doped barrier devices, respectively. To determine the source of the degradation mechanism for each device structure, failure analysis using the electron-beam induced current method is performed. This analysis reveals some degree of device degradation caused by ionic impurities in the passivation layer, and energy-dispersive spectrometry subsequently verified the presence of ionic sodium as the primary contaminant. However, since all device structures are similarly passivated, sodium contamination alone does not account for the observed variation between the differently doped APDs. This effect is explained by the dopant migration during stressing, which is verified by free carrier concentration measurements using the capacitance-voltage technique.

Hunt, W. D.↗

Development of Countermeasures and Exercise Protocols to Reduce the Effects of Microgravity

I have helped scientists at NASA-JSC in analyzing data from many projects. Some of the major ones are: (1) cardiovascular responses to lower body negative pressure (LBNP) following bed rest, (2) the effects of dietary sodium, (3) in-flight cycle exercise mitigates reduced oxygen consumption at submaximal heart rates following space flight, (4) exercise thermoregulation after 13 days of head down bed rest, and (5) bed rest induced orthostatic intolerance. Many of the projects have now been completed and some of them are in the process of being published and others have been presented at national meetings. These projects have helped me be a true statistician and given me a real-life perspective of how interesting and complicated data can be. As a by-product of of these involvements I have been able to write and publish some methodological research that have applications in NASA and elsewhere. For instance, while I was at JSC, I happened to meet Dr. Al Feiveson and got into a discussion of the Space Shuttle Reliability. This led us to rethink about the way the data on the accelerated life testing of space shuttle pressure vessels had been analyzed. This has resulted in a major statistical paper and the paper has appeared in one of the top journals in the field of Statistics. A review of the paper by the editor of the journal was published in AmStatNews, a copy is attached with this report. I have presented these findings at the national/international statistics conference and at other places. I have also written another paper on reliability and a paper on calibration techniques that have applications in the engineering and the biomedical branches of NASA. Further, I am currently in the process of writing at least two more papers that have direct applications in NASA related studies.

Kulkarni, Pandurang M.↗

Increased Surface Fatigue Lives of Spur Gears by Application of a Coating

Hard coatings have potential for increasing gear surface fatigue lives. Experiments were conducted using gears both with and without a metal-containing, carbonbased coating. The gears were case-carburized AISI 9310 steel spur gears. Some gears were provided with the coating by magnetron sputtering. Lives were evaluated by accelerated life tests. For uncoated gears, all of fifteen tests resulted in fatigue failure before completing 275 million revolutions. For coated gears, eleven of the fourteen tests were suspended with no fatigue failure after 275 million revolutions. The improved life owing to the coating, approximately a six-fold increase, was a statistically significant result.

Krantz, Timothy L.↗

COTS Ceramic Chip Capacitors: An Evaluation of the Parts and Assurance Methodologies

This viewgraph presentation profiles an experiment to evaluate the suitability of commercial off-the-shelf (COTS) ceramic chip capacitors for NASA spaceflight applications. The experiment included: 1) Voltage Conditioning ('Burn-In'); 2) Highly Accelerated Life Test (HALT); 3) Destructive Physical Analysis (DPA); 4) Ultimate Voltage Breakdown Strength. The presentation includes results for each of the capacitors used in the experiment.

Sampson, Michael J.↗

Magnetic Characterization of Micro Shutters for James Web Space Telescope (JWST)

Summary of Research that was part of the grant: NASA NAG5 - 13405: Magnetic Characterization of Micro Shutters for James Web Space Telescope (JWST) Period: May 1 2003-October 31 2005 The above funding resulted in following major achievements related to microshutter system for JWST. 1. The original rectangular pattern of magnetic material was changed into magnetic striped pattern to prevent unnecessary twisting during the actuation. The Original geometry favored magnetic remanence vector being oriented along the longer side of the shutter and thus resulting torque caused out of plane twist. Stripe pattern minimizes the out of plane motion and thus prolongs the life-time of microshutter device. 2. We built a new magnetic system (magnetic rotisserie) allowing an accelerated life test of microshutters at various temperatures. This system identified that shutter are capable to withstand as many as several millions of actuating cycles. Our system also identified fabrication related features, like bowing with temperature, collisions with the frame due to misalignment, delaminating of the light shields due to uncontrolled voltage release and poorly fabricated light shields.

Wasilewski, P.↗

LISA Technology Development and Risk Reduction at NASA

The Laser Interferometer Space Antenna (LISA) is a joint ESA-NASA project to design, build and operate a space-based gravitational wave detector based on a laser interferometer. LISA relies on several technologies that are either new to spaceflight or must perform at levels not previously demonstrated in a spaceflight environment. The ESA-led LISA Pathfinder mission is the main effort to demonstrate LISA technology. NASA also supports complementary ground-based technology development and risk reduction activities. This presentation will report the status of NASA work on micronewton thrusters, the telescope, the optical pointing subsystem and mission formulation. More details on some of these topics will be given in posters. Other talks and posters will describe NASA-supported work on the laser subsystem, the phasemeter, and aspects of the interferometry. Two flight-qualified clusters of four colloid micronewton thrusters, each capable of thrust Levels between 5 and 30 microNewton with a resolution less than 0.l microNewton and a thrust noise less than 0.1 microNewton/vHz (0.001 to 4 Hz), have been integrated onto the LISA Pathfinder spacecraft. The complementary ground-based development focuses on lifetime demonstration. Laboratory verification of failure models and accelerated life tests are just getting started. LISA needs a 40 cm diameter, afocal telescope for beam expansion/reduction that maintains an optical pathlength stability of approximately 1 pm/vHz in an extremely stable thermal environment. A mechanical prototype of a silicon carbide primary-secondary structure has been fabricated for stability testing. Two optical assemblies must point at different distant spacecraft with nanoradian accuracy over approximately 1 degree annual variation in the angle between the distant spacecraft. A candidate piezo-inchworm actuator is being tested in a suitable testbed. In addition to technology development, NASA has carried out several studies in support of the mission formulation. The results of systems engineering work on flight software, avionics and reliability will be summarized.

Stebbins, Robin T.↗

Reliability Evaluation of Base-Metal-Electrode Multilayer Ceramic Capacitors for Potential Space Applications

Base-metal-electrode (BME) ceramic capacitors are being investigated for possible use in high-reliability spacelevel applications. This paper focuses on how BME capacitors construction and microstructure affects their lifetime and reliability. Examination of the construction and microstructure of commercial off-the-shelf (COTS) BME capacitors reveals great variance in dielectric layer thickness, even among BME capacitors with the same rated voltage. Compared to PME (precious-metal-electrode) capacitors, BME capacitors exhibit a denser and more uniform microstructure, with an average grain size between 0.3 and 0.5 m, which is much less than that of most PME capacitors. BME capacitors can be fabricated with more internal electrode layers and thinner dielectric layers than PME capacitors because they have a fine-grained microstructure and do not shrink much during ceramic sintering. This makes it possible for BME capacitors to achieve a very high capacitance volumetric efficiency. The reliability of BME and PME capacitors was investigated using highly accelerated life testing (HALT). Most BME capacitors were found to fail with an early avalanche breakdown, followed by a regular dielectric wearout failure during the HALT test. When most of the early failures, characterized with avalanche breakdown, were removed, BME capacitors exhibited a minimum mean time-to-failure (MTTF) of more than 105 years at room temperature and rated voltage. Dielectric thickness was found to be a critical parameter for the reliability of BME capacitors. The number of stacked grains in a dielectric layer appears to play a significant role in determining BME capacitor reliability. Although dielectric layer thickness varies for a given rated voltage in BME capacitors, the number of stacked grains is relatively consistent, typically around 12 for a number of BME capacitors with a rated voltage of 25V. This may suggest that the number of grains per dielectric layer is more critical than the thickness itself for determining the rated voltage and the life expectancy of the BME capacitor. The leakage current characterization and the failure analysis results suggest that most of these early avalanche failures are due to the extrinsic minor construction defects introduced during fabrication of BME capacitors. The concentration of the extrinsic defects must be reduced if the BME capacitors are considered for high reliability applications. There are two approaches that can reduce or prevent the occurrence of early failure in BME capacitors: (1) to reduce the defect concentration with improved processing control; (2) to prevent the use of BME capacitors under harsh external stress levels so that the extrinsic defects will never be triggered for a failure. In order to do so appropriate dielectric layer thickness must be determined for a given rated voltage.

Liu, David (Donhang)↗

Degradation of Leakage Currents in Solid Tantalum Capacitors Under Steady-State Bias Conditions

Degradation of leakage currents in various types of solid tantalum capacitors under steady-state bias conditions was investigated at temperatures from 105 oC to 170 oC and voltages up to two times the rated voltage. Variations of leakage currents with time under highly accelerated life testing (HALT) and annealing, thermally stimulated depolarization currents, and I-V characteristics were measured to understand the conduction mechanism and the reason for current degradation. During HALT the currents increase gradually up to three orders of magnitude in some cases, and then stabilize with time. This degradation is reversible and annealing can restore the initial levels of leakage currents. The results are attributed to migration of positively charged oxygen vacancies in tantalum pentoxide films that diminish the Schottky barrier at the MnO2/Ta2O5 interface and increase electron injection. A simple model allows for estimation of concentration and mobility of oxygen vacancies based on the level of current degradation.

Teverovsky, Alexander A.↗