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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 109 records · Page 6
All sourcesNASA NTRSDOE OSTI
DOE OSTI2019

ICME Approach to Determining Critical Pore Size of IN718 Produced by Selective Laser Melting

A degree of porosity is expected in additively manufactured (AM) materials. To aid in the qualification of AM materials, the smallest pore size that results in a debit in the fatigue performance is quantified. In the work presented herein, crystal plasticity simulations are used to identify the stress concentration around pores of various sizes, revealing that a single 20-mu m pore or two 10-mu m pores (with centers spaced 15 mu m apart) localize stress at the pore, as opposed to elsewhere in the microstructure. In situ microtomography and far-field high-energy x-ray diffraction microscopy were used to identify crack formation and the evolution of the grain-level micromechanical fields during cyclic loading. Eighteen cracks were observed (15 at pores, 3 at the surface) at highly stressed grains in a sample, although most did not propagate. The dominant crack was seen to originate from the free surface, which is rationalized by fracture mechanics.

36 MATERIALS SCIENCE↗
DOE OSTI2021

AFRL Additive Manufacturing Modeling Series: Challenge 4, In Situ Mechanical Test of an IN625 Sample with Concurrent High-Energy Diffraction Microscopy Characterization

In this work, we describe 3D characterization of an additively manufactured Inconel 625 nickel-base superalloy specimen conducted during a uniaxial tension test using a suite of nondestructive x-ray techniques. High-energy diffraction microscopy in both near- and far-field modalities are employed in situ to track evolution of the material orientation and stress–strain fields at six points during the mechanical test, and these data streams are registered with micro-computed tomography reconstructions which probe the material density. This data volume was matched to a multi-modal serial sectioning characterization of the specimen taken after loading, described in this article’s companion. Twenty-eight grains which were monitored throughout the experiment were selected to form the basis for AFRL AM Modeling Series Challenge 4, Microscale Structure-to-Properties.

36 MATERIALS SCIENCE↗
DOE OSTI2017

Modeling slip system strength evolution in Ti-7Al informed by in-situ grain stress measurements

In this work, far-field high-energy X-ray diffraction microscopy is used to asses the evolution of slip system strengths in hexagonal close-packed (HCP) Ti-7Al during tensile deformation in-situ. The following HCP slip system families are considered: basal $\langle$a$\rangle$, prismatic $\langle$a$\rangle$, pyramidal$\langle$a$\rangle$, and first-order pyramidal $\langle$c + a$\rangle$. A 1 mm length of the specimen's gauge section, marked with fiducials and comprised of an aggregate of over 500 grains, is tracked during continuous deformation. The response of each slip system family is quantified using ‘slip system strength curves’ that are calculated from the average stress tensors of each grain over the applied deformation history. These curves, which plot the average resolved shear stress for each slip system family versus macroscopic strain, represent a mesoscopic characterization of the aggregate response. A short time-scale transient softening is observed in the basal $\langle$a$\rangle$, prismatic $\langle$a$\rangle$, and pyramidal $\langle$a$\rangle$ slip systems, while a long time-scale transient hardening is observed in the pyramidal $\langle$c + a$\rangle$ slip systems. These results are used to develop a slip system strength model as part of an elasto-viscoplastic constitutive model for the single crystal behavior. A suite of finite element simulations is performed on a virtual polycrystal to demonstrate the relative effects of the different parameters in the slip system strength model. The model is shown to accurately capture the macroscopic stress-strain response using parameters that are chosen to capture the mesoscopic slip system responses.

36 MATERIALS SCIENCE↗
DOE OSTI2017

In situ, 3D characterization of the deformation mechanics of a superelastic NiTi shape memory alloy single crystal under multiscale constraint

Microstructural elements in NiTi shape memory alloys (SMAs) – precipitates, phase boundaries, inclusions, grain boundaries – can be viewed as sources of multiscale constraint that influence their deformation response. In this paper, we characterized in situ, and in 3D, the deformation and the evolution of microstructure during a tension test in a superelastic NiTi specimen containing some of these sources of constraint. The method used was far-field high-energy X-ray diffraction microscopy (ff-HEDM), complemented by electron microscopy. We simulated the local stress state in the specimen using a microstructural model informed by the experimental data. Using these combined microstructure, deformation, and stress data, we report three phenomena, and relate them to specific sources of constraint. During initial elastic loading, axial lattice strain in austenite increased monotonically. On partial stress-induced phase transformation to martensite, the stress redistributed to both phases leading to a stress relaxation in austenite. The specimen contained a dense distribution of inclusions, which led to the activation of martensite habit plane variants that produce less than theoretical maximum transformation strain. Large Ni 4 Ti 3 precipitates potentially contributed to the poor transformation response. Under load, proportional gradients in local rotation and elastic stretch developed in the martensite phase, because of the constraint at phase interfaces. Finally, this combined ff-HEDM, electron microscopy, microstructural simulation toolbox provides a versatile method to understand the effect of constraint on inelastic deformation in other alloys with hierarchical microstructure.

36 MATERIALS SCIENCE↗
NASA NTRS2024

Exploring the Role of Type-II Residual Stresses in A Laser Powder Bed Fusion Nickel-Based Superalloy Using Measurement and Modeling

Far-field high-energy X-ray diffraction microscopy (ff-HEDM) and the crystal plasticity finite element method (CPFEM) are used to investigate the role of grain-scale (Type-II) residual stresses on the fatigue life of additively manufactured (AM) Inconel alloy 625 (IN-625). Grain-averaged orientations, centroids, and residual elastic strain tensors from ff-HEDM data are used to instantiate a crystal plasticity model to simulate the effect of residual stresses at the grain scale. Simulation results indicate that the presence of tensile residual strains increase stress localization and heterogeneity within grains, triggering an earlier onset of plasticity. A microscale fatigue indicator parameter (FIP) is computed to model the impact of these residual strains on the cycles to fatigue crack nucleation. The crack nucleation model, based on the computed FIPs, predicts a significant reduction in the number of cycles for fatigue crack nucleation for mid- and high-cycle fatigue due to the residual strain induced localization, while the residual strains have minimal impact on low-cycle fatigue life.

Inconel↗
DOE OSTI2023

Imaging Strain-Localized Single-Photon Emitters in Layered GaSe below the Diffraction Limit

Nanoscale strain control of exciton funneling is an increasingly critical tool for the scalable production of single photon emitters (SPEs) in two-dimensional materials. However, conventional far-field optical microscopies remain constrained in spatial resolution by the diffraction limit and thus can provide only a limited description of nanoscale strain localization of SPEs. Here, we quantify the effects of nanoscale heterogeneous strain on the energy and brightness of GaSe SPEs on nanopillars with correlative cathodoluminescence, photoluminescence, and atomic force microscopy, supported by density functional theory simulations. We report the strain-localized SPEs have a broad range of emission wavelengths from 620 to 900 nm. We reveal substantial strain-controlled SPE wavelength tunability over a ~100 nm spectral range and 2 orders of magnitude enhancement in the SPE brightness at the pillar center due to Type-I exciton funneling. In addition, we show that radiative biexciton cascade processes contribute to observed CL photon superbunching. Also, the GaSe SPEs show excellent stability, where their properties remain unchanged after electron beam exposure. Importantly, we anticipate that this comprehensive study on the nanoscale strain control of two-dimensional SPEs will provide key insights to guide the development of truly deterministic quantum photonics.

2D materials↗
DOE OSTI2013

Millimeter wave scattering and diffraction in 110 GHz air breakdown plasma

We present measurements of the scattering, reflection, absorption, and transmission of a 1.5 MW, 110 GHz quasioptical gyrotron beam by a self-induced air breakdown plasma. The breakdown forms a periodic array of plasma filaments, oriented parallel to the incident electric field polarization that propagates toward the microwave source. For incident intensity of 3 MW/cm{sup 2}, calorimetric measurements show that as much as 45% of the full beam power is absorbed by the plasma, averaged over the pulse, 1% is reflected backward, and the remainder is transmitted and also scattered into a wide angular spread. We observe that approximately 10 times more power is scattered in the direction perpendicular to the filaments than parallel. The far-field angular distribution of transmitted power exhibits a diffraction pattern that changes throughout the 2-{mu}s life of the plasma.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗
NASA NTRS1974

The radiation from slots in truncated dielectric-covered surfaces

A theoretical approach based on the geometrical theory of diffraction is used to study the electromagnetic radiation from a narrow slot in a dielectric-covered perfectly-conducting surface terminated at an edge. The total far-zone field is composed of a geometrical optics field and a diffracted field. The geometrical optics field is the direct radiation from the slot to the field point. The slot also generates surface waves which are incident at the termination of the dielectric cover, where singly-diffracted rays and reflected surface waves are excited. The diffraction and reflection coefficients are obtained from the canonical problem of the diffraction of a surface wave by a right-angle wedge where the dielectric-covered surface is approximated by an impedance surface. This approximation is satisfactory for a very thin cover; however, the radiation from its vertical and faces cannot be neglected in treating the thicker dielectric cover. This is taken into account by using a Kirchhoff-type approximation, which contributes a second term to the diffraction coefficient previously obtained. The contributions from the geometrical optics field, the singly-diffracted rays and all significant multiply-diffracted rays are summed to give the total radiation. Calculated and measured patterns are found to be in good agreement.

Hwang, Y. M.↗
NASA NTRS1991

Analyses of near- and far-field two-lobe patterns outside the output endface of a two-mode fiber

The behaviors of the near- and far-field two-lobe radiation patterns from a circular-core two-mode fiber are studied by using both the mode and Kirchhoff diffraction theories. The electric field outside the output endface of the fiber is derived from the electric field distribution of the LP sub 01 and LP sub 11 modes at the fiber endface using the Kirchhoff diffraction formula. Different phenomena are studied by solving this expression numerically at near-and far-fields. The Gouy phase shifts are quantitatively evaluated at cross-sections of the near field. The results reveal the distortion and dislocation of the far-field two-lobe pattern induced by an inclination angle of the fiber endface.

Wang, A.↗
DOE OSTI2020

Improved control of electron computer-generated holographic grating groove profiles using ion beam gas-assisted etching

In a transmission electron microscope, electrons are described by matter-waves with wavelengths five orders of magnitude smaller than optical electromagnetic waves. Analogous to optical holography, electron wavefronts can be shaped using nanoscale holographic gratings. Here we demonstrate a novel, scalable nanofabrication method for creating off-axis holographic gratings that demonstrate near ideal diffraction efficiencies for binary, sinusoidal, and blazed grating groove profiles. We show that this method can produce up to 50 µm diameter area gratings that diffract up to 68% of the transmitted electron wave into a desired diffraction order with less than 7% into any other order. Additionally, we find that the amount of inelastically scattered electrons from the material gratings remaining in the coherent diffraction orders from the gratings is negligible in the far field.

Johnson, Cameron W.↗
NASA NTRS1974

A curvature-corrected Kirchhoff formulation for radar sea-return from the near vertical

A new theoretical treatment of the problem of electromagnetic wave scattering from a randomly rough surface is given. A high frequency correction to the Kirchhoff approximation is derived from a field integral equation for a perfectly conducting surface. The correction, which accounts for the effect of local surface curvature, is seen to be identical with an asymptotic form found by Fock (1945) for diffraction by a paraboloid. The corrected boundary values are substituted into the far field Stratton-Chu integral, and average backscattered powers are computed assuming the scattering surface is a homogeneous Gaussian process. Preliminary calculations for K(-4) ocean wave spectrum indicate a resonable modelling of polarization effects near the vertical, theta 45 deg. Correspondence with the results of small perturbation theory is shown.

Jackson, F. C.↗
DOE OSTI2015

Far-field measurements of short-wavelength surface plasmons

We present direct far-field measurements of short-wavelength surface plasmon polaritons (SPP) by conventional optics means. Plasmonic wavelength as short as 231 nm was observed for 532 nm illumination on a Ag−Si{sub 3}N{sub 4} platform, demonstrating the capability to characterize SPPs well below the optical diffraction limit. This is done by scaling a sub-wavelength interferometric pattern to a far-field resolvable periodicity. These subwavelength patterns are obtained by coupling light into counter-propagating SPP waves to create a standing-wave pattern of half the SPP wavelength periodicity. Such patterns are mapped by a scattering slit, tilted at an angle so as to increase the periodicity of the intensity pattern along it to more than the free-space wavelength, making it resolvable by diffraction limited optics. The simplicity of the method as well as its large dynamic range of measurable wavelengths make it an optimal technique to characterize the properties of plasmonic devices and high-index dielectric waveguides, to improve their design accuracy and enhance their functionality.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
NASA NTRS2012

Far Sidelobes Measurement of the Atacama Cosmology Telescope

The Atacama Cosmology Telescope (ACT) is a 6m telescope designed to map the Cosmic Microwave Background (CMB) simultaneously at 145GHz, 220 GHz and 280 GHz. Its off-axis Gregorian design is intended to minimize and control the off-axis sidelobe response, which is critical for scientific purposes. The expected sidelobe level for this kind of design is less than -50 dB and can be challenging to measure. Here we present a measurement of the 145 GHz far sidelobes of ACT done on the near-field of the telescope. We used a 1 mW microwave source placed 13 meters away from the telescope and a chopper wheel to produce a varying signal that could be detected by the camera for different orientations of the telescope. The source feed was designed to produce a wide beam profile. Given that the coupling is expected to be dominated by diffraction over the telescope shielding structure, when combined with a measurements of the main beam far field response, these measurement can be used to validate elements of optical design and constrain the level of spurious coupling at large angles. Our results show that the diffractive coupling beyond the ground screen is consistently below -75 dB, satisfying the design expectations.

Duenner, Rolando↗
DOE OSTI2018

Cathodoluminescence-based nanoscopic thermometry in a lanthanide-doped phosphor

Crucial to analyze phenomena as varied as plasmonic hot spots and the spread of cancer in living tissue, nanoscale thermometry is challenging: probes are usually larger than the sample under study, and contact techniques may alter the sample temperature itself. Many photostable nanomaterials whose luminescence is temperature-dependent, such as lanthanide-doped phosphors, have been shown to be good non-contact thermometric sensors when optically excited. Using such nanomaterials, in this work we accomplished the key milestone of enabling far-field thermometry with a spatial resolution that is not diffraction-limited at readout. We explore thermal effects on the cathodoluminescence of lanthanide-doped NaYF$_4$ nanoparticles. Whereas cathodoluminescence from such lanthanide-doped nanomaterials has been previously observed, here we use quantitative features of such emission for the first time towards an application beyond localization. We demonstrate a thermometry scheme that is based on cathodoluminescence lifetime changes as a function of temperature that achieves $\sim$ 30 mK sensitivity in sub-$\mu$m nanoparticle patches. The scheme is robust against spurious effects related to electron beam radiation damage and optical alignment fluctuations. We foresee the potential of single nanoparticles, of sheets of nanoparticles, and also of thin films of lanthanide-doped NaYF$_4$ to yield temperature information via cathodoluminescence changes when in the vicinity of a sample of interest; the phosphor may even protect the sample from direct contact to damaging electron beam radiation. Cathodoluminescence-based thermometry is thus a valuable novel tool towards temperature monitoring at the nanoscale, with broad applications including heat dissipation in miniaturized electronics and biological diagnostics.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗
NASA NTRS1992

High-frequency techniques for RCS prediction of plate geometries

Given here are hard polarization diffraction coefficients for the special case of a wedge that is coated with a lossy dielectric on one face and is perfectly conducting on the other face. Expressions for plane-wave incidence, far-field observation; for cylindrical-wave incidence, far-field observation; and for plane-wave incidence, near-field observation are presented for regular diffractions. In addition, terms for surface-wave and surface-wave transition fields are presented. These expressions are derived from the Uniform Theory of Diffraction (UTD) coefficients for a generalized impedance wedge and are simplified for rapid calculation for the case of one perfectly conducting face. Results from a first-order model for a coated, rectangular plate are examined; and potential problems in extending this modeling approach to more complicated coated structures are identified.

Balanis, Constantine A.↗
NASA NTRS1990

Microstrip reflectarray antenna for the SCANSCAT radar application

This publication presents an antenna system that has been proposed as one of the candidates for the SCANSCAT (Scanned Scatterometer) radar application. It is the mechanically steered planar microstrip reflectarray. Due to its thin, lightweight structure, the antenna's mechanical rotation will impose minimum angular momentum for the spacecraft. Since no power-dividing circuitry is needed for its many radiating microstrip patches, this electrically large array antenna demonstrates excellent power efficiency. In addition, this fairly new antenna concept can provide many significant advantages over a conventional parabolic reflector. The basic formulation for the radiation fields of the microstrip reflectarray is presented. This formulation is based on the array theory augmented by the Uniform Geometrical Theory of Diffraction (UTD). A computer code for analyzing the microstrip reflectarray's performances, such as far-field patterns, efficiency, etc., is also listed in this report. It is proposed here that a breadboard unit of this microstrip reflectarray should be constructed and tested in the future to validate the calculated performance. The antenna concept presented here can also be applied in many other types of radars where a large array antenna is needed.

Huang, John↗
NASA NTRS1974

Electromagnetic and scalar diffraction by a right-angled wedge with a uniform surface impedance

The diffraction of an electromagnetic wave by a perfectly-conducting right-angled wedge with one surface covered by a dielectric slab or absorber is considered. The effect of the coated surface is approximated by a uniform surface impedance. The solution of the normally incident electromagnetic problem is facilitated by introducing two scalar fields which satisfy a mixed boundary condition on one surface of the wedge and a Neumann of Dirichlet boundary condition on the other. A functional transformation is employed to simplify the boundary conditions so that eigenfunction expansions can be obtained for the resulting Green's functions. The eigenfunction expansions are transformed into the integral representations which then are evaluated asymptotically by the modified Pauli-Clemmow method of steepest descent. A far zone approximation is made to obtain the scattered field from which the diffraction coefficient is found for scalar plane, cylindrical or sperical wave incident on the edge. With the introduction of a ray-fixed coordinate system, the dyadic diffraction coefficient for plane or cylindrical EM waves normally indicent on the edge is reduced to the sum of two dyads which can be written alternatively as a 2 X 2 diagonal matrix.

Hwang, Y. M.↗
DOE OSTI2017

Near-field limitations of Fresnel-regime coherent diffraction imaging

Coherent diffraction imaging (CDI) is a rapidly developing form of imaging that offers the potential of wavelength-limited resolution without image-forming lenses. In CDI, the intensity of the diffraction pattern is measured directly by the detector, and various iterative phase retrieval algorithms are used to “invert” the diffraction pattern and reconstruct a high-resolution image of the sample. But, there are certain requirements in CDI that must be met to reconstruct the object. Although most experiments are conducted in the “far-field”—or Fraunhofer—regime where the requirements are not as stringent, some experiments must be conducted in the “near field” where Fresnel diffraction must be considered. According to the derivation of Fresnel diffraction, successful reconstructions can only be obtained when the small-angle number, a derived quantity, is much less than one. We show, however, that it is not actually necessary to fulfill the small-angle condition. The Fresnel kernel well approximates the exact kernel in regions where the phase oscillates slowly, and in regions of fast oscillations, indicated by large A n , the error between kernels should be negligible due to stationary-phase arguments. Finally we verify, by experiment, this conclusion with a helium neon laser setup and show that it should hold at x-ray wavelengths as well.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗