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At least 109 records · Page 6
All sourcesNASA NTRSDOE OSTI
DOE OSTI2023

A coded aperture with sub-mean-free-path thickness for implosion geometry imaging on ICF and IFE experiments

Inertial confinement fusion and inertial fusion energy experiments diagnose the geometry of the fusion region through imaging of the neutrons released through fusion reactions. Pinhole arrays typically used for such imaging require thick substrates to obtain high contrast along with a small pinhole diameter to obtain high resolution capability, resulting in pinholes that have large aspect ratios. This leads to expensive pinhole arrays that have small solid angles and are difficult to align. Here, we propose a coded aperture with scatter and partial attenuation (CASPA) for fusion neutron imaging that relaxes the thick substrate requirement for good image contrast. These coded apertures are expected to scale to larger solid angles and are easier to align without sacrificing imaging resolution or throughput. We use Monte Carlo simulations (Geant4) to explore a coded aperture design to measure neutron implosion asymmetries on fusion experiments at the National Ignition Facility (NIF) and discuss the viability of this technique, matching the current nominal resolution of 10 µm. The results show that a 10 mm thick tungsten CASPA can image NIF implosions with neutron yields above 10 14 with quality comparable to unprocessed data from a current NIF neutron imaging aperture. Furthermore, this CASPA substrate is 20 times thinner than the current aperture arrays for fusion neutron imaging and less than one mean free-path of 14.1 MeV neutrons through the substrate. Since the resolution, solid angle, and throughput are decoupled in coded aperture imaging, the resolution and solid angle achievable with future designs will be limited primarily by manufacturing capability.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗
DOE OSTI2024

Upgrade of the Lyman-alpha diagnostic system on DIII-D for main chamber edge neutral studies

The LLAMA (Lyman Alpha Measurement Apparatus) pinhole camera diagnostic had previously been deployed on DIII-D to measure radial profiles of the Lyman-α (Ly-α) deuterium neutral line brightness across the plasma boundary in the lower chamber to infer neutral deuterium density and ionization rate profiles. This system has recently been upgraded with a new diagnostic head, named ALPACA, that also encloses two pinhole cameras and duplicates the LLAMA views in the upper chamber. Similar to LLAMA, ALPACA provides two times 20 lines of sight, viewing the plasma edge on the inboard and outboard sides with a radial resolution of ~2.5 cm (FWHM) and an effective time resolution of ~1 ms that allows for the investigation of inter-ELM dynamics. The extended Ly-α system provides better coverage to study neutrals in experiments with various plasma shapes utilizing both the upper and lower divertors. Furthermore, post-campaign calibration of the LLAMA diagnostic has successfully been demonstrated for the first time. This was facilitated by various upgrades to the calibration set-up and detailed measurements of the emissivity distribution of the Ly-α calibration source using a pinhole collimator. It was found that the sensitivity of the inboard LLAMA pinhole camera was reduced by a factor of 2.0 ± 0.2 over the course of six months of plasma operation in 2021. In conclusion, the upgraded Ly-α system, equipped with improved absolute calibration, will provide key input for neutral fueling and pedestal particle transport studies and for 2D edge transport code validation on the DIII-D tokamak.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗
NASA NTRS1987

The survivability of large space-borne reflectors under atomic oxygen and micrometeoroid impact

Solar dynamic power system mirrors for use on space station and other spacecraft flown in low Earth orbit (LEO) are exposed to the harshness of the LEO environment. Both atomic oxygen and micrometeoroids/space debris can degrade the performance of such mirrors. Protective coatings will be required to protect oxidizable reflecting media, such as silver and aluminum, from atomic oxygen attack. Several protective coating materials have been identified as good candidates for use in this application. The durability of these coating/mirror systems after pinhole defects have been inflicted during their fabrication and deployment or through micrometeoroid/space debris impact once on-orbit is of concern. Studies of the effect of an oxygen plasma environment on protected mirror surfaces with intentionally induced pinhole defects have been conducted at NASA Lewis and are reviewed. It has been found that oxidation of the reflective layer and/or the substrate in areas adjacent to a pinhole defect, but not directly exposed by the pinhole, can occur.

Gulino, D. A.↗
NASA NTRS1987

The survivability of large space-borne reflectors under atomic oxygen and micrometeoroid impact

Solar dynamic power system mirrors for use on Space Station and other spacecraft flown in low earth orbit (LEO) are exposed to the harshness of the LEO environment. Both atomic oxygen and micrometeoroids/space debris can degrade the performance of such mirrors. Protective coatings will be required to protect oxidizable reflecting media, such as silver and aluminum, from atomic oxygen attack. Several protective coating materials have been identified as good candidates for use in this application. The durability of these coating/mirror systems after pinhole defects have been inflicted during their fabrication and deployment or through micrometeoroid/space debris impact once on-orbit is of concern. Studies of the effect of an oxygen plasma environment on protected mirror surfaces with intentionally induced pinhole defects have been conducted at NASA Lewis and are reviewed. It has been found that oxidation of the reflective layer and/or the substrate in areas adjacent to a pinhole defect, but not directly exposed by the pinhole, can occur.

Gulino, Daniel A.↗
NASA NTRS1992

Intensity distribution of the x ray source for the AXAF VETA-I mirror test

The X-ray generator for the AXAF VETA-I mirror test is an electron impact X-ray source with various anode materials. The source sizes of different anodes and their intensity distributions were measured with a pinhole camera before the VETA-I test. The pinhole camera consists of a 30 micrometers diameter pinhole for imaging the source and a Microchannel Plate Imaging Detector with 25 micrometers FWHM spatial resolution for detecting and recording the image. The camera has a magnification factor of 8.79, which enables measuring the detailed spatial structure of the source. The spot size, the intensity distribution, and the flux level of each source were measured with different operating parameters. During the VETA-I test, microscope pictures were taken for each used anode immediately after it was brought out of the source chamber. The source sizes and the intensity distribution structures are clearly shown in the pictures. They are compared and agree with the results from the pinhole camera measurements. This paper presents the results of the above measurements. The results show that under operating conditions characteristic of the VETA-I test, all the source sizes have a FWHM of less than 0.45 mm. For a source of this size at 528 meters away, the angular size to VETA is less than 0.17 arcsec which is small compared to the on ground VETA angular resolution (0.5 arcsec, required and 0.22 arcsec, measured). Even so, the results show the intensity distributions of the sources have complicated structures. These results were crucial for the VETA data analysis and for obtaining the on ground and predicted in orbit VETA Point Response Function.

Zhao, Ping↗
NASA NTRS1999

Method for Fabricating Soft Tissue Implants with Microscopic Surface Roughness

A method for fabricating soft tissue implants using a mold. The cavity surface of an initially untextured mold. made of an organic material such as epoxy. is given a thin film coating of material that has pinholes and is resistant to atomic particle bombardment. The mold cavity surface is then subjected to atomic particle bombardment, such as when placed in an isotropic atomic oxygen environment. Microscopic depressions in the mold cavity surface are created at the pinhole sites on the thin film coating. The thin film coating is removed and the mold is then used to cast the soft tissue implant. The thin film coating having pinholes may be created by chilling the mold below the dew point such that water vapor condenses upon it; distributing particles, that can partially dissolve and become attached to the mold cavity surface, onto the mold cavity surface; removing the layer of condensate, such as by evaporation; applying the thin film coating over the entire mold surface; and, finally removing the particles, such as by dissolving or brushing it off. Pinholes are created in the thin film coating at the sites previously occupied by the particles.

Banks, Bruce A.↗
NASA NTRS2003

Plasma Interactions with a Negative Biased Electrodynamic Tether

The ProSEDS conductive tether design incorporates two distinct types of tethers from a plasma interaction viewpoint. The 200 m closest to the Delta 11 spacecraft is insulated from the plasma, and the remaining 5000 m is semi-bare. This latter portion is semi-bare because it has a conductive coating applied to the wires to permit electron collection while also regulating the overall tether temperature. Because the tether possesses these two distinct types of tethers, a transition point exists between the two types that form a triple point with the space plasma. Insulated tethers can suffer from a second plasma interaction if the insulation is weakened or breached, such as by pinholes caused by small particle debris strikes. Because electrodynamic tethers are typically long, they have a high probability of such impacts. These impacting particles may not be of sufficient size to severe the tether, but they can easily be of sufficient size to damage the tether insulation. Samples of both the ProSEDS tether transition region and the insulated tether section (with various degrees of pinhole damage) were placed into the MSFC plasma chamber and biased to typical ProSEDS open circuit tether potentials (-500 V to -1600 V). The results of the testing showed that the transition region of the tether (i.e. the triple point) arced and burned the tether in two at -900 V, and the damaged insulated sections arced and burned in two between -1000 V and -1600, depending on the pinhole damage geometry. tether design and make the tether ready for flight. To reduce the pinhole arcing risk, ProSEDS mission operations were changed to eliminate the negative potential on the tether. The results of the testing campaign and the design changes implemented to ensure a successful flight will be described.

Vaughn, Jason A.↗
NASA NTRS2004

Plasma Interactions With a Negative Biased Electrodynamic Tether

The ProSEDS conductive tether design incorporates two distinct types of tethers from a plasma interaction viewpoint. The 200 m closest to the Delta II spacecraft is insulated from the plasma, and the remaining 4800 m is semi-bare. This latter portion is considered semi-bare because a conductive coating, which is designed to collect electrons from the plasma, was applied to the wires to regulate the overall tether temperature. Because the tether has both insulating and conductive tether sections, a transition point exists between the two that forms a triple point with the space plasma. Also, insulated tethers can arc to the space plasma if the insulation is weakened or breached by pinholes caused by either improper handling or small meteoroid and orbital debris strikes. Because electrodynamic tethers are typically long, they have a high probability of these impacts. The particles, which strike the tether, may not have sufficient size to severe the tether, but they can easily penetrate the tether insulation producing a plasma discharge to the ambient plasma. Samples of both the ProSEDS tether transition region and the insulated tether section with various size of pinholes were placed into the MSFC plasma chamber and biased to typical ProSEDS open circuit tether potentials (-500 V to -1600 V). The results of the testing showed that the transition region of the tether (i.e. the triple point) arced to the ambient plasma at -900 V, and the tethers damaged by a pinhole or simulated debris strike arced to the plasma between -700 V and -900 V. Specific design steps were taken to eliminate the triple point issue in the ProSEDS tether design and make it ready for flight. To reduce the pinhole arcing risk, ProSEDS mission operations were changed to eliminate the high negative potential on the insulated tether. The results of the testing campaign and the design changes implemented to ensure a successful flight are described.

Vaughn, Jason A.↗
NASA NTRS2008

Micron-Accurate Laser Fresnel-Diffraction Ranging System

Two versions of an optoelectronic system undergoing development are depicted. The system is expected to be capable of measuring a distance between 2 and 10 m with an error of no more than 1 micrometer. The system would be designed to exploit Fresnel diffraction of a laser beam. In particular, it would be designed to take advantage of the fact that a Fresnel diffraction pattern is ultrasensitive to distance. The two versions would differ in the following respects: In version 1, the focus of the telescope would be in the Fresnel region, and the telescope would have a small depth of focus. As a consequence, the Fresnel pattern would be imaged directly onto the photodetector array; in version 2, a multielement lens module would displace the Fresnel region from the vicinity of the pinhole to the vicinity of the optical receiver. As the distance to be measured varied, the location of the receiver relative to the displaced Fresnel-diffraction region would vary, thereby causing the Fresnel diffraction pattern on the focal plane to vary. The multielement lens module would also correct for aberrations. The processing of the digitized Fresnel diffraction pattern in the computer might be accelerated by using only parts of the pattern or even only one small part - the central pixel. As the distance from the pinhole increased, the central pixel would rapidly cycle between maximum and minimum light intensity. This in itself would not be sufficient to uniquely determine the distance. However, by varying the size of the pinhole or the wavelength of the laser, one could obtain a second cycle of variation of intensity that, in conjunction with the first cycle, could enable a unique determination of distance. Alternatively, for a single wavelength and a single pinhole size, it should suffice to consider the data from only two different key pixels in the Fresnel pattern.

Lehner, David↗
NASA NTRS2019

Modeling transmittance of MODIS solar diffuser stability monitor sun view screen

Earlier work by Sun et al. [2005] modeled the Sun view screen transmittance of the solar diffuser stability monitor (SDSM) on Moderate Resolution Imaging Spectroradiometer (MODIS) which explains the oscillatory pattern in the Terra/Aqua MODIS SDSM Sun view response collected during the post-launch yaw maneuvers. The SDSM screen consists of small size pinholes which limit the screen transmittance. The SDSM Sun view transmittance pattern is affected by the size and distribution of pinholes, screen thickness, and orientation between the aperture stop and the Sun view screen. Planning of post-launch yaw maneuver test often requires comprehensive angular coverage to resolve the angular variation of the screen transmittance. This paper developed a Gauss-Kronrod quadrature method-based model to simulate the SDSM Sun view transmittance. This method performs iterative integration of the interception area between pinhole and aperture stop which is critical in the screen transmittance calculation. Parametric dependences of the MODIS SDSM Sun view transmittance on various geometric factors such as the pinhole size or spacing and misalignment between the SDSM Sun view screen and aperture stop are studied. The implications for the post-launch yaw maneuver planning to resolve the angular variation of the SDSM Sun view transmittance due to the SDSM Sun view screen misalignment are discussed.

MODIS↗
DOE OSTI2023

High-Performance Passivating Contacts for Si PV Based on Engineered, Doped Nanopinholes through Dielectric Layers

We present a novel, industrially relevant method to fabricate high-performance poly-Si passivating contacts for Si PV. Passivating contacts based on SiOx/poly-Si layer stacks have been implemented in record-efficiency homojunction Si solar cells. In this technology, the carrier transport through a surface-passivating SiOx is enabled either by quantum-tunneling or nanopinholes. The doped poly-Si layer provides charge-carrier selectivity. Previously, the ISFH research group demonstrated a record 26.1% efficient Si homojunction cell, where transport pinholes in ~2 nm SiOx were produced by thermal breakdown at > 1000 degrees C, which is hard to control and is surface morphology-dependent. At room temperature, our new process uses electroless plating of Ag nanoparticles, followed by metal-assisted chemical etching. Nanogalvanic corrosion yields < 20 nm-wide nanopinholes in an insulating > 2 nm SiOx layer. The nanopinholes are filled by a heavily doped a-Si:H overlayer. We drive in the dopants into the Si wafer with subsequent high-temperature annealing. Preferential incorporation of dopants at pinhole locations results in nanoscale p+/n or n+/n junctions near the wafer interface. Each heavily-doped nanoscale pinhole junction collects and transports photogenerated carriers to the cell metal contacts. The density of the engineered nanopinholes can be tuned over a wide range which is critical for optimization of device performance. The same nanogalvanic corrosion principles can be applied to produce doped transport pinholes in well-passivating thick dielectric SiOx/SiNy stacks. Importantly, our process does not rely on thermal breakdown of the dielectric layers and can be applied to textured wafers resulting in Si solar cells with > 20% conversion efficiency.

dielectric layer↗
DOE OSTI2023

Nanopinhole Passivating Contact Si Solar Cells Fabricated with Metal-Assisted Chemical Etching

Monocrystalline Si (c-Si) solar cells with passivating contacts based on doped polycrystalline Si (poly-Si) on ≈2.0 nm silicon oxide (SiO x ) require >1000 °C thermal processing to create conducting pinholes in the SiO x layer. However, this high thermal budget can induce bulk defects in the Czochralski c-Si wafers used as the cell absorber layer. We demonstrate that pinholes can instead be created using metal-assisted chemical etching on planar or textured morphologies, at room temperature. This wet process creates up to 200 nm wide conducting pinholes that are directly observed with transmission electron and atomic force microscopies. High-performance hole-selective poly-Si/SiN y /SiO x and electron-selective poly-Si/SiO x passivating contacts are fabricated and implemented in laboratory-scale solar cells. This process development significantly broadens the range of passivation layer materials, their thicknesses, and surface morphologies, which enables the design of poly-Si contacts with superior passivating quality.

14 SOLAR ENERGY↗
DOE OSTI2020

Surface SiO 2 Thickness Controls Uniform-to-Localized Transition in Lithiation of Silicon Anodes for Lithium-Ion Batteries

Silicon is a promising anode material for lithium-ion batteries because of its high capacity, but its widespread adoption has been hampered by a low cycle life arising from mechanical failure and the absence of a stable solid–electrolyte interphase (SEI). Understanding SEI formation and its impact on cycle life is made more complex by the oxidation of silicon materials in air or during synthesis, which leads to SiO x coatings of varying thicknesses that form the true surface of the electrode. Here, the lithiation of SiO 2 -coated Si is studied in a controlled manner using SiO 2 coatings of different thicknesses grown on Si wafers via thermal oxidation. SiO 2 thickness has a profound effect on lithiation: below 2 nm, SEI formation followed by uniform lithiation occurs at positive voltages versus Li/Li + . Si lithiation is reversible, and SiO 2 lithiation is largely irreversible. Above 2 nm SiO 2 , voltammetric currents decrease exponentially with SiO 2 thickness. For 2–3 nm SiO 2 , SEI formation above 0.1 V is suppressed, but a hold at low or negative voltages can initiate charge transfer whereupon SEI formation and uniform lithiation occur. Cycling of Si anodes with an SiO 2 coating thinner than 3 nm occurs at high Coulombic efficiency (CE). If an SiO 2 coating is thicker than 3–4 nm, the behavior is totally different: lithiation at positive voltages is strongly inhibited, and lithiation occurs at poor CE and is highly localized at pinholes which grow over time. As they grow, lithiation becomes more facile and the CE increases. Pinhole growth is proposed to occur via rapid transport of Li along the SiO 2 /Si interface radially outward from an existing pinhole, followed by the lithiation of SiO 2 from the interface outward.

25 ENERGY STORAGE↗
DOE OSTI2020

A coded aperture microscope for X-ray fluorescence full-field imaging

The design and construction of an instrument for full-field imaging of the X-ray fluorescence emitted by a fully illuminated sample are presented. The aim is to produce an X-ray microscope with a few micrometers spatial resolution, which does not need to scan the sample. Since the fluorescence from a spatially inhomogeneous sample may contain many fluorescence lines, the optic which will provide the magnification of the emissions must be achromatic, i.e. its optical properties must be energy-independent. The only optics which fulfill this requirement in the X-ray regime are mirrors and pinholes. The throughput of a simple pinhole is very low, so the concept of coded apertures is an attractive extension which improves the throughput by having many pinholes, and retains the achromatic property. Modified uniformly redundant arrays (MURAs) with 10 µm openings and 50% open area have been fabricated using gold in a lithographic technique, fabricated on a 1 µm-thick silicon nitride membrane. The gold is 25 µm thick, offering good contrast up to 20 keV. The silicon nitride is transparent down into the soft X-ray region. MURAs with various orders, from 19 up to 73, as well as their respective negative (a mask where open and closed positions are inversed compared with the original mask), have been made. Having both signs of mask will reduce near-field artifacts and make it possible to correct for any lack of contrast.

36 MATERIALS SCIENCE↗
DOE OSTI2020

Modeling synergistic fuel cell membrane degradation with mitigating effects of cerium

During operation, polymer-electrolyte fuel cells undergo mechanical and chemical degradation, which behave synergistically and lead to accelerated membrane deterioration over time. This study builds upon previous modeling work on mechanical degradation, as described by a pinhole in the membrane, and chemical degradation mitigation by using cerium. By combining these two models, analysis can be carried out on the coupled degradation methods and how the mitigation effects of cerium disrupt the degradation cycle. The model results show how the presence of a pinhole in the membrane changes the distribution of cerium in the cell and modifies chemical degradation rates. In addition, the model shows how cerium affects the rate of pinhole growth by slowing down the rate of change in mechanical properties due to chemical degradation. Finally, the model shows how cerium modifies the mechanical and chemical degradation rates of the membrane under humidity- and voltage-cycling conditions.

Ehlinger, VM↗
DOE OSTI2020

Modeling Synergistic Fuel Cell Membrane Degradation with Mitigating Effects of Cerium

During operation, polymer-electrolyte-membrane (PEM) fuel cells undergo mechanical and chemical degradation mechanisms, which behave synergistically and lead to accelerated membrane degradation over time. This study builds upon previous modeling work on mechanical degradation as described by a pinhole in the membrane and the effects of cerium on chemical degradation.1 By combining these two models, analysis can be carried out on the coupled degradation methods and how the mitigation effects of cerium disrupt the degradation cycle. The mechanical model represents a pinhole in the membrane using an effective void fraction, which allows for increased gas crossover through the membrane and impacts the membrane transport and mechanical properties. A microkinetic model for the chemical degradation is included in the model, including attack of the membrane polymer by hydroxyl radicals as well as the mitigation reaction for quenching of hydroxyl radicals with cerium. A concentrated solution theory approach is used to model the transport of cerium ions throughout the cell.2 The model results show how the location of cerium in the cell can be used to prevent chemical degradation. In addition, the model shows how cerium slows down the rate of pinhole growth by reducing the gas crossover and membrane thinning rate. Finally, the model can be used to optimize the distribution of cerium in the membrane and catalyst layers by balancing trade-offs between lowering degradation rates and decreasing fuel cell performance.

25 ENERGY STORAGE↗
NASA NTRS1989

Diffusion of Si in thin CoSi2 layers

Evidence of silicon diffusion in 100-A CoSi2 layers grown by room-temperature codeposition and annealing on Si(111) substrates was from Auger peak height ratios, which were interpreted in terms of a Si overlayer. It was found that this layer could be removed by chemical etching and reformed by subsequent annealing. By measuring the intensity of the plasmon energy loss peak associated with the CoL23 VV Auger peak, the effective thickness of the Si overlayer was measured as a function of annealing temperature, by calibrating the plasmon loss data against known overlayer thicknesses on unannealed samples. Similar results were found for samples grown both with and without the addition of a 10-A Si cap to prevent pinhole formation in the CoSi2; moreover, Si diffusion was also observed at temperatures well below the point where pinhole formation is first found, suggesting that Si diffusion does not depend on the presence of observable pinholes.

Schowengerdt, F. D.↗
NASA NTRS1990

High-voltage plasma interactions calculations using NASCAP/LEO

This paper reviews four previous simulations (two laboratory and two space-flight) of interactions of a high-voltage spacecraft with a plasma under low-earth orbit conditions, performed using a three-dimensional computer code NASCAP/LEO. Results show that NASCAP/LEO can perform meaningful simulations of high-voltage plasma interactions taking into account three-dimensional effects of geometry, spacecraft motion, and magnetic field. Two new calculations are presented: (1) for current collection by 1-mm pinholes in wires (showing that a pinhole in a wire can collect far more current than a similar pinhole in a flat plate); and (2) current collection by Charge-2 mother vehicle launched in December 1985. It is shown that the Charge-2 calculations predicted successfully ion collection at negative bias, the floating potential of a probe outside or inside the sheath under negative bias conditions, and magnetically limited electron collection under electron beam operation at high altitude.

Mandell, M. J.↗