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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 109 records · Page 6
All sourcesNASA NTRSDOE OSTI
NASA NTRS2007

Algorithm-Based Fault Tolerance for Numerical Subroutines

A software library implements a new methodology of detecting faults in numerical subroutines, thus enabling application programs that contain the subroutines to recover transparently from single-event upsets. The software library in question is fault-detecting middleware that is wrapped around the numericalsubroutines. Conventional serial versions (based on LAPACK and FFTW) and a parallel version (based on ScaLAPACK) exist. The source code of the application program that contains the numerical subroutines is not modified, and the middleware is transparent to the user. The methodology used is a type of algorithm- based fault tolerance (ABFT). In ABFT, a checksum is computed before a computation and compared with the checksum of the computational result; an error is declared if the difference between the checksums exceeds some threshold. Novel normalization methods are used in the checksum comparison to ensure correct fault detections independent of algorithm inputs. In tests of this software reported in the peer-reviewed literature, this library was shown to enable detection of 99.9 percent of significant faults while generating no false alarms.

Tumon, Michael↗
NASA NTRS2018

The Probability of False Go/No-Go Determined by GOES Proton Flux: Proposed Launch Constraints for Avoiding Damaging Solar Energetic Particle Events

Most space-bound hardware needs to be designed to withstand space weather events to some degree. Long-term predictability of space weather events, such as solar flares or coronal mass ejections, are still a matter of theory so designers should assume a worst case event for their specific environment. In our analysis, we show preliminary results of the probability of encountering a false/true go/no-go based on a threshold launch and design proton environment. The goal in choosing a threshold launch environment is to avoid the chance of exceeding the design environment during vulnerable parts of the mission. Operationally, this method cannot predict damaging space weather but can aid in avoiding space weather events that are already occurring. The GOES (Geostationary Operational Environmental Satellite) proton flux database is used as a proxy for the heavy ion fluxes, which impart a greater threat because of larger single event upsets and effects. Our use of protons as a proxy for heavy ions is justified on the basis of the correlation between their fluxes shown by a qualitative comparison of GOES proton integral fluxes at greater than 10 megaelectronvolts and ACE/SIS (Advanced Composition Explorer / Solar Isotope Spectrometer) heavy ion integral fluxes.

DeStefano, Anthony M.↗
NASA NTRS2006

Single Event Effects Test Results for Advanced Field Programmable Gate Arrays

Reconfigurable Field Programmable Gate Arrays (FPGAs) from Altera and Actel and an FPGA-based quick-turnApplication Specific Integrated Circuit (ASIC) from Altera were subjected to single-event testing using heavy ions. Both Altera devices (Stratix II and HardCopy II) exhibited a low latchup threshold (below an LET of 3 MeV-cm2/mg) and thus are not recommended for applications in the space radiation environment. The flash-based Actel ProASIC Plus device did not exhibit latchup to an effective LET of 75 MeV-cm2/mg at room temperature. In addition, these tests did not show flash cell charge loss (upset) or retention damage. Upset characterization of the design-level flip-flops yielded an LET threshold below 10 MeV-cm2/mg and a high LET cross section of about lxlO-6 cm2/bit for storing ones and about lxl0-7 cm2/bit for storing zeros . Thus, the ProASIC device may be suitable for critical flight applications with appropriate triple modular redundancy mitigation techniques.

Field Programmable Gate Arrays↗
NASA NTRS2003

Neutron Particle Effects on a Quad-Redundant Flight Control Computer

This paper describes a single-event upset experiment performed at the Los Alamos National Laboratory. A closed-loop control system consisting of a Quad-Redundant Flight Control Computer (FCC) and a B737 simulator was operated while the FCC was exposed to a neutron beam. The purpose of this test was to analyze the effects of neutron bombardment on avionics control systems operating at altitudes where neutron strikes are probable. The neutron energy spectrum produced at the Los Alamos National Laboratory is similar in shape to the spectrum of atmospheric neutrons but much more intense. The higher intensity results in accelerated life tests that are representative of the actual neutron radiation that a FCC may receive over a period of years.

Eure, Kenneth↗
NASA NTRS1995

Effects of target fragmentation on evaluation of LET spectra from space radiation in low-earth orbit (LEO) environment: impact on SEU predictions

Recent improvements in the radiation transport code HZETRN/BRYNTRN and galactic cosmic ray environmental model have provided an opportunity to investigate the effects of target fragmentation on estimates of single event upset (SEU) rates for spacecraft memory devices. Since target fragments are mostly of very low energy, an SEU prediction model has been derived in terms of particle energy rather than linear energy transfer (LET) to account for nonlinear relationship between range and energy. Predictions are made for SEU rates observed on two Shuttle flights, each at low and high inclination orbit. Corrections due to track structure effects are made for both high energy ions with track structure larger than device sensitive volume and for low energy ions with dense track where charge recombination is important. Results indicate contributions from target fragments are relatively important at large shield depths (or any thick structure material) and at low inclination orbit. Consequently, a more consistent set of predictions for upset rates observed in these two flights is reached when compared to an earlier analysis with CREME model. It is also observed that the errors produced by assuming linear relationship in range and energy in the earlier analysis have fortuitously canceled out the errors for not considering target fragmentation and track structure effects.

STS-51 Shuttle Project↗
NASA NTRS1995

Effects of Target Fragmentation on Evaluation of LET Spectra From Space Radiation in Low-Earth Orbit (LEO) Environment: Impact on SEU Predictions

Recent improvements in the radiation transport code HZETRN/BRYNTRN and galactic cosmic ray environmental model have provided an opportunity to investigate the effects of target fragmentation on estimates of single event upset (SEU) rates for spacecraft memory devices. Since target fragments are mostly of very low energy, an SEU prediction model has been derived in terms of particle energy rather than linear energy transfer (LET) to account for nonlinear relationship between range and energy. Predictions are made for SEU rates observed on two Shuttle flights, each at low and high inclination orbit. Corrections due to track structure effects are made for both high energy ions with track structure larger than device sensitive volume and for low energy ions with dense track where charge recombination is important. Results indicate contributions from target fragments are relatively important at large shield depths (or any thick structure material) and at low inclination orbit. Consequently, a more consistent set of predictions for upset rates observed in these two flights is reached when compared to an earlier analysis with CREME model. It is also observed that the errors produced by assuming linear relationship in range and energy in the earlier analysis have fortuitously canceled out the errors for not considering target fragmentation and track structure effects.

Shinn, J. L.↗
NASA NTRS2000

Simultaneous Spectral and Timing Observations of Accreting Neutron Stars

All six Rossi Timing Explorer (RXTE) observations approved for this proposal were car- ried out. Four of the observations were simultaneous with BeppoSAX (two of the source 4Ul820-30, and one each of 4U1636-536 and 4U0614+091) and two were simultaneous with ASCA (of 4Ul636-536 and of 4U0614+091). RXTE experienced a single event upset and went into a safe hold mode during the first 4U0614+091 observation and remained in safe hold until after the scheduled start of the second 4U0614+091 observation. An additional observation of 4U0614+091 was performed with RXTE to make up for the lost time. However, it was not possible to arrange for simultaneous observations with either BeppoSAX or ASCA. Our work has led to three papers directly related to observations made - one paper for each source observed - and one additional paper summarizing our progress in this field. In addition, several reports on these results were made at various conferences.

Kaaret, P.↗
NASA NTRS1991

Prediction of error rates in dose-imprinted memories on board CRRES by two different methods

An analysis of the expected space radiation effects on the single event upset (SEU) properties of CMOS/bulk memories onboard the Combined Release and Radiation Effects Satellite (CRRES) is presented. Dose-imprint data from ground test irradiations of identical devices are applied to the predictions of cosmic-ray-induced space upset rates in the memories onboard the spacecraft. The calculations take into account the effect of total dose on the SEU sensitivity of the devices as the dose accumulates in orbit. Estimates of error rates, which involved an arbitrary selection of a single pair of threshold linear energy transfer (LET) and asymptotic cross-section values, were compared to the results of an integration over the cross-section curves versus LET. The integration gave lower upset rates than the use of the selected values of the SEU parameters. Since the integration approach is more accurate and eliminates the need for an arbitrary definition of threshold LET and asymptotic cross section, it is recommended for all error rate predictions where experimental sigma-versus-LET curves are available.

Brucker, G. J.↗
NASA NTRS2005

Ionizing Radiation Environment on the International Space Station: Performance vs. Expectations for Avionics and Material

The role of structural shielding mass in the design, verification, and in-flight performance of International Space Station (ISS), in both the natural and induced orbital ionizing radiation (IR) environments, is reported. Detailed consideration of the effects of both the natural and induced ionizing radiation environment during ISS design, development, and flight operations has produced a safe, efficient manned space platform that is largely immune to deleterious effects of the LEO ionizing radiation environment. The assumption of a small shielding mass for purposes of design and verification has been shown to be a valid worst-case approximation approach to design for reliability, though predicted dependences of single event effect (SEE) effects on latitude, longitude, SEP events, and spacecraft structural shielding mass are not observed. The Figure of Merit (FOM) method over predicts the rate for median shielding masses of about 10g/cm(exp 2) by only a factor of 3, while the Scott Effective Flux Approach (SEFA) method overestimated by about one order of magnitude as expected. The Integral Rectangular Parallelepiped (IRPP), SEFA, and FOM methods for estimating on-orbit (Single Event Upsets) SEU rates all utilize some version of the CREME-96 treatment of energetic particle interaction with structural shielding, which has been shown to underestimate the production of secondary particles in heavily shielded manned spacecraft. The need for more work directed to development of a practical understanding of secondary particle production in massive structural shielding for SEE design and verification is indicated. In contrast, total dose estimates using CAD based shielding mass distributions functions and the Shieldose Code provided a reasonable accurate estimate of accumulated dose in Grays internal to the ISS pressurized elements, albeit as a result of using worst-on-worst case assumptions (500 km altitude x 2) that compensate for ignoring both GCR and secondary particle production in massive structural shielding.

Koontz, Steven L.↗
NASA NTRS2009

Comparison of TID Response and SEE Characterization of Single and Multi Level High Density NAND Flash Memories

Heavy ion single-event measurements and TID response for 8Gb commercial NAND flash memories are reported. Radiation results of multi-level flash technology are compared with results from single-level flash technology. In general, these commercial high density memories appear to be much less susceptible to SEE and have better TID response compared to older generations of flash memories. The charge pump survived up to 600 krads.

nonvolatile memory↗
DOE OSTI2022

A radiation tolerant clock generator for the CMS endcap timing layer readout chip

Here, we present the test results of a low jitter Phase Locked Loop (PLL) prototype chip for the CMS Endcap Timing Layer readout chip (ETROC). This chip is based on the improved version of a clock synthesis circuit named ljCDR from the Low Power Gigabit Transceiver (lpGBT) project. The ljCDR is tested in its PLL mode. An automatic frequency calibration (AFC) block with the Triple Modular Redundancy (TMR) register is developed for the LC-oscillator calibration. The chip was manufactured in a 65 nm CMOS process with 10 metal layers. The chip has been extensively tested, including Total Ionizing Dose (TID) testing up to 300 Mrad and Single Event Upset (SEU) testing with heavy ions possessing a Linear Energy Transfer (LET) from 1.3 to 62.5 MeV × cm 2 /mg.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
NASA NTRS2006

Upset Characterization of the PowerPC405 Hard-core Processor Embedded in Virtex-II Pro Field Programmable Gate Arrays

Shown in this presentation are recent results for the upset susceptibility of the various types of memory elements in the embedded PowerPC405 in the Xilinx V2P40 FPGA. For critical flight designs where configuration upsets are mitigated effectively through appropriate design triplication and configuration scrubbing, these upsets of processor elements can dominate the system error rate. Data from irradiations with both protons and heavy ions are given and compared using available models.

radiation effects↗
NASA NTRS1990

Assessing the SEU resistance of CMOS latches using alpha-particle sensitive test circuits

The importance of Cosmic Rays on the performance of integrated circuits (IC's) in a space environment is evident in the upset rate of the Tracking and Data Relay Satellite (TDRS) launched in Apr. 1983. This satellite experiences a single-event-upset (SEU) per day which must be corrected from the ground. Such experience caused a redesign of the Galileo spacecraft with SEU resistant IC's. The solution to the SEU problem continues to be important as the complexity of spacecraft grows, the feature size of IC's decreases, and as space systems are designed with circuits fabricated at non-radiation hardened foundries. This paper describes an approach for verifying the susceptibility of CMOS latches to heavy-ion induced state changes. The approach utilizes alpha particles to induce the upsets in test circuits. These test circuits are standard cells that have offset voltages which sensitize the circuits to upsets. These results are then used to calculate the upsetability at operating voltages. In this study results are presented for the alpha particle upset of a six-transistor static random access memory (SRAM) cell. Then a methodology is described for the analysis of a standard-cell inverter latch.

Buehler, M.↗
NASA NTRS2018

Validation of Fault-Tolerant Plans for Europa Clipper

The Europa Clipper mission will explore that icy moon in a series of brief flybys through the Jovian radiation belts. A single event upset in the spacecraft flight computer during these critical scientific periods could jeopardize the success of the mission. Rather than safing and awaiting operator intervention, the Clipper mission envisions limited onboard autonomy that can restore spacecraft state sufficiently to resume the encounter observation plan as rapidly as possible. The contingency plan is contained in an Activity Restart Timeline (ART) that is transmitted in parallel with the nominal plan, which must be co-validated jointly against all spacecraft state and resource constraints amid unpredictable fault timing. A prototype validation tool was built that leverages declarative spacecraft models and automated search techniques to find such potential inconsistencies in the unified contingent mission plan. Early validation results within motivating scenarios are presented.

Ferguson, Eric↗
DOE OSTI2023

The design and test results of A Giga-Bit Cable Receiver (GBCR) for the ATLAS Inner Tracker Pixel Detector

This paper presents the design and test results of a Gigabit Cable Receiver ASIC called GBCR for the HL-LHC upgrade of the ATLAS Inner Tracker (ITk) pixel detector. Three prototypes (GBCR1, GBCR2, and GBCR3) have been designed in the CERN-identified 65 nm CMOS technology. GBCR receives seven (GBCR2) or six (GBCR3) channels (RX) each at 1.28 Gbps from the front-end readout chip RD53B via flex cables up to 1 meter and Twinax cables up to 5 meters and sends the equalized and retimed signals to lpGBT. Both GBCR2 and GBCR3 ASICs have two transmitting channels (TX) that pre-emphasize the signals from lpGBT before sending them to RD53B through the same cables. No Single-Event Upset (SEU) is observed in any tested channels of GBCR2 in a 400 MeV proton beam. The extrapolated bit error rate for the future HL-LHC application is below 8*10^(-16), significantly below the specified BER criterion. GBCR3 is designed to improve the immunity to single-event-upset by applying the Triple Modular Redundancy (TMR) technology to all RX channels. The retimed signals from GBCR3 have less total jitter than those from GBCR2 (35 ps versus 79 ps). Each receiver channel of GBCR3 consumes 75% more power than that of GBCR2.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
NASA NTRS1988

Transport of cosmic ray nuclei in various materials

Cosmic-ray heavy ions have become a concern in space radiation effects analyses. Heavy ions rapidly deposit energy and create dense ionization trails as they traverse materials. Collection of the free charge disrupts the operation of microelectronic circuits. This effect, called the single-event upset, can cause a loss of digital data. Passage of high linear energy transfer particles through the eyes has been observed by Apollo astronauts. These heavy ions have great radiobiological effectiveness and are the primary risk factor for leukemia induction on a manned Mars mission. Models of the transport of heavy cosmic-ray nuclei through materials depend heavily on our understanding of the cosmic-ray environment, nuclear spallation cross sections, and computer transport codes. Our group has initiated and pursued the development of a full capability for modeling these transport processes. A recent review of this ongoing effort is presented in Ref. 5. In this paper, we discuss transport methods and present new results comparing the attenuation of cosmic rays in various materials.

NASA Discipline Radiation Health↗
NASA NTRS2001

Flight Computer Processing Avionics for Space Station Microgravity Experiments: A Risk Assessment of Commercial Off-the-Shelf Utilization

NASA/Marshall Space Flight Center (MSFC) is continually looking for ways to reduce the costs and schedule and minimize the technical risks during the development of microgravity programs. One of the more prominent ways to minimize the cost and schedule is to use off-the-shelf hardware (OTS). However, the use of OTS often increases the risk. This paper addresses relevant factors considered during the selection and utilization of commercial off-the-shelf (COTS) flight computer processing equipment for the control of space station microgravity experiments. The paper will also discuss how to minimize the technical risks when using COTS processing hardware. Two microgravity experiments for which the COTS processing equipment is being evaluated for are the Equiaxed Dendritic Solidification Experiment (EDSE) and the Self-diffusion in Liquid Elements (SDLE) experiment. Since MSFC is the lead center for Microgravity research, EDSE and SDLE processor selection will be closely watched by other experiments that are being designed to meet payload carrier requirements. This includes the payload carriers planned for the International Space Station (ISS). The purpose of EDSE is to continue to investigate microstructural evolution of, and thermal interactions between multiple dendrites growing under diffusion controlled conditions. The purpose of SDLE is to determine accurate self-diffusivity data as a function of temperature for liquid elements selected as representative of class-like structures. In 1999 MSFC initiated a Center Director's Discretionary Fund (CDDF) effort to investigate and determine the optimal commercial data bus architecture that could lead to faster, better, and lower cost data acquisition systems for the control of microgravity experiments. As part of this effort various commercial data acquisition systems were acquired and evaluated. This included equipment with various form factors, (3U, 6U, others) and equipment that utilized various bus structures, (VME, PC104, STD bus). This evaluation of hardware was performed in conjunction with a trade study that considered over twenty (20) different factors relevant to the selection of an optimum design approach. These factors included; safety, sizing and timing, radiation hardness and single event upset, power consumption, heat dissipation, size and volume, expected service life, maintainability, heritage, operating systems, requirements for software reuse, availability of compatible interface boards, relative cost, schedule, reliability, EMI/EMC factors, "hot swap" capability, standards for conduction cooling, I/O capabilities, unique carrier requirements and operating system considerations. The approach to evaluate Safety as part of this study included a review of the Preliminary Hazard Analysis (PHA) for each of the experiment designs and a determination of how each hazard could be addressed and eliminated when different processors were selected. This included evaluating various design approaches and trade-offs between fault tolerant designs and fail-safe designs in accordance with NSTS 1700.7B. This will include the results of radiation testing where available. Various operating systems, such as VxWorks, Linux, QNX, and Embedded NT are evaluated and the advantages and disadvantages of their utilization are also addressed. Design implementation strategies for the various operating systems are considered and discussed. This paper presents the results and recommendations from this trade study. Preliminary conclusions from this study are that safety concerns from lack or radiation testing on COTS equipment can be addressed by additional testing and design considerations, the PC104 bus provided adequate I/O for the SDLE and EDSE microgravity experiments, and PC104 bus components offered significant advantages over VME and cPCI for weight and space reductions.

Estes, Howard↗
NASA NTRS1982

Annual Conference on Nuclear and Space Radiation Effects, 19th, Las Vegas, NV, July 20-22, 1982, Proceedings

The results of research concerning the effects of nuclear and space radiation are presented. Topics discussed include the basic mechanisms of nuclear and space radiation effects, radiation effects in devices, and radiation effects in microcircuits, including studies of radiation-induced paramagnetic defects in MOS structures, silicon solar cell damage from electrical overstress, radiation-induced charge dynamics in dielectrics, and the enhanced radiation effects on submicron narrow-channel NMOS. Also examined are topics in SGEMP/IEMP phenomena, hardness assurance and testing, energy deposition, desometry, and radiation transport, and single event phenomena. Among others, studies are presented concerning the limits to hardening electronic boxes to IEMP coupling, transient radiation screening of silicon devices using backside laser irradiation, the damage equivalence of electrons, protons, and gamma rays in MOS devices, and the single event upset sensitivity of low power Schottky devices.

Long, D. M.↗