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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 1,099 records · Page 61

Performance Evaluation and Loss Modeling of WBG Devices based on a Novel Double-Pulse Test Method for Current Source Inverter

Careful measurements of the power device characteristics are necessary to accurately estimate a power converter's losses and efficiency. The conventional double-pulse test (DPT) circuit is a well-known method to implement this laboratory characterization of power devices and power modules. However, the switching characteristics of a power device depend on the power electronics circuit in which it is connected as well as the power circuit's physical layout, in addition to the device's internal structure. Hence, the conventional DPT circuit configuration, which is tailored for a standard voltage-source inverter (VSI), is not well-suited for a current-source inverter (CSI). This paper demonstrates a previously-proposed CSI-based DPT measurement technique that is appropriate for normal CSI operation. The characteristics of SiC MOSFETs and series-connected SiC Schottky diodes used in a CSI are measured using this improved technique while taking temperature effects into account to yield more accurate loss predictions. The CSI losses, including the switching and conduction losses of SiC MOSFETs and SiC Schottky diodes, have been modeled using this approach. The total CSI losses and efficiency have been estimated based on the CSI DPT results and loss models.

42 ENGINEERING↗

MxRAM (Final Report)

Sandia National Labs will provide Technical Assistance and consulting to Requester on a series of Requester’s test structures and devices to characterize and aid in the determination of optimal fabrication parameters via fabrication of functional test structures and cells. Working with previously established processes and test die modules, Sandia will construct a series of test chips with varying materials properties to allow the electrical characterization and component testing of Requester’s test structures and devices. Material variations will be selected for optimization of yield and desired target operation parameters. A deliverable in the form of a report will be written. Sandia intends to deliver testable die to the Requester.

36 MATERIALS SCIENCE↗

A comprehensive analysis of cavitation and liquid impingement erosion data

Cavitation-erosion experimental data previously covering several materials tested in a rotating disk device and a magnetostriction apparatus were analyzed using new normalization and curve-fitting techniques. From this process a universal approach is derived which can include data from cavitation and liquid impingement studies for specific materials from different test devices.

Rao, P. V.↗

Controlled release of free-falling test models

Releasing device, powered by a drill motor through an adjustable speed reducer, has a spinning release head with three retractable spring-loaded fingers. The fingers are retracted by manual triggering of a cable at the motor end of the unit.

Fife, W. J.↗

Apparatus for measuring semiconductor device resistance

A test structure is described for enabling the accurate measurement of the resistance characteristics of a semiconductor material and includes one or more pairs of electrical terminals disposed on the surface of the material to enable measurements of the resistance encountered by currents passed between the terminals. A pair of terminals includes a first terminal extending in a closed path, such as a circle, around a second terminal, so that all currents flowing between the terminals flow along a region of known width and length. Two or more pairs of concentric terminals can be utilized, wherein the ratio of radii of each pair of terminals is the same as the ratio for all other pairs of terminals, to facilitate the calculation of the contact resistance between each terminal and the semiconductor surface, as well as the calculation of the resistance of the semiconductor material apart from the effect of the terminal to semiconductor contact resistances.

Matzen, W. J.↗

Screening of Potential Landing Gear Noise Control Devices at Virginia Tech For QTD II Flight Test

In support of the QTD II (Quiet Technology Demonstrator) program, aeroacoustic measurements of a 26%-scale, Boeing 777 main landing gear model were conducted in the Virginia Tech Stability Tunnel. The objective of these measurements was to perform risk mitigation studies on noise control devices for a flight test performed at Glasgow, Montana in 2005. The noise control devices were designed to target the primary main gear noise sources as observed in several previous tests. To accomplish this task, devices to reduce noise were built using stereo lithography for landing gear components such as the brakes, the forward cable harness, the shock strut, the door/strut gap and the lower truck. The most promising device was down selected from test results. In subsequent stages, the initial design of the selected lower truck fairing was improved to account for all the implementation constraints encountered in the full-scale airplane. The redesigned truck fairing was then retested to assess the impact of the modifications on the noise reduction potential. From extensive acoustic measurements obtained using a 63-element microphone phased array, acoustic source maps and integrated spectra were generated in order to estimate the noise reduction achievable with each device.

Ravetta, Patricio A.↗

YBa2Cu3O(7-x)/Au/Nb device structures

Fabrication and testing of planar and edge geometry YBaCuO/Au/Nb superconductor/normal-metal/superconductor (SNS) device structures is described. Weak-link devices of this type serve as sensitive probes of the electrical quality of the YBaCuO/Au interface. The devices are fabricated using laser-ablated, in situ, c-axis-oriented YBaCuO thin films, with both annealed and unannealed YBaCuO/Au interfaces. The planar SNS structures are formed by sequential, in situ deposition of YBaCuO, Au, and Nb, followed by etching, planarization, and wiring electrode definition to produce junctions ranging from 5 to 20 micron on a side. Resulting RnA products are 1-10 x 10 to the -8th ohm-sq cm with critical current densities up to 5 kA/sq cm. For the edge geometry devices, the YBaCuO film edges are patterned using Ar ion milling, followed by a low energy ion cleaning step and in situ deposition of Au and Nb. Devices with areas in the 10 to the -7th to 10 to the -8th sq cm range have been fabricated with RnA products lower than 10 to the -8th ohm-sq cm and critical current densities up to 3kA/sq cm. Both types of devices show ac Josephson steps under microwave irradiation. The best results have been obtained with annealed YBaCuO/Au interfaces.

Hunt, B. D.↗

Operando X-ray absorption spectroscopic investigation of electrocatalysts state in anion exchange membrane fuel cells

Capturing the active state of (electro)catalysts under operating conditions, namely operando, is the ultimate objective of (electro)catalyst characterization, enabling the unraveling of reaction mechanisms and advancing (electro)catalyst development. Operando insights advance our understanding of the correlations between electrochemical tests and device-level performances. However, operando characterization of electrocatalysts is challenging due to the complexity of electrochemical devices and instrumental limitations. As a result, the majority of electrocatalyst characterizations have been limited to half-cell in situ studies. Here, we present an operando X-ray absorption spectroscopic study of Mn spinel oxide electrocatalysts in an operating fuel cell employing a custom-designed cell. Our results reveal that in anion exchange membrane fuel cells, the Mn valence state, within spinel Mn 3 O 4 /C, increases to above 3+, adopting an octahedral coordination devoid of Jahn-Teller distortions. This structural change results in an AEMFC performance equivalent to that of Co 1.5 Mn 1.5 O 4 /C, a composition that outperforms Mn 3 O 4 /C in rotating disk electrode tests. Our results underscore the importance of operando characterizations in elucidating the active state of electrocatalysts and understanding the correlation(s) between electrochemical tests and device performance.

Electrocatalysis↗

Evaluation of Interior Cellular Shades in a Residential Building

Windows are major contributors to energy demand in residential homes because of their inferior thermal resistance compared with the opaque envelope and sometimes from unwanted solar heat gain. Window attachments can help to mitigate this demand by controlling the solar heat gains and enhancing the thermal resistance of the windows. In this study, the energy savings potential of cellular shades in residential homes is studied using experimental testing and energy simulations. The energy performance of the shading devices was experimentally tested during the heating season from December 2019 to May 2020 with a focus on cellular shades. Five shading devices—three single and two double cellular/cell-in-cell shades—were used to compare the performance with generic horizontal (venetian) blinds using two nearly identical sideby-side rooms in a residential building with their exterior window facing east. Another objective of the experimental testing was to evaluate any impact of the side-channel of the shading device on energy savings. To observe the impact of the side-channels on energy savings, from shades in two of the test cases, cellular shades with side-channels were used. From the experimental testing, daily energy savings in the range of 9% to 23% were observed by considering data from 6 p.m. until 6 a.m. of the next day.

32 ENERGY CONSERVATION, CONSUMPTION, AND UTILIZATI↗

Conceptual Design of a Thermal–to-14-MeV Neutron Conversion Device for Use in the Advanced Test Reactor

Here, this paper details the conceptual design of a thermal-to-14-MeV neutron converter consisting of a mixture of lithium and deuterium in a blanket material. Such a device operates a two-step reaction, first generating tritons via thermal neutron absorption in the tritium breeding material, and in the second step, high-energy neutrons are produced either via deuterium-tritium fusion reaction or with tritium reacting with lithium. A thermal-to-14-MeV neutron converter significantly hardens the neutron spectrum by virtually removing thermal neutrons and adding a high-energy 14 MeV component to the neutron spectrum. While similar concepts have been previously proposed and tested in other reactors, the unique characteristics of the Advanced Test Reactor (ATR), namely its important thermal flux (up to $10^{15}$ n.cm$^{-2}$.s$^{-1}$) makes it markedly attractive for obtaining a very large fast neutron flux, usable for irradiation studies under neutron flux conditions prototypical of fusion reactors. The paper provides a description of a new computational scheme developed for handling the coupled neutron-triton transport mechanism using the Geant4 toolkit. Resulting neutron spectra and high-energy neutron yields are summarized for different irradiation positions and potential neutron breeder materials. Maximum predicted thermal-to-14-MeV neutron yields are on the order of $2.10^{-4}$, which is consistent with previous studies found in the literature. Thus, when placed inside the ATR, such a neutron converter will be providing the largest high-energy neutron source available for activation and irradiation studies of materials foreseen for use in fusion reactors. Future steps will involve qualifying the computational scheme using the ATR critical facility using activation foil measurements.

22 GENERAL STUDIES OF NUCLEAR REACTORS↗

Design, fabrication and test of a pneumatically controlled, renewable, microfluidic bead trapping device for sequential injection analysis applications

This paper describes the design, fabrication, and testing of a pneumatically controlled,renewable, microfluidic device for conducting bead-based assays in an automated sequential injection analysis system. The device used a “brick wall”-like pillar array (pillar size: 20 μm length X 50 μm width X 45 μm height) with 5 μm gaps between the pillars serving as the micro filter. The flow channel where bead trapping occurred is 500 μm wide X 75 μm deep. An elastomeric membrane and an air chamber were located underneath the flow channel. By applying pressure to the air chamber, the membrane is deformed and pushed upward against the filter structure. This effectively traps beads larger than 5 μm and creates a “bed” or micro column of beads that can be perfused and washed with liquid samples and reagents. Upon completion of the assay process, the pressure is released and the beads are flushed out from underneath the filter structure to renew the device. Mouse IgG was used as a model analyte to test the feasibility of using the proposed device for immunoassay applications. Resulting microbeads from an on-chip fluorescent immunoassay were individually examined using flow cytometry. The results show that the fluorescence signal intensity distribution is fairly narrow indicating high chemical reaction uniformity among the beads population. Electrochemical onchip assay was also conducted. A detection limit of 0.1 ng/mL1 ppb was achieved and good device reliability and repeatability were demonstrated. The novel microfluidic-based beadstrapping device thus opens up a new pathway to design micro-bead based biosensor immunoassays for clinical and othervarious applications.

beads trapping↗

Comparative Assessment of Experimental Testing of Instrument with an Embedded Digital Device Using Model-Based and Conventional Methods

The use of digital equipment has not been widespread in U.S. nuclear facilities. A major contributing factor to this situation arises from regulatory concerns about common cause failures (CCFs) stemming from the use of identical software in redundant systems, questions as to how to quantify the reliability of software-based products, validity of tools that are used for software verification and validation (V&V), and the effectiveness of software QA procedures. Compounding the concerns are sporadic incidents of digital equipment malfunctions in nuclear power plants, including lockups resulting from software memory leaks, feedwater control malfunctions due to excessive traffic on Ethernet networks, software logic errors, and other problems leading to plant trips. Additionally, the limited amount of demonstrated research and a lack of industry consensus on quantitative software reliability methodologies has hindered the widespread adoption of digital I&C in the nuclear industry. In a recent Regulatory Issue Summary (RIS), the U.S. Nuclear Regulatory Commission (NRC) identified concerns about the impact of greater use of instrumentation and control (I&C) equipment with an embedded digital device (EDD) [1]. Specifically, the NRC staff states that increased use of such devices “may increase a facility’s vulnerability to a CCF” (i.e., common-cause failure). The prevailing NRC guidance regarding software CCF (SCCF) identifies two design attributes that are acceptable for eliminating CCF concerns: (1) diversity or (2) testability (specifically, 100% testability). Either solution can result in high costs and remaining licensing uncertainty (i.e., how much diversity is enough? how to ensure test coverage of every possible sequence of device states?). Consequently, many utilities and reactor designers have limited or avoided more extensive use of digital technology to minimize licensing, scheduling, and financial risk. Without development of cost effective qualification methods to satisfy regulatory requirements and address the potential for CCF vulnerability associated with EDDs, the nuclear power industry may not be able to realize the benefits of digital technology achieved by other industries. In order to address these challenges, the U.S. Department of Energy (DOE) is sponsoring this research to assess the prospect of CCF in digital I&C equipment. The purpose of the current research is to develop an effective approach employing science-based methods to resolve concerns about CCF vulnerability that serve to inhibit deployment of advanced instrumentation (e.g., sensors, actuators, microcontrollers) with EDDs in nuclear power applications. The research objectives address the challenge of establishing high levels of safety and reliability assurance needed for the qualification of EDDs (e.g., microprocessors, programmable logic devices) that are subject to software design faults, complex failure modes, and CCF vulnerability. Specific objectives are: (1) assess the regulatory context for treatment of CCF vulnerability a graded approach to their qualification, (3) develop and extend model-based testing methods to enable effective demonstration of whether devices are subject to CCF, which may arise from vulnerabilities introduced at any stage of the design lifecycle, (4) establish a cost-effective testing framework that incorporates automation and test scenario prioritization, and (5) demonstrate the qualification approach through selection and testing of candidate digital device(s). This report documents an assessment of the results from experimental testing of a representative instrument with an embedded digital device. The experiment serves as a proof-of-concept demonstration of a model-based testing (MBT) framework. The objective of MBT is to ensure that an EDD undergoes suitably comprehensive testing to establish that it is not subject to SCCF. The approach by which MBT accomplishes this objective is through development and application of an effective test suite that provides the appropriate coverage to detect the full range of postulated faults that may arise at the requirements, design, and code (implementation) level of the EDD software. The findings of the experiment involve the application of the MBT framework by Ohio State University (OSU) through testing of the selected demonstration instrument (i.e., the prototype smart pressure sensor developed by Virginia Commonwealth University, VCU). In addition, the experiment findings also involve application of a more conventional black-box testing approach that serves as a baseline against which the MBT methodology can be compared. The primary outcome documented in this report is the comparative analysis of the capabilities demonstrated for each method. The results of the analysis demonstrate clear benefits that arise from the MBT methodology. The comparison indicates greater effectiveness from the more comprehensive evidence available through MBT and enhanced efficiency achieved through automation within the MBT framework. The structure of the report addresses the approach and application of each test method as well as the comparative analysis of the experimental results. Chapter 2 gives a summary overview of the demonstration approach. Chapter 3 covers the baseline testing and Chapter 4 documents the model-based testing. Chapter 5 describes the findings of the comparative analysis and presents the conclusions that can be drawn about the effectiveness and efficiency of the MBT methodology.

47 OTHER INSTRUMENTATION↗

Electromagnetic radiation screening of microcircuits for long life applications

The utility of X-rays as a stimulus for screening high reliability semiconductor microcircuits was studied. The theory of the interaction of X-rays with semiconductor materials and devices was considered. Experimental measurements of photovoltages, photocurrents, and effects on specified parameters were made on discrete devices and on microcircuits. The test specimens included discrete devices with certain types of identified flaws and symptoms of flaws, and microcircuits exhibiting deviant electrical behavior. With a necessarily limited sample of test specimens, no useful correlation could be found between the X-ray-induced electrical response and the known or suspected presence of flaws.

Brammer, W. G.↗

A research program to measure the lifetime of spin polarized fuel

The use of spin polarized fuel could increase the deuterium-tritium (D-T) fusion cross section by a factor of 1.5 and, owing to alpha heating, increase the fusion power by an even larger factor. Issues associated with the use of polarized fuel in a reactor are identified. Theoretically, nuclei remain polarized in a hot fusion plasma. The similarity between the Lorentz force law and the Bloch equations suggests polarization can be preserved despite the rich electromagnetic spectrum present in a magnetic fusion device. The most important depolarization mechanisms can be tested in existing devices. The use of polarized deuterium and 3 He in an experiment avoids the complexities of handling tritium, while encompassing the same nuclear reaction spin-physics, making it a useful proxy to study issues associated with full D-T implementation. 3 He fuel with 65% polarization can be prepared by permeating optically-pumped 3 He into a shell pellet. Dynamically polarized 7 Li-D pellets can achieve 70% vector polarization for the deuterium. Cryogenically-frozen pellets can be injected into fusion facilities by special injectors that minimize depolarizing field gradients. Alternatively, polarized nuclei could be injected as a neutral beam. Once injected, the lifetime of the polarized fuel is monitored through measurements of escaping charged fusion products. Multiple experimental scenarios to measure the polarization lifetime in the DIII-D tokamak and other magnetic-confinement facilities are discussed, followed by outstanding issues that warrant further study.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗

Apollo experience report: Spacecraft pyrotechnic systems

Pyrotechnic devices were used successfully in many systems of the Apollo spacecraft. The physical and functional characteristics of each device are described. The development, qualification, and performance tests of the devices and the ground-support equipment are discussed briefly. Recommendations for pyrotechnic devices on future space vehicles are given.

Falbo, M. J.↗

Multifunction Habitat Workstation/OLED Development

This paper gives a general outline of both a multifunction habitat workstation and the research put into an Organic Light Emitting Diode (OLED) device. It first covers the tests that the OLED device will go through to become flight ready along with reasoning. Guidelines for building an apparatus to house the display and its components are given next, with the build of such following. The three tests the OLED goes through are presented (EMI, Thermal/Vac, Radiation) along with the data recovered. The second project of a multifunction workstation is then discussed in the same pattern. Reasoning for building such a workstation with telepresence in mind is offered. Build guidelines are presented first, with the build timeline following. Building the workstation will then be shown in great detail along with accompanying photos. Once the workstation has been discussed, the versatility of its functions are given. The paper concludes with future views and concepts that can added when the time or technology presents itself.

Schumacher, Shawn↗

Transmission electron microscopy characterization of electrically stressed AlGaN/GaN high electron mobility transistor devices

A set of AlGaN/GaN high electron mobility transistor devices has been investigated using step-stress testing, and representative samples of undegraded, source-side-degraded, and drain-side-degraded devices were examined using electron microscopy and microanalysis. An unstressed reference sample was also examined. All tested devices and their corresponding transmission electron microscopy samples originated from the same wafer and thus received nominally identical processing. Step-stressing was performed on each device and the corresponding current voltage characteristics were generated. Degradation in electrical performance, specifically greatly increased gate leakage current, was shown to be correlated with the presence of crystal defects near the gate edges. However, the drain-side-degraded device showed a surface pit on the source side, and another region of the same device showed no evidence of damage. Moreover, significant metal diffusion into the barrier layer from the gate contacts was also observed, as well as thin amorphous oxide layers below the gate metal contacts, even in the unstressed sample. Overall, these observations emphasize that gate-edge defects provide only a partial explanation for device failure.

Johnson, Michael↗