Effect of disorder on the charge-carrier dynamics in {kappa}-(D{<_8}-ET){<_2}Cu[N(CN){<_2}]Br.
We have applied resistance fluctuation spectroscopy to study the intrinsic low-frequency dynamics of the charge carriers in the system {kappa}-(D{sub 8}-ET){sub 2}Cu[N(CN){sub 2}]Br for two different cooling rates. A strong increase of both the resistance and the noise level is observed below the thermodynamic glass-transition temperature T{sub g}. Surprisingly, the data of the normalized spectral weight <({delta}R){sup 2}>/R{sup 2} fall on top of each other for both cooling rates except for temperatures near the Mott critical point (T{sub 0} {approx_equal} 35 K) and below 28 K. The suppression of the peak in <({delta}R){sup 2}>/R{sup 2} associated with the Mott transition suggests that disorder is an additional parameter in the generalized phase diagram. The enhanced noise level below 28 K might be explained by a disorder-induced staggered magnetic moment in the metallic state close to the antiferromagnetic Mott insulator.