Search NASA⌕ Search

SEARCH · Search NASA

Results for “Microscopy”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 1,171 records · Page 65

Microstructure of highly strained BiFeO{sub 3} thin films: Transmission electron microscopy and electron-energy loss spectroscopy studies

Microstructure and electronic structure of highly strained bismuth ferrite (BiFeO{sub 3}) thin films grown on lanthanum aluminate substrates are studied using high-resolution transmission and scanning transmission electron microscopies and electron energy loss spectroscopy (EELS). Monoclinic and tetragonal phases were observed in films grown at different temperatures, and a mix of both phases was detected in a film grown at intermediate temperature. In this film, a smooth transition of the microstructure was found between the monoclinic and the tetragonal phases. A considerable increase in the c-axis parameters was observed in both phases compared with the rhombohedral bulk phase. The off-center displacement of iron (Fe) ions was increased in the monoclinic phase as compared with the tetragonal phase. EEL spectra show different electronic structures in the monoclinic and the tetragonal phases. These experimental observations are well consistent with the results of theoretical first-principle calculations performed.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Probing the local environment of two-dimensional ordered vacancy structures in Ga{sub 2}SeTe{sub 2} via aberration-corrected electron microscopy

There has been considerable interest in chalcogenide alloys with high concentrations of native vacancies that lead to properties desirable for thermoelectric and phase-change materials. Recently, vacancy ordering has been identified as the mechanism for metal-insulator transitions observed in GeSb{sub 2}Te{sub 4} and an unexpectedly low thermal conductivity in Ga{sub 2}Te{sub 3}. Here, we report the direct observation of vacancy ordering in Ga{sub 2}SeTe{sub 2} utilizing aberration-corrected electron microscopy. Images reveal a cation-anion dumbbell inversion associated with the accommodation of vacancy ordering across the entire crystal. The result is a striking example of the interplay between native defects and local structure.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

System analysis of force feedback microscopy

It was shown recently that the Force Feedback Microscope (FFM) can avoid the jump-to-contact in Atomic force Microscopy even when the cantilevers used are very soft, thus increasing force resolution. In this letter, we explore theoretical aspects of the associated real time control of the tip position. We take into account lever parameters such as the lever characteristics in its environment, spring constant, mass, dissipation coefficient, and the operating conditions such as controller gains and interaction force. We show how the controller parameters are determined so that the FFM functions at its best and estimate the bandwidth of the system under these conditions.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Note: Spring constant calibration of nanosurface-engineered atomic force microscopy cantilevers

The determination of the dynamic spring constant (k{sub d}) of atomic force microscopy cantilevers is of crucial importance for converting cantilever deflection to accurate force data. Indeed, the non-destructive, fast, and accurate measurement method of the cantilever dynamic spring constant by Sader et al. [Rev. Sci. Instrum. 83, 103705 (2012)] is confirmed here for plane geometry but surface modified cantilevers. It is found that the measured spring constants (k{sub eff}, the dynamic one k{sub d}), and the calculated (k{sub d,1}) are in good agreement within less than 10% error.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Direct imaging of electron recombination and transport on a semiconductor surface by femtosecond time-resolved photoemission electron microscopy

Much effort has been devoted to the development of techniques to probe carrier dynamics, which govern many semiconductor device characteristics. We report direct imaging of electron dynamics on semiconductor surfaces by time-resolved photoemission electron microscopy using femtosecond laser pulses. The experiments utilized a variable-repetition-rate femtosecond laser system to suppress sample charging problems. The recombination of photogenerated electrons and the lateral motion of the electrons driven by an external electric field on a GaAs surface were visualized. The mobility was estimated from a linear relationship between the drift velocity and the potential gradient.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Technique for measurement of magnetostriction in an individual nanowire using atomic force microscopy

We have investigated a method for measuring the dimensions of an individual multilayered Fe-Ga/Cu nanowire (NW) as it changes with induced magnetization. In this study, we demonstrate the proposed approach and establish this as a viable method for measuring the magnetostrictive behavior of an individual Fe-Ga/Cu NW using atomic force microscopy (AFM). When an external magnetic field (∼300 Oe) was applied perpendicular to the NW axis, the NW length appeared minimized. When a field (∼1000 Oe) was applied parallel to the NW axis, the height profile of the NW was found to be higher than in the case with no parallel external field. Since both ends of the NW were welded to the substrate, the magnetic field induced dimensional change of the NW caused deflection of the NW in the upward direction, which was significant enough to be detected by AFM. An average height difference of 15 nm was measured with and without an applied field which was then used to calculate the magnetostriction of the multilayered NW.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Synchronous digitization for high dynamic range lock-in amplification in beam-scanning microscopy

Digital lock-in amplification (LIA) with synchronous digitization (SD) is shown to provide significant signal to noise (S/N) and linear dynamic range advantages in beam-scanning microscopy measurements using pulsed laser sources. Direct comparisons between SD-LIA and conventional LIA in homodyne second harmonic generation measurements resulted in S/N enhancements consistent with theoretical models. SD-LIA provided notably larger S/N enhancements in the limit of low light intensities, through the smooth transition between photon counting and signal averaging developed in previous work. Rapid beam scanning instrumentation with up to video rate acquisition speeds minimized photo-induced sample damage. The corresponding increased allowance for higher laser power without sample damage is advantageous for increasing the observed signal content.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Entanglement-assisted electron microscopy based on a flux qubit

A notorious problem in high-resolution biological electron microscopy is radiation damage caused by probe electrons. Hence, acquisition of data with minimal number of electrons is of critical importance. Quantum approaches may represent the only way to improve the resolution in this context, but all proposed schemes to date demand delicate control of the electron beam in highly unconventional electron optics. Here we propose a scheme that involves a flux qubit based on a radio-frequency superconducting quantum interference device, inserted in a transmission electron microscope. The scheme significantly improves the prospect of realizing a quantum-enhanced electron microscope for radiation-sensitive specimens.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗

Local characterization of hindered Brownian motion by using digital video microscopy and 3D particle tracking

In this article we present methods for measuring hindered Brownian motion in the confinement of complex 3D geometries using digital video microscopy. Here we discuss essential features of automated 3D particle tracking as well as diffusion data analysis. By introducing local mean squared displacement-vs-time curves, we are able to simultaneously measure the spatial dependence of diffusion coefficients, tracking accuracies and drift velocities. Such local measurements allow a more detailed and appropriate description of strongly heterogeneous systems as opposed to global measurements. Finite size effects of the tracking region on measuring mean squared displacements are also discussed. The use of these methods was crucial for the measurement of the diffusive behavior of spherical polystyrene particles (505 nm diameter) in a microfluidic chip. The particles explored an array of parallel channels with different cross sections as well as the bulk reservoirs. For this experiment we present the measurement of local tracking accuracies in all three axial directions as well as the diffusivity parallel to the channel axis while we observed no significant flow but purely Brownian motion. Finally, the presented algorithm is suitable also for tracking of fluorescently labeled particles and particles driven by an external force, e.g., electrokinetic or dielectrophoretic forces.

74 ATOMIC AND MOLECULAR PHYSICS↗

Equilibrium Cu-Ag nanoalloy structure formation revealed by in situ scanning transmission electron microscopy heating experiments

Using in situ scanning transmission electron microscopy heating experiments, we observed the formation of a 3-dimensional (3D) epitaxial Cu-core and Ag-shell equilibrium structure of a Cu-Ag nanoalloy. The structure was formed during the thermal interaction of Cu(∼12 nm) and Ag NPs(∼6 nm) at elevated temperatures (150–300 °C) by the Ag NPs initially wetting the Cu NP along its (111) surfaces at one or multiple locations forming epitaxial Ag/Cu (111) interfaces, followed by Ag atoms diffusing along the Cu surface. This phenomenon was confirmed through Monte Carlo simulations to be a nanoscale effect related to the large surface-to-volume ratio of the NPs.

36 MATERIALS SCIENCE↗

Kelvin probe force microscopy study on operating In-Sn-O-channel ferroelectric-gate thin-film transistors

Surface potentials of an operating In-Sn-O channel ferroelectric-gate transistor (FGT) were mapped by Kelvin probe force microscopy. We clearly observed a gradual transition within the channel from linear potential profile to superlinear ones when drain voltage approaches and overcomes gate voltage, which is related to the physics of electronic transport under field-effect doping. The dependence of field-effect mobility on gate-bias and lateral field, as well as the effect of source/drain electrode materials on transport properties, was also elucidated. This study provides useful information for optimizing the FGT performance and for understanding its underlying physics.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Microcantilevers with embedded accelerometers for dynamic atomic force microscopy

The measurement of the intermittent interaction between an oscillating nanotip and the sample surface is a key challenge in dynamic Atomic Force Microscopy (AFM). Accelerometers integrated onto AFM cantilevers can directly measure this interaction with minimal cantilever modification but have been difficult to realize. Here, we design and fabricate high frequency bandwidth accelerometers on AFM cantilevers to directly measure the tip acceleration in commercial AFM systems. We demonstrate a simple way of calibrating such accelerometers and present experiments using amplitude modulated AFM on freshly cleaved mica samples in water to study the response of the accelerometer.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Plasticity mechanisms in ultrafine grained freestanding aluminum thin films revealed by in-situ transmission electron microscopy nanomechanical testing

In-situ bright field transmission electron microscopy (TEM) nanomechanical tensile testing and in-situ automated crystallographic orientation mapping in TEM were combined to unravel the elementary mechanisms controlling the plasticity of ultrafine grained Aluminum freestanding thin films. The characterizations demonstrate that deformation proceeds with a transition from grain rotation to intragranular dislocation glide and starvation plasticity mechanism at about 1% deformation. The grain rotation is not affected by the character of the grain boundaries. No grain growth or twinning is detected.

36 MATERIALS SCIENCE↗

Investigation of leakage current paths in n-GaN by conductive atomic force microscopy

We have investigated electrical characteristics of leakage current paths in n-GaN layer grown by metal-organic chemical vapor deposition with conductive-atomic force microscopy (C-AFM). The C-AFM mapping shows two kinds of leakage current paths existing in the n-GaN layer: open-core dislocation and pure screw dislocation. From the localized I-V curves measured by C-AFM, we confirmed that the open-core screw dislocation shows more significant leakage current. We explained these results in terms of a modified Schottky band model based on donor states formed by oxygen segregation at the (10−10) sidewall of the open-core screw dislocation.

36 MATERIALS SCIENCE↗

Low-temperature evolution of local polarization properties of PbZr{sub 0.65}Ti{sub 0.35}O{sub 3} thin films probed by piezoresponse force microscopy

The temperature evolution of local polarization properties in epitaxial PbZr{sub 0.65}Ti{sub 0.35}O{sub 3} films is studied by the low-temperature piezoresponse force microscopy (PFM). Pronounced changes in the film polarization state, including apparent polarization rotations and possible transitions between single-domain and polydomain states of individual ferroelectric nanocolumns, are revealed on cooling from the room temperature to 8 K using PFM imaging. More than two-fold increase in the coercive voltage extracted from the piezoresponse hysteresis loops is found on cooling from 240 to 8 K. The results are explained by the thermodynamic theory of strained epitaxial perovskite ferroelectric films.

36 MATERIALS SCIENCE↗

Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy

This paper presents a method and cantilever design for improving the mechanical measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method uses two harmonics in the drive signal to generate a bi-harmonic tapping trajectory. Mathematical analysis demonstrates that the wide-valley bi-harmonic tapping trajectory is as much as 70% more sensitive to changes in the sample topography than the standard single-harmonic trajectory typically used. Although standard AFM cantilevers can be driven in the bi-harmonic tapping trajectory, they require large forcing at the second harmonic. A design is presented for a bi-harmonic cantilever that has a second resonant mode at twice its first resonant mode, thereby capable of generating bi-harmonic trajectories with small forcing signals. Bi-harmonic cantilevers are fabricated by milling a small cantilever on the interior of a standard cantilever probe using a focused ion beam. Bi-harmonic drive signals are derived for standard cantilevers and bi-harmonic cantilevers. Experimental results demonstrate better than 30% improvement in measurement sensitivity using the bi-harmonic cantilever. Images obtained through bi-harmonic tapping exhibit improved sharpness and surface tracking, especially at high scan speeds and low force fields.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Rendering graphene supports hydrophilic with non-covalent aromatic functionalization for transmission electron microscopy

Amorphous carbon films have been routinely used to enhance the preparation of frozen-hydrated samples for transmission electron microscopy (TEM), either in retaining protein concentration, providing mechanical stability or dissipating sample charge. However, strong background signal from the amorphous carbon support obstructs that of the sample, and the insulating properties of thin amorphous carbon films preclude any efficiency in dispersing charge. Graphene addresses the limitations of amorphous carbon. Graphene is a crystalline material with virtually no phase or amplitude contrast and unparalleled, high electrical carrier mobility. However, the hydrophobic properties of graphene have prevented its routine application in Cryo-TEM. This Letter reports a method for rendering graphene TEM supports hydrophilic—a convenient approach maintaining graphene's structural and electrical properties based on non-covalent, aromatic functionalization.

36 MATERIALS SCIENCE↗

Frequency-modulated atomic force microscopy operation by imaging at the frequency shift minimum: The dip-df mode

In frequency modulated non-contact atomic force microscopy, the change of the cantilever frequency (Δf) is used as the input signal for the topography feedback loop. Around the Δf(z) minimum, however, stable feedback operation is challenging using a standard proportional-integral-derivative (PID) feedback design due to the change of sign in the slope. When operated under liquid conditions, it is furthermore difficult to address the attractive interaction regime due to its often moderate peakedness. Additionally, the Δf signal level changes severely with time in this environment due to drift of the cantilever frequency f{sub 0} and, thus, requires constant adjustment. Here, we present an approach overcoming these obstacles by using the derivative of Δf with respect to z as the input signal for the topography feedback loop. Rather than regulating the absolute value to a preset setpoint, the slope of the Δf with respect to z is regulated to zero. This new measurement mode not only makes the minimum of the Δf(z) curve directly accessible, but it also benefits from greatly increased operation stability due to its immunity against f{sub 0} drift. We present isosurfaces of the Δf minimum acquired on the calcite CaCO{sub 3}(101{sup ¯}4) surface in liquid environment, demonstrating the capability of our method to image in the attractive tip-sample interaction regime.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗